CN107038983A - Pin type plugboard - Google Patents

Pin type plugboard Download PDF

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Publication number
CN107038983A
CN107038983A CN201710063683.9A CN201710063683A CN107038983A CN 107038983 A CN107038983 A CN 107038983A CN 201710063683 A CN201710063683 A CN 201710063683A CN 107038983 A CN107038983 A CN 107038983A
Authority
CN
China
Prior art keywords
probe
mentioned
pin type
class
type plugboard
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN201710063683.9A
Other languages
Chinese (zh)
Inventor
朴钟铉
李镕宽
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
PRO 2000 CO Ltd
Original Assignee
PRO 2000 CO Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by PRO 2000 CO Ltd filed Critical PRO 2000 CO Ltd
Publication of CN107038983A publication Critical patent/CN107038983A/en
Pending legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06733—Geometry aspects
    • G01R1/06738—Geometry aspects related to tip portion
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07314—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/0735—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card arranged on a flexible frame or film

Abstract

A kind of pin type plugboard is provided.The pin type plugboard for panel inspection of the present invention includes：Base；Substrate, it is incorporated into the bottom of base；And multiple probes, its one end is formed with for the protuberance with the conductive contact of panel, and the other end is engaged with the bottom surface of substrate.

Description

Pin type plugboard
Technical field
The present invention relates to pin type plugboard, in more detail, being related to can be to the communication device class as portable phone The galvanoscopic pin type plugboard that liquid crystal display panel is stablized.
Background technology
Typically, flat-panel display panel refers to Organic Light Emitting Diode (OLED：Organic Light Emitting Diode), liquid crystal display (LCD：Liquid Crystal Display), plasma display (PDP：Plasma Display Panel) etc. display device, LCD has TFT (Thin Film Transistor：Thin film transistor (TFT)), TN (Twisted Nematic：Twisted-nematic), STN (Super Twisted Nematic：Super twisted nematic), CSTN (Color Super Twisted Nematic：Colorful ultra-twist nematic), DSTN (Double Super Twisted Nematic：Double supertwists to Row) type and organic EL (Electro Luminescence：Electroluminescent) type, this panel in addition to white goods, It can be used for the liquid crystal display panel of communication equipment as small-sized such as portable phone.
In order to check this liquid crystal display panel whether without pixel error (Pixel Error) normal work and use visit Pin block (Probe Block).
Recently, as liquid crystal display panel develops to higher image quality, the density increase of pixel is added due to miniaturization The necessity of the probe block of thin space.The detector developed before this has：It is the pin type that material makes with tungsten or rhenium tungsten filament (Needle Type), with nickel or beryllium copper be material make chip (Blade Type), in polyimide film (Polymide Film copper coin or other electric conductors are placed on) and carries out etching and processing and makes membrane type (Film Type), in membrane type detection Semiconductor process technique is used to be filled with hybrid (the Hybrid Type) of conductive medium, with using spring tension in device Spring thimble (Pogo Pin) is the spring (Pogo Type) of raw material making, uses semiconductor MEMS technology technology MEMS formulas (Mems Type：MEMS formula) etc..
So, the existing pin type plugboard installed in the probe block for checking liquid crystal display panel includes flexible electrical Base board (FPCB：Flexible Printed Circuit Board), the flexible circuit board is incorporated into included by probe block Main substrate and probe between, so as to be contacted with the rearward end of the probe including pin, playing in panel test to be inputted Signal is transferred to the effect of main substrate.
Thus, in existing pin type plugboard, such as the 2nd of the 1st contact of wire and pin, pin and flexible circuit board connects 3rd contact of point and flexible circuit board and main substrate so, make to carry out panel inspection each wire of panel with During each pin contact, using flexible circuit board 3 electric contacts of formation, therefore there are the following problems：Produce noise etc. and cause electricity Characteristic is reduced, it is impossible to is stably carried out electric-examination and is looked into.
In addition, existing pin type plugboard will form, configure flexible circuit board, so as to have economy and the production of product The problem of productivity of product is reduced.
The content of the invention
Problems to be solved by the invention
The problem of present invention is in order to solve as previously described and complete, its object is to provide to subtract when panel is checked Lack the electric contact quantity between the wire and substrate of panel and stably carry out the galvanoscopic pin type plugboard of counter plate.
The solution used to solve the problem
The present invention is a kind of pin type plugboard checked for panel, including：
Base；
Substrate, it is incorporated into the bottom of above-mentioned base；And
Multiple probes, its one end is formed with for the protuberance with the conductive contact of above-mentioned panel, the other end and above-mentioned base The bottom surface of plate is directly engaged.
In addition, the other end of above-mentioned probe can be with aforesaid substrate bottom surface solder joints.
