TW200801110A - Resin composition for semiconductor encapsulation and semiconductor device - Google Patents

Resin composition for semiconductor encapsulation and semiconductor device

Info

Publication number
TW200801110A
TW200801110A TW096111256A TW96111256A TW200801110A TW 200801110 A TW200801110 A TW 200801110A TW 096111256 A TW096111256 A TW 096111256A TW 96111256 A TW96111256 A TW 96111256A TW 200801110 A TW200801110 A TW 200801110A
Authority
TW
Taiwan
Prior art keywords
resin composition
semiconductor
epoxy resin
semiconductor encapsulation
encapsulation
Prior art date
Application number
TW096111256A
Other languages
English (en)
Other versions
TWI482815B (zh
Inventor
Masashi Endo
Hirofumi Kuroda
Original Assignee
Sumitomo Bakelite Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Bakelite Co filed Critical Sumitomo Bakelite Co
Publication of TW200801110A publication Critical patent/TW200801110A/zh
Application granted granted Critical
Publication of TWI482815B publication Critical patent/TWI482815B/zh

Links

Classifications

    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
    • C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
    • C08G59/40—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the curing agents used
    • C08G59/62—Alcohols or phenols
    • C08G59/621—Phenols
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L63/00—Compositions of epoxy resins; Compositions of derivatives of epoxy resins
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
    • C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
    • C08G59/20—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the epoxy compounds used
    • C08G59/22—Di-epoxy compounds
    • C08G59/24—Di-epoxy compounds carbocyclic
    • C08G59/245—Di-epoxy compounds carbocyclic aromatic
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
    • C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
    • C08G59/20—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the epoxy compounds used
    • C08G59/22—Di-epoxy compounds
    • C08G59/30—Di-epoxy compounds containing atoms other than carbon, hydrogen, oxygen and nitrogen
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
    • C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
    • C08G59/20—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the epoxy compounds used
    • C08G59/32—Epoxy compounds containing three or more epoxy groups
    • C08G59/3218—Carbocyclic compounds
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
    • C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
    • C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
    • C08G59/20—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the epoxy compounds used
    • C08G59/32—Epoxy compounds containing three or more epoxy groups
    • C08G59/3254—Epoxy compounds containing three or more epoxy groups containing atoms other than carbon, hydrogen, oxygen or nitrogen
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00—Use of inorganic substances as compounding ingredients
    • C—CHEMISTRY; METALLURGY
    • C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L61/00—Compositions of condensation polymers of aldehydes or ketones; Compositions of derivatives of such polymers
    • C08L61/04—Condensation polymers of aldehydes or ketones with phenols only
    • C08L61/06—Condensation polymers of aldehydes or ketones with phenols only of aldehydes with phenols
    • C08L61/12—Condensation polymers of aldehydes or ketones with phenols only of aldehydes with phenols with polyhydric phenols
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00—Details of semiconductor or other solid state devices
    • H01L23/28—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/29—Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
    • H01L23/293—Organic, e.g. plastic
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26—Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31—Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32—Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321—Disposition
    • H01L2224/32151—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32245—Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001—Core members of the connector
    • H01L2224/4501—Shape
    • H01L2224/45012—Cross-sectional shape
    • H01L2224/45015—Cross-sectional shape being circular
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L2224/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H01L2224/45001—Core members of the connector
    • H01L2224/45099—Material
    • H01L2224/451—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof
    • H01L2224/45138—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron (B), silicon (Si), germanium (Ge), arsenic (As), antimony (Sb), tellurium (Te) and polonium (Po), and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950°C and less than 1550°C
    • H01L2224/45144—Gold (Au) as principal constituent
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/4805—Shape
    • H01L2224/4809—Loop shape
    • H01L2224/48091—Arched
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42—Wire connectors; Manufacturing methods related thereto
    • H01L2224/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481—Disposition
    • H01L2224/48151—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/48247—Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic connecting the wire to a bond pad of the item
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73—Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732—Location after the connecting process
    • H01L2224/73251—Location after the connecting process on different surfaces
    • H01L2224/73265—Layer and wire connectors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42—Wire connectors; Manufacturing methods related thereto
    • H01L24/44—Structure, shape, material or disposition of the wire connectors prior to the connecting process
    • H01L24/45—Structure, shape, material or disposition of the wire connectors prior to the connecting process of an individual wire connector
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L24/42—Wire connectors; Manufacturing methods related thereto
    • H01L24/47—Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L24/48—Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00—Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/73—Means for bonding being of different types provided for in two or more of groups H01L24/10, H01L24/18, H01L24/26, H01L24/34, H01L24/42, H01L24/50, H01L24/63, H01L24/71
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/11—Device type
    • H01L2924/13—Discrete devices, e.g. 3 terminal devices
    • H01L2924/1301—Thyristor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10—Details of semiconductor or other solid state devices to be connected
    • H01L2924/11—Device type
    • H01L2924/14—Integrated circuits
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/151—Die mounting substrate
    • H01L2924/156—Material
    • H01L2924/157—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof
    • H01L2924/15738—Material with a principal constituent of the material being a metal or a metalloid, e.g. boron [B], silicon [Si], germanium [Ge], arsenic [As], antimony [Sb], tellurium [Te] and polonium [Po], and alloys thereof the principal constituent melting at a temperature of greater than or equal to 950 C and less than 1550 C
    • H01L2924/15747—Copper [Cu] as principal constituent
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/15—Details of package parts other than the semiconductor or other solid state devices to be connected
    • H01L2924/181—Encapsulation

