SG11202001663XA - Method and apparatus for cleaning semiconductor wafer - Google Patents

Method and apparatus for cleaning semiconductor wafer

Info

Publication number
SG11202001663XA
SG11202001663XA SG11202001663XA SG11202001663XA SG11202001663XA SG 11202001663X A SG11202001663X A SG 11202001663XA SG 11202001663X A SG11202001663X A SG 11202001663XA SG 11202001663X A SG11202001663X A SG 11202001663XA SG 11202001663X A SG11202001663X A SG 11202001663XA
Authority
SG
Singapore
Prior art keywords
semiconductor wafer
cleaning semiconductor
cleaning
wafer
semiconductor
Prior art date
Application number
SG11202001663XA
Other languages
English (en)
Inventor
Hui Wang
Xi Wang
Fuping Chen
Original Assignee
Acm Res Shanghai Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Acm Res Shanghai Inc filed Critical Acm Res Shanghai Inc
Publication of SG11202001663XA publication Critical patent/SG11202001663XA/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02041Cleaning
    • H01L21/02057Cleaning during device manufacture
    • H01L21/0206Cleaning during device manufacture during, before or after processing of insulating layers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67017Apparatus for fluid treatment
    • H01L21/67028Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
    • H01L21/6704Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
    • H01L21/67057Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing with the semiconductor substrates being dipped in baths or vessels
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/04Cleaning involving contact with liquid
    • B08B3/048Overflow-type cleaning, e.g. tanks in which the liquid flows over the tank in which the articles are placed
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/04Cleaning involving contact with liquid
    • B08B3/10Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration
    • B08B3/12Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration by sonic or ultrasonic vibrations
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02041Cleaning
    • H01L21/02101Cleaning only involving supercritical fluids
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/67005Apparatus not specifically provided for elsewhere
    • H01L21/67011Apparatus for manufacture or treatment
    • H01L21/67155Apparatus for manufacturing or treating in a plurality of work-stations
    • H01L21/6719Apparatus for manufacturing or treating in a plurality of work-stations characterized by the construction of the processing chambers, e.g. modular processing chambers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67754Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber horizontal transfer of a batch of workpieces
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/677Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
    • H01L21/67739Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
    • H01L21/67757Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber vertical transfer of a batch of workpieces
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/683Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping
    • H01L21/687Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches
    • H01L21/68707Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for supporting or gripping using mechanical means, e.g. chucks, clamps or pinches the wafers being placed on a robot blade, or gripped by a gripper for conveyance
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B2240/00Type of materials or objects being cleaned
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/67Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
    • H01L21/673Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere using specially adapted carriers or holders; Fixing the workpieces on such carriers or holders
SG11202001663XA 2017-09-08 2017-09-08 Method and apparatus for cleaning semiconductor wafer SG11202001663XA (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/CN2017/100983 WO2019047140A1 (en) 2017-09-08 2017-09-08 METHOD AND APPARATUS FOR CLEANING A SEMICONDUCTOR WAFER

Publications (1)

Publication Number Publication Date
SG11202001663XA true SG11202001663XA (en) 2020-03-30

Family

ID=65634707

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11202001663XA SG11202001663XA (en) 2017-09-08 2017-09-08 Method and apparatus for cleaning semiconductor wafer

Country Status (6)

Country Link
US (2) US11335550B2 (ja)
JP (1) JP7055467B2 (ja)
KR (1) KR102414340B1 (ja)
CN (1) CN111095512B (ja)
SG (1) SG11202001663XA (ja)
WO (1) WO2019047140A1 (ja)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP3840024B1 (en) 2019-12-20 2022-02-16 Semsysco GmbH Module for chemically processing a substrate
US20210407824A1 (en) * 2020-06-30 2021-12-30 Applied Materials, Inc. Spm processing of substrates
JP2022138907A (ja) * 2021-03-11 2022-09-26 キオクシア株式会社 基板洗浄装置および基板洗浄方法
CN113695308B (zh) * 2021-07-20 2023-01-13 山东力冠微电子装备有限公司 一种半导体晶圆前处理系统
EP4300556A1 (de) * 2022-06-27 2024-01-03 Siltronic AG Abdeckung für ein reinigungsmodul zum reinigen einer halbleiterscheibe und verfahren zum reinigen einer halbleiterscheibe in einer reinigungsstrasse
CN117457571B (zh) * 2023-11-16 2024-04-19 江苏星辉半导体有限公司 一种半导体电器元件晶圆加工酸洗装置