In addition, the incorporating section for storing the above-mentioned respective other end of probe can be formed with the bottom surface of aforesaid substrate.
In addition, the other end of the above-mentioned probe directly engaged with the bottom surface of aforesaid substrate can be formed as zigzag.
In addition, the incorporating section for storing the above-mentioned respective jagged part of probe can be formed with the bottom surface of aforesaid substrate.
In addition, above-mentioned probe can be included on the basis of above-mentioned protuberance arrange when engaged with the bottom surface of aforesaid substrate it is another The position of one end mutually different the 1st class probe and the 2nd class probe, above-mentioned 1st class probe and above-mentioned 2nd class probe are alternately arranged Row.
In addition, the other end engaged with the bottom surface of aforesaid substrate of above-mentioned 1st class probe can be located at than above-mentioned 2nd class probe Position of the other end away from above-mentioned protuberance engaged with the bottom surface of aforesaid substrate.
In addition, above-mentioned 1st class stored and be alternately arranged can be formed with the bottom surface of aforesaid substrate in the way of being alternately arranged The incorporating section of probe and the respective other end of above-mentioned 2nd class probe.
Invention effect
The present invention relates to pin type plugboard, it is not necessary to flexible circuit board, by making main substrate and probe mutually directly connect Close and be electrically connected to each other, with regard to the electric contact that flexible circuit board is formed can be reduced, noise can not be produced, electrical characteristics, energy are improved The electric-examination for stably carrying out counter plate is looked into.
In addition, the present invention is not due to needing flexible circuit board, therefore it need not form and configure flexible circuit board, energy The economy of product is improved, the productivity of product is improved.
Brief description of the drawings
Fig. 1 is the stereogram of the pin type plugboard of embodiment.
Fig. 2 is the stereogram for the probe being alternately arranged for showing Fig. 1.
Fig. 3 is Fig. 1 exploded perspective view.
Fig. 4 is the exploded perspective view that Fig. 3 probe is engaged in the state of main substrate.
Fig. 5 is the stereogram of the 1st class probe of embodiment.
Fig. 6 is the stereogram of the 2nd class probe of embodiment.
Description of reference numerals
10：Base
30：Main substrate
31：Incorporating section
50：Probe
51：Probe body
53：1st extension
55：2nd extension
57：Protuberance
511：Hole
Embodiment
Hereinafter, the preferred embodiment that present invention will be described in detail with reference to the accompanying.
Embodiments of the present invention are provided to further completely illustrate the present invention to those skilled in the art, under State embodiment and can be deformed into various other modes, the scope of the present invention is not limited by following embodiments.On the contrary, these are implemented Mode is to make the disclosure further enrich and complete, the thought of the present invention is intactly passed on to those skilled in the art and is provided 's.
The term used in this manual uses to illustrate specific embodiment, is not used in the present invention Limited.As used in this specification like that, if not clearly indicating other situations within a context, odd number shape State can also include plural form.Separately outside, used in this specification " including (comprise) " and/or " including (comprising) " it is used for shape, numeral, stage, action, component, key element and/or these presence organized mentioned by determining, It is not precluded from the presence or additional of other shapes, numeral, action, component, key element and/or the group of more than 1.Such as in this explanation In book as use, term "and/or" includes all combinations of any 1 and more than 1 in the project that it is enumerated.
In this manual, the 1st, term such as 2nd has been used in order to illustrate various component, region and/or position, but These components, part, region, layer and/or position obviously will not be limited by these terms.These terms do not indicate that specific suitable It is sequence, up and down or good and bad, only for 1 component, region or position and other components, region or position are distinguished Use.Therefore, also can be by the 1st component, region or position described below in the range of the teachings of the present invention is not departed from Referred to as the 2nd component, region or position.
Hereinafter, reference roughly shows the accompanying drawing of embodiments of the present invention to illustrate embodiments of the present invention.Can be pre- Expect for example due to manufacturing technology and/or tolerance shown shape being caused to deform in the accompanying drawings.Therefore, it is of the invention Embodiment should not be construed as limited by the given shape in the region shown in this specification, and should be comprising for example being led in manufacture The change in shape of cause.
Fig. 1 is the stereogram of the pin type plugboard (Needle Type Pin Board) of embodiment.Also, Fig. 2 is to show Go out the stereogram of Fig. 1 probe being alternately arranged.In addition, Fig. 3 is Fig. 1 exploded perspective view, the probe that Fig. 4 is Fig. 3 is engaged in The exploded perspective view of the state of main substrate.
As shown in Figures 1 to 4, the pin type plugboard for the embodiment tested for counter plate includes base (Base Block) 10, main substrate 30 and probe (Probe Pin) 50.
