WO2012099405A2

WO2012099405A2 - Probe block

Info

Publication number: WO2012099405A2
Application number: PCT/KR2012/000461
Authority: WO
Inventors: Jun Soo Cho; Jong Hyun Park
Original assignee: Pro-2000 Co. Ltd.
Priority date: 2011-01-21
Filing date: 2012-01-19
Publication date: 2012-07-26
Also published as: WO2012099405A3

Abstract

A probe block for testing a panel including one or more rows of pads is provided. The probe block includes a body block configured to be coupled to a bottom surface of a manipulator and vertically move by means of elasticity; a pressurizing block configured to be coupled to a bottom surface of the body block and have one or more pressurizing blocks protruding from a bottom surface; and a sheet configured to be coupled to a bottom surface of the pressurizing unit and have electrode lines arranged thereon so as to contact the pads for testing the panel, wherein each of the one or more pressurizing units is located at a position corresponding to a contacting portion between each of the electrode lines of the sheet and a corresponding row of pads of the panel.

Description

PROBE BLOCK

The present invention relates to a probe block, and more particularly, to a probe block for testing a panel including one or more rows of pads.

In general, a flat-panel display panel refers to a display device, such as a liquid crystal display (LCD), a plasma display panel (PDP), and the like. LCDs include thin film transistor-(TFT-), twisted nematic- (TN-), super twisted nematic- (STN-), color super twisted nematic- (CSTN-), double super twisted nematic- (DSTN-), and organic electro luminance (EL)-type displays. Such panels are mounted as a display for small communication devices, such as mobile phones, as well as for large electronic appliances.

A probe block is used in checking the presence of a pixel error in such a small LCD panel. With the increase in resolution of LCD panels, the pixel density has increased, and with the reduction in size of the LCD panels, there is an increasing need for probe blocks having a narrow pitch. Prior art probes may include a needle type probe formed of a tungsten or rhenium-tungsten wire, a blade-type probe formed of nickel or beryllium copper, a film-type probe which is fabricated by etching a copper plate or other conductive material being applied to a polymide film, a hybrid-type probe which is formed by injecting a conductive medium using a semiconductor fabrication process, a pogo-type probe formed of a pogo pin for creating spring tension, and an MEMS-type probe using a semiconductor MEMS fabrication process.

A conventional probe block for testing an LCD panel generally has a needle in the form of wire, and the needle is fixedly bonded to the probe block via epoxy resin. Thus, there is a limitation in reducing an outside diameter of each needle in the form of wire, and such limitation makes it difficult to respond to the recent trend of highly integrated display panel.

In other words, high integration of a flat-panel display device results in the increase of the number of terminals, and considering the condition that an area of a needle holder where needles are accommodated is limited, it is difficult to arrange sufficient number of wire-type needles on the needle holder, corresponding to the number of the terminals.

In addition, in the conventional probe block, it is difficult for probe pins to make accurate physical contact with contact points of an LCD panel due to the impact during the process of test, and the probe block absorbs the impact in all directions, which is generated when the probe block contacts the LCD panel. The probe pins may be bent or deformed by the impact, causing an error in test results.

Further, if a measurement error is generated since a number of measurement ends of the probe block fail to contact a contacting portion of a flat-panel display panel, the reliability of the test cannot be ensured.

Further, a blade-type probe may have an electric signal noise and fail to directly contact a contacting portion of a flat-panel display panel, and hence the amount of overdrive can be increased, resulting in a physical force that hinders the stable electric test.

The object of the present invention is to provide a probe block including one or more pressurizing units, instead of an elastic object, for use in testing a panel including at least one row of pads.

Additional features of the invention will be set forth in the description which follows, and in part will be apparent from the description, or may be learned by practice of the invention.

The present invention provides a probe block for testing a panel including at least one row of pads, the probe block including: a body block configured to be coupled to a bottom surface of a manipulator and vertically move by means of elasticity; a pressurizing block configured to be coupled to a bottom surface of the body block and have one or more pressurizing blocks protruding from a bottom surface; and a sheet configured to be coupled to a bottom surface of the pressurizing unit and have electrode lines arranged thereon so as to contact the pads for testing the panel, wherein each of the one or more pressurizing units is located at a position corresponding to a contacting portion between each of the electrode lines of the sheet and a corresponding row of pads of the panel.

The pressurizing block and the one or more pressurizing units may be made of a ceramic material or synthetic resin and integrated into one body.

The pressurizing block and the one or more pressurizing units may be made of zirconia and integrated into one body.

Each of the one or more pressurizing units may be a rod-like projection projecting in a direction perpendicular to the bottom surface of the pressurizing block.

An end of the body block that faces the panel may have an insertion groove into which the pressurizing block to be inserted.

