TW200521273A - Liquid composition, process for producing the same, film of low dielectric constant, abradant and electronic component - Google Patents
Liquid composition, process for producing the same, film of low dielectric constant, abradant and electronic component Download PDFInfo
- Publication number
- TW200521273A TW200521273A TW093131969A TW93131969A TW200521273A TW 200521273 A TW200521273 A TW 200521273A TW 093131969 A TW093131969 A TW 093131969A TW 93131969 A TW93131969 A TW 93131969A TW 200521273 A TW200521273 A TW 200521273A
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- Prior art keywords
- diamond
- film
- liquid composition
- dielectric constant
- particles
- Prior art date
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- 239000000203 mixture Substances 0.000 title claims abstract description 56
- 238000000034 method Methods 0.000 title claims description 25
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- 229910003460 diamond Inorganic materials 0.000 claims abstract description 83
- 150000001412 amines Chemical class 0.000 claims abstract description 31
- 238000004519 manufacturing process Methods 0.000 claims abstract description 3
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- 239000000126 substance Substances 0.000 claims description 31
- 239000010419 fine particle Substances 0.000 claims description 26
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims description 18
- 239000002612 dispersion medium Substances 0.000 claims description 14
- QAOWNCQODCNURD-UHFFFAOYSA-N Sulfuric acid Chemical compound OS(O)(=O)=O QAOWNCQODCNURD-UHFFFAOYSA-N 0.000 claims description 12
- 239000006185 dispersion Substances 0.000 claims description 10
- 238000011282 treatment Methods 0.000 claims description 9
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- 238000010438 heat treatment Methods 0.000 claims description 5
- 239000002609 medium Substances 0.000 claims description 3
- 238000009835 boiling Methods 0.000 claims description 2
- 239000003795 chemical substances by application Substances 0.000 claims description 2
