KR102216326B1 - Probe unit for testing OLED array glass - Google Patents

Abstract

The present invention relates to a probe unit for testing OLED array glass, which contacts OLED array glass and applies a signal of a tester to the OLED array glass to test whether the OLED array glass normally operates by transmitting a signal to the OLED array glass. The probe unit for testing OLED array glass comprises: a plurality of connectors (10); a connector board (20); a probe frame (30); and probe blocks (40). The probe frame (30) has: a guide on which the probe blocks (40) are variable in the longitudinal direction of the probe frame (30); and fixing members for fixing the positions of the probe blocks (40) at the points where the probe blocks (40) are moved along the guide. The arrangement of probes (45) and the distance between the probes (45) can be adjusted to correspond to the arrangement of electrodes E that varies as the model of the OLED array glass is changed.

Description

Probe unit for testing OLED array glass {Probe unit for testing OLED array glass}

The present invention relates to a probe unit that applies a signal from the tester to the OLED ledger by contacting the OLED ledger to test whether the OLED ledger is operating normally by transmitting a signal to the OLED ledger.

The ledger is a large panel-shaped glass that is the basis for making OLED or LCD panels. In the case of a smartphone, one OLED ledger glass (P) consists of dozens of cells (C) as shown in FIG. 1A, so that individual cells (C) can be divided, and when divided into each cell (C) One cell (C) constitutes one liquid crystal of a smartphone.

The probe unit is a device that connects the OLED led glass P and a test device (not shown). When a test signal is applied from a test device (not shown), the probe unit transmits the test signal to the OLED ledger.

Therefore, when the model of the smartphone to be manufactured is changed, the OLED ledger glass P shows the number and arrangement of the signal electrode pads E, which are electrodes installed on the OLED ledger, and the distance between the signal electrode pads E as shown in FIG. 1A. Changes.

As shown in FIG. 1B, the conventional probe unit includes a ZIF connector board 2 on which a ZIF (Zero Insertion Force) connector 1 is mounted, a probe frame 3 on which the ZIF connector board 2 is mounted, and a probe. It consists of a plurality of probe blocks 4 installed on the frame 3, and each probe block 4 corresponds to each of a plurality of cells C constituting the OLED led glass P. That is, one probe block 4 is in contact with one cell C. Although not shown in FIG. 1B, probes in the form of pins or blades are densely arranged on the bottom of the tip of the probe block 4, and each probe is provided with one signal electrode pad E shown in FIG. 1A. It is contacted correspondingly.

Therefore, when the model of the smartphone is changed, the position and number of each electrode shown in FIG. 1A are different, so in the past, a new probe unit device is manufactured so that probes corresponding to the position and number of electrodes suitable for the changed smartphone model are arranged. .

However, since the probe unit device itself is a precision machine that requires considerable high cost to manufacture, if a new probe unit device that fits the product model needs to be manufactured every time the product model is changed, the inspection of the OLED ledger will inevitably cost enormous costs. none.

Registered Patent Publication No. 10-1452121 (Notification date: 2014. 10. 16)

Accordingly, the present invention intends to provide a probe unit for testing an OLED ledger in which the probe arrangement can be freely adjusted so that even if the model of the OLED ledger to be inspected is changed, the probe array can be freely adjusted to correspond to the model of the new OLED ledger with only simple adjustment.

The OLED ledger test probe unit according to the present invention for achieving this purpose includes a plurality of connectors 10 and a plurality of connectors 10 connected to a test apparatus for testing of an organic light emitting device (OLED) ledger. The connector board 20 to be mounted and the connector board 20 are mounted, and the probe frame 30 is made long to correspond to the long side of the OLED ledger, and a plurality of probe frames are installed along the length direction of the probe frame 30, respectively. As a block with the tip of the OLED facing the long side of the OLED ledger, a plurality of probes 45 installed at the tip of the OLED ledger in contact with each electrode (E), a block body supporting the probe 45, and a probe 45 It is composed of a probe block 40 comprising a manipulator 43 that protects the probe and a signal cable that conducts the probe 45 and the connector board 20. In the probe frame 30, the probe block 40 includes a probe frame ( 30) and a fixing member that fixes the position of the probe block 40 at the point where the probe block 40 is moved along the guide, so that the model of the OLED ledger is changed. Accordingly, the arrangement of the probes 45 and the distance between the probes 45 may be adjusted to correspond to the changed arrangement of the electrodes E.

