SG10201401250YA - Method For Polishing Semiconductor Wafers By Means Of Simultaneous Double-Side Polishing - Google Patents
Method For Polishing Semiconductor Wafers By Means Of Simultaneous Double-Side PolishingInfo
- Publication number
- SG10201401250YA SG10201401250YA SG10201401250YA SG10201401250YA SG10201401250YA SG 10201401250Y A SG10201401250Y A SG 10201401250YA SG 10201401250Y A SG10201401250Y A SG 10201401250YA SG 10201401250Y A SG10201401250Y A SG 10201401250YA SG 10201401250Y A SG10201401250Y A SG 10201401250YA
- Authority
- SG
- Singapore
- Prior art keywords
- polishing
- semiconductor wafers
- simultaneous double
- side polishing
- polishing semiconductor
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/07—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool
- B24B37/08—Lapping machines or devices; Accessories designed for working plane surfaces characterised by the movement of the work or lapping tool for double side lapping
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B53/00—Devices or means for dressing or conditioning abrasive surfaces
- B24B53/017—Devices or means for dressing, cleaning or otherwise conditioning lapping tools
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having at least one potential-jump barrier or surface barrier, e.g. PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic System or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE102013206613.9A DE102013206613B4 (en) | 2013-04-12 | 2013-04-12 | Method for polishing semiconductor wafers by means of simultaneous two-sided polishing |
Publications (1)
Publication Number | Publication Date |
---|---|
SG10201401250YA true SG10201401250YA (en) | 2014-11-27 |
Family
ID=51618384
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG10201401250YA SG10201401250YA (en) | 2013-04-12 | 2014-04-04 | Method For Polishing Semiconductor Wafers By Means Of Simultaneous Double-Side Polishing |
Country Status (7)
Country | Link |
---|---|
US (1) | US9221149B2 (en) |
JP (1) | JP5957483B2 (en) |
KR (1) | KR101604076B1 (en) |
CN (1) | CN104097134B (en) |
DE (1) | DE102013206613B4 (en) |
SG (1) | SG10201401250YA (en) |
TW (1) | TWI521587B (en) |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102013201663B4 (en) * | 2012-12-04 | 2020-04-23 | Siltronic Ag | Process for polishing a semiconductor wafer |
DE102015220090B4 (en) | 2015-01-14 | 2021-02-18 | Siltronic Ag | Method for dressing polishing cloths |
WO2016196216A1 (en) * | 2015-05-29 | 2016-12-08 | Sunedison Semiconductor Limited | Methods for processing semiconductor wafers having a polycrystalline finish |
SG11201806747QA (en) * | 2016-02-16 | 2018-09-27 | Shin Etsu Handotai Co Ltd | Double-side polishing method and double-side polishing apparatus |
JP7232763B2 (en) * | 2016-12-21 | 2023-03-03 | スリーエム イノベイティブ プロパティズ カンパニー | Pad conditioner with spacer and wafer planarization system |
CN108400081A (en) * | 2017-02-08 | 2018-08-14 | 上海新昇半导体科技有限公司 | The production method of silicon chip |
KR102561647B1 (en) * | 2018-05-28 | 2023-07-31 | 삼성전자주식회사 | Conditioner and chemical mechanical polishing apparatus including the same |
CN109551360B (en) * | 2018-12-27 | 2020-07-28 | 西安奕斯伟硅片技术有限公司 | Method and apparatus for dressing polishing pad, and double-side polishing apparatus |
JP2020171996A (en) * | 2019-04-11 | 2020-10-22 | 信越半導体株式会社 | Double-sided polishing method |
JP7308074B2 (en) * | 2019-05-14 | 2023-07-13 | 東京エレクトロン株式会社 | SUBSTRATE PROCESSING APPARATUS AND SUBSTRATE PROCESSING METHOD |
CN113561052A (en) * | 2021-07-19 | 2021-10-29 | 山西汇智博科科技发展有限公司 | Semiconductor processing grinding and polishing machine with dust removal structure and working method thereof |
CN113561051B (en) * | 2021-07-28 | 2022-04-19 | 上海申和投资有限公司 | Wafer regeneration processing device and control system |
