CN102565470B - Probe assembly - Google Patents
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- CN102565470B CN102565470B CN201110400368.3A CN201110400368A CN102565470B CN 102565470 B CN102565470 B CN 102565470B CN 201110400368 A CN201110400368 A CN 201110400368A CN 102565470 B CN102565470 B CN 102565470B
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Abstract
The present invention provides a probe assembly which can configure a probe with a narrow gap without reducing the gap of a groove of a tape-shaped groove rod. The probe assembly comprises a supporting sheet; a plurality of probes, which comprise tape-shaped mounting areas, a front area extending forwards from the mounting area, and a front end needle tip protruding downwards form the front area, wherein the plurality of probes are in a vertical state in the width direction of the mounting area, so as to enable the mounting areas to be arranged in parallel in an opposite manner at the lower side of the supporting sheet; a tape-shaped groove rod, which is configured at the lower side of the front end portion of the supporting sheet, wherein the tape-shaped groove rod is provided with a gap separated along a left and right direction and a plurality of grooves open downwards, and at least one portion of the front areas of at least two probes adjacent along the left and right direction are contained in a common groove.
Description
Technical field
The present invention relates to a kind of contactor assembly using in the such tested electrical test of having a medical check-up of display panels.
Background technology
As a kind of the contactor assembly using, there is the contactor assembly described in patent documentation 1 in the tested electrical test of having a medical check-up of the such tabular of display panels.
Contactor assembly described in patent documentation 1 comprises: supporting slice; Multiple probes, it possesses respectively the front area and the Background Region that extend along the fore-and-aft direction of banded installation region (Y-direction), the plurality of probe becomes under the state of above-below direction at the Width (Z direction) of installation region, so that the mode that installation region is faced is mutually configured in the downside of supporting slice side by side; Elongated cramp bar, its thickness direction along the installation region of each above-mentioned probe (directions X) run through this each above-mentioned probe installation region extend, and supported by supporting slice at both ends; A pair of band channel bar, it is configured on supporting slice and extends along the orientation (directions X) of probe.
Respectively with channel bar have along length direction (directions X) with channel bar spaced apart extend and open multiple grooves downwards along fore-and-aft direction.The end of the length direction of cramp bar is accommodated in tabular side cover, and this side cover screw thread is fixed on the each end in the orientation of probe of supporting slice (chunk).Thus, probe utilizes cramp bar and side cover to be assembled on supporting slice.
Each probe has the dielectric film of a part that covers this face on a side face, in addition, the part of giving prominence to from the leading section of front area is made as to the front end needle point being pressed against on tested electrode of having a medical check-up downwards, the part of giving prominence to upward from the leading section of Background Region is made as to the rear end needle point in the wiring that is pressed against flaky connector tool.
In addition, a part for the front area of probe and a part for Background Region are accommodated in respectively a side and the opposing party's the groove with channel bar.Thus, can prevent that the needle region of each probe is along the length direction displacement with channel bar, thereby can prevent from electrically contacting along the adjacent probe of left and right directions.
But for the relation of physical strength, the degree of dwindling of the spacing of the groove with channel bar is limited.But, in above-mentioned contactor assembly in the past, owing to the front area of probe being accommodated in to the shared groove with channel bar, so must arrange on channel bar and the groove of probe equal number.Therefore, in above-mentioned contactor assembly in the past, cannot form the groove of narrow-pitch on channel bar, can not configure probe with narrow-pitch.
Patent documentation 1: No. 303969 communiques of TOHKEMY 2007 –
Summary of the invention
The object of the invention is to, provide a kind of spacing that need not dwindle the groove with channel bar just can configure with narrow-pitch the contactor assembly of probe.
Contactor assembly of the present invention comprises: supporting slice; Multiple probes, it comprises banded installation region, the front area that forwards extend this installation region certainly and the front end needle point that this front area is given prominence to certainly downwards, the plurality of probe becomes the state of above-below direction with the Width of above-mentioned installation region, so that the mode that above-mentioned installation region is faced is mutually configured in the downside of above-mentioned supporting slice side by side; Band channel bar, the leading section downside that it is configured in above-mentioned supporting slice, has multiple grooves spaced apart and that open along left and right directions downwards.At least a portion along the front area of at least 2 adjacent probes of left and right directions is accommodated in the 1st shared groove.
At least 1 front area that is accommodated in above-mentioned shared groove of probe also can be with respect to above-mentioned installation region along left and right directions and fore-and-aft direction distortion.
Each groove can angularly extend with left and right directions and fore-and-aft direction.
At least a portion of front area is accommodated in the front end needle point of at least 2 probes of above-mentioned shared groove can be along fore-and-aft direction configuration spaced apart, also can be along fore-and-aft direction and left and right directions configuration spaced apart.
At least a portion of the front area that is accommodated in above-mentioned shared above-mentioned groove of probe also can separate along the vertical direction and have interval.
Contactor assembly can also have the 2nd band channel bar, and the 2nd is configured in the rearward end downside of above-mentioned supporting slice with channel bar, and the 2nd has and downwards open multiple 2nd grooves spaced apart along left and right directions with channel bar.In this case, each probe can also comprise the Background Region rearward extending from above-mentioned installation region, certainly the rear end needle point that this Background Region is given prominence to upward, above-mentioned multiple probe can belong to any group in the 1st probe groups and the 2nd probe groups, at least a portion that the 1st probe groups has an above-mentioned Background Region is accommodated in multiple the 1st probes of above-mentioned the 2nd groove, and the 2nd probe groups has multiple the 2nd probes between above-mentioned 1st probe adjacent along left and right directions.Each the 1st probe can also have the teat of giving prominence to from above-mentioned Background Region downwards, and at least a portion of the above-mentioned Background Region of each the 1st probe can be accommodated in to above-mentioned the 2nd groove.The above-mentioned Background Region of each the 2nd probe can extend between the above-mentioned teat of the 1st probe on the left side at the 2nd probe and right side.