- 239000004065 semiconductor Substances 0.000 abstract description 14
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- 230000000052 comparative effect Effects 0.000 description 6
- -1 hafnium nitride Chemical class 0.000 description 6
- 239000000463 material Substances 0.000 description 6
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- 238000004880 explosion Methods 0.000 description 2
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- 239000000843 powder Substances 0.000 description 2
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- UMJSCPRVCHMLSP-UHFFFAOYSA-N pyridine Chemical group COC1=CC=CN=C1 UMJSCPRVCHMLSP-UHFFFAOYSA-N 0.000 description 2
- 238000011160 research Methods 0.000 description 2
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- 125000005270 trialkylamine group Chemical group 0.000 description 2
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- VTIRNZBEJBPYCV-UHFFFAOYSA-N 1-hydrazinylethanol Chemical compound CC(O)NN VTIRNZBEJBPYCV-UHFFFAOYSA-N 0.000 description 1
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- BFSVOASYOCHEOV-UHFFFAOYSA-N 2-diethylaminoethanol Chemical compound CCN(CC)CCO BFSVOASYOCHEOV-UHFFFAOYSA-N 0.000 description 1
- ZNQVEEAIQZEUHB-UHFFFAOYSA-N 2-ethoxyethanol Chemical compound CCOCCO ZNQVEEAIQZEUHB-UHFFFAOYSA-N 0.000 description 1
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- 102000002151 Microfilament Proteins Human genes 0.000 description 1
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- OPKOKAMJFNKNAS-UHFFFAOYSA-N N-methylethanolamine Chemical compound CNCCO OPKOKAMJFNKNAS-UHFFFAOYSA-N 0.000 description 1
- 239000004743 Polypropylene Substances 0.000 description 1
- 239000004372 Polyvinyl alcohol Substances 0.000 description 1
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- 238000001069 Raman spectroscopy Methods 0.000 description 1
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 description 1
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- WPWCLBXYKATSMD-UHFFFAOYSA-N [2-(tert-butylcarbamoylamino)-2-oxoethyl] 3-cyclopentylpropanoate Chemical compound CC(C)(C)NC(=O)NC(=O)COC(=O)CCC1CCCC1 WPWCLBXYKATSMD-UHFFFAOYSA-N 0.000 description 1
