SG11201505018QA - Carrier for use in double-side polishing apparatus and method of double-side polishing wafer - Google Patents

Carrier for use in double-side polishing apparatus and method of double-side polishing wafer

Info

Publication number
SG11201505018QA
SG11201505018QA SG11201505018QA SG11201505018QA SG11201505018QA SG 11201505018Q A SG11201505018Q A SG 11201505018QA SG 11201505018Q A SG11201505018Q A SG 11201505018QA SG 11201505018Q A SG11201505018Q A SG 11201505018QA SG 11201505018Q A SG11201505018Q A SG 11201505018QA
Authority
SG
Singapore
Prior art keywords
double
side polishing
carrier
wafer
polishing apparatus
Prior art date
Application number
SG11201505018QA
Other languages
English (en)
Inventor
Masanao Sasaki
Isao Uchiyama
Original Assignee
Shinetsu Handotai Kk
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shinetsu Handotai Kk filed Critical Shinetsu Handotai Kk
Publication of SG11201505018QA publication Critical patent/SG11201505018QA/en

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/27Work carriers
    • B24B37/28Work carriers for double side lapping of plane surfaces
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/04Lapping machines or devices; Accessories designed for working plane surfaces
    • B24B37/07Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
    • B24B37/08Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for double side lapping

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
SG11201505018QA 2013-01-29 2013-12-19 Carrier for use in double-side polishing apparatus and method of double-side polishing wafer SG11201505018QA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2013014172A JP5807648B2 (ja) 2013-01-29 2013-01-29 両面研磨装置用キャリア及びウェーハの両面研磨方法
PCT/JP2013/007464 WO2014118860A1 (ja) 2013-01-29 2013-12-19 両面研磨装置用キャリア及びウェーハの両面研磨方法

Publications (1)

Publication Number Publication Date
SG11201505018QA true SG11201505018QA (en) 2015-07-30

Family

ID=51261610

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11201505018QA SG11201505018QA (en) 2013-01-29 2013-12-19 Carrier for use in double-side polishing apparatus and method of double-side polishing wafer

Country Status (8)

Country Link
US (1) US20150321311A1 (ja)
JP (1) JP5807648B2 (ja)
KR (1) KR102050750B1 (ja)
CN (1) CN104903053B (ja)
DE (1) DE112013006351T5 (ja)
SG (1) SG11201505018QA (ja)
TW (1) TWI600495B (ja)
WO (1) WO2014118860A1 (ja)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101660900B1 (ko) * 2015-01-16 2016-10-10 주식회사 엘지실트론 웨이퍼 연마 장치 및 이를 이용한 웨이퍼 연마 방법
JP6447332B2 (ja) * 2015-04-13 2019-01-09 信越半導体株式会社 両面研磨装置用のキャリアの製造方法およびウェーハの両面研磨方法
JP6281537B2 (ja) * 2015-08-07 2018-02-21 信越半導体株式会社 半導体ウェーハの製造方法
KR102577033B1 (ko) * 2016-02-16 2023-09-12 신에쯔 한도타이 가부시키가이샤 양면연마방법 및 양면연마장치
JP6443370B2 (ja) * 2016-03-18 2018-12-26 信越半導体株式会社 両面研磨装置用のキャリアの製造方法およびウェーハの両面研磨方法
JP7159898B2 (ja) * 2019-02-14 2022-10-25 株式会社Sumco ウェーハ回収装置、研磨システム、および、ウェーハ回収方法
CN112435954B (zh) * 2020-11-25 2024-01-26 西安奕斯伟材料科技股份有限公司 一种晶圆载体的处理方法和晶圆载体
CN114310654A (zh) * 2021-12-28 2022-04-12 海南钇坤智能科技有限公司 荧光陶瓷片厚度调整工艺