Main substrate 30 is combined in the bottom of above-mentioned base 10.
Above-mentioned main substrate 30 is electrically connected by connector (C) with visual examination device, mutually carries out the input and output of signal. Also, in order to carry out the inspection of above-mentioned panel, main substrate 30 is by probe 50 by the inspection for being checked above-mentioned panel Signal is applied to above-mentioned panel.
In addition, although not shown, main substrate 30 includes control unit, driving voltage generating unit and multiple electrodes line etc., above-mentioned Multiple electrodes line is used to transmit the signal that the probe 50 being connected by the wire with panel is received.Here, above-mentioned control unit is defeated Go out control signal, the voltage needed for the action of above-mentioned driving voltage generating unit output display device, such as supply voltage, grid is led Be powered pressure, grid cut-off voltage etc..
As shown, each probe 50 is formed with protuberance 57 described later at one end, so that each with corresponding panel Individual conductive contact, the other end 513,523 described later is directly engaged with the bottom surface of main substrate 30.
Here, the bottom surface of probe 50 and main substrate 30 can solder joints.Also, probe 50 is by the metal sheet of fixed thickness Formed.
In addition, the respective other end 513,523 of probe 50 can be formed as zigzag to easily be engaged with main substrate 30. On this point, reference picture 5 to Fig. 6 is further described.
In addition, in order that probe 50 is engaged with main substrate 30, and it is each storage probe 50 to be formed in the bottom surface of main substrate 30 From the other end 513,523 incorporating section 31.Thus, from main substrate 30 electricity can be provided to each probe 50 by the incorporating section 31 Signal.Also, the jagged part of the respective other end 513,523 of probe 50 can be stored in the incorporating section 31 of main substrate 30.
Probe 50 can include the other end position engaged when arranging (A1) on the basis of protuberance 57 with the bottom surface of main substrate 30 Put mutually different the 1st class probe and the 2nd class probe.For example, referring to Fig. 2 and Fig. 3, the bottom with main substrate 30 of the 1st class probe The other end 513 of face engagement can be located at the position more farther than the other end 523 engaged with the bottom surface of main substrate 30 of the 2nd class probe Put.Also, arrangement (B1) such as the 1st class probe and the arrangement (B2) of the 2nd class probe, the 1st class probe and the 2nd class probe energy Engaged in the way of being alternately arranged (B1, B2) with main substrate 30.Therefore, the incorporating section of the other end 513 of the 1st class probe is stored The incorporating section 31-2 of the other end 523 of the 2nd class probe of 31-1 and storage can also be handed in the same manner as the 1st class probe and the 2nd class probe For arrangement.That is, as shown in figure 3, incorporating section 31 can be by arrangement in a zigzag.
As it was previously stated, the pin type plugboard of embodiment does not need flexible circuit board, it is to make main substrate 30 and probe 50 Mutually directly engage and be electrically connected to each other.That is, as the necessary flexible circuit board constituted of prior art with after probe The mode of ends contact is incorporated between main substrate and probe, is played in panel test the signal inputted being transferred to main base The effect of plate.
Thus, the pin type plugboard of embodiment is compared with above-mentioned flexible circuit board is the necessary prior art constituted, The electric contact quantity between the wire of above-mentioned panel and main substrate 30 can be reduced when above-mentioned panel is checked, noise is not produced, than Prior art improves electrical characteristics.
Also, the pin type plugboard of embodiment need not form and configure above-mentioned flexible circuit board, can improve product Economy, improve product productivity.
In addition, in the pin type plugboard of embodiment, above-mentioned 1st class probe and above-mentioned 2nd class probe are to be alternately arranged Mode directly engaged with the bottom surface of main substrate 30, thus, spacing (pitch) between probe 50 can be made compared with linear array more Engaged smallly, the trend of the higher image quality of liquid crystal display panel can be tackled.
That is, with the higher image quality of liquid crystal display panel, the density increase of pixel, because miniaturization causes the spy of thin space The necessity of pin block is in increased trend, therefore, in the case where each probe 50 is mutually directly engaged with main substrate 30, it is necessary to The spacing between probe 50 is set to be engaged smallly.
Thus, as shown in Fig. 2 the 1st foregoing class probe and the 2nd class probe are respectively formed as connecing with the bottom surface of main substrate 30 The position of the above-mentioned other end closed is mutually different.Thus, with the mutually different mode in the position of the above-mentioned other end formed it is above-mentioned 1st class probe and above-mentioned 2nd class probe can be alternately arranged, and above-mentioned 1st class probe and above-mentioned 2nd class probe can be to be alternately arranged Mode is directly engaged with the bottom surface of main substrate 30.
Hereinafter, the structure of above-mentioned probe 50 is described in detail.