Here, the guide is preferably a guide slot 31 formed in the probe frame 30 along the longitudinal direction of the probe 45, and preferably inserted into the probe block 40 inside the guide slot 31. A rolling member and a shaft connecting the rolling member and the probe block 40 are provided.

In this case, the fixing member is preferably a nut member that is coupled to the shaft and has an outer diameter larger than the width of the guide slot 31, and the nut member is preferably rotated outside the probe block 40 to rotate the nut member. The dial gauge 33 is installed to transmit a rotational motion to the nut member so that the position of the probe block 40 can be fixed by pressing the outer surface and the inner surface of the slot with the rolling member.

Alternatively, the guide is preferably a guide rail 32 manufactured to be elongated along the length direction of the probe frame 30 and installed on the probe frame 30, and the probe block 40 slides along the guide rail 32 A sliding jig 322 is installed, and a jig brake 323 is preferably installed on the side of the sliding jig 322 to fix or release the sliding jig 322, and to the outside of the probe block 40 A dial gauge 33 that controls the jig brake 323 is installed.

At this time, when the guide is a guide slot 31 or a guide rail 32, the body of the probe 45 is preferably divided into a first body 41 and a second body 42, and a plurality of the probes Among the 45, one probe 45 is installed on the first body 41, and the other probes 45, which are the remaining probes 45, are installed on the second body 42, and the manipulator Preferably, the auxiliary guide slot 31 is formed in 43, and the first body 41 and the second body 42 are independently variable in the transverse direction while being guided to the auxiliary guide slot 31, respectively.

In particular, the signal cable is preferably formed in a two-dimensional planar shape by combining cables of a plurality of strands corresponding to the number of probes 45 in parallel with each other on the side.

In addition, the first body 41 and the second body 42 preferably have alignment guide holes 48 having a predetermined diameter, respectively, and the upper or lower part of the first body 41 and the second body 42 A position detection sensor is installed to recognize the alignment guide hole 48 and calculate the positions of the first body 41 and the second body 42.

The probe unit according to the present invention is a new probe unit, which is an expensive device even if the OLED ledger model is changed because the probe arrangement can be freely adjusted so that even if the model of the OLED ledger to be inspected is changed, it is possible to freely adjust the probe arrangement to correspond to the model of the new OLED ledger by simple adjustment Since there is no need for cost and time to manufacture, there is an effect that significant cost reduction and process time can be reduced.

1A is a schematic plan view and a partially enlarged view of an OLED ledger,
1B is an exploded perspective view of a probe unit for OLED testing according to the prior art,
2A is a perspective view of a probe unit for OLED testing according to the present invention,
Figure 2b is a bottom perspective view of Figure 2a,
2C is a partially enlarged view of FIG. 2A;
3A is an enlarged perspective view of the probe block in FIG. 2A,
Figure 3b is a bottom perspective view of Figure 3a,
Figure 3c is a bottom view of Figure 3a,
4A and 4B are perspective views of a second embodiment of a probe block,

Specific structural or functional descriptions presented in the embodiments of the present invention are exemplified only for the purpose of describing the embodiments according to the concept of the present invention, and embodiments according to the concept of the present invention may be implemented in various forms. In addition, it should not be construed as being limited to the embodiments described in the present specification, and should be understood to include all modifications, equivalents, and substitutes included in the spirit and scope of the present invention.

Hereinafter, the present invention will be described in detail with reference to the accompanying drawings.

The OLED ledger test probe unit according to the present invention includes a plurality of connectors 10, a connector board 20, a probe frame 30, and a probe block 40 as shown in FIG. 2A.

The plurality of connectors 10 are connected to a test apparatus for testing the organic light emitting device (OLED) ledger glass P (hereinafter referred to as'OLED ledger') shown in FIG. 1A.

The test device (not shown) is a device that tests whether the OLED ledger is operating normally while exchanging signals with the OLED ledger.

At this time, the probe unit according to the present invention is installed between the test device and the OLED ledger to transmit a signal applied by the test device to the OLED ledger or to transmit an operation signal from the OLED ledger to the test device.

As shown in FIG. 1A, when the OLED ledger is a ledger for a small device, it is formed in the form of a panel in which cells C to be used for dozens of devices are two-dimensionally bonded to each other. Here, each cell (C) is divided and assembled into one smart device for each cell (C).