The sheet may be coupled between the pressurizing block and the body block while an end of the sheet is coupled to the bottom surface of the pressurizing block and encloses the one or more pressurizing units or the sheet may be coupled to the bottom surface of the pressurizing block while an end of the sheet is coupled between the pressurizing block and the body block and encloses the one or more pressurizing units.

The sheet may be a TAB IC which is connected to the electrode lines and equipped with a driver IC to deliver a driving signal to the panel.

The probe block may further include a plate configured to adhesively fix the sheet to the bottom surface of the pressurizing block wherein a pitch between the electrode lines of the sheet has been adjusted to be the same as a pitch between the pads of the panel.

The plate may be coupled to a portion of the bottom surface of the pressurizing block on which the one or more pressurizing blocks are not formed.

The probe block may further include a cover block configured to be coupled to the bottom surface of the body block to protect the sheet and a flexible circuit board, wherein the sheet is electrically connected to the flexible circuit board to deliver a test signal.

According to the exemplary embodiments of the present invention, a probe block pressurizes a panel by vertically moving one or more pressurizing units formed on a bottom surface of a pressurizing block, instead of a conventional elastic object which is inserted into a body block to exert an elastic force to a contact point. Thus, a problem which may occur when the elastic object that is compressed and inserted into the body block is replaced can be prevented, and damage to pads of the panel or electrode lines of the sheet can be also prevented. In addition, the probe block includes a plurality of pressurizing units formed on the bottom surface of the pressurizing block, thereby being capable of easily testing a panel including a plurality of rows of pads.

The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention, and together with the description serve to explain the principles of the invention.

FIG. 1 is a diagram illustrating an exploded perspective view of a probe block according to an exemplary embodiment of the present invention.

FIG. 2 is a diagram illustrating a combined cross-sectional view of the probe block shown in FIG. 1.

FIG. 3 is a diagram illustrating a partial cross-sectional view of the probe block shown in FIG. 1 when testing a panel.

FIG. 4 is a diagram illustrating an exploded perspective view of a probe block according to another exemplary embodiment of the present invention.

FIG. 5 is a diagram illustrating a combined cross-sectional view of the probe block shown in FIG. 4.

FIG. 6 is a diagram illustrating a partial cross-sectional view of the probe block shown in FIG. 4 when testing a panel.

The invention is described more fully hereinafter with reference to the accompanying drawings, in which exemplary embodiments of the invention are shown. This invention may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure is thorough, and will fully convey the scope of the invention to those skilled in the art. In the drawings, the size and relative sizes of layers and regions may be exaggerated for clarity. Like reference numerals in the drawings denote like elements.

FIG. 1 is a diagram illustrating an exploded perspective view of a probe block according to an exemplary embodiment of the present invention. FIG. 2 is a diagram illustrating a combined cross-sectional view of the probe block shown in FIG. 1. FIG. 3 is a diagram illustrating a partial cross-sectional view of the probe block shown in FIG. 1 when testing a panel.

Referring to FIGS. 1 to 3, a probe block 100 for testing a panel 150 including a plurality of rows of pads (for example, PAD1 and PAD2) may include a body block 110, a pressurizing block 120, and a sheet 130.

The body block 110 may have a top surface coupled to a bottom surface of a manipulator (not shown) and may move vertically by means of elasticity. The body block 110 may have an insertion groove 115 on a bottom surface for the pressurizing block 120 to be inserted thereinto. The insertion groove 115, as illustrated in FIG. 1, may be provided at each side of the body block 110. However, the insertion groove 115 may not be limited thereto, and a shape of the insertion groove 115 may vary. The pressurizing block 120 may be coupled to the bottom surface of the body block without the insertion groove.

The pressurizing block 120 may be coupled to the bottom surface of the body block 110, and may include one or more pressurizing units 125 that protrude from a bottom surface thereof. In the examples of FIGS. 1 to 3 which illustrate the probe block for testing the panel 150 including two rows of pads PAD1 and PAD2, the bottom surface of the pressurizing block 120 may have two pressurizing units 125. However, the number of pressurizing units 125 is not limited thereto, and if the panel 150 includes different number of rows of pads, the number of the pressurizing units 125 protruding from the bottom surface of the pressurizing block 120 may be varied. For example, in testing a panel including three rows of pads, the pressurizing block may have three pressurizing units on the bottom surface.

Each of the pressurizing units 125 may be located at a contacting portion between electrode lines of the sheet 130 and each corresponding row of pads of the panel, and pressurize the contacting portion. Since the body block 110 moves vertically by means of elasticity to pressurize the contacting portion, the pressurizing units 125 on the bottom surface of the pressurizing block 120 that is coupled to the body block 110 is enabled to pressurize the contacting portion by means of elasticity.

