SG11201807050SA - Method for polishing silicon substrate and polishing composition set - Google Patents
Method for polishing silicon substrate and polishing composition setInfo
- Publication number
- SG11201807050SA SG11201807050SA SG11201807050SA SG11201807050SA SG11201807050SA SG 11201807050S A SG11201807050S A SG 11201807050SA SG 11201807050S A SG11201807050S A SG 11201807050SA SG 11201807050S A SG11201807050S A SG 11201807050SA SG 11201807050S A SG11201807050S A SG 11201807050SA
- Authority
- SG
- Singapore
- Prior art keywords
- polishing
- silicon substrate
- stock
- final
- sub
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/07—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
- B24B37/08—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for double side lapping
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B57/00—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents
- B24B57/02—Devices for feeding, applying, grading or recovering grinding, polishing or lapping agents for feeding of fluid, sprayed, pulverised, or liquefied grinding, polishing or lapping agents
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1454—Abrasive powders, suspensions and pastes for polishing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02002—Preparing wafers
- H01L21/02005—Preparing bulk and homogeneous wafers
- H01L21/02008—Multistep processes
- H01L21/0201—Specific process step
- H01L21/02013—Grinding, lapping
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02002—Preparing wafers
- H01L21/02005—Preparing bulk and homogeneous wafers
- H01L21/02008—Multistep processes
- H01L21/0201—Specific process step
- H01L21/02024—Mirror polishing
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02043—Cleaning before device manufacture, i.e. Begin-Of-Line process
- H01L21/02052—Wet cleaning only
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2016037247A JP6377656B2 (ja) | 2016-02-29 | 2016-02-29 | シリコン基板の研磨方法および研磨用組成物セット |
PCT/JP2017/005139 WO2017150157A1 (fr) | 2016-02-29 | 2017-02-13 | Procédé permettant de polir un substrat de silicium et ensemble de composition de polissage |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11201807050SA true SG11201807050SA (en) | 2018-09-27 |
Family
ID=59743844
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11201807050SA SG11201807050SA (en) | 2016-02-29 | 2017-02-13 | Method for polishing silicon substrate and polishing composition set |
Country Status (8)
Country | Link |
---|---|
US (1) | US11648641B2 (fr) |
EP (1) | EP3425658B1 (fr) |
JP (1) | JP6377656B2 (fr) |
KR (1) | KR102612276B1 (fr) |
CN (1) | CN108966673B (fr) |
SG (1) | SG11201807050SA (fr) |
TW (1) | TWI797076B (fr) |
WO (1) | WO2017150157A1 (fr) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP3950877A4 (fr) * | 2019-03-27 | 2022-04-27 | Fujimi Incorporated | Procédé de polissage d'un objet à polir comprenant un matériau ayant une liaison silicium-silicium |
WO2020255581A1 (fr) * | 2019-06-20 | 2020-12-24 | 富士フイルム株式会社 | Liquide de polissage, et procédé de polissage chimique et mécanique |
CN110922897B (zh) * | 2019-11-18 | 2024-03-08 | 宁波日晟新材料有限公司 | 一种用于硅化合物的低雾值无损伤抛光液及其制备方法 |
CN115697629A (zh) * | 2020-05-27 | 2023-02-03 | 福吉米株式会社 | 研磨方法和抛光用组合物套组 |
Family Cites Families (25)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5860848A (en) | 1995-06-01 | 1999-01-19 | Rodel, Inc. | Polishing silicon wafers with improved polishing slurries |
JP3219142B2 (ja) * | 1997-12-17 | 2001-10-15 | 信越半導体株式会社 | 半導体シリコンウエーハ研磨用研磨剤及び研磨方法 |
JPH11214338A (ja) * | 1998-01-20 | 1999-08-06 | Memc Kk | シリコンウェハーの研磨方法 |
US6431959B1 (en) * | 1999-12-20 | 2002-08-13 | Lam Research Corporation | System and method of defect optimization for chemical mechanical planarization of polysilicon |