Each the 2nd groove also can extend along fore-and-aft direction, or angularly extends with left and right directions and fore-and-aft direction.Above-mentioned the 1st groove and the 2nd groove can also be distinguished side's side and the opposing party's side of direction forwards, backwards and open.
In addition, contactor assembly can comprise: bar member, and the position of its configuration spaced apart on the length direction of the installation region of above-mentioned the 1st probe and the 2nd probe, along the thickness direction of this position, runs through this position and extends; Side cover, it is tabular, receives each end of the length direction of this bar member, this side cover is assembled in the sidepiece of above-mentioned supporting slice removedly.
The above-mentioned front area of each probe also can be by elastic deformation and with respect to the distortion of above-mentioned installation region.Also in can above-mentioned front area, be at least accommodated in the part electrical isolation of groove.
In contactor assembly of the present invention, because at least a portion of the front area along at least 2 adjacent probes of left and right directions is accommodated in same groove, the groove below 1/2nd that therefore probe sum is set on channel bar, can reduce the quantity in the next door between groove.Thereby, the spacing that correspondingly can dwindle groove, result can be with the spacing configuration probe than in the past narrow.
When at least 1 front area that is accommodated in above-mentioned same groove of probe during along left and right directions and fore-and-aft direction distortion, can be pressed by the next door between groove the front area of this probe with respect to above-mentioned installation region.As a result, can maintain the front end (needle point) of the front area of this probe constant with respect to the position with channel bar.
In the time that each groove and left and right directions and fore-and-aft direction angularly extend, the front area of each probe also with the angle of the groove of left and right directions and fore-and-aft direction accordingly, bending and extend with respect to left and right directions and fore-and-aft direction with respect to installation region.Like this, when front area is with respect to installation region by elastic deformation and when bending, can press front area and be incorporated in by the next door between groove the front area of the probe of the side in the probe in same groove, be pressed on the opposing party's the front area of probe by the front area of this side's probe.As a result, even there is play between band channel bar and front area, the front end (needle point) that also can maintain each front area is constant with respect to the position with channel bar.
Brief description of the drawings
Fig. 1 is the figure that has represented to use an embodiment of the probe unit of the 1st embodiment of contactor assembly of the present invention.
Fig. 2 is the exploded perspective view of the contactor assembly shown in exploded representation Fig. 1.
Fig. 3 is the figure of the contactor assembly shown in the Fig. 1 looking from oblique front under the state that has unloaded side cover.
Fig. 4 is the figure of the contactor assembly shown in the Fig. 1 looking from oblique rear under the state that has unloaded side cover.
Fig. 5 be represent the 1st with channel bar and the 2nd figure of the position relationship with channel bar and two kinds of probes.
(A) of Fig. 6 is the 6A-6A sectional view of Fig. 5, is (B) the 6B-6B sectional view of Fig. 5.
Fig. 7 is the enlarged drawing of 7 parts in Fig. 3.
Fig. 8 is the enlarged drawing of 8 parts in Fig. 4.
Fig. 9 be represent the 1st with channel bar and the 2nd figure of the position relationship of the probe with channel bar and a side.
Figure 10 be represent the 1st with channel bar and the 2nd figure of the position relationship of the probe with channel bar and the opposing party.
(A) of Figure 11 is the figure that represents supporting slice and the 1st embodiment with channel bar with channel bar and the 2nd, is (B) the 1st upward view with channel bar, is (C) the 2nd upward view with channel bar.
Figure 12 is the figure that represents the position relationship of two kinds of probes.
(A) of Figure 13 is the vertical view of probe, is (B) figure that represents an embodiment of the 1st probe, is (C) figure that represents an embodiment of the 2nd probe.
Figure 14 is the figure that represents the position relationship of two probes in the 2nd embodiment of contactor assembly.
Figure 15 is the figure that is illustrated in an embodiment of the 3rd probe using in the 2nd embodiment.
Figure 16 is the enlarged drawing of 16 parts in Figure 14.
Figure 17 is the left view of Figure 14.
Figure 18 is the upward view of the 2nd embodiment.
Figure 19 is the figure that represents the position relationship of two probes in the 3rd embodiment of contactor assembly.
Figure 20 is the upward view of the 3rd embodiment.
Figure 21 is the figure that represents the position relationship of 3 probes of the 4th embodiment of contactor assembly.
Figure 22 is the upward view of the 4th embodiment.
Embodiment
about term
In the present invention, in Fig. 1, above-below direction is called to above-below direction or Z direction, left and right directions is called to fore-and-aft direction or the Y-direction taking the front area side of probe as front, the back side direction of paper is called to left and right directions or directions X.But above-mentioned direction is difference according to being bearing in tested posture of having a medical check-up in the such panel receiving portion of worktable.
Therefore, probe unit and contactor assembly above-below direction of the present invention (Z direction) actual for above-below direction, turn upside down, under the state of the either direction such as vergence direction, be arranged on test unit and use.
the embodiment of probe unit
With reference to Fig. 1, probe unit 10 is used in have a medical check-up 12 light in inspection of tested in Fig. 1 and Fig. 5 of Local Representation.Tested having a medical check-up 12 is to enclose to have the display panels of liquid crystal, is rectangular shape, and tested having a medical check-up 12 is formed with multiple electrodes 14 at least corresponding with rectangular 2 limits edge with prescribed distance.Each electrode 14 is formed as along the band shape of extending with the orthogonal directions X in the edge that disposes this electrode 14 or Y-direction.
Probe unit 10 comprises: tabular probe base 16, and it is arranged on the main body frame (not shown) of test unit; Supporting station 18, it is the leading section upside at probe base 16 with the state configuration along left and right directions extension; Multiple probe units 20 (representing 1 in Fig. 1), its along left and right directions spaced apart be positioned on supporting station 18; Tabular relaying pedestal 22, it is configured on probe base 16; Interposer 24, it is configured on relaying pedestal 22.
Supporting station 18 utilizes the tabular main part 18a extending along left and right directions, and a pair of shank 18b, the 18b that independently extend downwards the end of the left and right directions of body 18a, is formed as a shape.Thus, the space 26 (with reference to Fig. 1) that supporting station 18 has forwards, rear and below are open.Thereby utilize from below the position separating along left and right directions of penetration probe pedestal 16 and a pair of screw member (not shown) that shank 18b, 18b are threadedly engaged with upward, supporting station 18 is arranged on probe base 16.
In illustrated example, multiple probe units 20 share supporting station 18.Thereby probe unit 20 is arranged on main part 18a dividually along left and right directions.But, also can 1 supporting station 18 be set every 1 probe unit 20, every 2 probe units 20 arrange 1 supporting station 18, or every 3 probe units 20 arrange 1 supporting station 18.
Each probe unit 20 comprises: contactor assembly 30; Supporting chunk 32, it supports contactor assembly 30; Link chunk 34, it supports supporting chunk 32; In conjunction with chunk 36, it is bearing in the downside of supporting chunk 32, and contactor assembly 30 is assembled on supporting chunk 32; Connect chunk 38, its be configured in supporting chunk 32 with in conjunction with between chunk 36, and be arranged on and support the downside of chunk 32.
As shown in Figure 2 to 4, contactor assembly 30 will utilize conductive material to make tabular multiple the 1st probes 40 and multiple the 2nd probe 42, with state spaced apart along left and right directions and that extend along fore-and-aft direction, alternate configurations in the 1st band channel bar 46 and the 2nd band channel bar 48, the 1 with channel bar 46 and the 2nd with channel bar 48 along fore-and-aft direction spaced apart be assembled in the downside of block supporting slice 44.
The bar member 50,52 that at least outer peripheral face has an electrical insulating property runs through the 1st probe 40 and the 2nd probe 42 to run through state.The 1st probe 40 and the 2nd probe 42 utilize bar member 50,52, receive the tabular side cover 54 of each end of above-mentioned bar member 50,52, and are positioned at another tabular side cover 56 in the outside of side cover 54, are assembled on supporting slice 44.
Each the 1st probe 40, as shown in Figure 13 (B), comprising: tabular pin main part is installation region 40a, and it is formed as rectangle; Front area 40b, it is forwards semi-girder shape from installation region 40a and extends integratedly; Background Region 40c, it is rearward semi-girder shape from installation region 40a and extends integratedly; Front end needle point 40d, its front end from front area 40b extends downwards integratedly; Rear end needle point 40e, extend upward integratedly its rear end from Background Region 40c; Tongue-shaped teat 40f, it is given prominence to downwards and extends along fore-and-aft direction from Background Region 40c.
Each the 2nd probe 42, as shown in Figure 13 (C), is formed as comprising the blade type pin as lower member, that is, tabular pin main part is installation region 42a, and it is formed as rectangle; Front area 42b, it is forwards semi-girder shape from installation region 42a and extends integratedly; Background Region 42c, it is rearward semi-girder shape from installation region 42a and extends integratedly; Front end needle point 42d, its front end from front area 42b extends downwards integratedly; Rear end needle point 42e, extend upward integratedly its rear end from Background Region 42c.But each the 2nd probe 42 does not have the teat corresponding with the teat 40f of the 1st probe 40.
The 1st probe 40 has the circular through hole 40g running through for bar member 50 at the central portion of installation region 40a, and have in the front portion of installation region 40a for bar member 52 and run through and the circular through hole 40h less than through hole 40g, the 2nd probe 42 has the circular through hole 42g running through for bar member 50 at the central portion of installation region 42a, and has in the front portion of installation region 42a for bar member 52 and run through and the circular through hole 42h less than through hole 42g.
The 1st probe 40 and the 2nd probe 42 have identical gauge, and have electrical insulating film on each surface of left and right directions.At least front area 40b and Background Region 40c can be with respect to corresponding installation region 40a elastic deformations, and at least front area 42b and Background Region 42c can be with respect to corresponding installation region 42a elastic deformations.
As shown in Fig. 2～Fig. 4 and Fig. 9～Figure 11 etc., supporting slice 44 is made up of pottery and the synthetic resin etc. with electrical insulating property, and have downwards at rearward end downside, groove that left side and right side are open, i.e. recess 64 (with reference to Fig. 2).
The 1st is made up of pottery and the synthetic resin etc. with electrical insulating property with channel bar 48 with channel bar 46 and the 2nd.Be positioned at the 1st of front and utilize with channel bar 46 the leading section downside that screw thread is fixed, the suitable method such as bonding is arranged on supporting slice 44, be positioned at the 2nd of rear and utilize with channel bar 48 the rearward end downside that screw thread is fixed, the suitable method such as bonding is arranged on supporting slice 44.
The 1st has from leading section upper surface abutting part 66 (with reference to Fig. 2, Fig. 9 and Figure 10) outstanding and that extend along left and right directions upward with channel bar 46, makes the front surface bottom butt of abutting part 66 and supporting slice 44.Thus, determine the 1st position on fore-and-aft direction with channel bar 46 and supporting slice 44.
The 2nd has from leading section upper surface abutting part 68 (with reference to Fig. 2, Fig. 9 and Figure 10) outstanding and that extend along left and right directions upward with channel bar 48, abutting part 68 is inserted in the recess 64 of supporting slice 44, makes abutting part 68 and the face butt towards front that forms recess 64.Thus, determine the 2nd position on fore-and-aft direction with channel bar 48 and supporting slice 44.
As shown in Fig. 5～Figure 11 waits, the 1st band channel bar 46 has multiple the 1st grooves 60 (with reference to Figure 11 (B)), and the 1st groove 60 is spaced apart along left and right directions, angularly tilts to extend with fore-and-aft direction and left and right directions.The 2nd has multiple the 2nd grooves 62 (with reference to Figure 11 (C)) spaced apart along left and right directions and that extend along fore-and-aft direction with channel bar 48.The 1st groove 60 and the 2nd groove 62 are all formed as the open groove in direction both sides and below forwards, backwards.
Each the 1st groove 60 have with the gauge of the front area 40b of the 1st probe 40 and the front area 42b of the 2nd probe 42 roughly the same, along the width dimensions of left and right directions, thereby can make the front area 40b of the 1st probe 40 and the front area 42b of the 2nd probe 42 along the vertical direction displacement state under receive this front area 40b, 42b.
Each the 2nd groove 62 have with the right and left gauge of the Background Region 40c of the 1st probe 40 roughly the same, along the width dimensions of left and right directions, thereby can receive the Background Region 40c of the 1st probe 40.The 1st groove 60 and the 2nd groove 62 are formed at corresponding band channel bar 46 or band channel bar 48 with identical spacing.
The 1st probe 40 and the 2nd probe 42, taking the thickness direction of installation region 40a, 42a as left and right directions and along the state of left and right directions alternate configurations, are configured on the 1st band channel bar 46 and the 2nd band channel bar 48 side by side.
Each the 1st groove 60 as shown in Fig. 5, Fig. 6 (A) and Fig. 7, under the state that a part of front area 40b, 42b for the 1st probe 40 of 1 group and the 2nd probe 42 is separated along the vertical direction, a part of receiving this front area 40b, 42b.Each the 2nd groove 62 is received a part of the Background Region 40c of 1 the 1st probe 40.The Background Region 42c of each the 2nd probe 42 extends between the teat 40f of two adjacent the 1st probes 40.
The front area 40b of each the 1st probe 40 angularly extends with left and right directions and fore-and-aft direction in the 1st groove 60.The Background Region 40c of each the 1st probe 40 extends along fore-and-aft direction the 2nd groove 62 is interior.The front end needle point 40d of each the 1st probe 40 extends downwards in the anterior position of the 1st groove 60.The rear end needle point 40e of each the 1st probe 40 is rearward outstanding from the 2nd groove 62, and teat 40f is outstanding downwards from the 2nd groove 62.
The front area 42b of each the 2nd probe 42 is the outstanding state downwards midway from the fore-and-aft direction of the 1st groove 60 with front end needle point 42d, in the 1st groove 60, extends along fore-and-aft direction at the downside of the height and position of the front area 40b of the 1st probe 40.The Background Region 42c of each the 2nd probe 42, extends along fore-and-aft direction between the teat 40f of the 1st adjacent probe 40 from rearward mode outstanding and that extend upward of the 2nd groove 62 with rear end needle point 42e.
The position of the front end needle point 40d of the 1st probe 40 is positioned at the front of the front end needle point 42d of the 2nd probe 42, and the position of the rear end needle point 40e of the 1st probe 40 is positioned at the front of the rear end needle point 42e of the 2nd probe 42.Therefore, the front end needle point 42d of the front end needle point 40d of the 1st probe 40 and the 2nd probe 42 has interval in vain along fore-and-aft direction, the rear end needle point 40e of the 1st probe 40 and the rear end needle point 42e of the 2nd probe 42 have interval in vain along fore-and-aft direction, can make the length dimension of the fore-and-aft direction of the 1st probe 40 and the 2nd probe 42, particularly effectively electrical length is formed as identical size.
According to 1.: front end needle point 40d tilts to extend with respect to fore-and-aft direction with the angle identical with the angle θ (with reference to Figure 11 (B)) of the 1st groove 60 with respect to fore-and-aft direction; And 2.: front end needle point 40d is positioned at the structure in front end needle point 42d front to be learnt, the front end needle point 42d of the front end needle point 40d of the 1st probe 40 and the 2nd probe 42 also has interval in vain on left and right directions.
It is tabular that side cover 54,56 utilizes electrically insulating material or conductive material to be made into.As shown in Figure 2, the end that connects the bar member 50 in through hole 40g, the 42g of probe is accommodated in through hole 54a, the end that connects the bar member 52 in through hole 40h, the 42h of probe is accommodated in through hole 54b, thereby the each side cover 54 that is positioned at inner side is can make the mode of probe 40,42 displacements support probe 40,42.
Utilize the such pin-shaped multiple screw members 65 (seeing figures.1.and.2) of bolt side cover 54,56 to be arranged on removedly on the side of left and right directions of supporting slice 44, this screw member 65 runs through along the fore-and-aft direction position spaced apart of above-mentioned side cover 54,56 and is threadedly engaged with supporting slice 44.
In addition, utilize register pin 72 (with reference to Fig. 1) that side cover 54 is positioned with respect to supporting slice 44, this register pin 72 run through along fore-and-aft direction spaced apart be located at the multiple through holes 70 (with reference to Fig. 2) on side cover 54 and supporting slice 44, arrive along fore-and-aft direction spaced apart be located at other the multiple through holes 70 (with reference to Fig. 2) on the side cover 54 of the opposing party's side.
Like this, the 1st probe 40 and the 2nd probe 42 utilize bar member 50,52, side cover 54,56, screw member 65 and register pin 72 etc., can be assembled in discretely on supporting slice 44, and the 1st probe 40 and the 2nd left and right directions of probe 42 and the position of fore-and-aft direction are positioned.
By bar member 50,52 is assembled on side cover 54,56, the 1st band channel bar 46 and the 2nd band channel bar 48 are assembled on supporting slice 44, side cover 54,56 is assembled on supporting slice 44, each probe assembling can be held in to supporting slice 44.
In the accompanying drawings, represented that adjacent probe separates the configuration mode compared with large-spacing along left and right directions, but in fact the arrangement pitches of probe is very little.Quantity, disposition interval, the width dimensions of quantity, gauge, arrangement pitches and the groove with channel bar of probe, according to the difference of the disposition interval of the tested kind of having a medical check-up, particularly electrode and width dimensions and difference.
The 1st probe 40 and the 2nd probe 42 are arranged on band channel bar 46,48 with above-mentioned state, with the assembly forming thus side by side or in the front and back of this assembly, two band channel bars 46,48 are arranged on supporting slice 44 with above-mentioned state, then utilize screw member 65 that side cover 54,56 is arranged on supporting slice 44 with above-mentioned state, thereby can be combined to form contactor assembly 30.
Referring again to Fig. 1, utilize tabular 2 support 32a, 32b to be made into the cross sectional shape of L font supporting chunk 32.Link chunk 34 utilizes the main part 34a being arranged on supporting station 18, and the extension 34b that independently forwards extend on the top of body 34a, is formed as the shape of the font of falling L.
Be installed on the downside of the support 32b of supporting chunk 32 by suitable combination utensil 78 in conjunction with chunk 36, contactor assembly 30 utilizes the such suitable combination utensil (not shown) of screw member to be assembled in the downside in conjunction with chunk 36, and this screw member runs through downwards in conjunction with chunk 36 and is threadedly engaged with supporting slice 44 from top.
In illustrated example, be expressed as the member described in Japanese Patent Application 2009-174248 for example in conjunction with utensil 78, but can be also run through along the vertical direction support chunk 32 support 32b and with the screw member being threadedly engaged with in conjunction with chunk 36.
Utilize pair of guide rails 80 and guiding piece 82, supporting chunk 32 can be connected with the front surface of the main part 34a that links chunk 34 along the vertical direction movably, above-mentioned pair of guide rails 80 is spaced apart and extension along the vertical direction along left and right directions, guiding piece 82 extends along the vertical direction between two guide rails 80, and supporting chunk 32 utilize bolt 84 can adjust above-below direction position with link the extension 34b of chunk 34 and be connected.
Two guide rails 80 are linear guides, and guiding piece 82 is Linear guides.Two guide rails 80 are arranged on the rear end face of support 32a of supporting chunk 32.On the other hand, the mode of guiding piece 82 can make two guide rails 80 move along the vertical direction with respect to guiding piece 82, is configured between two guide rails 80 of left and right directions, and guiding piece 82 is arranged on the front end face of the main part 34a that links chunk 34.
Each compression helical spring 88 is configured between tabular leaf spring 92 and the support 32a of supporting chunk 32, and this leaf spring 92 utilizes multiple screw members 90 (representing one of them in Fig. 1) to be arranged on the extension 34b that links chunk 34.Thus, by adjusting the screw-in amount of bolt 84 to the extension 34b of link chunk 34, not only can adjust the height and position of supporting chunk 32, can also adjust the height and position of contactor assembly 30.
The state of relaying pedestal 22 taking thickness direction as above-below direction, utilizes not shown multiple screw members to be configured on probe base 16.Interposer 24 is the circuit boards with corresponding with the probe of probe unit 20 respectively many wirings (not shown).The wiring of interposer 24 utilizes the electrical connection utensil 100 of the sheet that each probe unit 20 has and corresponding probe electrical connection.
The 1st wiring region 102 is compound circuit sheets that flexible print wiring circuit (FPC), corbel back slab (TAB) or flexible print wiring circuit and corbel back slab combine.The 2nd wiring region is flexible print wiring circuit (FPC).The 1st wiring region 102 is positioned at the downside in conjunction with chunk 36, and the 1st wiring region 102 will drive tested 12 the integrated circuit (not shown) of having a medical check-up to be configured in zone line, is rearward extending in conjunction with the downside of chunk 36 in the 1st wiring region 102 in addition.
As shown in Figure 1, the state that the leading section in the 1st wiring region 102 is exposed to below with the leading section of the 1st wiring maintains on the lower surface in conjunction with chunk 36.Thus, be combined under the state of probe unit 20, the rear end needle point e of each probe is pressed by the leading section of the 1st wiring and is electrically connected (with reference to Fig. 5) with the 1st wiring.