Fig. 5 is the stereogram of the 1st class probe of embodiment.As shown in figure 5, the 1st class probe 50 includes：The probe of tabular Main body 51；1st extension 53, it is configured from the lateral lower side in lower end one of probe body 51 to extension；2nd extension 55, its It is spaced apart with probe body 51, probe body must be compared by being configured to extend from another side of the 1st extension 53 to opposite side direction 51 length；And protuberance 57, its from the opposite side lower end of the 2nd extension 55 to lower side to with the one of the 2nd extension 55 and The mode that top comes to a point is formed.
Above-mentioned probe body 51 includes multiple holes 511.As described above, in the pin type plugboard of embodiment, probe Main body 51 includes multiple holes 511, and thus, when each probe 50 is mutually directly engaged with main substrate 30, cement passes through each hole 511 And positioned at the both sides of probe body 51, the situation phase of the side of probe body 51 is only located at the above-mentioned cement without hole 511 Than the zygosity of above-mentioned engagement can be improved.
In addition, the upper end of probe body 51, which is the above-mentioned other end 513 engaged with the bottom surface of main substrate 30, is formed as sawtooth Shape.
As described above, in the pin type plugboard of embodiment, the upper end of probe body 51 is the above-mentioned shape of the other end 513 As zigzag, thus, when each probe 50 is mutually directly engaged with main substrate 30, due to being zigzag, connect compared with linear Closing area can increase, so as to improve zygosity.
Above-mentioned protuberance 57 includes：Pin 57a, it is formed as taper in the way of forming point, when above-mentioned panel is checked with The conductive contact of above-mentioned panel；And alignment (align) portion 57b, it is spaced apart with pin 57a and extends configuration.Here, above-mentioned pin 57a is more protrusively provided compared with aligned portions 57b from the 2nd extension 55.Also, above-mentioned aligned portions 57b is used in above-mentioned face Each wire of plate judges whether to be aligned when contacting with each pin 57a.
Above-mentioned 2nd extension 55 is included in the elasticity offer mouth 551 that central part is formed as bar-shaped.Here, elasticity is provided Mouth 551 is formed parallel in the way of the long side direction elongation to the 2nd extension 55 with the outer peripheral face of the 2nd extension 55, can shape Into there is more than 1.In addition, can certainly have other shapes.
Now, above-mentioned probe 50 provides mouth 551 by the elasticity including structure as described above, and pin can be made by having The elastic force flowed above and below 57a parts.
That is, in the inspection of above-mentioned panel, in the case of the contacts of pin 57a and panel, mouth is provided using elasticity 551 provide mobility in vertical direction up and down.Thus, if applying certain impact from outside, easily absorb the impact and Warpage or the deformation of probe 50 itself are prevented, the deviation of contact positions of the pin 57a on liquid crystal display panel can be prevented, simultaneously The accurate electric-examination that above-mentioned panel can be carried out is looked into.
Fig. 6 is the stereogram of the 2nd class probe of embodiment.Hereinafter, the 1st class probe 50 actually phase with Fig. 5 is omitted The explanation of same composition, is illustrated centered on difference.
As shown in fig. 6, the 2nd class probe 50 includes the probe body 52 of tabular.
Above-mentioned probe body 52 includes：Be formed as the other end that jagged upper end is engaged with the bottom surface of main substrate 30 523；And tilted down from the other end 523 along side direction, extend the lower end of configuration.Here, the 1st extension 53 is from probe The lower end of main body 51 is configured to lower side to extension.
Thus, in the case where each probe 50 is mutually directly engaged with main substrate 30, from the other end 523 along side direction The position for tilting down and extending configuration can be located at the position being spaced apart from main substrate 30 to downside.
Now, above-mentioned 2nd class probe 50 is included in when each 2nd class probe 50 is mutually directly contacted with main substrate 30 from main base The probe body 52 that plate 30 is spaced apart to downside, so as in the inspection of above-mentioned panel, be connect in pin 57a parts and the contact of panel In the case of touching, mobility is provided in vertical direction up and down using the probe body 52 being spaced apart from main substrate 30 to downside.
The embodiment relevant with the pin type plugboard of embodiments of the present invention is this concludes the description of, but it is clear that Various implementation deformations can be carried out in the limit for do not depart from the scope of the present invention.
Therefore, the scope of the present invention, which should not be decided to be, is limited to illustrated embodiment, but should by claim with And the scope being equal with claim etc. is determined.
, it should be understood that being to illustrate and non-limiting, of the invention model in all fields for foregoing embodiment Enclose by claim rather than describe in detail is represented, the implication and scope of claim should be construed to or even from its equivalent concepts The mode of derived various changes or deformation is both contained in the scope of the present invention.
Industrial utilizability
Present invention can apply to the technical field related to pin type plugboard.