The signal electrode pads E formed on the OLED ledger (hereinafter referred to as'electrode E)') are densely arranged along any one or more sides of the OLED ledger as shown in the maximum enlarged view of FIG. 1A. At this time, the probe 45 in the form of a pin or blade, which will be described later, is in contact with the electrode E of the OLED ledger. Conversely, the member connected to the test apparatus side is the connector 10 shown in Fig. 1B or 2A. Although different reference numerals are assigned to the connector 10 of FIG. 1B and the connector 10 of FIG. 2A, the connector 10 is not different from the present invention and the prior art.

A plurality of connectors 10 are mounted on the connector board 20 as shown in FIG. 2A. The connector board 20 is a board on which the connector 10 is installed.

The connector board 20 is mounted on the probe frame 30 as shown in FIG. 2A. The probe frame 30 is formed to be elongated correspondingly along the longitudinal direction in which the electrodes E arranged on the OLED ledger shown in FIG. 1A are arranged.

A plurality of probe blocks 40 are installed parallel to each other in front of the probe frame 30. Here, each probe block 40 corresponds to one cell C of the OLED ledger of FIG. 1A. As described above, a probe 45 is installed at the tip of the probe block 40 so that one probe 45 is in contact with one electrode E of the OLED ledger.

More specifically, a plurality of probe blocks 40 are installed along the length direction of the probe frame 30 and each tip is a block facing the long side of the OLED ledger, and is installed at the tip to contact each electrode (E) of the OLED ledger. It consists of a plurality of probes 45, a block body supporting the probe 45, a manipulator 43 protecting the probe 45, and a signal cable for energizing the probe 45 and the connector board 20. .

In the conventional probe unit, all of the probe blocks 40 are fixedly installed at a predetermined position. Therefore, in the past, one probe unit could only be used to inspect the OLED ledger of a specific model, so if the model of the OLED ledger was changed, a new model had to be produced accordingly.

On the other hand, in the present invention, in the probe frame 30, the probe block 40 includes a guide that can be variable along the length direction of the probe frame 30, and the probe block 40 at the point where the probe block 40 is moved along the guide. A fixing member for fixing the position of 40) is provided.

Accordingly, the arrangement of the probes 45 and the distance between the probes 45 may be adjusted to correspond to the arrangement of the electrodes E that is changed as the model of the OLED ledger is changed.

That is, a guide may be formed in the probe frame 30 as shown in FIG. 2C, and a structure having a shape that can be changed in a sliding operation while being engaged with each other to correspond to the guide shape may be formed in the probe frame 30. At this time, since the probe block 40 slides along the guide and the position becomes variable, even if the model of the OLED ledger is changed, the probe block 40 is varied to correspond to the electrode (E) arrangement of the changed OLED ledger, thereby causing considerable cost. There is no need to build a new pro-boo unit that takes this.

There can be two more specific forms of the guide as follows.

The first embodiment of the guide is a case in which the guide is a guide slot 31 in the form of an elongated groove formed in the length direction of the probe frame 30 as shown in FIG. 2C.

At this time, the principle that the probe block 40 is fixed to the guide slot 31 is as shown in FIGS. 2D to 2F, a brake plate 324 is provided on the bottom of the guide slot 31, and the brake plate and the probe block ( When the brake bolt 325 that simultaneously tightens 40) is assembled to the brake plate 324, the brake plate 324 and the probe block 40 are in close contact with the guide slot 31 in a tightening structure, The probe block 40 moved along the guide slot 31 may be fixed at a desired position.

Alternatively, although not shown, a rolling member inserted into the guide slot 31 and a shaft connecting the rolling member and the probe block 40 may be installed in the probe block 40. In this case, the fixing member may be a nut member that is coupled to the shaft and has an outer diameter larger than the width of the guide slot 31. And the nut member is rotated outside of the probe block 40 so that the nut member and the rolling member press the outer and inner surfaces of the slot to each other, so that the position of the probe block 40 can be fixed. Dial gauge 33 may be installed. The shape of the dial gauge 33 is the same as the dial gauge 33 shown in FIG. 4A or 4B, and may be in the form of a conventional dial knob.

That is, in the first embodiment of the guide, the guide is formed in the shape of a guide slot 31, and the probe block 40 is connected to a wheel-shaped member that rolls along the inside of the guide by a rotating shaft, and the probe block 40 is fixed. To do this, the wheel and the second member are simultaneously compressed inside and outside the guide slot 31 so that the guide slot 31 can be fixed in a tight fit in the middle.

A second embodiment of the guide is in the form of a guide rail 32 as shown in Fig. 4A or 4B. At this time, as shown in FIG. 4A, a sliding jig 322 sliding along the guide rail 32 is installed on the probe block 40, and a jig brake 323 is installed on the side of the sliding jig 322. It may be configured to fix or release the sliding jig 322. And, as shown in FIGS. 4A and 4B, a dial gauge 33 for controlling the jig brake 323 may be installed outside the probe block 40.

At this time, the principle of operating the jig brake 323 with the dial gauge 33 or varying the sliding jig 322 may be installed in the form of a MEMS gearbox including a worm gear or bevel gear inside or on the rear surface of the probe block 40. In addition, any power transmission structure of a known gearbox type can be adopted as such a power transmission structure.

However, the problem that is not solved by the previous two embodiments of the guide is that in the case of any one probe block 40 responsible for any one cell (C), the OLED ledger is changed due to the model change of the smart device. When one cell (C) is changed in size, the entire left and right width of the electrode (E) formed in one cell (C) is changed, so the model is changed to the probe block 40 with a fixed width. There may be a case where it is not possible to perform the test corresponding to.

In order to solve this problem, the probe unit for OLED ledger test according to the present invention is divided into a first body 41 and a second body 42 as shown in FIGS. 3A and 3B, Among the plurality of probes 45 installed in one probe block 40, one probe 45 is installed on the first body 41, and the other probes 45, which are the remaining probes 45, are the second body. It is installed in 42, and an auxiliary guide slot 31 is formed in the manipulator 43, and the first body 41 and the second body 42 are guided to the auxiliary guide slot 31, respectively, and are independently in the transverse direction. It can be configured to be variable.

Because of the change in the model of the OLED ledger according to the model change of the smart device, among the electrodes (E) formed in any one cell (C), the electrode (E) that generates any one signal or light emission is the one cell (C). Positions of the probes 45 installed in the probe block 40 because the widths between the two electrodes E having opposite polarities for generating any one signal change together due to a model change because they are disposed on both sides of each other in the width direction. This is because it must be changed correspondingly.

Therefore, in the probe unit according to the present invention, a part of the probe block 40 itself is two parts so that the distance between one of the electrodes E installed in the probe block 40 and the opposite electrode E can be changed. It is divided into and configured to be variable independently of each other. Here, the two parts will be referred to as the first body 41 and the second body 42, respectively.

In this case, as shown in FIGS. 3A to 3C, the first body 41 and the second body 42 form one probe 45 and are connected with one cable, so as shown in FIGS. 3A to 3C. The first and second bodies 42 are connected to each other by a manipulator 43, but an auxiliary guide slot 31 (not shown) is formed in the manipulator 43, so that the first body 41 and the second body 42 Independent variability may be possible.

Alternatively, although not shown, the manipulator 43 may also be divided into two parts so as to be completely independent of each other as the first body 41 and the second body 42 (not shown). Even when changing or fixing the 41) and the second body 42, a dial gauge 33 similar to that shown in FIGS. 4A and 4B may be installed and performed.

However, in the case of a cable that electrically connects the probe 45 installed in the first body 41 and the second body 42 and the connector board 20 described above, conventionally, the flexible printing shown in FIG. 4A or 4B A circuit board cable 44b is used, and if the flexible printed circuit board is connected to the variable first body 41 and the second body 42 as in the present invention, the first body 41 or the second body ( As 42) is varied, the flexible printed circuit board cable 44b is buckling in the horizontal direction, and disconnection or damage defects may occur due to the bending of the printed circuit.

In order to prevent such a problem, the signal cable used in the present invention is a flat cable made of a flexible material formed in a two-dimensional plane shape by combining a plurality of strands of cables corresponding to the number of probes 45 in parallel with each other on the side. Phosphorus movable cable 44a is used.

That is, unlike the flexible printed circuit board cable 44b, the movable cable 44a is a cable formed of an inner core wire and an outer sheath, although it is a fine strand, so that the movable cable 44a is side-coupled to provide an overall two-dimensional shape with the flexible printed circuit board cable 44b. Although similar, there is no fear of disconnection even when buckling or bending occurs, and thus, the fear of signal disconnection is prevented despite the horizontal movement of the first body 41 and the second body 42.

On the other hand, the electrodes E installed on the OLED ledger or the probes 45 installed on the probe block 40 are formed to have a fine thickness of about several tens of micrometers, so the first body 41 and the second body 42 It may be difficult to accurately control the variable distance of the probe block 40 or the variable distance of the probe block 40 itself by determining with the naked eye of the operator.

In order to solve this problem, in the probe unit according to the present invention, as shown in FIG. 3C, alignment guide holes 48 of a predetermined diameter are formed in the first body 41 and the second body 42, respectively, and the first A position sensor is installed at the top or bottom of the body 41 and the second body 42 to recognize the alignment guide hole 48 and calculate the position of the first body 41 and the second body 42. When the first body 41 or the second body 42 is moved to the correct position, the position detection sensor generates a stop signal, so that the positions of all the probes 45 can be finally accurately arranged.

The present invention described above is not limited to the above-described embodiments and the accompanying drawings, and various substitutions, modifications and changes are possible within the scope of the technical spirit of the present invention. It will be obvious to those who have the knowledge of.

P: Ledger glass C: Cell
E: signal electrode pad 1, 10: connector
2,20: connector board 3,30: probe frame
31: guide slot 32: guide rail
33: dial gauge 4,40: probe block
41: first body 42: second body
43: manipulator 44a: movable cable
44b: flexible printed circuit board cable
45: probe 46: block connector
47: conversion board 48: alignment guide hole
49: block body 322: sliding jig
323: jig brake 324: brake plate
325: brake bolt

Claims (7)

A plurality of connectors 10 connected to a test apparatus for testing an organic light-emitting device (OLED) ledger;
A connector board 20 on which the plurality of connectors 10 are mounted on an upper surface;
A probe frame 30 on which the connector board 20 is mounted and is manufactured to correspond to the long side of the OLED ledger; And,
A plurality of probes 45 are installed along the length direction of the probe frame 30 and each end is a block facing the long side of the OLED ledger, and is installed at the tip to contact each electrode (E) of the OLED ledger. , A probe block 40 composed of a block body supporting the probe 45, a manipulator 43 protecting the probe 45, and a signal cable for energizing the probe 45 and the connector board 20; Do it,
The probe frame 30 includes a guide in which the probe block 40 is variable along the length direction of the probe frame 30, and the position of the probe block 40 at a point where the probe block 40 is moved along the guide. By providing a fixing member for fixing the,
An OLED ledger test probe unit, characterized in that the arrangement of the probes 45 and the distance between the probes 45 can be adjusted to correspond to the arrangement of the electrodes E that are changed as the model of the OLED ledger is changed. The method of claim 1,
The guide is a guide slot 31 formed in the probe frame 30 along the longitudinal direction of the probe 45,
An OLED ledger test probe unit, characterized in that the probe block 40 has a rolling member inserted into the guide slot 31 and a shaft connecting the rolling member and the probe block 40. The method of claim 2,
The fixing member is a nut member coupled to the shaft and having an outer diameter larger than the width of the guide slot 31,
On the outside of the probe block 40, the nut member is rotated so that the nut member and the rolling member press the outer surface and the inner surface of the slot to each other, so that the position of the probe block 40 can be fixed. An OLED ledger test probe unit, characterized in that a dial gauge (33) is installed. The method of claim 1,
The guide is a guide rail 32 manufactured to be elongated along the length direction of the probe frame 30 and installed on the probe frame 30,
A sliding jig 322 sliding along the guide rail 32 is installed in the probe block 40,
A jig brake 323 is installed on the side of the sliding jig 322 to fix or release the sliding jig 322,
An OLED ledger test probe unit, characterized in that a dial gauge (33) for controlling the jig break (323) is installed outside the probe block (40). The method according to any one of claims 3 and 4,
The body of the probe 45 is divided into a first body 41 and a second body 42,
One probe 45 of the plurality of probes 45 is installed on the first body 41, and the other probes 45, which are the remaining probes 45 among the probes 45, are attached to the second body 42. Installed,
An auxiliary guide slot 31 is formed in the manipulator 43, and the first body 41 and the second body 42 are each guided to the auxiliary guide slot 31 and are independently variable in the transverse direction. OLED ledger test probe unit. The method of claim 5,
The signal cable is an OLED ledger test probe, characterized in that it is a flexible material flat cable formed in a two-dimensional plane shape by combining cables of a plurality of strands corresponding to the number of probes 45 in parallel unit. The method of claim 6,
Alignment guide holes 48 having a constant diameter are formed in the first body 41 and the second body 42, respectively, and an alignment guide hole in the upper or lower portion of the first body 41 and the second body 42 A probe unit for testing an OLED ledger, characterized in that a position sensing sensor that recognizes 48 and calculates the positions of the first body 41 and the second body 42 is installed.

Images