Each of the pressurizing units 125 may be a rod-like projection projecting in a direction perpendicular to the bottom surface of the pressurizing block 120. That is, each of the pressurizing units 125 may be a rod-like projection with the same length as the length of the entire corresponding row of pads of the panel. The pressurizing units 125 may be provided in various shapes, such as a rectangle, a cylinder, and the like.

The pressurizing block 120 and the pressurizing units 125 may be made of ceramic materials or synthetic resins, and may be integrated into one body. For example, the pressurizing block 120 and the pressurizing units 125 may be made of zirconia, and be integrated into one body.

A portion of the pressurizing block 120 on which the pressurizing units 125 are formed may be protrude outward more than an end of the body block 110. However, the form of the pressurizing block 120 is not limited thereto, and the portion of the pressurizing block 120 on which the pressurizing units 125 are formed may not protrude outward more than the end of the body block 110.

The sheet 130 may be coupled to a top surface and a bottom surface of the pressurizing block 120 to enclose the pressuring units 125.

For example, as shown in FIGS. 1 to 3, the sheet 130 may be coupled between the top surface of the pressurizing block 120 and the bottom surface of the body block 110, and may have an end coupled to the bottom surface of the pressurizing block 120 wherein the end of the sheet 130 encloses the side of the pressurizing block 120 and the pressurizing units 125. In this example, the electrode lines on the sheet 130 may be formed on a surface of the sheet 140 which is exposed to the outside since the electrode lines should be in contact with the pads of the panel 150.

The sheet 130 may be a TAB IC to which the driver IC electrically connected to the electrode lines is bonded and which is coupled to a surface of the sheet 130 facing the bottom surface of the body block 110 so as to transmit a driving signal to the panel 150. The TAB IC may be a TAB IC for use in a panel, or a sheet to which the driver IC is bonded by a TAB process. In this case, as shown in FIGS. 1 to 3, the sheet 130 may be electrically connected to a flexible circuit board (FCB) 140 to transmit a test signal to the panel 150. Alternatively, the sheet 130 may be a sheet (for example, a flexible circuit board, etc.) that is not bonded with the driver IC, and in this example, the driver IC may be interposed between the sheet 130 and the FCB 140 to be electrically connected to the sheet 130 and the FCB 140.

Although FIGS. 1 to 3 illustrate that the end of the sheet 130 is coupled to the bottom surface of the pressurizing block 120, the present invention is not limited thereto, and the end of the sheet 130 may be coupled to a top surface of the pressurizing block 120. For example, the sheet 130 may be coupled to the bottom surface of the pressurizing block 120 and have an end interposed between the top surface of the pressurizing block 120 and the bottom surface of the body block 110 wherein the end of the sheet 130 encloses the ends of the side of the pressurizing block 120 and the pressurizing units 125. That is, in the embodiments illustrated in FIGS. 1 to 3, the sheet 130 encloses the side of the pressurizing block 120 and the pressurizing blocks 125 from the top to the bottom thereof and has an end coupled to the bottom surface of the pressurizing block 120, but the sheet 130 may enclose the side of the pressurizing block 120 and the pressurizing units 125 from the bottom to the top thereof, and thus the end of the sheet 130 may be coupled to the top surface of the pressurizing block 120. In this example, the electrode lines on the sheet 130 may be formed on a surface of the sheet 130 which is exposed to the outside since the electrode lines should be in contact with the pads of the panel 150.

Even in this example, the sheet 130 may be a TAB IC to which the driver IC is bonded, and the TAB IC may be coupled to a surface opposite to the surface of the sheet 130 facing the bottom surface of the pressurizing block 120. If the sheet 130 is the above-described TAB IC, the sheet 130 is electrically connected to the FCB 140 and thus can transmit a test signal. The sheet 130 may be, as described above, a sheet (for example, a flexible circuit board, etc.) to which the driver IC is not bonded, and in this case, the TAB IC may be interposed between the sheet 130 and the FCB 140 to be electrically connected to the sheet 130 and the FCB 140.

In a case in which a pitch of the electrode lines of the sheet 130 is different from a pitch of the pads of the panel 150 since the sheet 130 is a TAB IC for use in the panel, the probe block 100 may further include a plate 210 to adjust the pitch of the sheet 130 and adhesively fix the pitch-adjusted sheet 130 so as to maintain the same pitch between the sheet 130 and the pads of the panel 150. For example, a pitch between the electrode lines of the sheet 130 is adjusted to be the same as a pitch between the pads of the panel 150, and the pitch-adjusted sheet 130 is adhesively fixed to the plate 210, and thereby the adjusted pitch can be maintained. In addition, the plate 210 onto which the pitch-adjusted sheet 130 is fixed is coupled to the pressurizing block 120, thereby allowing the sheet 130 to be coupled to the bottom surface of the pressurizing block 120. The plate 210 may be coupled to a portion of the bottom surface of the pressurizing block 120 which does not have the pressurizing units 125 formed.