- 230000002378 acidificating effect Effects 0.000 description 1
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- 238000007605 air drying Methods 0.000 description 1
- 150000001335 aliphatic alkanes Chemical group 0.000 description 1
- 229910052783 alkali metal Inorganic materials 0.000 description 1
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- 125000000217 alkyl group Chemical group 0.000 description 1
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 1
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- RQPZNWPYLFFXCP-UHFFFAOYSA-L barium dihydroxide Chemical compound [OH-].[OH-].[Ba+2] RQPZNWPYLFFXCP-UHFFFAOYSA-L 0.000 description 1
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- 230000015572 biosynthetic process Effects 0.000 description 1
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- NVVZQXQBYZPMLJ-UHFFFAOYSA-N formaldehyde;naphthalene-1-sulfonic acid Chemical compound O=C.C1=CC=C2C(S(=O)(=O)O)=CC=CC2=C1 NVVZQXQBYZPMLJ-UHFFFAOYSA-N 0.000 description 1
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- TWYVVGMYFLAQMU-UHFFFAOYSA-N gelgreen Chemical compound [I-].[I-].C1=C(N(C)C)C=C2[N+](CCCCCC(=O)NCCCOCCOCCOCCCNC(=O)CCCCC[N+]3=C4C=C(C=CC4=CC4=CC=C(C=C43)N(C)C)N(C)C)=C(C=C(C=C3)N(C)C)C3=CC2=C1 TWYVVGMYFLAQMU-UHFFFAOYSA-N 0.000 description 1
- 229910052735 hafnium Inorganic materials 0.000 description 1
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- 125000000959 isobutyl group Chemical group [H]C([H])([H])C([H])(C([H])([H])[H])C([H])([H])* 0.000 description 1
- 239000003350 kerosene Substances 0.000 description 1
- 229910052743 krypton Inorganic materials 0.000 description 1
- DNNSSWSSYDEUBZ-UHFFFAOYSA-N krypton atom Chemical compound [Kr] DNNSSWSSYDEUBZ-UHFFFAOYSA-N 0.000 description 1
- 238000003475 lamination Methods 0.000 description 1
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Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1454—Abrasive powders, suspensions and pastes for polishing
- C09K3/1463—Aqueous liquid suspensions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1409—Abrasive particles per se