Family Cites Families (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5271871A (en) * 1975-12-11 1977-06-15 Nec Corp Washing apparatus
JPS587830A (ja) * 1981-07-08 1983-01-17 Hitachi Ltd 薄片状物品の洗浄方法及び装置
US4736758A (en) 1985-04-15 1988-04-12 Wacom Co., Ltd. Vapor drying apparatus
JPH04151828A (ja) * 1990-10-16 1992-05-25 Nippon Steel Corp 薬液雰囲気分離装置
JP3559099B2 (ja) * 1995-06-09 2004-08-25 大日本スクリーン製造株式会社 基板処理装置
DE69732392T8 (de) * 1996-06-24 2006-04-27 Interuniversitair Microelectronica Centrum Vzw Vorrichtung und Verfahren zur Nassreinigung oder zum Ätzen eines flachen Substrats
US6138694A (en) * 1998-03-06 2000-10-31 Scp Global Technologies Multiple stage wet processing platform and method of use
JP2001291698A (ja) * 2000-04-10 2001-10-19 Nec Corp 処理装置および処理方法
JP4565718B2 (ja) * 2000-09-11 2010-10-20 アプリシアテクノロジー株式会社 ウエハ洗浄装置
JP2003077882A (ja) * 2001-08-31 2003-03-14 Shimada Phys & Chem Ind Co Ltd 洗浄乾燥装置
JP2003203856A (ja) * 2001-10-23 2003-07-18 Ums:Kk 有機被膜の除去方法
US6845779B2 (en) * 2001-11-13 2005-01-25 Fsi International, Inc. Edge gripping device for handling a set of semiconductor wafers in an immersion processing system
US6808589B2 (en) * 2002-06-14 2004-10-26 Taiwan Semiconductor Manufacturing Co. Ltd Wafer transfer robot having wafer blades equipped with sensors
US7584760B2 (en) * 2002-09-13 2009-09-08 Dainippon Screen Mfg. Co., Ltd. Substrate processing apparatus
TWI601199B (zh) * 2002-11-15 2017-10-01 荏原製作所股份有限公司 基板處理裝置及基板處理方法
US7934513B2 (en) * 2003-10-08 2011-05-03 Semes Co., Ltd. Facility with multi-storied process chamber for cleaning substrates and method for cleaning substrates using the facility
JP2006114884A (ja) * 2004-09-17 2006-04-27 Ebara Corp 基板洗浄処理装置及び基板処理ユニット
US20060201532A1 (en) * 2005-03-14 2006-09-14 Applied Materials, Inc. Semiconductor substrate cleaning system
JP4954728B2 (ja) * 2007-01-26 2012-06-20 東京エレクトロン株式会社 ゲートバルブの洗浄方法及び基板処理システム
US20090320875A1 (en) * 2008-06-25 2009-12-31 Applied Materials, Inc. Dual chamber megasonic cleaner
US9595457B2 (en) * 2008-12-12 2017-03-14 Acm Research (Shanghai) Inc. Methods and apparatus for cleaning semiconductor wafers
CN101722158B (zh) * 2009-12-03 2011-09-07 北京有色金属研究总院 一种用于槽式清洗机的补液方法
JP2011230097A (ja) * 2010-04-30 2011-11-17 Yokogawa Denshikiki Co Ltd 洗浄装置
JP5562189B2 (ja) * 2010-09-22 2014-07-30 東京エレクトロン株式会社 基板処理装置
JP5890198B2 (ja) * 2011-03-25 2016-03-22 株式会社Screenホールディングス 基板処理装置及び基板処理方法
WO2012147658A1 (ja) * 2011-04-25 2012-11-01 株式会社ニコン 基板処理装置
JP5829458B2 (ja) * 2011-08-25 2015-12-09 株式会社Screenホールディングス 基板処理装置
JP5792094B2 (ja) * 2012-02-24 2015-10-07 東京エレクトロン株式会社 液処理装置、液処理方法および液処理方法を実行するためのコンピュータプログラムが記録された記録媒体
CN202655283U (zh) * 2012-04-23 2013-01-09 江苏爱多光伏科技有限公司 一种多级循环清洗设备
CN104813438B (zh) * 2012-11-28 2017-07-25 盛美半导体设备(上海)有限公司 半导体硅片的清洗方法和装置
TWI630652B (zh) * 2014-03-17 2018-07-21 斯克林集團公司 基板處理裝置及使用基板處理裝置之基板處理方法
TWI604522B (zh) * 2014-05-16 2017-11-01 Acm Res (Shanghai) Inc Semiconductor wafer cleaning method and device
US9829249B2 (en) * 2015-03-10 2017-11-28 Mei, Llc Wafer dryer apparatus and method
CN204996772U (zh) * 2015-06-29 2016-01-27 上海华力微电子有限公司 一种兆声波槽
TWM515418U (zh) * 2015-07-27 2016-01-11 盟立自動化股份有限公司 用來清洗平板構件之槽體
JP6456792B2 (ja) * 2015-08-07 2019-01-23 東京エレクトロン株式会社 基板液処理装置、基板液処理方法及び記憶媒体
US11037805B2 (en) * 2018-11-23 2021-06-15 Nanya Technology Corporation Wafer cleaning apparatus and method of cleaning wafer