The probe block 100 may further include a cover block 220 to be fixed on the bottom surface of the body block 110 so as to protect the sheet 130 and the FCB 140. The cover block 220 may protect the sheet 130 and the FCB 140 from the outside, and may be coupled to the bottom surface of the body block 110.

FIG. 4 is a diagram illustrating an exploded perspective view of a probe block according to another exemplary embodiment of the present invention. FIG. 5 is a diagram illustrating a combined cross-sectional view of the probe block shown in FIG. 4. FIG. 6 is a diagram illustrating a partial cross-sectional view of the probe block shown in FIG. 4 when testing a panel.

Referring to FIGS. 4 to 6, a probe block 400 is different from the probe block 100 illustrated in FIGS. 1 to 3 since the probe block 400 tests a panel 450 that includes a row of pads PAD. In other words, the probe block 100 illustrated in FIGS. 1 to 3 tests the panel 150 by contacting a plurality of pads of the panel 150 with the electrode lines of the sheet 140, whereas the probe block 400 illustrated in FIGS. 4 to 6 tests the panel 450 by contacting single row of pads of the panel 450 with electrode lines of the sheet 130.

The probe block 400 illustrated in FIGS. 4 to 6 is the same as the probe block 100 illustrated in FIGS. 1 to 3, excepting that only one pressurizing block 125 on the bottom surface of the pressurizing block 120. That is, the probe block 400 is generated by removing one pressurizing unit 125 from the probe block 100 illustrated in FIGS. 1 to 3. Therefore, the configuration and operations of the probe block 400 are the same as those of the probe block 100, and thus the detailed descriptions thereof will not be reiterated.

As apparent from the above description, the

probe block

100 or 400 according to the exemplary embodiments of the present invention includes a pressurizing block having one or more pressurizing blocks, instead of a conventional elastic object, and test the panel 150 by vertically moving the pressurizing block to exert an elastic force and a pressure to a contacting portion between the sheet 130 and the

panel

150 or 450. Accordingly, it is possible to prevent problems that may occur when replacing the elastic object, prevent damages to the pads of the panel or the electrode lines of the sheet, and easily test a panel having a plurality of rows of pads as well as a panel having a single row of pads.

It will be apparent to those skilled in the art that various modifications and variation can be made in the present invention without departing from the spirit or scope of the invention. Thus, it is intended that the present invention cover the modifications and variations of this invention provided they come within the scope of the appended claims and their equivalents.

This invention can be applied to the field of manufacturing prove block.

Claims

A probe block for testing a panel including at least one row of pads, the probe block comprising:

a body block configured to be coupled to a bottom surface of a manipulator and vertically move by means of elasticity;

a pressurizing block configured to be coupled to a bottom surface of the body block and have one or more pressurizing blocks protruding from a bottom surface; and

a sheet configured to be coupled to a bottom surface of the pressurizing unit and have electrode lines arranged thereon so as to contact the pads for testing the panel,

wherein each of the one or more pressurizing units is located at a position corresponding to a contacting portion between each of the electrode lines of the sheet and a corresponding row of pads of the panel.
The probe block of claim 1, wherein the pressurizing block and the one or more pressurizing units are made of a ceramic material or synthetic resin and integrated into one body.
The probe block of claim 1, wherein the pressurizing block and the one or more pressurizing units are made of zirconia and integrated into one body.
The probe block of claim 1, wherein each of the one or more pressurizing units is a rod-like projection projecting in a direction perpendicular to the bottom surface of the pressurizing block.
The probe block of claim 1, wherein the pressurizing block has a portion protruding outward more than an end of the body block wherein the one or more pressurizing units are formed on the portion.
The probe block of claim 1, wherein an end of the body block that faces the panel has an insertion groove into which the pressurizing block to be inserted.
The probe block of claim 1, wherein the sheet is coupled between the pressurizing block and the body block while an end of the sheet is coupled to the bottom surface of the pressurizing block and encloses the one or more pressurizing units or the sheet is coupled to the bottom surface of the pressurizing block while an end of the sheet is coupled between the pressurizing block and the body block and encloses the one or more pressurizing units.
The probe block of claim 1, wherein the sheet is a TAB IC which is connected to the electrode lines and equipped with a driver IC to deliver a driving signal to the panel.
The probe block of claim 1, further comprising:

a plate configured to adhesively fix the sheet to the bottom surface of the pressurizing block wherein a pitch between the electrode lines of the sheet has been adjusted to be the same as a pitch between the pads of the panel.
The probe block of claim 9, wherein the plate is coupled to a portion of the bottom surface of the pressurizing block on which the one or more pressurizing blocks are not formed.
The probe block of claim 1, further comprising:

a cover block configured to be coupled to the bottom surface of the body block to protect the sheet and a flexible circuit board,

wherein the sheet is electrically connected to the flexible circuit board to deliver a test signal.