Family Cites Families (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US5538460A (en) * | 1992-01-16 | 1996-07-23 | System Seiko Co., Ltd. | Apparatus for grinding hard disk substrates |
US5718618A (en) * | 1996-02-09 | 1998-02-17 | Wisconsin Alumni Research Foundation | Lapping and polishing method and apparatus for planarizing photoresist and metal microstructure layers |
JPH1110530A (en) * | 1997-06-25 | 1999-01-19 | Shin Etsu Handotai Co Ltd | Carrier for both-sided polishing |
US6338672B1 (en) * | 1998-12-21 | 2002-01-15 | White Hydraulics, Inc. | Dressing wheel system |
US6206765B1 (en) * | 1999-08-16 | 2001-03-27 | Komag, Incorporated | Non-rotational dresser for grinding stones |
US7201645B2 (en) * | 1999-11-22 | 2007-04-10 | Chien-Min Sung | Contoured CMP pad dresser and associated methods |
JP3791302B2 (en) * | 2000-05-31 | 2006-06-28 | 株式会社Sumco | Semiconductor wafer polishing method using a double-side polishing apparatus |
JP2002217149A (en) * | 2001-01-19 | 2002-08-02 | Shin Etsu Handotai Co Ltd | Wafer polishing apparatus and method |
US6752687B2 (en) * | 2001-04-30 | 2004-06-22 | International Business Machines Corporation | Method of polishing disks |
TWI229381B (en) * | 2003-12-11 | 2005-03-11 | Promos Technologies Inc | Chemical mechanical polishing apparatus, profile control system and conditioning method of polishing pad thereof |
JP4777727B2 (en) * | 2005-09-05 | 2011-09-21 | 不二越機械工業株式会社 | Polishing pad pasting method and polishing pad pasting jig |
JP2007069323A (en) * | 2005-09-08 | 2007-03-22 | Shinano Denki Seiren Kk | Grinding tool for adjusting surface of surface plate and surface adjusting method |
JP2007118146A (en) | 2005-10-28 | 2007-05-17 | Speedfam Co Ltd | Dresser for pad-attached surface of surface plate, and pad-attached surface dressing method |
JP4904960B2 (en) * | 2006-07-18 | 2012-03-28 | 信越半導体株式会社 | Carrier for double-side polishing apparatus, double-side polishing apparatus and double-side polishing method using the same |
WO2010128631A1 (en) | 2009-05-08 | 2010-11-11 | 株式会社Sumco | Semiconductor wafer polishing method and polishing pad shaping jig |
DE102010032501B4 (en) | 2010-07-28 | 2019-03-28 | Siltronic Ag | Method and device for dressing the working layers of a double-side sanding device |
CN102554748B (en) * | 2010-12-23 | 2014-11-05 | 中芯国际集成电路制造(北京)有限公司 | Polishing method |
DE102011003006B4 (en) | 2011-01-21 | 2013-02-07 | Siltronic Ag | A method for providing each a level working layer on each of the two working wheels of a double-sided processing device |
CN102229105A (en) * | 2011-06-28 | 2011-11-02 | 清华大学 | Chemically mechanical polishing method |
DE102013202488B4 (en) * | 2013-02-15 | 2015-01-22 | Siltronic Ag | Process for dressing polishing cloths for simultaneous two-sided polishing of semiconductor wafers |
-
2013
- 2013-04-12 DE DE102013206613.9A patent/DE102013206613B4/en active Active
-
2014
- 2014-04-04 SG SG10201401250YA patent/SG10201401250YA/en unknown
- 2014-04-10 US US14/249,377 patent/US9221149B2/en active Active
- 2014-04-11 JP JP2014081743A patent/JP5957483B2/en active Active
- 2014-04-11 TW TW103113377A patent/TWI521587B/en active
- 2014-04-11 CN CN201410144265.9A patent/CN104097134B/en active Active
- 2014-04-11 KR KR1020140043591A patent/KR101604076B1/en active IP Right Grant
Also Published As
Publication number | Publication date |
---|---|
TWI521587B (en) | 2016-02-11 |
US20140308878A1 (en) | 2014-10-16 |
DE102013206613A1 (en) | 2014-10-16 |
KR20140123442A (en) | 2014-10-22 |
DE102013206613B4 (en) | 2018-03-08 |
JP5957483B2 (en) | 2016-07-27 |
TW201440135A (en) | 2014-10-16 |
CN104097134B (en) | 2017-05-17 |
CN104097134A (en) | 2014-10-15 |
US9221149B2 (en) | 2015-12-29 |
JP2014207450A (en) | 2014-10-30 |
KR101604076B1 (en) | 2016-03-16 |
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