Also Published As

Publication number Publication date
CN111095512B (zh) 2024-01-26
JP2020533789A (ja) 2020-11-19
CN111095512A (zh) 2020-05-01
US20220246420A1 (en) 2022-08-04
US11335550B2 (en) 2022-05-17
WO2019047140A1 (en) 2019-03-14
JP7055467B2 (ja) 2022-04-18
US11955328B2 (en) 2024-04-09
KR20200047597A (ko) 2020-05-07
KR102414340B1 (ko) 2022-06-29
US20210166933A1 (en) 2021-06-03

Similar Documents

Publication Publication Date Title
SG11201702033VA (en) Apparatus and method for cleaning semiconductor wafer
SG11201708695PA (en) Pre-alignment device and method for wafer
SG11202001663XA (en) Method and apparatus for cleaning semiconductor wafer
EP3298622A4 (en) METHODS AND APPARATUS FOR CLEANING SEMICONDUCTOR WAFERS
SG11201802520YA (en) Wafer inspection method and wafer inspection device
SG11201808637XA (en) Methods and apparatus for cleaning semiconductor wafers
SG11201802518XA (en) Wafer inspection device and wafer inspection method
SG10201905294RA (en) Wafer processing method
SG10201904699RA (en) Wafer processing method
SG11201909787SA (en) Method for polishing silicon wafer
SG10201605035VA (en) Wafer drying apparatus and wafer drying method
SG11202011718XA (en) Apparatus and method for cleaning semiconductor wafers
SG11201807140QA (en) Method for cleaning semiconductor wafer
SG10201707070RA (en) Substrate cleaning apparatus and substrate cleaning method
SG11202010143VA (en) Semiconductor wafer mass metrology apparatus and semiconductor wafer mass metrology method
SG10201905935VA (en) Wafer processing method
SG11201702213YA (en) Polishing apparatus and wafer polishing method
SG10201911116YA (en) Wafer processing method
EP3521845A4 (en) SEMICONDUCTOR DEVICE INSPECTION METHOD AND SEMICONDUCTOR DEVICE INSPECTION DEVICE
SG10201909522RA (en) Wafer processing method
SG10201906678TA (en) Wafer processing method
SG10201905936RA (en) Wafer processing method
SG10201904719TA (en) Wafer processing method
FI3715933T3 (fi) Kiekontarkastusmenetelmä ja kiekko
SG11201910867VA (en) Method and apparatus for wafer level packaging