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02104—Forming layers
- H01L21/02107—Forming insulating materials on a substrate
- H01L21/02109—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates
- H01L21/02112—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer
- H01L21/02115—Forming insulating materials on a substrate characterised by the type of layer, e.g. type of material, porous/non-porous, pre-cursors, mixtures or laminates characterised by the material of the layer the material being carbon, e.g. alpha-C, diamond or hydrogen doped carbon
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
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Description
200521273 九、發明說明: 【考务明戶斤屬4支彳街Ά員】 發明所屬之技術領域 本發明係有關於-種使鑽石微粒子分散之液狀組成 物,與作為絕緣膜之由鑽石微粒子所構成之多孔結構低介 電率薄膜,及具有純介電率薄觀高韻度、高速動作 型半導體積體電路元件等電子零件。 L先前技術3 背景技術 10 於半導體積體電路元件中,特別是超LSI裝置中,隨著 配線之微細化、高積體化,通過裳置中所製作之配線之信 號的延遲會產生使消耗電力降低之問題,且亦成為重大課 題。特別是在高速邏輯裝置中,因配線之電阻或分布電容 所造成之RC延遲成為最大的問題,其中,為了縮小分布電 15容,配線間之絕緣材料必須使用低介電率之材料。 以往’半導體積體電路内之絕緣膜係使用二氧化石夕膜 ⑸〇2)、氧化组膜(Ta2〇5)、氧化_(Al2〇3)、氮化㈣(Si3N4) 等’特別是多層配線間之絕緣材料係'使用或研究氮化石夕 膜、添加有機物或氟之二氧化矽膜以作為低介電率膜。又, 2〇用以更進一步低介電率化之絕緣膜係研究氣樹脂、業已培 燒發泡性有機二氧化石夕膜之二氧化石夕膜、堆積有二氧化石夕 微粒子之多孔二氧化矽膜等。 在此,下表列舉因低介電率而週知之材料 材料名 介電常數 二氧化矽(電漿CVD法) 4.2〜5.〇 200521273 加氣-—氧*化 鑽石 多孔二氧化石夕 多孔鑽石 聚醯亞胺 聚四氟乙烯 空氣 如前所述 3.7 5.68 1.5 〜2·5 2·1 〜2·72 3.0 〜3·5 1.9 1.0 為了 :Γ"化 陰電性度高之_種元素所構成,因Γ 為低介電率膜時會不足,故研究利用 具有充分之二 10 序中於空氣中之要切祕為程 時會杈化且仍舊無法使用。 -方面,由_石之導熱度或機械強度優於其他材 /士 ’因此’在频度高且發歸多之半導體裝置中,近年 來破研究作為適於放熱之材料使用,例如,於日本專利公 開公報特開平6—97671號公報巾揭示n由麟法、離子電 鑛法、叢㈣子束料賴法成膜厚度5_之鑽石膜。又, 特開平9-263488號公報中揭示—種於基板上散佈鑽石微 粒子且以此為核並藉由CVD(化學蒸鍍堆積)法來供給破以 使鑽石結晶成長之成膜法。 如特開2002— 110870號公報中業已揭示,發明人玎藉 由夕孔結構之鑽石微粒子膜而得到介電常數2 72。又,於 200521273 特開平2002 — 289604號公報中揭示藉由六氯二矽氧烷處理 使鑽石微粒子間交聯鍵結並強化之方法,且顯示藉由該處 理亦可得到同等之介電常數。再者,發明人在學會中發表 可藉由精製鑽石微粒子而得到介電常數21者(第5〇回應用 5物理學關係聯合演說會要旨集N0.2,pl9^2()()3))。 【智^明内溶1】 發明之揭示 如前所述,發明人雖可得到具有充分介電常數與強度 之低介電率膜’然而,若進-步研究,則雖然塗布於基板 10前之鑽石微粒子水性液狀組成物之濃度為固定,然而膠體 狀態卻不安定,且若長時間放置,則會凝谬化成膠綠或 產生沈澱或層分離,因此無法得到多孔結構安定之厚度之 ,。於特開平9 —25⑽號公報中雖未涉及該膠體狀態之不 安疋度’但s兄明了藉由以硫酸或確酸等進行精製處理而得 15到親水性鑽石微粒子者係由於在粒子表面生成羥基之故, 且揭示了分散介質為水或醇。然而,發明人在鑽石微粒子 水性液狀組成物中添加乙醇時黏度雖然降低,但卻無法解 決凝膠化現象。 