US20020004265A1 (en) * | 2000-03-17 | 2002-01-10 | Krishna Vepa | Grind polish cluster and methods to remove visual grind pattern |
WO2001070457A1 (fr) * | 2000-03-17 | 2001-09-27 | Wafer Solutions, Inc | Bloc a polir par meulage et polissage de substrats sur les deux faces |
EP1261020A4 (fr) * | 2000-10-26 | 2005-01-19 | Shinetsu Handotai Kk | Procede de production de plaquettes, appareil de polissage et plaquette |
JP2003297775A (ja) * | 2002-04-03 | 2003-10-17 | Komatsu Electronic Metals Co Ltd | 鏡面半導体ウェーハの製造方法および半導体ウェーハ用研磨スラリ |
JP2004165424A (ja) * | 2002-11-13 | 2004-06-10 | Ekc Technology Inc | 研磨剤組成物とそれによる研磨方法 |
JP4467241B2 (ja) * | 2003-01-28 | 2010-05-26 | 信越半導体株式会社 | 半導体ウエーハの製造方法 |
EP1610365B1 (fr) | 2003-03-18 | 2012-08-08 | Nomura Micro Science Co., Ltd. | Materiau de purification d'une suspension de purification de semi-conducteurs, module de purification d'une suspension de purification de semi-conducteurs et procede de fabrication d'une suspension de purification de semi-conducteurs |
JP2005268665A (ja) * | 2004-03-19 | 2005-09-29 | Fujimi Inc | 研磨用組成物 |
JP2006135059A (ja) * | 2004-11-05 | 2006-05-25 | Renesas Technology Corp | 半導体装置の製造方法 |
CN100353518C (zh) * | 2004-12-08 | 2007-12-05 | 上海华虹Nec电子有限公司 | 浅沟槽隔离工艺中化学机械抛光工艺窗口确定方法 |
JP4524643B2 (ja) | 2005-05-18 | 2010-08-18 | 株式会社Sumco | ウェーハ研磨方法 |
JP2007103515A (ja) | 2005-09-30 | 2007-04-19 | Fujimi Inc | 研磨方法 |
JP5219334B2 (ja) | 2005-11-30 | 2013-06-26 | 株式会社Sumco | 半導体基板の製造方法および品質評価方法 |
US20110027997A1 (en) | 2008-04-16 | 2011-02-03 | Hitachi Chemical Company, Ltd. | Polishing liquid for cmp and polishing method |
JP2010021487A (ja) * | 2008-07-14 | 2010-01-28 | Sumco Corp | 半導体ウェーハおよびその製造方法 |
US8834230B2 (en) | 2008-07-31 | 2014-09-16 | Shin-Etsu Handotai Co., Ltd. | Wafer polishing method and double-side polishing apparatus |
JP2011142284A (ja) | 2009-12-10 | 2011-07-21 | Hitachi Chem Co Ltd | Cmp研磨液、基板の研磨方法及び電子部品 |
EP2533274B1 (fr) | 2010-02-01 | 2014-07-30 | JSR Corporation | Dispersion aqueuse pour le polissage chimique-mécanique, et procédé de polissage chimique-mécanique utilisant celle-ci |
CN102339742A (zh) * | 2011-09-01 | 2012-02-01 | 上海宏力半导体制造有限公司 | 多晶硅化学机械研磨工艺的研磨垫预研磨方法 |
JP5460827B2 (ja) * | 2012-11-14 | 2014-04-02 | 株式会社フジミインコーポレーテッド | シリコンウエハの製造方法 |
DE102013218880A1 (de) | 2012-11-20 | 2014-05-22 | Siltronic Ag | Verfahren zum Polieren einer Halbleiterscheibe, umfassend das gleichzeitige Polieren einer Vorderseite und einer Rückseite einer Substratscheibe |
-
2016
- 2016-02-29 JP JP2016037247A patent/JP6377656B2/ja active Active
-
2017
- 2017-02-13 SG SG11201807050SA patent/SG11201807050SA/en unknown
- 2017-02-13 CN CN201780014069.1A patent/CN108966673B/zh active Active
- 2017-02-13 WO PCT/JP2017/005139 patent/WO2017150157A1/fr active Application Filing
- 2017-02-13 US US16/080,659 patent/US11648641B2/en active Active
- 2017-02-13 KR KR1020187019225A patent/KR102612276B1/ko active IP Right Grant
- 2017-02-13 EP EP17759628.5A patent/EP3425658B1/fr active Active
- 2017-02-23 TW TW106106214A patent/TWI797076B/zh active
Also Published As
Publication number | Publication date |
---|---|
TW201737334A (zh) | 2017-10-16 |
KR20180121481A (ko) | 2018-11-07 |
KR102612276B1 (ko) | 2023-12-12 |
CN108966673B (zh) | 2024-02-27 |
US20190022821A1 (en) | 2019-01-24 |
EP3425658B1 (fr) | 2024-04-03 |
EP3425658A4 (fr) | 2019-11-13 |
US11648641B2 (en) | 2023-05-16 |
JP6377656B2 (ja) | 2018-08-22 |
WO2017150157A1 (fr) | 2017-09-08 |
CN108966673A (zh) | 2018-12-07 |
EP3425658A1 (fr) | 2019-01-09 |
TWI797076B (zh) | 2023-04-01 |
JP2017157608A (ja) | 2017-09-07 |
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