Family Cites Families (27)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US2787541A (en) * 1952-01-29 1957-04-02 Rem Cru Titanium Inc Titanium-base alloys
US4600449A (en) * 1984-01-19 1986-07-15 Sundstrand Data Control, Inc. Titanium alloy (15V-3Cr-3Sn-3Al) for aircraft data recorder
US4729546A (en) * 1985-12-24 1988-03-08 Ford Motor Company Titanium engine valve and method of making
US4851055A (en) * 1988-05-06 1989-07-25 The United States Of America As Represented By The Secretary Of The Air Force Method of making titanium alloy articles having distinct microstructural regions corresponding to high creep and fatigue resistance
US5263957A (en) * 1990-03-12 1993-11-23 Ultracision Inc. Ultrasonic scalpel blade and methods of application
US5350466A (en) * 1993-07-19 1994-09-27 Howmet Corporation Creep resistant titanium aluminide alloy
JP3830541B2 (ja) * 1993-09-02 2006-10-04 株式会社ルネサステクノロジ 半導体装置及びその製造方法
JP2002018707A (ja) * 2000-07-03 2002-01-22 Puroshiido:Kk ディスク研磨機のワークキャリア
EP1729920A1 (en) * 2004-03-11 2006-12-13 Memry Corporation Finishing processes for improving fatigue life of metal components
JP4116983B2 (ja) * 2004-03-31 2008-07-09 本田技研工業株式会社 チタン製バルブスプリングリテーナ
US7837812B2 (en) * 2004-05-21 2010-11-23 Ati Properties, Inc. Metastable beta-titanium alloys and methods of processing the same by direct aging
JP4698178B2 (ja) 2004-07-13 2011-06-08 スピードファム株式会社 被研磨物保持用キャリア
JP4939740B2 (ja) * 2004-10-15 2012-05-30 住友金属工業株式会社 β型チタン合金
US20080166952A1 (en) * 2005-02-25 2008-07-10 Shin-Etsu Handotai Co., Ltd Carrier For Double-Side Polishing Apparatus, Double-Side Polishing Apparatus And Double-Side Polishing Method Using The Same
KR101193406B1 (ko) * 2005-02-25 2012-10-24 신에쯔 한도타이 가부시키가이샤 양면 연마 장치용 캐리어 및 이를 이용한 양면 연마 장치,양면 연마 방법
JP2006274392A (ja) * 2005-03-30 2006-10-12 Honda Motor Co Ltd チタン合金製ボルト及び引張り強さが少なくとも800MPaであるチタン合金製ボルトの製造方法
US8337750B2 (en) * 2005-09-13 2012-12-25 Ati Properties, Inc. Titanium alloys including increased oxygen content and exhibiting improved mechanical properties
JP4904960B2 (ja) * 2006-07-18 2012-03-28 信越半導体株式会社 両面研磨装置用キャリア及びこれを用いた両面研磨装置並びに両面研磨方法
JP5130850B2 (ja) * 2006-10-26 2013-01-30 新日鐵住金株式会社 β型チタン合金
JP4605233B2 (ja) * 2008-02-27 2011-01-05 信越半導体株式会社 両面研磨装置用キャリア及びこれを用いた両面研磨装置並びに両面研磨方法
JP4858507B2 (ja) * 2008-07-31 2012-01-18 トーカロ株式会社 被研磨物保持用キャリア
JP5399759B2 (ja) * 2009-04-09 2014-01-29 株式会社神戸製鋼所 高強度で曲げ加工性並びにプレス成形性に優れたチタン合金板およびチタン合金板の製造方法
US20100326571A1 (en) * 2009-06-30 2010-12-30 General Electric Company Titanium-containing article and method for making
JP5233888B2 (ja) * 2009-07-21 2013-07-10 信越半導体株式会社 両面研磨装置用キャリアの製造方法、両面研磨装置用キャリア及びウェーハの両面研磨方法
CN201776693U (zh) * 2010-04-21 2011-03-30 云南中科鑫圆晶体材料有限公司 双面抛光机
US20120094418A1 (en) * 2010-10-18 2012-04-19 Triquint Semiconductor, Inc. Wafer Level Package and Manufacturing Method Using Photodefinable Polymer for Enclosing Acoustic Devices
US9884229B2 (en) * 2012-02-24 2018-02-06 Nippon Steel & Sumitomo Metal Corporation Titanium alloy for golf club face

Also Published As

Publication number Publication date
DE112013006351T5 (de) 2015-09-17
JP2014144503A (ja) 2014-08-14
KR102050750B1 (ko) 2019-12-02
TWI600495B (zh) 2017-10-01
WO2014118860A1 (ja) 2014-08-07
CN104903053A (zh) 2015-09-09
JP5807648B2 (ja) 2015-11-10
TW201442822A (zh) 2014-11-16
US20150321311A1 (en) 2015-11-12
KR20150111930A (ko) 2015-10-06
CN104903053B (zh) 2018-09-25

Similar Documents

Publication Publication Date Title
SG11201505594XA (en) Method of producing carrier for use in double-side polishing apparatus and method of double-side polishing wafers
SG10201405189QA (en) Polishing method and polishing apparatus
SG10201407062PA (en) Polishing apparatus and polishing method
SG11201503659QA (en) Method and apparatus for cleaning semiconductor wafer
SG11201505018QA (en) Carrier for use in double-side polishing apparatus and method of double-side polishing wafer
SG11201600812PA (en) Polishing device and polishing method
TWI563558B (en) Substrate treatment apparatus and substrate treatment method
TWI563560B (en) Substrate processing apparatus and substrate processing method
EP2988554A4 (en) METHOD AND DEVICE FOR SUPPORTING MULTIPLE CONNECTIONS IN A WIRELESS LAN
SG11201405431TA (en) Method and apparatus for manufacturing semiconductor device
EP2832496A4 (en) POLISHING DEVICE AND METHOD THEREFOR
SG11201504078TA (en) Wafer dicing apparatus and wafer dicing method
GB201302186D0 (en) Method and apparatus for use in image processing
SG11201506296VA (en) Polishing composition and method for producing polished article
PL2983864T3 (pl) Sposób i urządzenie do obróbki powierzchniowej przedmiotów obrabianych
TWI562221B (en) Substrate processing method and substrate processing apparatus
SG11201604486XA (en) Semiconductor wafer processing methods and apparatus
SG11201607115QA (en) Manufacturing method of carrier for double-side polishing apparatus,carrier for double-side polishing apparatus, and double-side polishing method
SG2014009971A (en) Method for conditioning polishing pads for the simultaneous double-side polishing of semiconductor wafers
SG10201407353UA (en) Substrate holder, polishing apparatus, polishing method, and retaining ring
SG10201401250YA (en) Method For Polishing Semiconductor Wafers By Means Of Simultaneous Double-Side Polishing
SG10201801928PA (en) Slurry, polishing-liquid set, polishing liquid, method for polishing substrate, and substrate
SG11201403886VA (en) Method of double-side polishing wafer
EP2884525A4 (en) DIAMOND SEMICONDUCTOR ELEMENT AND METHOD FOR PRODUCING THEREOF
SG10201403725TA (en) Polishing apparatus, polishing pad positioning method, and polishing pad