Claims (8)

1. a kind of pin type plugboard, for panel inspection, it is characterised in that including：
Base；
Substrate, it is incorporated into the bottom of above-mentioned base；And
Multiple probes, its one end is formed with for the protuberance with the conductive contact of above-mentioned panel, the other end and aforesaid substrate Bottom surface is directly engaged.
2. pin type plugboard according to claim 1, it is characterised in that
The other end of above-mentioned probe and the bottom surface solder joints of aforesaid substrate.
3. pin type plugboard according to claim 1, it is characterised in that
The incorporating section for storing the above-mentioned respective other end of probe is formed with the bottom surface of aforesaid substrate.
4. pin type plugboard according to claim 1, it is characterised in that
The other end of the above-mentioned probe engaged with the bottom surface of aforesaid substrate is formed as zigzag.
5. pin type plugboard according to claim 4, it is characterised in that
The incorporating section for storing the above-mentioned respective jagged part of probe is formed with the bottom surface of aforesaid substrate.
6. pin type plugboard according to claim 1, it is characterised in that
Above-mentioned probe is included in the position of the other end engaged when being arranged on the basis of above-mentioned protuberance with the bottom surface of aforesaid substrate The 1st mutually different class probe and the 2nd class probe,
Above-mentioned 1st class probe and above-mentioned 2nd class probe are alternately arranged.
7. pin type plugboard according to claim 6, it is characterised in that
The other end engaged with the bottom surface of aforesaid substrate of above-mentioned 1st class probe is located at than above-mentioned 2nd class probe and above-mentioned base The other end of the bottom surface engagement of plate is further from the position of above-mentioned protuberance.
8. pin type plugboard according to claim 6, it is characterised in that
The above-mentioned 1st class probe of storage is formed with the way of being alternately arranged in the bottom surface of aforesaid substrate and above-mentioned 2nd class probe is each From the other end incorporating section.
CN201710063683.9A 2016-02-03 2017-02-03 Pin type plugboard Pending CN107038983A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR1020160013668A KR101672826B1 (en) 2016-02-03 2016-02-03 Needle type pin board
KR10-2016-0013668 2016-02-03

Publications (1)

Publication Number Publication Date
CN107038983A true CN107038983A (en) 2017-08-11

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ID=57529792

Family Applications (1)

Application Number Title Priority Date Filing Date
CN201710063683.9A Pending CN107038983A (en) 2016-02-03 2017-02-03 Pin type plugboard

Country Status (2)

Country Link
KR (1) KR101672826B1 (en)
CN (1) CN107038983A (en)

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2020217804A1 (en) * 2019-04-25 2020-10-29 オムロン株式会社 Probe pin, inspection jig, and inspection unit
WO2020250637A1 (en) * 2019-06-11 2020-12-17 オムロン株式会社 Probe pin, testing jig, and testing unit
CN112955754A (en) * 2018-11-08 2021-06-11 欧姆龙株式会社 Probe and inspection tool

