KR970067681A - 세정방법 및 세정장치 - Google Patents
세정방법 및 세정장치 Download PDFInfo
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- KR970067681A KR970067681A KR1019970010567A KR19970010567A KR970067681A KR 970067681 A KR970067681 A KR 970067681A KR 1019970010567 A KR1019970010567 A KR 1019970010567A KR 19970010567 A KR19970010567 A KR 19970010567A KR 970067681 A KR970067681 A KR 970067681A
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- Prior art keywords
- water
- washing
- alkaline
- acidic
- washing water
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- 238000004140 cleaning Methods 0.000 title claims abstract description 11
- 238000000034 method Methods 0.000 title claims 8
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 claims abstract 40
- 238000005406 washing Methods 0.000 claims abstract 36
- UFHFLCQGNIYNRP-UHFFFAOYSA-N Hydrogen Chemical compound [H][H] UFHFLCQGNIYNRP-UHFFFAOYSA-N 0.000 claims abstract 11
- CBENFWSGALASAD-UHFFFAOYSA-N Ozone Chemical compound [O-][O+]=O CBENFWSGALASAD-UHFFFAOYSA-N 0.000 claims abstract 11
- 230000002378 acidificating effect Effects 0.000 claims abstract 8
- 239000012670 alkaline solution Substances 0.000 claims abstract 8
- 239000001257 hydrogen Substances 0.000 claims abstract 7
- 229910052739 hydrogen Inorganic materials 0.000 claims abstract 7
- 230000001590 oxidative effect Effects 0.000 claims abstract 7
- 239000003929 acidic solution Substances 0.000 claims abstract 6
- 238000005868 electrolysis reaction Methods 0.000 claims description 2
- 239000002253 acid Substances 0.000 claims 3
- 239000007789 gas Substances 0.000 claims 3
- 239000000243 solution Substances 0.000 claims 2
- 239000000203 mixture Substances 0.000 claims 1
- 239000000758 substrate Substances 0.000 abstract 3
- 239000004973 liquid crystal related substance Substances 0.000 abstract 1
- 238000004519 manufacturing process Methods 0.000 abstract 1
- 229910021642 ultra pure water Inorganic materials 0.000 abstract 1
- 239000012498 ultrapure water Substances 0.000 abstract 1
- 239000003643 water by type Substances 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 2
Classifications
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/302—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to change their surface-physical characteristics or shape, e.g. etching, polishing, cutting
- H01L21/304—Mechanical treatment, e.g. grinding, polishing, cutting
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67057—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing with the semiconductor substrates being dipped in baths or vessels
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- B—PERFORMING OPERATIONS; TRANSPORTING
- B01—PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
- B01F—MIXING, e.g. DISSOLVING, EMULSIFYING OR DISPERSING
- B01F23/00—Mixing according to the phases to be mixed, e.g. dispersing or emulsifying
- B01F23/20—Mixing gases with liquids
- B01F23/29—Mixing systems, i.e. flow charts or diagrams
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- C—CHEMISTRY; METALLURGY
- C02—TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
- C02F—TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
- C02F1/00—Treatment of water, waste water, or sewage
- C02F1/46—Treatment of water, waste water, or sewage by electrochemical methods
- C02F1/461—Treatment of water, waste water, or sewage by electrochemical methods by electrolysis
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- C—CHEMISTRY; METALLURGY
- C02—TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
- C02F—TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
- C02F1/00—Treatment of water, waste water, or sewage
- C02F1/70—Treatment of water, waste water, or sewage by reduction
-
- C—CHEMISTRY; METALLURGY
- C02—TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
- C02F—TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
- C02F1/00—Treatment of water, waste water, or sewage
- C02F1/72—Treatment of water, waste water, or sewage by oxidation
- C02F1/78—Treatment of water, waste water, or sewage by oxidation with ozone
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D3/00—Other compounding ingredients of detergent compositions covered in group C11D1/00
- C11D3/0005—Other compounding ingredients characterised by their effect
- C11D3/0042—Reducing agents
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- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D3/00—Other compounding ingredients of detergent compositions covered in group C11D1/00
- C11D3/39—Organic or inorganic per-compounds
- C11D3/3947—Liquid compositions
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
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- C—CHEMISTRY; METALLURGY
- C02—TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
- C02F—TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
- C02F1/00—Treatment of water, waste water, or sewage
- C02F1/008—Control or steering systems not provided for elsewhere in subclass C02F
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- C—CHEMISTRY; METALLURGY
- C02—TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
- C02F—TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
- C02F1/00—Treatment of water, waste water, or sewage
- C02F1/30—Treatment of water, waste water, or sewage by irradiation
- C02F1/32—Treatment of water, waste water, or sewage by irradiation with ultraviolet light
-
- C—CHEMISTRY; METALLURGY
- C02—TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
- C02F—TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
- C02F2201/00—Apparatus for treatment of water, waste water or sewage
- C02F2201/78—Details relating to ozone treatment devices
- C02F2201/782—Ozone generators
-
- C—CHEMISTRY; METALLURGY
- C02—TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
- C02F—TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
- C02F2209/00—Controlling or monitoring parameters in water treatment
- C02F2209/04—Oxidation reduction potential [ORP]
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- C—CHEMISTRY; METALLURGY
- C02—TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
- C02F—TREATMENT OF WATER, WASTE WATER, SEWAGE, OR SLUDGE
- C02F2209/00—Controlling or monitoring parameters in water treatment
- C02F2209/06—Controlling or monitoring parameters in water treatment pH
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D2111/00—Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
- C11D2111/10—Objects to be cleaned
- C11D2111/14—Hard surfaces
- C11D2111/22—Electronic devices, e.g. PCBs or semiconductors
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- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/1333—Constructional arrangements; Manufacturing methods
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S134/00—Cleaning and liquid contact with solids
- Y10S134/902—Semiconductor wafer
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- Chemical & Material Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Hydrology & Water Resources (AREA)
- Water Supply & Treatment (AREA)
- Environmental & Geological Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Power Engineering (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Wood Science & Technology (AREA)
- Electrochemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Inorganic Chemistry (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Detergent Compositions (AREA)
- Cleaning By Liquid Or Steam (AREA)
Abstract
액정기판이나 IC 등 전자 부품의 웨트세정에 있어서, 산성이나 알칼리성의 용액에 의한 기판의 세정으로는, 기판에 데미지를 준다. 또, 초순수는 세정력이 약하고, 기판 표면의 부착물이 제거되기 어려웠다.
오존수와 산성 용액 또는 알칼리성 용액을 혼합하여, 산화력이 있고 동시에 산성인 세정수① 또는, 산화력이 있고 동시에 알칼리성인 세정수③을 생성한다. 또, 수소수와 산성 용액 또는 알칼리성 용액을 혼합하여 환원력이 있고 동시에 알칼리성인 세정수② 혹은, 환원력이 있고 동시에 산성인 세정수④를 생성한다. 이들의 세정수는 세정력이 높고, ORP나 pH를 각각 조절할 수 있다. 따라서, 피세정물의 제조공정에 따른 부착물의 종류에 대응하여 세정수를 선택할 수 있고, 1개의 세정수로 복수종의 부착물을 세정할 수 있다.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1a도는 본 발명에서 세정장치의 전체구조를 나타내는 장치 구성도이고, 도1b는 세정장치에 사용되고 있는 전기분해장치의 구성도이다.
Claims (10)
- 산화력이 있고 동시에 알칼리성인 세정수로 피세정물을 세정하는 것을 특징으로 하는 세정방법.
- 제1항에 있어서, 상기 산화력이 있고 동시에 알칼리성인 세정수가, 오존수와 알칼리성 용액이 혼합된 것인 것을 특징으로 하는 세정방법.
- 환원력이 있고 동시에 산성인 세정수로 피세정물을 세정하는 것을 특징으로 하는 세정방법.
- 제3항에 있어서, 상기 환원력이 있고 동시에 산성인 세정수가 수소수와 산성용액이 혼합된 것인 것을 특징으로 하는 세정방법.
- 오존수와 산성 용액을 혼합하여 산화력이 있고 동시에 산성인 세정수를 생성하고, 이 세정수로 피세정물을 세정하는 것을 특징으로 하는 세정방법.
- 수소수와 알칼리성을 용액을 혼합하여 환원력이 있고 동시에 알칼리성인 세정수를 생성하고, 이 세정수로 페세정물을 세정하는 것을 특징으로 하는 세정방법.
- 오존수가 또는 수소가스인 어느 한쪽을 선택하여 순수에 용해하여 오존수 또는 수소수를 생성하고, 상기 오존수에 산성 용액 또는 알칼리성 용액의 어느 한쪽을 선택하여 혼합하는 것에 의하여 2종의 세정수의 어느것을 생성하고, 또는 상기 수소수에 산성용액 또는 알칼리성 용액의 어느 한 쪽을 선택하여 혼합하는 것에 의하여 2종의 세정수의 어느 것을 선택하여 생성하고, 상기 4종 세정수의 어느 것을 사용하여 피세정물을 세정하는 것을 특징으로 하는 세정방법.
- 산화력이 있고 동시에 산성인 세정수, 환원력이 있고 동시에 알칼리성인 세정수, 산화력이 있고 동시에 알칼리성인 세정수, 환원력이 있고 동시에 산성인 세정수 중 어느것을 선택하여 생성하는 세정수의 생성부와, 상기 생성부에서 생성된 어느 것의 세정수가 선택되어 공급되는 세정실을 가지는 것을 특징으로 하는 세정장치.
- 제8항에 있어서, 상기 세정수의 생성부는, 오존가스를 발생시키는 장치 및 수소가스를 발생시키는 장치와, 상기 오존가스 또는 수소가스의 어느 것을 순수에 용해시켜 오존수 또는 수소수를 생성하는 혼합장치와, 상기 오존수 또는 수소수에, 산용 용액 또는 알칼리성 용액의 어느 한 쪽을 혼합시키는 혼합장치를 가지고 있는 것을 특징으로 하는 세정장치.
- 제9항에 있어서, 오존가스와 수소가스는, 모두 공통의 전기분해장치로부터 얻어지는 것을 특징으로 하는 세정장치.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP07217596A JP3590470B2 (ja) | 1996-03-27 | 1996-03-27 | 洗浄水生成方法および洗浄方法ならびに洗浄水生成装置および洗浄装置 |
JP8-72175 | 1996-03-27 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR970067681A true KR970067681A (ko) | 1997-10-13 |
KR100242271B1 KR100242271B1 (ko) | 2000-02-01 |
Family
ID=13481638
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019970010567A KR100242271B1 (ko) | 1996-03-27 | 1997-03-26 | 세정방법 및 세정장치 |
Country Status (4)
Country | Link |
---|---|
US (2) | US6039815A (ko) |
JP (1) | JP3590470B2 (ko) |
KR (1) | KR100242271B1 (ko) |
CN (3) | CN100413606C (ko) |
Families Citing this family (69)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO1998008248A1 (fr) * | 1996-08-20 | 1998-02-26 | Organo Corporation | Procede et dispositif pour laver des composants electroniques ou similaires |
JP3296405B2 (ja) * | 1996-08-20 | 2002-07-02 | オルガノ株式会社 | 電子部品部材類の洗浄方法及び洗浄装置 |
US6007406A (en) | 1997-12-04 | 1999-12-28 | Micron Technology, Inc. | Polishing systems, methods of polishing substrates, and method of preparing liquids for semiconductor fabrication process |
US6849153B2 (en) * | 1998-04-16 | 2005-02-01 | Siemens Aktiengesellschaft | Removal of post-rie polymer on A1/CU metal line |
JP2000117208A (ja) * | 1998-10-13 | 2000-04-25 | Kurita Water Ind Ltd | 電子材料の洗浄方法 |
US20050229946A1 (en) * | 1998-11-12 | 2005-10-20 | Dainippon Screen Mfg. Co., Ltd. | Substrate treating method and apparatus |
US20010001392A1 (en) * | 1998-11-12 | 2001-05-24 | Dainippon Screen Mfg. Co., Ltd. | Substrate treating method and apparatus |
JP4005249B2 (ja) * | 1999-01-12 | 2007-11-07 | 株式会社 ユニップ | ガラス基板の表面処理方法 |
JP4484980B2 (ja) * | 1999-05-20 | 2010-06-16 | 株式会社ルネサステクノロジ | フォトマスクの洗浄方法、洗浄装置およびフォトマスクの洗浄液 |
JP3557601B2 (ja) * | 1999-07-15 | 2004-08-25 | 東京エレクトロン株式会社 | 洗浄・乾燥処理装置及びその方法 |
US6743301B2 (en) | 1999-12-24 | 2004-06-01 | mFSI Ltd. | Substrate treatment process and apparatus |
KR100342376B1 (ko) * | 2000-03-21 | 2002-07-02 | 송재필 | 모포세척용 화공약품 자동공급장치 |
JP2001312817A (ja) * | 2000-04-26 | 2001-11-09 | Fuji Electric Co Ltd | 磁気記録媒体用ガラス基板の洗浄方法、該洗浄方法により洗浄された磁気記録媒体用ガラス基板、および該基板を使用した磁気記録媒体 |
JP2002009035A (ja) * | 2000-06-26 | 2002-01-11 | Toshiba Corp | 基板洗浄方法及び基板洗浄装置 |
JP3908443B2 (ja) | 2000-06-30 | 2007-04-25 | 株式会社東芝 | 基板処理方法 |
KR100712980B1 (ko) * | 2000-10-19 | 2007-05-02 | 주식회사 하이닉스반도체 | 화학 기계적 연마 세정방법 |
US20020121286A1 (en) * | 2001-01-04 | 2002-09-05 | Applied Materials, Inc. | Rinsing solution and rinsing and drying methods for the prevention of watermark formation on a surface |
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-
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- 1997-03-26 KR KR1019970010567A patent/KR100242271B1/ko not_active IP Right Cessation
- 1997-03-26 US US08/829,701 patent/US6039815A/en not_active Expired - Lifetime
- 1997-03-27 CN CNB021028222A patent/CN100413606C/zh not_active Expired - Lifetime
- 1997-03-27 CN CNB971019592A patent/CN1148267C/zh not_active Expired - Lifetime
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Also Published As
Publication number | Publication date |
---|---|
CN1636640A (zh) | 2005-07-13 |
CN1494955A (zh) | 2004-05-12 |
CN100413606C (zh) | 2008-08-27 |
CN1636640B (zh) | 2012-06-06 |
JP3590470B2 (ja) | 2004-11-17 |
JPH09255998A (ja) | 1997-09-30 |
US6039815A (en) | 2000-03-21 |
KR100242271B1 (ko) | 2000-02-01 |
CN1148267C (zh) | 2004-05-05 |
US5983909A (en) | 1999-11-16 |
CN1163802A (zh) | 1997-11-05 |
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