Landscapes

  • Chemical & Material Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • General Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Epoxy Resins (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
TW096111256A 2006-03-31 2007-03-30 半導體密封用樹脂組成物及半導體裝置 TWI482815B (zh)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2006100287 2006-03-31
JP2007004252 2007-01-12

Publications (2)

Publication Number Publication Date
TW200801110A true TW200801110A (en) 2008-01-01
TWI482815B TWI482815B (zh) 2015-05-01

Family

ID=38560086

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096111256A TWI482815B (zh) 2006-03-31 2007-03-30 半導體密封用樹脂組成物及半導體裝置

Country Status (7)

Country Link
US (1) US7696286B2 (zh)
JP (1) JP5321057B2 (zh)
KR (1) KR101016067B1 (zh)
CN (1) CN101379107B (zh)
MY (1) MY145942A (zh)
TW (1) TWI482815B (zh)
WO (1) WO2007125635A1 (zh)

Families Citing this family (16)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4163162B2 (ja) * 2003-08-29 2008-10-08 住友ベークライト株式会社 エポキシ樹脂用潜伏性触媒、エポキシ樹脂組成物および半導体装置
JP5320714B2 (ja) * 2007-09-27 2013-10-23 住友ベークライト株式会社 半導体封止用エポキシ樹脂組成物及び半導体装置
JP5104252B2 (ja) * 2007-11-29 2012-12-19 住友ベークライト株式会社 半導体封止用エポキシ樹脂組成物及び半導体装置
JP5228496B2 (ja) * 2008-01-16 2013-07-03 住友ベークライト株式会社 半導体封止用エポキシ樹脂組成物及び半導体装置
JP5050923B2 (ja) * 2008-02-27 2012-10-17 住友ベークライト株式会社 半導体封止用エポキシ樹脂組成物及び半導体装置
JP5200867B2 (ja) * 2008-11-10 2013-06-05 住友ベークライト株式会社 半導体封止用エポキシ樹脂組成物及び半導体装置
JP5578168B2 (ja) * 2009-03-11 2014-08-27 住友ベークライト株式会社 半導体封止用樹脂組成物及び半導体装置
WO2010106698A1 (ja) * 2009-03-18 2010-09-23 Dic株式会社 リン原子含有フェノール類の製造方法、新規リン原子含有フェノール類、硬化性樹脂組成物、その硬化物、プリント配線基板、及び半導体封止材料
CN102666642A (zh) * 2009-10-26 2012-09-12 住友电木株式会社 半导体封装用树脂组合物及使用其的半导体装置
SG191755A1 (en) 2011-01-28 2013-08-30 Sumitomo Bakelite Co Epoxy resin composition for sealing, and electronic component device
KR101252063B1 (ko) 2011-08-25 2013-04-12 한국생산기술연구원 알콕시실릴기를 갖는 에폭시 화합물, 이의 제조 방법, 이를 포함하는 조성물과 경화물 및 이의 용도
JP5835664B2 (ja) * 2011-11-28 2015-12-24 スリーボンドファインケミカル株式会社 光硬化型樹脂組成物
KR101464700B1 (ko) * 2013-03-19 2014-11-27 주식회사 유니플러스 반도체용 에폭시 수지조성물
CN104098870B (zh) * 2014-05-09 2016-04-20 傅进 一种半导体器材密封用芳烷基环氧树脂材料的制备方法
KR20210057884A (ko) * 2019-11-12 2021-05-24 삼성디스플레이 주식회사 표시 장치 및 이의 제조 방법
KR102232340B1 (ko) 2019-11-15 2021-03-26 한국생산기술연구원 알콕시실릴기를 갖는 에폭시 수지의 조성물 및 이의 복합체

