SG11201800262YA - Defect measurement method, defect measurement device, and testing probe - Google Patents

Defect measurement method, defect measurement device, and testing probe

Info

Publication number
SG11201800262YA
SG11201800262YA SG11201800262YA SG11201800262YA SG11201800262YA SG 11201800262Y A SG11201800262Y A SG 11201800262YA SG 11201800262Y A SG11201800262Y A SG 11201800262YA SG 11201800262Y A SG11201800262Y A SG 11201800262YA SG 11201800262Y A SG11201800262Y A SG 11201800262YA
Authority
SG
Singapore
Prior art keywords
defect measurement
testing probe
measurement device
measurement method
defect
Prior art date
Application number
SG11201800262YA
Other languages
English (en)
Inventor
Toyokazu Tada
Hidehiko Suetsugu
Original Assignee
Sumitomo Chemical Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Sumitomo Chemical Co filed Critical Sumitomo Chemical Co
Publication of SG11201800262YA publication Critical patent/SG11201800262YA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9013—Arrangements for scanning
    • G01N27/902—Arrangements for scanning by moving the sensors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
SG11201800262YA 2015-07-16 2016-06-15 Defect measurement method, defect measurement device, and testing probe SG11201800262YA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2015142390A JP6579840B2 (ja) 2015-07-16 2015-07-16 欠陥測定方法、欠陥測定装置、および検査プローブ
PCT/JP2016/067808 WO2017010215A1 (ja) 2015-07-16 2016-06-15 欠陥測定方法、欠陥測定装置、および検査プローブ

Publications (1)

Publication Number Publication Date
SG11201800262YA true SG11201800262YA (en) 2018-02-27

Family

ID=57756918

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201800262YA SG11201800262YA (en) 2015-07-16 2016-06-15 Defect measurement method, defect measurement device, and testing probe

Country Status (8)

Country Link
US (1) US10539535B2 (ja)
EP (1) EP3336533B1 (ja)
JP (1) JP6579840B2 (ja)
KR (1) KR102501069B1 (ja)
CN (1) CN107850571B (ja)
SA (1) SA518390730B1 (ja)
SG (1) SG11201800262YA (ja)
WO (1) WO2017010215A1 (ja)

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KR20230154205A (ko) * 2021-03-16 2023-11-07 스미또모 가가꾸 가부시키가이샤 정보 처리 방법, 프로그램, 정보 처리 장치 및 모델 생성 방법
CN113267559B (zh) * 2021-07-06 2023-03-17 清华大学 漏磁检测装置及漏磁检测方法
CN113777154A (zh) * 2021-09-09 2021-12-10 国家石油天然气管网集团有限公司华南分公司 一种增强涡流传感器线圈灵敏度的方法
CN113777155B (zh) * 2021-09-09 2024-05-03 国家石油天然气管网集团有限公司华南分公司 一种基于Halbach阵列式线圈的涡流探头
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Also Published As

Publication number Publication date
CN107850571A (zh) 2018-03-27
CN107850571B (zh) 2021-03-30
KR102501069B1 (ko) 2023-02-20
SA518390730B1 (ar) 2021-12-06
US10539535B2 (en) 2020-01-21
WO2017010215A1 (ja) 2017-01-19
JP2017026354A (ja) 2017-02-02
KR20180030991A (ko) 2018-03-27
EP3336533A1 (en) 2018-06-20
JP6579840B2 (ja) 2019-09-25
EP3336533B1 (en) 2020-04-15
EP3336533A4 (en) 2019-03-27
US20180217097A1 (en) 2018-08-02

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