由於原本利用爆炸法所製造之鑽石微粒子粗原料含有 2〇雜質之非晶性碳或石墨,因此發明人藉由濃硫酸或濃确酸 氧化精製來除去雜質。發明人於該研究過程中發現,處理 後即使充分水洗後pH亦顯示2.0至4.5之酸性,且若藉由濃硝 酸、确酸鹽、過氯酸、過氣酸鹽、過氧化氫、濃硫酸等精 製劑處理鑽石微粒子,則於其表面不僅生成羥基,且亦生 200521273 成叛基’ X,若藉由濃硫酸進行處理,則除此之外更會生 成續基。 5 低 毛明人务現右於由鑽石微粒子與水性分散介質所 構成之液狀組成物中添加胺性物f,則黏度會劇列地降 ,且即使放置數《不會凝膠化、沈澱及層分離而可持 續安定之膠體狀態並完成本發明。 10 步前進 、依據本毛明,由於含有胺性物質之鑽石微粒子液狀組 成物不會產生凝膠化及沈❹可維持安定之低黏度同時 亦可進彳了管輸送,且塗衫置可_财料者,因此, 可朝具有低介電率膜之半導體積體電路元件等之工業化大 又本魚明含有胺性物質之鑽石微粒子液狀組成物可 使用作為半導體晶圓之表面研磨用等工業用研磨材,特別 是除了使鑽石微粒子分散之液狀研磨劑外,尚可應用在與 15黏結劑一同塗布於強力紙或基布之研磨紙、研磨布、固定 為磨料狀之研磨零件等。 圖式簡單說明 第1圖係顯示本發明之鑽石微粒子液狀組成物與比較 例之鑽石微粒子液狀組成物之黏度—旋轉數之關係圖。 20 帛2圖係顯示本發明之液狀組成物之分散相粒子徑分 布圖。 弟3圖係顯示本發明其他實施例之液狀組成物之分散 相粒子徑分布圖。 200521273 發明之較佳實施形態 本發明所使用之胺性物質係只要是顯示提昇氧化精製 粗鑽石後之酸性分散液之pH的作用且對分散介質為可溶性 之物質則無特殊之限制。 5 纟半導體元件用之絕緣_成用途中使驗狀組成物 時,宜使用胺性物質,若由污染物之觀點來看,則不宜為 金屬氫氧化物。另-方面,於研磨材用途中使用液狀組成 物時,亦以胺性物質為佳。 胺性物質係具有胺結構之有機、無機化合物,且可列 10舉如·氨、單烧基胺、三烧基胺、三燒基胺、N—單烧基胺 基乙醇、NH基胺基乙醇、苯胺、n—單苯胺、 N,N—一烷基苯胺、嗎福啉、N—烷基嗎福啉(前述烷基為 。〜心2)、一元(烷基取代苯基)胺、二笨基胺、三苯基胺、 苄胺、N—單烷基爷胺、N,N 一二烷基窄胺、N~烧基二苯 15基胺、三苯基胺、咄啶、烷基取代咄啶、單乙醇胺、二乙 醇胺、三乙醇胺、四烷基氫氧化銨。 胺性物質具有揮發性時,可藉由加熱處理使其揮散, 且由於亦不會殘留於絕緣膜,因此不會造成不良影響。 於前述胺性物質中,宜為沸點50°C以上、30(TC以下, 較為理想的是贼以上、·。〇以下之胺。此係由於與鑽石 微粒子表面之羧基、磺基成鹽之胺性物質宜為於室溫下不 會自液狀組成物揮散,且成膜後可藉由加熱使其與分散介 質一同揮散者之故。 液狀組成物中胺性物質之添加量雖然依照鑽石微粒子 200521273 之粒子徑及胺性物質之種類而有所不同,然而,相對於鑽 石微粒子100重量份,係以丨重量份以上為佳,尤以2重量份 以上為佳。又,胺性物質之添加量宜為200重量份以下,且 以50重量份以下為佳。又,具體揭示於實施例。 5 分散液中鑽石微粒子之量在分散液全體構成100重量 %時宜為1重量%以上,且以2重量%以上為佳。又,分散液 中鑽石微粒子之量在分散液全體構成100重量%時宜為50 重量%以下,且以2〇重量%以下為佳。 本發明之鑽石微粒子液狀組成物可單獨使用選自於由 10水、甲醇、乙醇、n(或is0卜丙醇、η(或is〇、sec或是㈣ —丁醇、丙_、苯、甲苯、〇(或/及m、P)-二甲苯、己烧、 每己烧、汽油、煤油、曱基溶纖劑、乙基溶纖劑、丁基溶 纖劑、一甲基甲醯胺、二甲基乙醯胺、二甲基亞礙等所構 成之群中之至少1種或者混合數種來使用以作為分散介 B質’其中,為了使其與鑽石微粒子表面之魏基、石黃基進行 離子反應’故最為理想的是水、水溶性分散介質及水與水 溶性分散介質之混合物。水溶性分散介質可列舉如:甲醇、 乙醇、異丙醇、二甲基甲醯胺、二甲基亞颯等親水性有機 刀月欠”貝另方面,於本發明中,若在前述胺性物質中 2〇選擇特疋物質添加於鑽石微粒子,則會構成親油性且亦可 良好地分散於有機系分散介質中。 鑽石微粒子可於其精製程序前或/及後,或/及鑽石膠體 作成A刀放於夂粒子,該分散方法可使用高速搜掉器、 球磨機、妙磨機、滾珠研磨機等公知裝置。又,分散劑可 200521273 ^用A知之陰離子系界面活性劑、非離子系界面活性劑、 口牙’肖/包劑’當然,亦可使用本發明所使用之鹼性物質, 然而,缚膜化而作為電子材料利用時,宜使用未含有金屬 離子之物質。 5 η丨,鑽石微粒子分散於一次粒子時,宜藉由酸處理(即便 =里)精製未精製鑽石,然後藉*前述公知裝置添加本發 用之驗性物質並使其分散,再藉由酸處理進行精 ^右使错由該順序所得到之鑽石微粒子分散於分散介 液、可得至j粒子控小且非常安定地分散之鑽石膠體溶 二,’有時亦於精製鑽石微粒子後進行—次乾燥,此時 二燥方法可為-般之加熱乾燥,_,為了防止微粒子 ^結’宜為於常溫之風乾法或冷;東乾燥法。&,亦可不 "王乾燥並止於—定濃度之她而送往下-程序。