Family Cites Families (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04220413A (ja) * 1990-12-20 1992-08-11 Nippon Kayaku Co Ltd フェノール類ノボラック型の化合物、樹脂、樹脂組成物及び硬化物
JPH0940748A (ja) * 1995-07-31 1997-02-10 Sumitomo Bakelite Co Ltd 半導体封止用エポキシ樹脂組成物
JP2000026573A (ja) 1998-07-10 2000-01-25 Yuka Shell Epoxy Kk エポキシ樹脂の製造方法、エポキシ樹脂、及びエポキシ樹脂組成物
US6486242B1 (en) * 1999-04-20 2002-11-26 Sumitomo Bakelite Company Limited Flame-retardant resin composition and prepreg and laminate using the same
JP2001270931A (ja) * 2000-03-27 2001-10-02 Sumitomo Bakelite Co Ltd エポキシ樹脂組成物及び半導体装置
JP2002037859A (ja) * 2000-07-19 2002-02-06 Sumitomo Chem Co Ltd 半導体封止用エポキシ樹脂組成物および樹脂封止型半導体装置
EP1287071A1 (en) * 2001-04-23 2003-03-05 Sumitomo Bakelite Co., Ltd. Epoxy resin composition and semiconductor device
JP2003171529A (ja) 2001-12-10 2003-06-20 Kyocera Chemical Corp エポキシ樹脂組成物および半導体装置
JP2004155841A (ja) 2002-11-05 2004-06-03 Kyocera Chemical Corp 封止用樹脂組成物および半導体封止装置
JP2004203911A (ja) 2002-12-24 2004-07-22 Kyocera Chemical Corp 封止用樹脂組成物および樹脂封止型半導体装置
JP4404050B2 (ja) * 2003-03-11 2010-01-27 住友ベークライト株式会社 半導体封止用樹脂組成物およびこれを用いた半導体装置
JP4569137B2 (ja) * 2003-03-17 2010-10-27 住友ベークライト株式会社 半導体封止用樹脂組成物および半導体装置
TWI300083B (en) * 2003-04-25 2008-08-21 Mitsui Chemicals Inc Epoxy resin and its usage
JP4163162B2 (ja) * 2003-08-29 2008-10-08 住友ベークライト株式会社 エポキシ樹脂用潜伏性触媒、エポキシ樹脂組成物および半導体装置
JP4496739B2 (ja) 2003-09-09 2010-07-07 住友ベークライト株式会社 硬化促進剤、エポキシ樹脂組成物および半導体装置
US20070043166A1 (en) * 2004-07-29 2007-02-22 Norihisa Hoshika Epoxy resin composition for encapsulating semiconductor chip and semiconductor device
US7985822B2 (en) * 2004-09-01 2011-07-26 Dainippon Ink And Chemicals, Inc. Epoxy resin composition,cured article thereof, semiconductor sealing material, novel phenol resin, novel epoxy resin,method for producing novel phenol resin, and method for producing novel epoxy resin
US7741388B2 (en) * 2004-11-02 2010-06-22 Sumitomo Bakelite Company, Ltd. Epoxy resin composition and semiconductor device
JP4941804B2 (ja) * 2005-03-02 2012-05-30 Ｄｉｃ株式会社 エポキシ樹脂組成物、その硬化物、半導体封止材料、新規フェノール樹脂、および新規エポキシ樹脂
JP4706904B2 (ja) * 2005-05-31 2011-06-22 Ｄｉｃ株式会社 エポキシ樹脂組成物、その硬化物、新規エポキシ樹脂及びその製造方法
JP4706905B2 (ja) * 2005-05-31 2011-06-22 Ｄｉｃ株式会社 エポキシ樹脂組成物、その硬化物、新規多価ヒドロキシ化合物およびその製造方法

