TW201209203A - Indium target and preparation method thereof - Google Patents

Indium target and preparation method thereof Download PDF

Info

Publication number
TW201209203A
TW201209203A TW100116983A TW100116983A TW201209203A TW 201209203 A TW201209203 A TW 201209203A TW 100116983 A TW100116983 A TW 100116983A TW 100116983 A TW100116983 A TW 100116983A TW 201209203 A TW201209203 A TW 201209203A
Authority
TW
Taiwan
Prior art keywords
indium
target
less
average roughness
arithmetic mean
Prior art date
Application number
TW100116983A
Other languages
English (en)
Other versions
TWI372186B (zh
Inventor
Takamasa Maekawa
Yousuke Endo
Original Assignee
Jx Nippon Mining & Amp Metals
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jx Nippon Mining & Amp Metals filed Critical Jx Nippon Mining & Amp Metals
Publication of TW201209203A publication Critical patent/TW201209203A/zh
Application granted granted Critical
Publication of TWI372186B publication Critical patent/TWI372186B/zh

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B22CASTING; POWDER METALLURGY
    • B22DCASTING OF METALS; CASTING OF OTHER SUBSTANCES BY THE SAME PROCESSES OR DEVICES
    • B22D7/00Casting ingots, e.g. from ferrous metals
    • B22D7/005Casting ingots, e.g. from ferrous metals from non-ferrous metals
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/18Processes or apparatus specially adapted for the manufacture or treatment of these devices or of parts thereof
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/06Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the coating material
    • C23C14/14Metallic material, boron or silicon
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B22CASTING; POWDER METALLURGY
    • B22DCASTING OF METALS; CASTING OF OTHER SUBSTANCES BY THE SAME PROCESSES OR DEVICES
    • B22D21/00Casting non-ferrous metals or metallic compounds so far as their metallurgical properties are of importance for the casting procedure; Selection of compositions therefor
    • B22D21/02Casting exceedingly oxidisable non-ferrous metals, e.g. in inert atmosphere
    • B22D21/027Casting heavy metals with low melting point, i.e. less than 1000 degrees C, e.g. Zn 419 degrees C, Pb 327 degrees C, Sn 232 degrees C
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B22CASTING; POWDER METALLURGY
    • B22DCASTING OF METALS; CASTING OF OTHER SUBSTANCES BY THE SAME PROCESSES OR DEVICES
    • B22D23/00Casting processes not provided for in groups B22D1/00 - B22D21/00
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/3407Cathode assembly for sputtering apparatus, e.g. Target
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C14/00Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
    • C23C14/22Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
    • C23C14/34Sputtering
    • C23C14/3407Cathode assembly for sputtering apparatus, e.g. Target
    • C23C14/3414Metallurgical or chemical aspects of target preparation, e.g. casting, powder metallurgy
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L31/00Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L31/04Semiconductor devices sensitive to infrared radiation, light, electromagnetic radiation of shorter wavelength or corpuscular radiation and specially adapted either for the conversion of the energy of such radiation into electrical energy or for the control of electrical energy by such radiation; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof adapted as photovoltaic [PV] conversion devices
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02EREDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E10/00Energy generation through renewable energy sources
    • Y02E10/50Photovoltaic [PV] energy

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Materials Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Electromagnetism (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Physical Vapour Deposition (AREA)