15 20 物,本發明之鑽石微粒子液狀組成物係藉由前述趣 :之添加而降低黏度’因此,為了依照用途之㈣ 調Γ故亦可調整•餘子濃度,且亦可添加增斜 纖二=材在水性分散介質中可使用聚乙二醇、㈣ 素、來丙烯醯胺、聚乙烯醇、 共聚物水解物、異丁烯一 :順丁烯1 在_介質中則可使用聚苯二㈣:水解物負 酸軒共聚物、異丁浠—順丁埽二^、本乙稀—順丁対 等,其中宜為聚乙-醇,且二共聚物、聚丙烯_ 1〇00萬者。 %騎使用其分子量範圍為20,
於本發明中,由於黏度安定 且可得到任意黏度 ’因此
A 12 200521273 液狀組成物之塗布裝置可使用财型式,例如可使用旋轉 塗布裝置、噴霧塗布裝置、棒狀塗布器、刀塗布器、喷墨 塗布裝置等。X ’由於不會凝膠化,因此亦可進行液狀組 成物之管輸送。 5 用於本發明之原料鑽石微粒子在利用電子顯微鏡攝影 之測定中為-次粒子徑―㈣啦之固體粒子,且以2励 至20nm之粒子為佳。又 鑽石純度宜精製為95%以上,且 10 亦可少量含有雜質之石墨或非晶性碳。 般而。此種奈米單位之微粒子係即使分散為膠體 液狀亦不#分散於-諫子,且會形成凝料數百⑽至數 千nm之分散相。於本發明中,在前述驗性物質,特別是胺
15 性物質存在下,藉由公知球磨機或滾珠研磨機之分散 操作可使鑽石从粒子分散相之數千⑽之平均粒子徑降低 至數nm至數十nm,且帶來賴安定性。_是在藉由含有 硫酸之處理使鑽石餘子表面生《基時其效果顯著。 20 别述本發明之鑽石微粒子液狀組成物可塗布於基板上 以製k具有空隙之鑽石微粒子低介電率膜。空隙率宜為 40%至7G%。塗布後,該膜亦可藉由六氯^^氧烧等來強 化又4 了提昇電特性,該低介電率膜亦可藉由鎖鹽等 水洛液進彳了翁,錢在鑽^微粒絲社減或續基不 溶化。
,由於本發明之鑽石微粒子财有空隙,因此當然其表 面粗糙,所以可進行表面緻密化,故,可使用s〇G(旋塗式 玻璃)法、SG(矽玻璃)膜法、BpsG(硼磷矽玻璃)膜法、電漿 13 200521273 C VD法等公知方法。 本發明包含有具前述鑽石微粒子低介電率膜之半導體 積體電路元件。即,可將前述液狀組成物塗布於業已描繪 電路之單晶矽基板、導電膜或業已描繪電路之玻璃基板^ 5形成絕緣膜,並利用公知方法以所期望之處理製造高積體 度、高速動作型半導體積體電路元件等電子零件。此外, 亦可為具有本發明之低介電率膜之一般半導體元件、微型 機械或電容器等電子零件。 又,亦可朝要求作為半導體晶圓之表面研磨用等工業 1〇用液狀研磨劑安定之黏度特性之用途開展。又,於工業用 研磨劑中既可使用胺性物質,亦可使用即使殘留亦不構成 問題之苛性鈉、苛性鉀、氫氧化鋰等鹼金屬或氫氧化鈣、 氫氧化鋇等鹼土類金屬等之鹼性物質。前述金屬氫氧化物 不具揮發性,因此,若使本發明之液狀組成物之塗膜或成 15形物乾燥,則分散介質會揮發,然而,除了研磨材之主成 分(鑽石粒子)外,尚有金屬氫氧化物殘留於研磨材中。當 然,鹼性物質僅使用揮發性胺性物質時,研磨材上大致不 會殘留驗性物質。又,為了使用在公知CMP法(化學機械磨 光)本务明之液狀組成物或研磨材亦可含有草酸等研磨促 20 進劑。 實施例 以下揭示本發明之實施例,然而本發明並不僅限於實 施例。 、 (實施例1) 200521273 <原料鑽石之精製> 將〇.6g藉由爆炸法製造之市售叢集鑽石(電子顯微鏡法 平均粒子徑:5nm,拉曼譜法測定:鑽石80%、石墨6%、 一 非晶性碳約10%、碳單鍵成分4%)與55〇11之10%濃確酸一濃 5硫酸一同放入石英製燒瓶,且以300至310°C煮沸2小時。冷 卻至室溫後,加入大量之水並進行離心分離,且反覆接著 的傾析並精製至pH大於3為止,同時將其冷凍真空乾燥以作 成精製鑽石微粒子。測定其純度時,鑽石為96 5%、石琛 15%、非晶性碳約〇%、碳單鍵成分2.5%。 暴 10 <液狀組成物之調製> 與水一同注入石英製燒杯以構成精製鑽石微粒子5重 里%,且添加聚乙二醇600以構成丨重量%,又,將該燒杯浸 潰於超音波水槽以2小時充分分散,得到黏稠之分二夜^ 又’於其中添加G.1重量%之二甲基胺基乙醇並充分授掉, 15且稭由_黏度計(東京計器製,^和,使旋轉數自啊 上昇至lOOrpm來測定黏度時,如第丨圖之三角記號線所示, 至1.5mPa · sec且大致固定。反之,一面從高旋轉數下 ❿ F+面測定時,黏度同為該線而沒有改變,且即使放置 月’亦仍然為低黏度之狀態。X,可藉由市售嘴墨印刷機(精 , 20工·愛普生(七〇 ·工力 >)公司製,MJ - 1〇_2型) 塗布該低黏度液狀組成物。另,胺性物質之量相對於鑽石 粒子100重量份為2.0重量份。 (比較例1) 藉由E型黏度計(東京計器製,25〇r),改變旋轉數來 15 200521273 測定添加前述二甲基胺基乙醇前之液狀組成物之黏度時, 如第1圖之菱形線所示,在0.5rpm時為3〇〇mpa · sec之高黏 度’在20rpm時為15mPa · sec,在l〇〇rpm時降低為811^ · sec。