Also Published As

Publication number Publication date
MY145942A (en) 2012-05-31
JP5321057B2 (ja) 2013-10-23
WO2007125635A1 (ja) 2007-11-08
KR20080108408A (ko) 2008-12-15
JPWO2007125635A1 (ja) 2009-09-10
CN101379107A (zh) 2009-03-04
US20070232728A1 (en) 2007-10-04
TWI482815B (zh) 2015-05-01
CN101379107B (zh) 2011-02-09
US7696286B2 (en) 2010-04-13
KR101016067B1 (ko) 2011-02-17

Similar Documents

Publication Publication Date Title
TW200801110A (en) Resin composition for semiconductor encapsulation and semiconductor device
MY134219A (en) Resin composition for encapsulating semiconductor chip and semiconductor device therewith
MY161129A (en) Epoxy resin composition for sealing and electronic component device
MY148272A (en) Curable silicone composition
WO2009057530A1 (ja) 半導体用接着剤組成物およびそれを用いて製造した半導体装置
TW200801081A (en) Novel phenolic resin, its preparation and its use
TW200613436A (en) Resin composition for semiconductor encapsulation and semiconductor device
TW200631981A (en) The novel curable resin, the method of manufacturing the same, the epoxy resin composition and the electronic parts/devices
MY143474A (en) Semiconductor encapsulant of expoxy resin, phenolic resin, phosphine-quinone adduct and oh compound
TW200631982A (en) Epoxy resin composition, process for providing latency to the composition and a semiconductor device
SG156623A1 (en) Epoxy resin composition and semiconductor device
MY165894A (en) Epoxy resin molding material for encapsulation and electronic component device including element encapsulated with same
MY160024A (en) Adhesive composition, adhesive sheet, circuit board and semiconductor device both produced using these, and processes for producing these
TW200732366A (en) Thermosetting resin composition
EA200870174A1 (ru) Отверждающие агенты для эпокси-функциональных соединений
TW200734377A (en) Phenol resin and resin composition
MY155689A (en) Resin composition for encapsulating semiconductor and semiconductor device
TW200834235A (en) Photosensitive resin composition, insulation film, protective film and electronic apparatus
MY153000A (en) Resin composition for encapsulating semiconductor and semiconductor device
TW200740870A (en) Epoxy resin composition for encapsulating semiconductor and semiconductor device
MY152137A (en) Epoxy resin composition for encapsulating semiconductor chip and semiconductor device
TW200500412A (en) Resin composition for encapsulating semiconductor chip and semiconductor device therewith
WO2014114556A3 (de) 2,2',6,6'-tetramethyl-4,4'-methylenbis(cyclohexylamin) als härter für epoxidharze
WO2009084831A3 (en) Epoxy resin composition for encapsulating semiconductor device and semiconductor device using the same
TW200707673A (en) Semiconductor encapsulating epoxy resin composition and semiconductor device

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees