SG118241A1 - Inspection coaxial probe and inspection unit incorporating the same - Google Patents

Inspection coaxial probe and inspection unit incorporating the same

Info

Publication number
SG118241A1
SG118241A1 SG200402187A SG200402187A SG118241A1 SG 118241 A1 SG118241 A1 SG 118241A1 SG 200402187 A SG200402187 A SG 200402187A SG 200402187 A SG200402187 A SG 200402187A SG 118241 A1 SG118241 A1 SG 118241A1
Authority
SG
Singapore
Prior art keywords
inspection
same
unit incorporating
coaxial probe
inspection unit
Prior art date
Application number
SG200402187A
Other languages
English (en)
Inventor
Yoshida Takuto
Sato Atsushi
Fukushima Yasuo
Noguchi Masaki
Original Assignee
Yokowo Seisakusho Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Yokowo Seisakusho Kk filed Critical Yokowo Seisakusho Kk
Publication of SG118241A1 publication Critical patent/SG118241A1/en

Links

Classifications

    • E—FIXED CONSTRUCTIONS
    • E02—HYDRAULIC ENGINEERING; FOUNDATIONS; SOIL SHIFTING
    • E02B—HYDRAULIC ENGINEERING
    • E02B3/00—Engineering works in connection with control or use of streams, rivers, coasts, or other marine sites; Sealings or joints for engineering works in general
    • E02B3/04—Structures or apparatus for, or methods of, protecting banks, coasts, or harbours
    • E02B3/12—Revetment of banks, dams, watercourses, or the like, e.g. the sea-floor
    • E02B3/14—Preformed blocks or slabs for forming essentially continuous surfaces; Arrangements thereof
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06772—High frequency probes
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/06711—Probe needles; Cantilever beams; "Bump" contacts; Replaceable probe pins
    • G01R1/06716—Elastic
    • G01R1/06722—Spring-loaded
    • C—CHEMISTRY; METALLURGY
    • C02—TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
    • C02F—TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
    • C02F1/00—Treatment of water, waste water, or sewage
    • C02F1/28—Treatment of water, waste water, or sewage by sorption
    • C02F1/283—Treatment of water, waste water, or sewage by sorption using coal, charred products, or inorganic mixtures containing them
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0441—Details
    • G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
    • G01R1/0433—Sockets for IC's or transistors
    • G01R1/0483—Sockets for un-leaded IC's having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Ocean & Marine Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Civil Engineering (AREA)
  • Structural Engineering (AREA)
  • Measuring Leads Or Probes (AREA)
  • Tests Of Electronic Circuits (AREA)
SG200402187A 2003-04-25 2004-04-22 Inspection coaxial probe and inspection unit incorporating the same SG118241A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003121574A JP2004325306A (ja) 2003-04-25 2003-04-25 検査用同軸プローブおよびそれを用いた検査ユニット

Publications (1)

Publication Number Publication Date
SG118241A1 true SG118241A1 (en) 2006-01-27

Family

ID=32959695

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200402187A SG118241A1 (en) 2003-04-25 2004-04-22 Inspection coaxial probe and inspection unit incorporating the same

Country Status (5)

Country Link
US (1) US7456645B2 (ko)
EP (1) EP1471358A3 (ko)
JP (1) JP2004325306A (ko)
KR (1) KR100638694B1 (ko)
SG (1) SG118241A1 (ko)

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JP6837283B2 (ja) * 2016-02-29 2021-03-03 株式会社ヨコオ ソケット
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US11221348B2 (en) 2017-05-26 2022-01-11 Smiths Interconnect Americas, Inc. Impedance controlled test socket
US11495901B2 (en) * 2017-09-08 2022-11-08 Enplas Corporation Electric connection socket connecting a circuit board and an integrated circuit package
KR101954086B1 (ko) * 2017-11-07 2019-03-06 리노공업주식회사 검사 프로브 조립체 및 검사 소켓
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CN111316112B (zh) * 2017-11-30 2022-08-09 恩普乐股份有限公司 电连接用插座
CN108802596A (zh) * 2018-05-07 2018-11-13 北京中微普业科技有限公司 一种大功率芯片测试装置及其测试方法
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JP2020020664A (ja) * 2018-07-31 2020-02-06 東京特殊電線株式会社 半導体デバイスの検査治具
JP2020020661A (ja) * 2018-07-31 2020-02-06 東京特殊電線株式会社 半導体デバイスの検査治具
KR102103746B1 (ko) * 2018-11-12 2020-04-23 주식회사 오킨스전자 고주파(ｒｆ) 반도체 기기의 테스트 소켓
JP7206140B2 (ja) * 2019-03-22 2023-01-17 株式会社ヨコオ 検査装置
TWI679424B (zh) * 2019-03-29 2019-12-11 矽品精密工業股份有限公司 檢測裝置及其製法
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CN110726918B (zh) * 2019-09-25 2022-04-05 苏州韬盛电子科技有限公司 阻抗匹配结构的半导体芯片测试同轴插座及其制备方法
KR102455150B1 (ko) * 2020-02-10 2022-10-18 주식회사 아이에스시 피검사 디바이스 검사용 테스트 소켓
WO2021162314A1 (ko) * 2020-02-10 2021-08-19 주식회사 아이에스시 피검사 디바이스 검사용 테스트 소켓
KR102321112B1 (ko) * 2020-05-22 2021-11-04 리노공업주식회사 검사소켓의 제조방법
KR102570428B1 (ko) * 2020-05-22 2023-08-25 리노공업주식회사 검사소켓 및 그의 제조방법
CN112230025A (zh) * 2020-11-05 2021-01-15 东莞中探探针有限公司 一种射频测试针及射频测试设备
KR102315536B1 (ko) 2021-08-31 2021-10-21 하병호 검사소켓 및 그 제조방법

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Also Published As

Publication number Publication date
JP2004325306A (ja) 2004-11-18
EP1471358A2 (en) 2004-10-27
US7456645B2 (en) 2008-11-25
KR20040093023A (ko) 2004-11-04
EP1471358A3 (en) 2012-11-07
KR100638694B1 (ko) 2006-10-30
US20040212381A1 (en) 2004-10-28

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