其次,若反過來降低旋轉數,則如第丨圖之白圓形線 5所示,越是低旋轉數則黏度愈高,且顯示出比先前更低之 黏度。於室溫下靜置該液狀組成物2日時,雖然會凝膠化為 瓊脂狀,但若劇烈搖動容器則又開始流動。 (實施例2) 於石英製燒杯中分別準備〇·6重量%之二曱基胺基乙醇 10水溶液,且以構成實施例1所得到之精製鑽石微粒子濃度為 10重來加入精製鐵石微粒子,並於超音波水槽中浸潰2 小犄,使精製鑽石微粒子分散於水溶液中並得到膠體液, 且將該膠體液放置數日。該液狀組成物並未凝膠化,且亦 沒有產生層分離或沈澱而均一地分散。另,胺性物質之量 15相對於鑽石粒子100重量份為6重量份。 (實施例3) 於實施例2中,使用2.0重量%之胺基乙醇水溶液以取代 0.6重量%之二甲基胺基乙醇水溶液,且作成膠體液並放 置。該膠體液並未凝膠化,且亦沒有產生層分離、沈殿而 20均一地分散。胺性物質之量相對於鑽石粒子100重量份為20 重量份。 (實施例4) 於球磨機(Ine Shokai C〇, Ltd)之容器中加入2.27g之實 施例1所得到之精製鑽石微粒子(石墨含有率12%)、2514g ]6 200521273 之純水、0.25g之二乙基胺基乙醇與39 75g之氧化錯球,並 使其刀政72小日$。所使用之球為直徑〇 5mm。分散後之鑽 石微粒子液狀組成物為黑色液體,且其分散相之平均粒徑
為78.4nm(以大緣電子股份有限公司製之雷射z電位計ELS 5 -8_測絲子徑),且可得到完全不會產生凝膠化、沈殿 及層刀離之安定液狀組成物。該液狀組成物可藉由市售喷 墨印刷機(精卫·愛普生公司製,MI-1GGGV2型)塗布。另: 胺性物質之量相對於鑽石粒子1〇〇重量份為_量份。
(實施例5) 10 於實施例4中,加入2.69g之市售粗鑽石粉末(石墨含有 率7.〇%)以取代精製鑽石、29.43g之純水、〇.26g之二乙基胺 基乙醇與39.89g之氧化錯球,並使其分散72小時。分散後 之鑽石微粒子龍液可得到完全不會產生凝膠化、沈殿及 15 層分離之钱分舰,且其綠歡平均粒料344nm(前 述測定器)°胺性物質之量相對於鑽石粒子1G G重量份為9 · 7 重量份。
(實施例6) 於貫施例1中,在相對於液狀組成物添加1%之分子量 50萬之聚乙二醇以取代聚乙二醇_時,黏度係與旋轉數無 20關為l〇mPa· sec且大致固定,又,藉由旋轉塗布機以測啊 旋轉速度來塗布,且乾雜於·。C下使用熱盤H、時進行 培燒,然後,於常溫下進行六氯二石夕氧燒蒸氣處理,且於 300°C下使用熱盤H、時進行焙燒。塗布膜具有干涉色,又, 膜厚為510nm且大致均一,介電常數為2 5。 17 200521273 (實施例7) 除了原料使用直徑1〜3μιη之鑽石微粒子粉末外,構成 與實施例1相同,進行氧化精製處理、精製、水洗後,得到 ρΗ3·5之分散液並乾燥。藉由球磨機充分混合該精製鑽石微 5粒子1重量份、黏結劑之苯紛樹脂1重量份與溶劑之甲基異 丁基酮10重量份,得到鑽石微粒子液狀組成物。接著,藉 由棒狀塗布器將該液狀組成物以濕塗布厚度8 〇卜m塗布於 綿基布上,並以80°C加熱乾燥且使樹脂交聯。塗布有所得 到之鑽石微粒子膜狀物之基布作為玻璃或金屬表面精加工 10 用研磨布是有用的。 (實施例8) 與0.05mm氧化锆製滾珠一同注入滾珠研磨機(事吹(〕 卜7、、年)技研製),以構成實施例i之方法所精製之鑽石微粒 子為5重量%、二甲基胺基乙醇為〇·5重量%,且進行75分鐘 15撕碎處理。第3圖顯示滾珠研磨機處理前(虛線)及處理後(實 線)之粒子徑分布。藉由該處理凝結且峰值為27〇〇nm之鑽石 微粒子被撕碎成接近電子顯微鏡觀察之一次粒子徑的峰值 7nm之粒子徑。 (比較例2) ⑨含有5重量%之實施例1之方法所精製的鑽石微粒子 且業經超音波分散之灰色液狀組成物卜相對於前述組成 物,添加5重量%之市售非離子系界面活性劑(艾曼(工 歹/)120,花王(股)製)且充分攪拌混合。與實施例1相同地 /貝J疋4、,且成物之黏度舉動時,在〇5叩m時為⑹ 18 200521273 在20rPm時為 10mPa . sec ’ 在 100rpm時為5mpa . sec,雖然 黏度低於比較例1,但搖變之黏度舉動並未改變,且若放置 數曰,則會凝膠化為瓊脂狀,且無法構成安定之膠體液。 (比較例3) 5 與水一同注入裝有直徑2mm之氧化錘製球之球磨機, 以構成實施例1之原料鑽石微粒子為58重量%、陰離子界面 活性劑(MX-2045L:萘磺酸甲醛縮合物銨鹽,花王(股)製) 為1.23重量%,且進行48小時撕碎處理。取出所得到之該液 狀混合物並放置3曰肖,會大量產生沈殿物且分離為二層, 10同時無法得到安定之膠體狀液狀組成物。 產業上之可利用性 本發明可得到在工業上極為重要且低黏度而具有安定 黏度之鑽石微粒子液狀組成物,且可利用各種塗布裝置塗 布而形成均一之鑽石微粒子膜。該膜係耐熱性及導熱性優 15異之無機質低介電率膜,且介電常數可實現2·5之極低值。 藉此,則不僅可製造多層配線半導體元件或半導體電容 器,亦可製造高性能電容器等高性能電子零件,又,或者, 液狀組成物亦可塗布於基布等而作為研磨材來利用。 【圖式簡單說^明】 2〇 帛1圖係顯示本發明之鑽石微粒子液狀組成物與比較 例之鑽石微粒子液狀組成物之黏度一旋轉數之關係圖。 第2圖係顯示本發明之液狀組成物之分散相粒子徑分 布圖。 第3圖係顯示本發明其他實施例之液狀組成物之分散 19 200521273 相粒子徑分布圖。 【主要元件符號說明】(無)
