TW200522187A - Gallium nitride semiconductor substrate and process for producing the same - Google Patents
Gallium nitride semiconductor substrate and process for producing the same Download PDFInfo
- Publication number
- TW200522187A TW200522187A TW093123946A TW93123946A TW200522187A TW 200522187 A TW200522187 A TW 200522187A TW 093123946 A TW093123946 A TW 093123946A TW 93123946 A TW93123946 A TW 93123946A TW 200522187 A TW200522187 A TW 200522187A
- Authority
- TW
- Taiwan
- Prior art keywords
- gan
- cleaning
- substrate
- etching
- metal
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P14/00—Formation of materials, e.g. in the shape of layers or pillars
- H10P14/20—Formation of materials, e.g. in the shape of layers or pillars of semiconductor materials
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P90/00—Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
- H10P90/12—Preparing bulk and homogeneous wafers
- H10P90/126—Preparing bulk and homogeneous wafers by chemical etching
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P50/00—Etching of wafers, substrates or parts of devices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P50/00—Etching of wafers, substrates or parts of devices
- H10P50/60—Wet etching
- H10P50/64—Wet etching of semiconductor materials
- H10P50/642—Chemical etching
- H10P50/646—Chemical etching of Group III-V materials
Landscapes
- Weting (AREA)
- Drying Of Semiconductors (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2003365867 | 2003-10-27 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200522187A true TW200522187A (en) | 2005-07-01 |
| TWI332236B TWI332236B (https=) | 2010-10-21 |
Family
ID=34510199
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW093123946A TW200522187A (en) | 2003-10-27 | 2004-08-10 | Gallium nitride semiconductor substrate and process for producing the same |
Country Status (7)
| Country | Link |
|---|---|
| US (2) | US20070018284A1 (https=) |
| EP (1) | EP1679740A4 (https=) |
| JP (1) | JP4479657B2 (https=) |
| KR (1) | KR20060090827A (https=) |
| CN (2) | CN101661910B (https=) |
| TW (1) | TW200522187A (https=) |
| WO (1) | WO2005041283A1 (https=) |
Families Citing this family (49)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US9279193B2 (en) | 2002-12-27 | 2016-03-08 | Momentive Performance Materials Inc. | Method of making a gallium nitride crystalline composition having a low dislocation density |
| JP4232605B2 (ja) | 2003-10-30 | 2009-03-04 | 住友電気工業株式会社 | 窒化物半導体基板の製造方法と窒化物半導体基板 |
| JP2006352075A (ja) | 2005-05-17 | 2006-12-28 | Sumitomo Electric Ind Ltd | 窒化物系化合物半導体および化合物半導体の洗浄方法、これらの製造方法および基板 |
| US9708735B2 (en) | 2005-06-23 | 2017-07-18 | Sumitomo Electric Industries, Ltd. | Group III nitride crystal substrate, epilayer-containing group III nitride crystal substrate, semiconductor device and method of manufacturing the same |
| JP4277826B2 (ja) | 2005-06-23 | 2009-06-10 | 住友電気工業株式会社 | 窒化物結晶、窒化物結晶基板、エピ層付窒化物結晶基板、ならびに半導体デバイスおよびその製造方法 |