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101896873B1 (en) 2018-05-02 2018-09-10 주식회사 프로이천 Pin board
CN109301341A (en) * 2018-10-18 2019-02-01 天津中聚新能源科技有限公司 A kind of forming and capacity dividing pin type device of lithium-ion-power cell

Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100600700B1 (en) * 2005-07-29 2006-07-19 프롬써어티 주식회사 Probe unit for testing plat display panel
WO2008026875A1 (en) * 2006-09-01 2008-03-06 Nemsprobe Co., Ltd. Probe beam assembly
CN101424702A (en) * 2007-10-29 2009-05-06 京元电子股份有限公司 Probe, test socket and tester thereof
US20090160473A1 (en) * 2007-12-21 2009-06-25 Kabushiki Kaisha Nihon Micronics Contactor for electrical test, electrical connecting apparatus using the same, and method for manufacturing contactor
CN101738512A (en) * 2008-11-05 2010-06-16 稳银科技股份有限公司 Probe assembly arrangement
WO2010087668A2 (en) * 2009-02-02 2010-08-05 주식회사 미코티엔 Probe structure and a probe card having the same
CN102282662A (en) * 2008-12-29 2011-12-14 日本电子材料株式会社 Probe, probe card with probe mounted thereon, method for mounting probe on probe card and method for removing probe mounted on probe card
CN202133687U (en) * 2011-03-25 2012-02-01 金准科技股份有限公司 Test probe and probe mounting seat
CN102478594A (en) * 2010-11-22 2012-05-30 励威电子股份有限公司 High-frequency vertical spring probe card structure
JP5096825B2 (en) * 2007-07-26 2012-12-12 株式会社日本マイクロニクス Probe and electrical connection device
CN102879616A (en) * 2011-07-12 2013-01-16 南茂科技股份有限公司 Probe card
CN103257255A (en) * 2012-02-20 2013-08-21 木本军生 Probe assembling device
KR200471838Y1 (en) * 2013-10-28 2014-03-19 주식회사 프로이천 Needle Type Pin Board for Small Size Liquid Crystal Panel

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100586011B1 (en) * 2004-08-04 2006-06-08 주식회사 코디에스 Probe block for patern inspection of flat display panel
KR100884475B1 (en) * 2007-10-10 2009-02-20 유명자 A device for testing for display panel

Patent Citations (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100600700B1 (en) * 2005-07-29 2006-07-19 프롬써어티 주식회사 Probe unit for testing plat display panel
WO2008026875A1 (en) * 2006-09-01 2008-03-06 Nemsprobe Co., Ltd. Probe beam assembly
JP5096825B2 (en) * 2007-07-26 2012-12-12 株式会社日本マイクロニクス Probe and electrical connection device
CN101424702A (en) * 2007-10-29 2009-05-06 京元电子股份有限公司 Probe, test socket and tester thereof
US20090160473A1 (en) * 2007-12-21 2009-06-25 Kabushiki Kaisha Nihon Micronics Contactor for electrical test, electrical connecting apparatus using the same, and method for manufacturing contactor
CN101738512A (en) * 2008-11-05 2010-06-16 稳银科技股份有限公司 Probe assembly arrangement
CN102282662A (en) * 2008-12-29 2011-12-14 日本电子材料株式会社 Probe, probe card with probe mounted thereon, method for mounting probe on probe card and method for removing probe mounted on probe card
WO2010087668A2 (en) * 2009-02-02 2010-08-05 주식회사 미코티엔 Probe structure and a probe card having the same
CN102478594A (en) * 2010-11-22 2012-05-30 励威电子股份有限公司 High-frequency vertical spring probe card structure
CN202133687U (en) * 2011-03-25 2012-02-01 金准科技股份有限公司 Test probe and probe mounting seat
CN102879616A (en) * 2011-07-12 2013-01-16 南茂科技股份有限公司 Probe card
CN103257255A (en) * 2012-02-20 2013-08-21 木本军生 Probe assembling device
KR200471838Y1 (en) * 2013-10-28 2014-03-19 주식회사 프로이천 Needle Type Pin Board for Small Size Liquid Crystal Panel

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Application publication date: 20170811