TW200707673A - Semiconductor encapsulating epoxy resin composition and semiconductor device - Google Patents
Semiconductor encapsulating epoxy resin composition and semiconductor deviceInfo
- Publication number
- TW200707673A TW200707673A TW095114547A TW95114547A TW200707673A TW 200707673 A TW200707673 A TW 200707673A TW 095114547 A TW095114547 A TW 095114547A TW 95114547 A TW95114547 A TW 95114547A TW 200707673 A TW200707673 A TW 200707673A
- Authority
- TW
- Taiwan
- Prior art keywords
- epoxy resin
- weight
- parts
- resin composition
- semiconductor
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L63/00—Compositions of epoxy resins; Compositions of derivatives of epoxy resins
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08G—MACROMOLECULAR COMPOUNDS OBTAINED OTHERWISE THAN BY REACTIONS ONLY INVOLVING UNSATURATED CARBON-TO-CARBON BONDS
- C08G59/00—Polycondensates containing more than one epoxy group per molecule; Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups
- C08G59/18—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing
- C08G59/40—Macromolecules obtained by polymerising compounds containing more than one epoxy group per molecule using curing agents or catalysts which react with the epoxy groups ; e.g. general methods of curing characterised by the curing agents used
- C08G59/62—Alcohols or phenols
- C08G59/621—Phenols
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K3/00—Use of inorganic substances as compounding ingredients
- C08K3/34—Silicon-containing compounds
- C08K3/36—Silica
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L61/00—Compositions of condensation polymers of aldehydes or ketones; Compositions of derivatives of such polymers
- C08L61/04—Condensation polymers of aldehydes or ketones with phenols only
- C08L61/06—Condensation polymers of aldehydes or ketones with phenols only of aldehydes with phenols
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09D—COATING COMPOSITIONS, e.g. PAINTS, VARNISHES OR LACQUERS; FILLING PASTES; CHEMICAL PAINT OR INK REMOVERS; INKS; CORRECTING FLUIDS; WOODSTAINS; PASTES OR SOLIDS FOR COLOURING OR PRINTING; USE OF MATERIALS THEREFOR
- C09D163/00—Coating compositions based on epoxy resins; Coating compositions based on derivatives of epoxy resins
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L33/00—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
- H01L33/48—Semiconductor devices with at least one potential-jump barrier or surface barrier specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the semiconductor body packages
- H01L33/52—Encapsulations
- H01L33/56—Materials, e.g. epoxy or silicone resin
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08K—Use of inorganic or non-macromolecular organic substances as compounding ingredients
- C08K3/00—Use of inorganic substances as compounding ingredients
- C08K3/18—Oxygen-containing compounds, e.g. metal carbonyls
- C08K3/20—Oxides; Hydroxides
- C08K3/22—Oxides; Hydroxides of metals
- C08K2003/221—Oxides; Hydroxides of metals of rare earth metal
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L2201/00—Properties
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L2201/00—Properties
- C08L2201/02—Flame or fire retardant/resistant
-
- C—CHEMISTRY; METALLURGY
- C08—ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
- C08L—COMPOSITIONS OF MACROMOLECULAR COMPOUNDS
- C08L2666/00—Composition of polymers characterized by a further compound in the blend, being organic macromolecular compounds, natural resins, waxes or and bituminous materials, non-macromolecular organic substances, inorganic substances or characterized by their function in the composition
- C08L2666/66—Substances characterised by their function in the composition
- C08L2666/72—Fillers; Inorganic pigments; Reinforcing additives
Abstract
An epoxy resin composition comprising (A) a naphthalene type epoxy resin in which 35-85 parts by weight of 1,1-bis(2-glycidyloxy-1-naphthyl)alkane and 1-35 parts by weight of 1,1-bis(2,7-diglycidyloxy-1-naphthyl)alkane are included per 100 parts by weight of the resin, (B) a curing agent in the form of a naphthalene type phenolic resin, (C) an inorganic filler, and (D) a rare earth oxide or hydrotalcite compound is best suited for semiconductor encapsulation because it has good flow, a low coefficient of linear expansion, a high Tg, minimal moisture absorption, and crack resistance upon lead-free soldering.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005125897 | 2005-04-25 | ||