| US8771552B2 (en) | 2005-06-23 | 2014-07-08 | Sumitomo Electric Industries, Ltd. | Group III nitride crystal substrate, epilayer-containing group III nitride crystal substrate, semiconductor device and method of manufacturing the same |
| JP2007116057A (ja) * | 2005-10-24 | 2007-05-10 | Sumitomo Electric Ind Ltd | 半導体素子の製造方法、半導体素子、半導体レーザ、面発光素子、および光導波路 |
| JP2007234952A (ja) * | 2006-03-02 | 2007-09-13 | Sumitomo Electric Ind Ltd | 化合物半導体基板の表面処理方法、化合物半導体の製造方法、化合物半導体基板、および半導体ウエハ |
| JP5157081B2 (ja) * | 2006-04-24 | 2013-03-06 | 日亜化学工業株式会社 | 半導体発光素子及び半導体発光素子の製造方法 |
| JP5218047B2 (ja) * | 2006-04-28 | 2013-06-26 | 住友電気工業株式会社 | 窒化ガリウム結晶を作製する方法および窒化ガリウムウエハ |
| JP2008037705A (ja) * | 2006-08-07 | 2008-02-21 | Sumitomo Electric Ind Ltd | GaxIn1−xN基板とGaxIn1−xN基板の洗浄方法 |
| WO2008047627A1 (en) * | 2006-10-19 | 2008-04-24 | Sumitomo Electric Industries, Ltd. | Group iii element nitride substrate, substrate with epitaxial layer, processes for producing these, and process for producing semiconductor element |
| US8283694B2 (en) * | 2006-10-19 | 2012-10-09 | Sumitomo Electric Industries, Ltd. | GaN substrate, epitaxial layer-provided substrate, methods of manufacturing the same, and method of manufacturing semiconductor device |
| JP2008130799A (ja) * | 2006-11-21 | 2008-06-05 | Sharp Corp | 半導体発光素子および半導体発光素子の製造方法 |
| JP4321595B2 (ja) * | 2007-01-23 | 2009-08-26 | 住友電気工業株式会社 | Iii−v族化合物半導体基板の製造方法 |
| EP1950326A1 (en) * | 2007-01-29 | 2008-07-30 | Interuniversitair Microelektronica Centrum | Method for removal of bulk metal contamination from III-V semiconductor substrates |
| KR101452550B1 (ko) * | 2007-07-19 | 2014-10-21 | 미쓰비시 가가꾸 가부시키가이샤 | Ⅲ 족 질화물 반도체 기판 및 그 세정 방법 |
| JP5560528B2 (ja) * | 2008-01-28 | 2014-07-30 | 住友電気工業株式会社 | Iii族窒化物単結晶インゴットの製造方法、及びiii族窒化物単結晶基板の製造方法 |
| JP5575372B2 (ja) * | 2008-03-04 | 2014-08-20 | 日立金属株式会社 | 窒化ガリウム基板 |
| JP2009272380A (ja) * | 2008-05-01 | 2009-11-19 | Sumitomo Electric Ind Ltd | Iii族窒化物結晶およびその表面処理方法、iii族窒化物積層体およびその製造方法、ならびにiii族窒化物半導体デバイスおよびその製造方法 |
| CN101587859B (zh) * | 2008-05-23 | 2011-03-23 | 中芯国际集成电路制造(北京)有限公司 | 形成半导体互联结构的方法 |
| JP2009302409A (ja) * | 2008-06-16 | 2009-12-24 | Sumco Corp | 半導体ウェーハの製造方法 |
| JP5678402B2 (ja) * | 2008-08-04 | 2015-03-04 | 住友電気工業株式会社 | ショットキーバリアダイオードおよびその製造方法 |
| EP2200077B1 (en) * | 2008-12-22 | 2012-12-05 | Soitec | Method for bonding two substrates |
| JP4305574B1 (ja) | 2009-01-14 | 2009-07-29 | 住友電気工業株式会社 | Iii族窒化物基板、それを備える半導体デバイス、及び、表面処理されたiii族窒化物基板を製造する方法 |
| JP5365454B2 (ja) * | 2009-09-30 | 2013-12-11 | 住友電気工業株式会社 | Iii族窒化物半導体基板、エピタキシャル基板及び半導体デバイス |
| JP4513927B1 (ja) | 2009-09-30 | 2010-07-28 | 住友電気工業株式会社 | Iii族窒化物半導体基板、エピタキシャル基板及び半導体デバイス |
| CN102148429B (zh) * | 2010-02-06 | 2016-03-30 | 清华大学 | 纳米光学天线阵列的制造方法 |
| TWI443741B (zh) * | 2011-01-14 | 2014-07-01 | 國立交通大學 | 一種平整化氮化物基板的方法 |
| WO2013014713A1 (ja) * | 2011-07-28 | 2013-01-31 | パナソニック株式会社 | 表面改質半導体及びその製造方法並びに粒子配置方法 |
| CN102569065A (zh) * | 2011-12-23 | 2012-07-11 | 重庆平伟实业股份有限公司 | 一种二极管芯片的酸洗工艺 |
| JP5696734B2 (ja) * | 2013-03-22 | 2015-04-08 | 住友電気工業株式会社 | Iii族窒化物結晶基板、エピタキシャル層付iii族窒化物結晶基板および半導体デバイス |