20
Claims (1)
- 200521273 十、申請專利範圍: 1·種液狀組成物,係至少含有鑽石微粒子、分散介質及 胺性物質者。 、 2. 如申請專利範圍第!項之液狀組成物,其中前述胺性物 質之沸點為50°C以上、3〇(rc以下。 3. 如申請專利顚第以2奴綠組賴,其巾前述分散 介質係水、水雜分散介質或水與水雜分散介質之混 合物。 10 15 4. -種低介電率膜,係塗布如申請專利範圍第⑴項中任 一項之液狀組成物而得且由鑽石微粒子所構成者。 5. -種電子零件,係具有作為絕賴之如中料利範 4項之低介電率膜者。 6· —種研磨材,係得自如申請專利範圍第丨至3項中任一工 之液狀組成物且含有鑽石微粒子者。 員 7· -種鑽石微粒子_組成物之製造方法,係於 劑之溶液巾將粗鑽;5·子進行加熱處理後 月、 胺性物質存在下進行分散處理者。 並於 前述精製劑包含有8·如申請專利範圍第7項之方法,其中 硫酸。 21
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-
2004
- 2004-10-21 US US10/576,976 patent/US20070107317A1/en not_active Abandoned
- 2004-10-21 WO PCT/JP2004/015973 patent/WO2005038897A1/ja active Application Filing
- 2004-10-21 KR KR1020067007609A patent/KR100771074B1/ko not_active IP Right Cessation
- 2004-10-21 TW TW093131969A patent/TW200521273A/zh not_active IP Right Cessation
- 2004-10-21 DE DE112004002023T patent/DE112004002023B8/de not_active Expired - Fee Related
- 2004-10-21 JP JP2005514898A patent/JP4384638B2/ja not_active Expired - Fee Related
- 2004-10-21 CN CN2004800311895A patent/CN1871697B/zh not_active Expired - Fee Related
- 2004-10-21 DE DE112004003055T patent/DE112004003055B4/de not_active Expired - Fee Related
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2009
- 2009-07-17 US US12/458,634 patent/US20090283013A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
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KR100771074B1 (ko) | 2007-10-29 |
CN1871697B (zh) | 2010-12-01 |
JP4384638B2 (ja) | 2009-12-16 |
US20090283013A1 (en) | 2009-11-19 |
JPWO2005038897A1 (ja) | 2007-02-01 |
KR20060107742A (ko) | 2006-10-16 |
DE112004002023B8 (de) | 2010-12-02 |
DE112004002023T5 (de) | 2006-08-24 |
WO2005038897A1 (ja) | 2005-04-28 |
CN1871697A (zh) | 2006-11-29 |
US20070107317A1 (en) | 2007-05-17 |
TWI378159B (zh) | 2012-12-01 |
DE112004002023B4 (de) | 2010-07-15 |
DE112004003055B4 (de) | 2012-08-30 |
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