JP2006105155A JP4844725B2 (en) | 2005-04-25 | 2006-04-06 | Epoxy resin composition for semiconductor encapsulation and semiconductor device |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200707673A true TW200707673A (en) | 2007-02-16 |
TWI415230B TWI415230B (en) | 2013-11-11 |
Family
ID=37550383
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095114547A TWI415230B (en) | 2005-04-25 | 2006-04-24 | Epoxy resin composition for semiconductor sealing and semiconductor device |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP4844725B2 (en) |
KR (1) | KR101204196B1 (en) |
TW (1) | TWI415230B (en) |
Families Citing this family (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US20070029682A1 (en) * | 2005-08-05 | 2007-02-08 | Shin-Etsu Chemical Co., Ltd. | Epoxy resin composition and semiconductor device |
JP2009102635A (en) * | 2007-10-04 | 2009-05-14 | Hitachi Chem Co Ltd | Epoxy resin molding material for sealing, and electronic component device having element sealed with the epoxy resin molding material for sealing |
JP5187101B2 (en) * | 2008-09-26 | 2013-04-24 | 住友ベークライト株式会社 | Epoxy resin composition and semiconductor device |
JP5904078B2 (en) * | 2011-10-07 | 2016-04-13 | 信越化学工業株式会社 | Prepreg, metal-clad laminate, printed wiring board, and semiconductor device |
JP7043861B2 (en) * | 2018-02-05 | 2022-03-30 | Dic株式会社 | Resist material |
KR102483006B1 (en) * | 2020-05-14 | 2022-12-29 | 삼성에스디아이 주식회사 | Epoxy resin composition for encapsulating semiconductor device and semiconductor device encapsulated using the same |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3137202B2 (en) * | 1990-10-30 | 2001-02-19 | 大日本インキ化学工業株式会社 | Epoxy resin, method for producing the same, and epoxy resin composition |
US5302672A (en) * | 1991-02-27 | 1994-04-12 | Dainippon Ink And Chemicals, Inc. | 2,7-dihydroxynaphthalene based epoxy resin, intermediate thereof, processes for producing them, and epoxy resin composition |
JPH04300914A (en) * | 1991-03-29 | 1992-10-23 | Shin Etsu Chem Co Ltd | Epoxy resin composition and semiconductor device |
US5358980A (en) * | 1991-10-03 | 1994-10-25 | Shin-Etsu Chemical Company, Limited | Naphthol novolac epoxy resin compositions and semiconductor devices encapsulated therewith |
JP2768088B2 (en) * | 1991-10-03 | 1998-06-25 | 信越化学工業株式会社 | Thermosetting resin composition and semiconductor device |
JP2591392B2 (en) * | 1991-11-26 | 1997-03-19 | 信越化学工業株式会社 | Thermosetting resin composition and semiconductor device |
JP3049898B2 (en) * | 1991-12-25 | 2000-06-05 | 日立化成工業株式会社 | Epoxy resin molding material for sealing electronic parts and IC package using the same |
JP3204461B2 (en) * | 1992-03-13 | 2001-09-04 | 日本化薬株式会社 | Epoxy resin composition and cured product thereof |
JP2705527B2 (en) * | 1993-05-25 | 1998-01-28 | 松下電工株式会社 | Epoxy resin composition |
JP3022135B2 (en) * | 1994-01-26 | 2000-03-15 | 信越化学工業株式会社 | Epoxy resin composition |
EP0749996B1 (en) * | 1995-01-05 | 2004-08-18 | Sumitomo Bakelite Co., Ltd. | Epoxy resin composition |
JP4004160B2 (en) * | 1998-09-21 | 2007-11-07 | 協和化学工業株式会社 | Hydrotalcite compounds with low uranium (U) content and process for producing the same |
JP3537082B2 (en) * | 1999-02-09 | 2004-06-14 | 住友ベークライト株式会社 | Epoxy resin composition and semiconductor device |
JP2002053734A (en) * | 2000-08-08 | 2002-02-19 | Nitto Denko Corp | Epoxy resin composition for sealing semiconductor, and semiconductor device made by using it |
US6794031B2 (en) * | 2001-09-28 | 2004-09-21 | Ube Industries, Ltd. | Cover-lay film and printed circuit board having the same |
DE10224887A1 (en) * | 2002-06-05 | 2003-12-18 | Bayer Ag | Molding composition, useful for the production of switches, plug moldings, spray bodies and fuse boxes contains red phosphorous, zinc borate, talc and a lanthanide and/or lanthanide compound |
JP4661033B2 (en) * | 2003-06-27 | 2011-03-30 | Dic株式会社 | Epoxy resin composition, semiconductor sealing material, and semiconductor device |
-
2006
- 2006-04-06 JP JP2006105155A patent/JP4844725B2/en active Active
- 2006-04-24 TW TW095114547A patent/TWI415230B/en active
- 2006-04-24 KR KR1020060036725A patent/KR101204196B1/en active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
KR101204196B1 (en) | 2012-11-26 |
KR20060111851A (en) | 2006-10-30 |
JP2006328362A (en) | 2006-12-07 |
TWI415230B (en) | 2013-11-11 |
JP4844725B2 (en) | 2011-12-28 |
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