| JP2014192353A (ja) * | 2013-03-27 | 2014-10-06 | Sumitomo Electric Ind Ltd | 基板を処理する方法 |
| EP2881982B1 (en) * | 2013-12-05 | 2019-09-04 | IMEC vzw | Method for fabricating cmos compatible contact layers in semiconductor devices |
| JP6248359B2 (ja) * | 2013-12-20 | 2017-12-20 | 住友電工デバイス・イノベーション株式会社 | 半導体層の表面処理方法 |
| KR20150138479A (ko) | 2014-05-29 | 2015-12-10 | 삼성전자주식회사 | 발광 소자 패키지의 제조 방법 |
| US10043654B2 (en) | 2014-07-22 | 2018-08-07 | Sumitomo Electric Industries, Ltd. | Method for rinsing compound semiconductor, solution for rinsing compound semiconductor containing gallium as constituent element, method for fabricating compound semiconductor device, method for fabricating gallium nitride substrate, and gallium nitride substrate |
| JP6574104B2 (ja) * | 2015-04-28 | 2019-09-11 | 一般財団法人ファインセラミックスセンター | 窒化物系半導体のエッチング方法および窒化物系半導体の結晶欠陥検出方法 |
| JP6038237B2 (ja) * | 2015-06-18 | 2016-12-07 | 住友化学株式会社 | 窒化ガリウム基板の製造方法 |
| US10186630B2 (en) * | 2016-08-02 | 2019-01-22 | QMAT, Inc. | Seed wafer for GaN thickening using gas- or liquid-phase epitaxy |
| DE102017121480B4 (de) * | 2017-09-15 | 2024-04-18 | OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung | Lichtemittierendes Halbleiterbauteil |
| CN110768106B (zh) * | 2018-07-26 | 2021-01-26 | 山东华光光电子股份有限公司 | 一种激光二极管制备方法 |
| US10867815B2 (en) * | 2018-09-04 | 2020-12-15 | Tokyo Electron Limited | Photonically tuned etchant reactivity for wet etching |
| JP7056511B2 (ja) * | 2018-10-25 | 2022-04-19 | 住友電気工業株式会社 | 面発光レーザの製造方法 |
| CN110010461A (zh) * | 2019-04-11 | 2019-07-12 | 中国科学院半导体研究所 | 氮化物材料的湿法腐蚀方法 |
| CN110797259B (zh) * | 2019-10-23 | 2022-03-29 | 中国电子科技集团公司第十三研究所 | 同质外延氮化镓衬底处理方法及氮化镓衬底 |
| TWI741911B (zh) * | 2020-12-16 | 2021-10-01 | 環球晶圓股份有限公司 | 磊晶層去除方法 |
| CN113231386A (zh) * | 2021-04-20 | 2021-08-10 | 南京纳科半导体有限公司 | 去除氮化镓表面污染物的方法及氮化镓基材 |
| CN120048798B (zh) * | 2025-04-24 | 2025-08-12 | 合肥晶合集成电路股份有限公司 | 一种半导体结构的制备方法及其半导体结构 |
Family Cites Families (23)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5508829A (en) * | 1992-12-18 | 1996-04-16 | International Business Machines Corporation | LTG AlGaAs non-linear optical material and devices fabricated therefrom |
| JP3398896B2 (ja) * | 1994-12-06 | 2003-04-21 | キヤノン販売株式会社 | ドライエッチング方法 |
| JP3649771B2 (ja) * | 1995-05-15 | 2005-05-18 | 栗田工業株式会社 | 洗浄方法 |
| JPH10233382A (ja) * | 1997-02-17 | 1998-09-02 | Hewlett Packard Co <Hp> | 半導体の表面清浄方法 |
| US6682402B1 (en) * | 1997-04-04 | 2004-01-27 | Rodel Holdings, Inc. | Polishing pads and methods relating thereto |
| US6829273B2 (en) * | 1999-07-16 | 2004-12-07 | Agilent Technologies, Inc. | Nitride semiconductor layer structure and a nitride semiconductor laser incorporating a portion of same |
| JP4145437B2 (ja) * | 1999-09-28 | 2008-09-03 | 住友電気工業株式会社 | 単結晶GaNの結晶成長方法及び単結晶GaN基板の製造方法と単結晶GaN基板 |
| JP2001244240A (ja) * | 2000-02-25 | 2001-09-07 | Speedfam Co Ltd | 半導体ウエハの製造方法 |
| US6596079B1 (en) * | 2000-03-13 | 2003-07-22 | Advanced Technology Materials, Inc. | III-V nitride substrate boule and method of making and using the same |