Description

201209203 六、發明說明: 【發明所屬之技術領域】 本發明係關於一種濺鍍靶及其製造方法,更詳細而言 係關於一種銦乾及其製造方法。 【先前技術】 銦係用作為Cu— In— Ga— Se系(CIGS系)薄膜太陽 電池之光吸收層形成用之濺鍍靶。 先前,銦靶可如專利文獻〖所揭示,藉由使銦合金等 附著於支持板上之後,將銦澆注至金屬模具進行鑄造而製 作。 專利文獻1 :日本特公昭63 — 44820號公報 【發明内容】 然而,於以此種熔鑄法製造銦靶之情形下,就藉由將 銦邊鑄於金屬模具所得之銦鍵而t,若不實施表面加工則 會於其表面形成氧化膜。若為了除去該氧化膜而研磨鍵表 面,則因銦為非常柔軟之金屬,故反而使得表面變粗縫。 此種銦靶之表面的粗糙化成為濺鍍時之異常放電產生的原 u此,本發明之課題為 電之產生的銦靶及其製造方法 *本發明人為了解決上述課題而潛心研究,結果發現: =由對以熔鑄法而製作之銦把之表面進行切削加工,使乾 面之算術平均粗链度(Ra) 4 以下,較佳 使把表面之十點平均粗糙度( ''' ”且槌度CRZ)為l5"m以下,藉此可 201209203 良好地抑制異常放電之產生。 以上述之見解為基礎而完成之本發明之·一態樣係|巴表 面之算術平均粗糙度(Ra)為1.6#m以下之銦乾。 本發明之銦靶之一實施形態中,算術平均粗糙度(Ra ) 為1 · 2 μ m以下。 本發明之銦靶之另一實施形態中,靶表面之十點平均 粗縫度(Rz)為15ym以下。 本發明之銦靶之又一實施形態中,十點平均粗糙度 (Rz)為i〇em以下。 本發明另一態樣係,藉由將銦原料熔鑄後,進行利用 刮刀之切削加工而製作本發明之銦靶的銦靶製造方法。 根據本發明,可提供一種能良好地抑制異常放電之產 生的銦靶及其製造方法。 【實施方式】 本發月之銦乾具有乾表面之算術平均粗縫度(Ra)為 1.6// m以下之特徵。若靶表面之算術平均粗糙度(尺。超 過1 ·6 β m ’則當對㉚進行濺鍍時有可能產生異常放電。乾 表面之算術平均㈣度(Ra)較佳為12_以下更佳為 ’ T本發明中’「算術平均粗链度(Ra )」係依循 JIS B0601— 1994 之定義 本發明之銦絶且古± _ 具有靶表面之十點平均粗糙度(Rz)為 15一下之特徵。若乾表面之十點平均粗縫度(RZ)為 =以二則可更良好地抑制對乾進行 的產生。乾表面之十點平均粗糖度( 201209203 下,更佳為以m以下。本發明中,「十點 係依循JIS B0601 — 1994之定義。 又、Kz)」 戈明其Ϊ先對广發明之銦靶製造方法的較佳之例依序進行 〇 作為原料之銦熔解,繞注至鑄模。若所使 用之原料銦含有雜質,則剎m κ 所便 …… 亥原料製作而成之太陽電池 之轉換效率會降低,因此理 ^ 7疋再具有问純度,例如可 使用純度99_99質量%以上姻。 <畑其後,將其冷卻至室溫, 形成銦錠。冷卻速度可為 厌J马利用空氣之自然放置冷卻。 、:而’若需要則可將所得之銦鍵冷乳至所需之厚度, 進而若有需要則可對1谁耔* ’、 -义洗或脫脂。其次,例如使用 乃見5〜1 〇〇mrn之刮刀推#主 進仃表面之切削加工,藉此,製作銦 乾。到刀若為具有可板yj + 面之切削之硬度、耐磨耗
f生優異者’則並無4± 5,1 UP .、、 疋如可使用不鏽鋼、高鉻鋼 , 刀,或者,若可能則亦可使用陶瓷製到刀。藉 由利用此種到刀研磨知矣 9 表面,而將靶表面之算術平均粗糙 f(Ra)加工成U心以下,較佳為12_以下,更佳 = ι·〇ρ以下。又,對於乾表面之十點平均㈣度(Rz), 成15…下,較佳為10…下,更佳為8/zm 以下。 θ ^方式所知之銦靶可較佳地用作為cigs系薄膜太 陽電池用光吸收層之濺鍍靶。 [實施例] 〆以下’同時揭示本發明之實施例與比較例該等實施 m系為了更好地理解本發明及其優點而提供,並無限定發 5 201209203 明之意圖。 (實施例1 ) 以直徑205mm '高度7mm之圓柱狀鑄模包圍直句 250mm、厚度5mm之銅製支持板上之·,於其 k 以160 C炫解之銦原料(純度5 N )之後,冷卻至室溫" 而形成圓盤狀銦錠(直徑綱mmx厚度6mm)。繼而,利^ 刃寬20mm之不鏽鋼製刮刀對該銦錠之表面進行切 工,從而獲得銦靶。 加 (實施例2) 除將不鏽鋼製刮刀之刀寬設為40mm以外,以與實施 1相同之條件製作銦乾。 、 列 (實施例3) 除將不鏽鋼製刮刀之刃寬設為l〇mm以外,以與實施 1相同之條件製作銦乾。 、 ^ (實施例4) 除將不鏽鋼製到刀之刃寬設為5mm以外,以與實施例 1相同之條件製作銦免。 、 (比較例1 ) 除不進行靶表面之切削以外,以與實施例1相同之條 件製作銦乾。 ' (比較例2) 除進盯硏磨加工來代替利用不鏽鋼製到刀之靶表面之 切削加工以外’以與實施例1相同之條件製作銦靶。 (評價) 201209203 對由實施例及比較例所得之銦靶,測定JIS b〇60 1 — 1 994所規定之「算術平均粗糙度(Ra )」及「十點平均粗糙 度(Rz)」。 又’利用ANELVA製SpF_313H濺鍍裝置,以濺鍍開 始前之腔室内之極限真空壓力為lxl〇-4Pa、濺鍍時之壓力 為0.5Pa、氬濺鍍氣流量為5SCcm、濺鍍功率為650W之條 件對該等實施例及比較例之銦靶進行3〇分鐘濺鍍,計算利 用目測觀察到的濺鍍中之異常放電的次數。 各測定結果顯示於表1中。 [表1] i施例1 Ra ( ^m) Rz ( ^m) 異常放電次數 1.3 12 0 實施例2 1.6 15 0 實施例3 1.2 10 0 實施例4 0,8 8 0 比較例1 2 20 ^~80 ~ 比較例2 50 150 250 實施例1中’利用刀寬20mm之不鏽鋼製刮刀對靶表面 進行切削加工,算術平均粗糙度(Ra )為1 ·3 " m且十點平 均袓糙度(Rz )為1 2 # m。因此,未發現異常放電。 實施例2中,利用刃寬較實施例1寬之40mm的不鏽鋼 製刮刀對靶表面進行切削加工,算術平均粗糙度(Ra )為 U/zm且十點平均粗糙度(Rz)為15/ζιη,表面略比實施 例1粗糙,但未發現異常放電。 實施例3中,利用刃寬較實施例1窄之10111〇1的不鏽鋼 201209203 算術平均粗糙度(Ra )為 為1 0以m,表面較實施例 製到刀對靶表面進行切削加工 1.2/ 01且十點平均粗糙度(RZ 1平坦,未發現異常放電。 :施例4中’利用刃寬較實施例丨及3窄之$麵的不 •’到刀對表面進行切削加工,算術平均粗度(⑷ 為且十點平均粗糙度(Rz)為,表面較實施 例1及3光滑,未發現異常放電。 比較例1中,未進行靶表面之切削,算術平均粗糙度 (Ra)為2 // m且十點平均粗糙度(Rz )為2〇 "爪,較粗糙, 異常放電亦多達8〇次。 比較例2中’藉由利用硏磨加工來代替利用刮刀之把 表面之切削加工而進行表面處理,因此算術平均粗糙度 (Ra )為50 # m且十點平均粗糙度(Rz )為150 # m,較粗 糙,異常放電亦多達250次。 【圖式簡單說明】 無 【主要元件符號說明】

Claims (1)

  1. 201209203 七、申請專利範圍: 1·-種銦歡,其乾表面之算術平均粗經度(Ra)為 // Π1以下。 2·如申請專利範Μ !項之銦乾,其算術平均粗縫度 (Ra)為 1.2#m 以下。 3·如申請專利範圍第丨項之銦靶,並 〜八祀表面之十點平均 粗縫度(Rz)為15/Wm以下。 4·如申請專利範圍第3項之銦乾, 〜丹卞點平均粗糙度 (Rz)為lo^m以下。 5·-種銦mm藉由將銦原料炫鑄後,進行利 用刮刀之切削加工而製作中請專利範圍第ι至4中任一項 之銦靶。 '
TW100116983A 2010-08-31 2011-05-16 Indium target and preparation method thereof TW201209203A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2010194532A JP4948633B2 (ja) 2010-08-31 2010-08-31 インジウムターゲット及びその製造方法

Publications (2)

Publication Number Publication Date
TW201209203A true TW201209203A (en) 2012-03-01
TWI372186B TWI372186B (zh) 2012-09-11

Family

ID=45772468

Family Applications (1)

Application Number Title Priority Date Filing Date
TW100116983A TW201209203A (en) 2010-08-31 2011-05-16 Indium target and preparation method thereof

Country Status (7)

Country Link
US (1) US20130105311A1 (zh)
EP (1) EP2612952B1 (zh)
JP (1) JP4948633B2 (zh)
KR (1) KR101274385B1 (zh)
CN (2) CN104480435A (zh)
TW (1) TW201209203A (zh)
WO (1) WO2012029355A1 (zh)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4948634B2 (ja) 2010-09-01 2012-06-06 Jx日鉱日石金属株式会社 インジウムターゲット及びその製造方法
JP5140169B2 (ja) 2011-03-01 2013-02-06 Jx日鉱日石金属株式会社 インジウムターゲット及びその製造方法
JP5026611B1 (ja) 2011-09-21 2012-09-12 Jx日鉱日石金属株式会社 積層構造体及びその製造方法
JP5074628B1 (ja) * 2012-01-05 2012-11-14 Jx日鉱日石金属株式会社 インジウム製スパッタリングターゲット及びその製造方法
US9761421B2 (en) 2012-08-22 2017-09-12 Jx Nippon Mining & Metals Corporation Indium cylindrical sputtering target and manufacturing method thereof
CN104919080B (zh) 2013-07-08 2018-10-16 Jx日矿日石金属株式会社 溅射靶及其制造方法
EP3165632B1 (en) * 2014-07-03 2018-10-03 Sumitomo Metal Mining Co., Ltd. Target material for sputtering and method for manufacturing the same
CN108165936A (zh) * 2017-12-21 2018-06-15 清远先导材料有限公司 制备铟靶材的方法
CN112030119A (zh) * 2020-08-27 2020-12-04 苏州思菲科新材料科技有限公司 一种铟管靶及其制备方法

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6344820A (ja) 1986-08-11 1988-02-25 萩原工業株式会社 植物を直接被覆する保護シ−ト
US5630918A (en) * 1994-06-13 1997-05-20 Tosoh Corporation ITO sputtering target
JP3152108B2 (ja) * 1994-06-13 2001-04-03 東ソー株式会社 Itoスパッタリングターゲット
JPH08281208A (ja) * 1995-04-07 1996-10-29 Sumitomo Light Metal Ind Ltd アルミニウム合金研削部の塗装前処理方法
JP2003089869A (ja) * 2001-09-18 2003-03-28 Mitsui Mining & Smelting Co Ltd スパッタリングターゲットおよびその製造方法
CN100457961C (zh) * 2001-09-18 2009-02-04 三井金属鉱业株式会社 溅射靶及其制备方法
JP2005002364A (ja) * 2003-06-09 2005-01-06 Mitsui Mining & Smelting Co Ltd スパッタリングターゲット及びその製造方法
JP2006257510A (ja) * 2005-03-17 2006-09-28 Mitsui Mining & Smelting Co Ltd スパッタリングターゲットの製造方法およびスパッタリングターゲット
US8003432B2 (en) * 2008-06-25 2011-08-23 Stion Corporation Consumable adhesive layer for thin film photovoltaic material
JP4992843B2 (ja) * 2008-07-16 2012-08-08 住友金属鉱山株式会社 インジウムターゲットの製造方法

Also Published As

Publication number Publication date
EP2612952B1 (en) 2014-11-12
EP2612952A1 (en) 2013-07-10
US20130105311A1 (en) 2013-05-02
JP4948633B2 (ja) 2012-06-06
TWI372186B (zh) 2012-09-11
KR101274385B1 (ko) 2013-06-17
WO2012029355A1 (ja) 2012-03-08
CN102652185A (zh) 2012-08-29
CN104480435A (zh) 2015-04-01
EP2612952A4 (en) 2014-02-12
JP2012052173A (ja) 2012-03-15
KR20120091246A (ko) 2012-08-17

Similar Documents

Publication Publication Date Title
TW201209203A (en) Indium target and preparation method thereof
Lv et al. Influence of substrate bias voltage on structure and properties of the CrAlN films deposited by unbalanced magnetron sputtering
TWI390067B (zh) Indium target and its manufacturing method
JP5254290B2 (ja) インジウムターゲット及びその製造方法
CN104838182B (zh) 活塞环
MY167437A (en) Aluminium alloy sheet and method for manufacturing same
TW201229247A (en) Indium target and its manufacturing method
WO2013103029A1 (ja) インジウム製スパッタリングターゲット及びその製造方法
KR101355902B1 (ko) 태양 전지용 스퍼터링 타깃
CN103911587A (zh) 非晶合金材料源的应用、复合材料及其制备方法
CN106756846A (zh) 一种共掺杂dlc薄膜的制备方法
CN104109837A (zh) 保护膜形成用溅射靶及层叠配线膜
CN103993272B (zh) 保护膜形成用溅射靶及层叠配线膜
TW201606107A (zh) 濺鍍靶及濺鍍靶之製造方法
Zhao et al. Microstructure and properties of Mo doped DLC nanocomposite films deposited by a hybrid sputtering system
WO2012073831A1 (ja) Al基合金スパッタリングターゲット
CN102345100B (zh) 铝铈金属靶材及利用该铝铈金属靶材制作铝铈膜的方法
CN102943239B (zh) 一种压铸铝合金表面耐蚀性银基非晶薄膜及其制备工艺
JP5871106B2 (ja) In合金スパッタリングターゲット、その製造方法及びIn合金膜
Li et al. Microstructure and corrosion resistance of vanadium films deposited at different target-substrate distance by HPPMS
JP5183818B1 (ja) インジウム製スパッタリングターゲット部材及びその製造方法
Ayala et al. Modeling of the effect of substrate temperature on Na diffusion through molybdenum films
JP6459601B2 (ja) Niスパッタリングターゲット
WO2013088785A1 (ja) インジウム製スパッタリングターゲット部材及びその製造方法
JP2013227632A (ja) インジウムターゲット及びその製造方法