As shown in Figure 1, by by the 1st wiring region 102 the rearward end in conjunction with chunk 36 upward and front turn back into U font sidewards, thereby the state that is exposed to top with the 1st rearward end connecting up in the 1st wiring region 102, maintains the rearward end in the 1st wiring region 102 on the upper surface in conjunction with chunk 36.
As shown in Figure 1, the 2nd wiring region 104 leading section be positioned at the 1st wiring region 102 return portion above state under, and the leading section of the 2nd wiring in the 2nd wiring region 104 be positioned at connect chunk 38 below state under, the leading section in the 2nd wiring region 104 is maintained and is connected on the lower surface of chunk 38.Thus, be combined under the state of probe unit 20, the leading section of the 2nd wiring in the rearward end of the 1st wiring in the 1st wiring region 102 and the 2nd wiring region 104 is pressed each other and is electrically connected.
The 2nd wiring region 104 is from connecting the upside that is guided to probe base 16 between the rear end of chunk 38 and the front end of probe base 16, and the further rearward extension on probe base 16 by the space 26 of supporting station 18.
The 2nd wiring region 104 utilizes the connector (not shown) and interposer 24 combinations of the rear end that is located at the 2nd wiring region 104.This connector has the multiple terminals that are connected with the probe of corresponding probe unit 20 by the wiring of electrical connection utensil 100.These terminals are connected with the above-mentioned wiring of interposer 24.
The wiring of interposer 24 is connected with the circuit (not shown) that produces test signal.Test signal via electrical connection utensil 100 and be supplied to probe, drives that (lighting) is tested haves a medical check-up 12 from foregoing circuit.
In contactor assembly 30, due to by the front area 40b along adjacent 2 probes 40,42 of left and right directions, at least a portion of 42b, state with front end needle point 40d, 42d along fore-and-aft direction configuration spaced apart, be accommodated in the 1st groove 60 that tilts to extend with respect to left and right directions and fore-and-aft direction, so the 1st groove 60 below 1/2nd of probe sum is set on channel bar 46 the 1st.Therefore, can reduce the quantity in the next door of 60 of the 1st grooves, thereby the spacing that correspondingly can dwindle the 1st groove 60.
Equally, owing to making the Background Region 42c of each the 2nd probe 42 between the teat 40f of 2 adjacent probes 40, so the 2nd groove 62 below 1/2nd of probe sum is set on channel bar 48 the 2nd.Therefore, can reduce the quantity in the next door of 62 of the 2nd grooves, the spacing that therefore correspondingly can dwindle the 2nd groove 62.
Like this, adopt contactor assembly 30, compared with contactor assembly in the past, the spacing that need not dwindle groove just can configure probe 40,42 with narrow-pitch.
In addition, in contactor assembly 30, because each the 1st groove 60 and left and right directions and fore-and-aft direction angularly extend, so front area 40b, the 42b of probe 40,42 are also with respect to installation region 40a, 42a, with respect to left and right directions and fore-and-aft direction elastic deformation and bending extension.Therefore, at least a portion of front area 40b, 42b is incorporated in front end needle point 40d, the 42d of the probe 40,42 in same the 1st groove 60, combines, and separate along left and right directions with above-mentioned front end needle point 40d, 42d along fore-and-aft direction structure spaced apart.
In the time that thereby front area 40b, 42b are bending with respect to installation region 40a, 42a elastic deformation, the front area that front area is incorporated in to the probe of the side in the probe 40,42 in same the 1st groove 60 is pressed by the next door of 60 of the 1st grooves, and the front area of the opposing party's probe is pressed by the front area of the probe of one side.As a result, even there is play between the 1st band channel bar 46 and front area, the front end (needle point) that also can maintain each front area is constant with the position of channel bar 46 with respect to the 1st.
In the time that the angle θ with respect to fore-and-aft direction of the 1st groove 60 (with reference to Figure 11) is too small, front area reduces with respect to the elastic deformation amount of installation region, the pressing force that the front area of one side's probe is pressed to the next door of 60 of the 1st grooves, and the pressing force that the front area of the opposing party's probe is pressed to the front area of this side's probe becomes too small.As a result, each front end needle point becomes unstable with respect to the 1st with the position of channel bar 46.On the contrary, in the time that angle θ is excessive, front area becomes excessive with respect to the deflection of installation region, and front area may be lost.
As a result, the 1st groove 60 can be made as to 3 degree～60 degree with respect to the angle θ of fore-and-aft direction, be preferably 5 degree～30 degree.But angle θ not only determines according to front end needle point 40d, the target location of 42d in all directions of left and right directions and fore-and-aft direction, also according to tested electrode of having a medical check-up, determine the position in all directions of left and right directions and fore-and-aft direction.
In contactor assembly 30, by making each probe there is electrical insulating film, maintain the electrical insulating property of the probe adjacent along left and right directions.But, also can replace the Shangdi, two sides that dielectric film is located to the thickness direction of each probe, electrical insulation sheet is configured between adjacent probe, also electrical insulating film only can be located in the scope that adjacent probe contacts to for example front area, Background Region and teat.
In the above-described embodiments, front area 40b, the 42b of 2 probes 40,42 are configured in each the 1st groove 60, but also the front area of 1 probe can be configured in 1 the 1st groove, also can, with the arrangement mode of the arrangement mode of the 1st probe, the 2nd probe, the 1st probe, the 1st probe, the 2nd probe, the 1st probe, the 2nd probe, the front area of 3 above probes be configured in each the 1st groove.
Also can replace the Background Region 42c that makes each the 2nd probe 42 by between teat 40f, make a part of the Background Region 42c of each the 2nd probe 42 be arranged in the 2nd corresponding groove 62.The 2nd groove 62 is also same with the 1st groove 60, also can angularly extend with respect to left and right directions and fore-and-aft direction.
With reference to Figure 14～Figure 18, contactor assembly 110 uses the 2nd probe 42 shown in (C) of multiple Figure 13 and the 3rd probe 112 shown in multiple Figure 15.Each the 3rd probe 112 is except being provided with at front area 112b the structure of bend 112i of reverse U shape, and the 1st probe 40 shown in other structures and Figure 13 (B) similarly forms.
Therefore, each the 3rd probe 112 comprises: tabular pin main part is installation region 112a, and it is formed as rectangle; Front area 112b, it is forwards semi-girder shape from installation region 112a and extends integratedly; Background Region 112c, it is rearward semi-girder shape from installation region 112a and extends integratedly; Front end needle point 112d, its front end from front area 112b extends downwards integratedly; Rear end needle point 112e, extend upward integratedly its rear end from Background Region 112c; Tongue-shaped teat 112f, it is outstanding downwards from Background Region 112c, and extends along fore-and-aft direction; Through hole 112g, 112h; Electrical insulating film (not shown).
The position of front end needle point 112d is positioned at the front of front end needle point 42d, and the position of rear end needle point 112e is positioned at the front of rear end needle point 42e.Therefore, front end needle point 112d and front end needle point 42d have interval in vain along fore-and-aft direction, and rear end needle point 112e and rear end needle point 42e have interval in vain along fore-and-aft direction.
Adopt contactor assembly 110, identical with contactor assembly 30, compared with the past, also the spacing that need not dwindle groove just can configure probe 40,42 with narrow-pitch, and the length dimension of the fore-and-aft direction of the 2nd probe 42 and the 3rd probe 112, particularly effective electrical length can be formed as to same size.
Above-described embodiment all makes the 1st groove 60 form angle with respect to left and right directions and fore-and-aft direction, but also can the contactor assembly 120 shown in Figure 19 and Figure 20, only the 1st groove 60 be formed as to the structure extending along fore-and-aft direction.In contactor assembly 120, make the front area 40b of the 1st probe 40 with respect to installation region 40a elastic deformation, be configured in same the 1st groove 60 with together with the front area 42b of the 2nd probe 42 on side.
In addition, above-described embodiment is all by front area 40b, the 42b of 2 probes 40,42, or front area 42b, the 112b of 2 probes 42,112 are configured in same the 1st groove 60, but also can the contactor assembly 130 shown in Figure 21 and Figure 22, front area 132b, 134b, the 136b of 3 above probes 132,134,136 be configured in same the 1st groove 60.
In the contactor assembly 130 shown in Figure 21 and Figure 22, probe 132,134,136 is with following state configuration,, be out of shape and front area 132b, 134b, 136b be accommodated in same the 1st groove 60, and Background Region 132c, 134c, 136c are accommodated in to the state in same the 2nd groove at front area 132b, 134b and Background Region 132c, 134c Elastic.
Adopt contactor assembly 120,130, same with contactor assembly 30,110, compared with the past, also the spacing that need not dwindle groove just can configure probe 40,42 with narrow-pitch, and the length dimension of the fore-and-aft direction of the 2nd probe 42 and the 3rd probe 112, particularly effective electrical length can be formed as to same size.
utilizability in industry
The present invention not only can be applied in to enclose to be had in the electrical test of display panels of liquid crystal contactor assembly used, can also be applied in the tested electrical test of having a medical check-up of other such tabulars of display panels glass substrate contactor assembly used.
The present invention is not limited to above-described embodiment, only otherwise depart from the purport described in claim, can carry out various changes.
description of reference numerals
10, probe unit; 12, tested having a medical check-up; 14, tested electrode of having a medical check-up; 16, probe base; 18, supporting station; 20, probe unit; 30, contactor assembly; 40, the 42, the 1st probe and the 2nd probe; 40a, 42a, installation region; 40b, 42b, front area; 40c, 42c, Background Region; 40d, 42d, front end needle point; 40e, 42e, rear end needle point; 40f, teat; 40g, 42g, through hole; 44, supporting slice; 46, the 48, the 1st band channel bar and the 2nd band channel bar; 50,52, bar member; 54,56, side cover; 60, the 62, the 1st groove and the 2nd groove; 110,120,130, contactor assembly; 112,132,134,130, probe; 112a, 132a, 134a, 136a, installation region; 112b, 132b, 134b, 136b, front area; 112c, 132c, 134c, 136c, Background Region; 112d, 132d, 134d, 136d, front end needle point; 112e, 132e, 134e, 136e, rear end needle point.
Claims (13)
1. a contactor assembly, it comprises:
Supporting slice;
Multiple probes, it comprises banded installation region, the front area that forwards extend this installation region certainly and the front end needle point that this front area is given prominence to certainly downwards, the plurality of probe becomes the state of above-below direction with the Width of above-mentioned installation region, so that the mode that above-mentioned installation region is faced is mutually configured in the downside of above-mentioned supporting slice side by side;
The 1st band channel bar, the leading section downside that it is configured in above-mentioned supporting slice, has multiple the 1st grooves spaced apart and that open along left and right directions downwards,
At least a portion along the front area of at least 2 adjacent probes of left and right directions is accommodated in the 1st shared groove.