| JP3994640B2 (ja) * | 2000-07-24 | 2007-10-24 | 松下電器産業株式会社 | 窒化ガリウム系化合物半導体成長用基板の洗浄方法 |
| JP2002110688A (ja) * | 2000-09-29 | 2002-04-12 | Canon Inc | Soiの熱処理方法及び製造方法 |
| AU2001292110A1 (en) * | 2000-10-06 | 2002-04-15 | Aoti Operating Company, Inc. | Method to detect surface metal contamination |
| JP3889933B2 (ja) * | 2001-03-02 | 2007-03-07 | シャープ株式会社 | 半導体発光装置 |
| JP2002284600A (ja) * | 2001-03-26 | 2002-10-03 | Hitachi Cable Ltd | 窒化ガリウム結晶基板の製造方法及び窒化ガリウム結晶基板 |
| US6488767B1 (en) * | 2001-06-08 | 2002-12-03 | Advanced Technology Materials, Inc. | High surface quality GaN wafer and method of fabricating same |
| US6613143B1 (en) * | 2001-07-06 | 2003-09-02 | Technologies And Devices International, Inc. | Method for fabricating bulk GaN single crystals |
| JP3711055B2 (ja) * | 2001-09-25 | 2005-10-26 | 三洋電機株式会社 | 窒化物系半導体素子の形成方法 |
| JP3957268B2 (ja) * | 2002-01-17 | 2007-08-15 | シルトロニック・ジャパン株式会社 | 半導体基板の洗浄方法 |
| US6791120B2 (en) * | 2002-03-26 | 2004-09-14 | Sanyo Electric Co., Ltd. | Nitride-based semiconductor device and method of fabricating the same |
| US6770536B2 (en) * | 2002-10-03 | 2004-08-03 | Agere Systems Inc. | Process for semiconductor device fabrication in which a insulating layer is formed on a semiconductor substrate |
| US6786390B2 (en) * | 2003-02-04 | 2004-09-07 | United Epitaxy Company Ltd. | LED stack manufacturing method and its structure thereof |
| US7250114B2 (en) * | 2003-05-30 | 2007-07-31 | Lam Research Corporation | Methods of finishing quartz glass surfaces and components made by the methods |
| JP3929939B2 (ja) * | 2003-06-25 | 2007-06-13 | 株式会社東芝 | 処理装置、製造装置、処理方法及び電子装置の製造方法 |
-
2004
- 2004-08-06 CN CN2009101706533A patent/CN101661910B/zh not_active Expired - Lifetime
- 2004-08-06 US US10/595,523 patent/US20070018284A1/en not_active Abandoned
- 2004-08-06 CN CNB2004800317980A patent/CN100552888C/zh not_active Expired - Lifetime
- 2004-08-06 EP EP04771650A patent/EP1679740A4/en not_active Withdrawn
- 2004-08-06 WO PCT/JP2004/011683 patent/WO2005041283A1/ja not_active Ceased
- 2004-08-06 JP JP2005514909A patent/JP4479657B2/ja not_active Expired - Lifetime
- 2004-08-06 KR KR1020067007108A patent/KR20060090827A/ko not_active Ceased
- 2004-08-10 TW TW093123946A patent/TW200522187A/zh not_active IP Right Cessation
-
2012
- 2012-02-06 US US13/366,386 patent/US20120135549A1/en not_active Abandoned
Also Published As
| Publication number | Publication date |
|---|---|
| CN101661910A (zh) | 2010-03-03 |
| TWI332236B (https=) | 2010-10-21 |
| CN101661910B (zh) | 2012-07-18 |
| CN1875465A (zh) | 2006-12-06 |
| WO2005041283A1 (ja) | 2005-05-06 |
| JPWO2005041283A1 (ja) | 2007-04-26 |
| EP1679740A1 (en) | 2006-07-12 |
| HK1094279A1 (zh) | 2007-03-23 |
| US20070018284A1 (en) | 2007-01-25 |
| US20120135549A1 (en) | 2012-05-31 |
| EP1679740A4 (en) | 2009-09-02 |
| CN100552888C (zh) | 2009-10-21 |
| JP4479657B2 (ja) | 2010-06-09 |
| KR20060090827A (ko) | 2006-08-16 |
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