2. contactor assembly according to claim 1, wherein,
At least 1 front area that is accommodated in above-mentioned the 1st shared groove of probe is out of shape along left and right directions and fore-and-aft direction with respect to above-mentioned installation region.
3. contactor assembly according to claim 1, wherein,
Each the 1st groove and left and right directions and fore-and-aft direction angularly extend.
4. contactor assembly according to claim 1, wherein,
Each the 1st groove extends along fore-and-aft direction.
5. contactor assembly according to claim 1, wherein,
At least a portion of front area is accommodated in the front end needle point of at least 2 probes of above-mentioned the 1st shared groove along fore-and-aft direction configuration spaced apart.
6. contactor assembly according to claim 1, wherein,
At least a portion of front area is accommodated in the front end needle point of at least 2 probes of above-mentioned the 1st shared groove along fore-and-aft direction and left and right directions configuration spaced apart.
7. contactor assembly according to claim 1, wherein,
At least a portion of the front area that is accommodated in above-mentioned shared above-mentioned the 1st groove of probe separates along the vertical direction interval.
8. contactor assembly according to claim 1, wherein,
This contactor assembly also has the 2nd band channel bar, and the 2nd is configured in the rearward end downside of above-mentioned supporting slice with channel bar, and the 2nd has and downwards open multiple 2nd grooves spaced apart along left and right directions with channel bar;
Each probe also comprises the Background Region rearward extending from above-mentioned installation region, and the rear end needle point that this Background Region is given prominence to upward certainly;
Above-mentioned multiple probe can belong to any group in the 1st probe groups and the 2nd probe groups, at least a portion that the 1st probe groups has an above-mentioned Background Region is accommodated in multiple the 1st probes of above-mentioned the 2nd groove, and the 2nd probe groups has multiple the 2nd probes between above-mentioned 1st probe adjacent along left and right directions;
Each the 1st probe also has the teat of giving prominence to from above-mentioned Background Region downwards, and at least a portion of the above-mentioned Background Region of each the 1st probe is accommodated in above-mentioned the 2nd groove;
The above-mentioned Background Region of each the 2nd probe extends between the above-mentioned teat of the 1st probe on the left side at the 2nd probe and right side.
9. contactor assembly according to claim 8, wherein,
Each the 2nd groove extends along fore-and-aft direction, or angularly extends with left and right directions and fore-and-aft direction.
10. contactor assembly according to claim 8, wherein,
Also side's side of direction and the opposing party's side are open forwards, backwards respectively for above-mentioned the 1st groove and the 2nd groove.
11. contactor assemblies according to claim 9, wherein,
This contactor assembly also comprises:
Bar member, the position of its configuration spaced apart on the length direction of the installation region of above-mentioned the 1st probe and the 2nd probe, along the thickness direction of this position, runs through this position and extends;
Side cover, it is tabular, receives each end of the length direction of this bar member, this side cover is assembled in the sidepiece of above-mentioned supporting slice removedly.
12. contactor assemblies according to claim 1, wherein,
The above-mentioned front area of each probe is by elastic deformation and with respect to the distortion of above-mentioned installation region.
13. contactor assemblies according to claim 1, wherein,
The part that is at least accommodated in the 1st groove in above-mentioned front area is electrical isolation.
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2010-269917 | 2010-12-03 | ||
| JP2010269917 | 2010-12-03 | ||
| JP2011-034665 | 2011-02-21 | ||
| JP2011034665A JP5588892B2 (en) | 2010-12-03 | 2011-02-21 | Probe assembly |
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| Publication Number | Publication Date |
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| CN102565470A CN102565470A (en) | 2012-07-11 |
| CN102565470B true CN102565470B (en) | 2014-06-04 |
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| Application Number | Title | Priority Date | Filing Date |
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| CN201110400368.3A Expired - Fee Related CN102565470B (en) | 2010-12-03 | 2011-12-05 | Probe assembly |
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| KR101558256B1 (en) * | 2015-05-18 | 2015-10-12 | 주식회사 기가레인 | A probe pin and assembly for fixing the probe pin |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2914098Y (en) * | 2006-05-12 | 2007-06-20 | 海鸿科技股份有限公司 | Probe equipment |
| CN101430344A (en) * | 2007-11-06 | 2009-05-13 | 日本麦可罗尼克斯股份有限公司 | Probe combination and inspection device |
| CN101776700A (en) * | 2009-01-12 | 2010-07-14 | De&T株式会社 | Probe unit for inspecting display panel |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| JP5337341B2 (en) * | 2006-11-30 | 2013-11-06 | 株式会社日本マイクロニクス | Electrical connection device and method of assembling the same |
| JP5459646B2 (en) * | 2007-05-08 | 2014-04-02 | 株式会社日本マイクロニクス | Probe unit and inspection device |
| JP5396104B2 (en) * | 2009-03-05 | 2014-01-22 | 株式会社日本マイクロニクス | Probe assembly |
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Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN2914098Y (en) * | 2006-05-12 | 2007-06-20 | 海鸿科技股份有限公司 | Probe equipment |
| CN101430344A (en) * | 2007-11-06 | 2009-05-13 | 日本麦可罗尼克斯股份有限公司 | Probe combination and inspection device |
| CN101776700A (en) * | 2009-01-12 | 2010-07-14 | De&T株式会社 | Probe unit for inspecting display panel |
Non-Patent Citations (2)
| Title |
|---|
| JP特开2008-139034A 2008.06.19 |
| JP特开2008-281360A 2008.11.20 |
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