KR970002339A - 소오스 측에 부하를 가진 파워 반도체 소자의 부하 전류 검출 회로 - Google Patents
소오스 측에 부하를 가진 파워 반도체 소자의 부하 전류 검출 회로 Download PDFInfo
- Publication number
- KR970002339A KR970002339A KR1019960019929A KR19960019929A KR970002339A KR 970002339 A KR970002339 A KR 970002339A KR 1019960019929 A KR1019960019929 A KR 1019960019929A KR 19960019929 A KR19960019929 A KR 19960019929A KR 970002339 A KR970002339 A KR 970002339A
- Authority
- KR
- South Korea
- Prior art keywords
- load current
- power semiconductor
- semiconductor device
- detection circuit
- current detection
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05F—SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES
- G05F3/00—Non-retroactive systems for regulating electric variables by using an uncontrolled element, or an uncontrolled combination of elements, such element or such combination having self-regulating properties
- G05F3/02—Regulating voltage or current
- G05F3/08—Regulating voltage or current wherein the variable is dc
- G05F3/10—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics
- G05F3/16—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices
- G05F3/20—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations
- G05F3/24—Regulating voltage or current wherein the variable is dc using uncontrolled devices with non-linear characteristics being semiconductor devices using diode- transistor combinations wherein the transistors are of the field-effect type only
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/20—Modifications of basic electric elements for use in electric measuring instruments; Structural combinations of such elements with such instruments
- G01R1/203—Resistors used for electric measuring, e.g. decade resistors standards, resistors for comparators, series resistors, shunts
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
- G01R19/0092—Arrangements for measuring currents or voltages or for indicating presence or sign thereof measuring current only
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
- H03K17/14—Modifications for compensating variations of physical values, e.g. of temperature
- H03K17/145—Modifications for compensating variations of physical values, e.g. of temperature in field-effect transistor switches
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03K—PULSE TECHNIQUE
- H03K2217/00—Indexing scheme related to electronic switching or gating, i.e. not by contact-making or -breaking covered by H03K17/00
- H03K2217/0027—Measuring means of, e.g. currents through or voltages across the switch
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- General Physics & Mathematics (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Nonlinear Science (AREA)
- Electromagnetism (AREA)
- Radar, Positioning & Navigation (AREA)
- Automation & Control Theory (AREA)
- Amplifiers (AREA)
- Measurement Of Current Or Voltage (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Control Of Voltage And Current In General (AREA)
Abstract
"Sense"-FET의 공지된 원리를 기초로, 측정 출력과, 접지에 접속된 측정 저항(5) 사이에 제어가능한 저항(6)이 접속된다. 그것의 저항값은 항상 파워 FET(1)와 "Sense"-FET(2)의 드레인 소오스 전압이 동일하도록 조절된다. 따라서, 측정 전류가 부하의 크기와 무관하게 부하 전류에 비례하게 된다.
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 회로의 기본 구성을 나타낸 회로도, 제2도는 확장된 회로의 회로도.
Claims (7)
- -전계 효과에 의해 제어가능한 또 다른 반도체소자가 제공되며, -두 반도체소자의 드레인 단자 및 게이트 단자가 서로 접속되고 -부하 전류의 일부가 또 다른 반도체소자를 통해 흐르며, -또 다른 반도체소자에 저항이 직렬 접속되고, 이 저항에서 부하전류에 비례하는 전압이 탭되도록 구성된, 전계 효과에 의해 제어가능한 파워 반도체 소자의 부하전류를 검출하기 위한 회로에 있어서, 저항(5)이 한편으로는 고정 전위에 접속된 단자에 접속되며 다른 한편으로는 제어가능한 저항(6)을 통해 또 다른 반도체소자인(2)의 소오스 단자에 접속되고, 또 다른 반도체 소자의 전류는 제어가능한 저하에 의해, 두 반도체소자의 드레인 소오스 전압이 서로 동일해지도록, 조절되는 것을 특징으로 하는 파워 반도체 소자의 부하 전류 검출회로.
- 제1항에 있어서, 제어가능한 저항(6)이 MOSFET이고, 그것의 제어 입력이 차동 증폭기의 출력에 접속되고, 상기 차동 증폭기의 제1입력은 파워 반도체 소자(1)의 소오스 단자에 접속되며 그것의 제2입력은 또 다른 반도체 소자(2)의 소오스 단자에 접속되는 것을 특징으로 하는 파워 반도체 소자의 부하 전류 검출회로.
- 제2항에 있어서, 차동 증폭기(3)가 연산 증폭기인 것을 특징으로 하는 파워 반도체 소자의 부하 전류 검출회로.
- 제1항에 있어서, 고정 전위가 접지 전위인 것을 특징으로 하는 파워 반도체 소자의 부하 전류 검출회로.
- 제1항 내지 제4항 중 어느 한 항에 있어서, 반도체 소자(1,2)가 서로 유사한 ID/UDS특성 곡선을 갖는 것을 특징으로 하는 파워 반도체 소자의 부하 전류 검출회로.
- 제1항 내지 제5항 중 어느 한 항에 있어서, 파워 반도체 소자(1) 및 또 다른 반도체 소자(2)가 단일 칩상에 집적된 다수의 셀로 이루어지는 것을 특징으로 하는 파워 반도체 소자의 부하 전류 검출회로.
- 제1항 내지 제6항 중 어느 한 항에 있어서, 파워 반도체 소자(1)의 드레인 단자는 또 다른 차동 증폭기(14)의 제1입력에 접속되고, 상기 차동 증폭기(14)의 제2입력에는 제1차동 증폭기(3)의 오프셋 전압 보다 큰 전압이 인가되는 것을 특징으로 하는 파워 반도체 소자의 부하 전류 검출회로.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE19520735.1 | 1995-06-07 | ||
DE19520735A DE19520735C2 (de) | 1995-06-07 | 1995-06-07 | Schaltungsanordnung zum Erfassen des Laststroms eines Leistungs-Halbleiterbauelementes mit sourceseitiger Last |
Publications (1)
Publication Number | Publication Date |
---|---|
KR970002339A true KR970002339A (ko) | 1997-01-24 |
Family
ID=7763807
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019960019929A KR970002339A (ko) | 1995-06-07 | 1996-06-05 | 소오스 측에 부하를 가진 파워 반도체 소자의 부하 전류 검출 회로 |
Country Status (5)
Country | Link |
---|---|
US (1) | US5815027A (ko) |
EP (1) | EP0747713B1 (ko) |
JP (1) | JPH08334534A (ko) |
KR (1) | KR970002339A (ko) |
DE (2) | DE19520735C2 (ko) |
Families Citing this family (57)
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DE19706946C2 (de) * | 1997-02-21 | 2000-06-21 | Daimler Chrysler Ag | Battierüberwachungseinheit |
ITMI981217A1 (it) * | 1997-06-05 | 1999-12-02 | Denso Corp | Struttura perfezionata per un circuito di misura di corrente |
DE19812920C2 (de) * | 1998-03-24 | 2000-09-07 | Siemens Ag | Schaltungsanordnung zur Steuerung und Erfassung des Laststromes durch eine Last |
DE69920159T2 (de) * | 1998-06-09 | 2005-09-29 | Koninklijke Philips Electronics N.V. | Strommessvorrichtung und telefonendgerät unter verwendung einer solchen strommessvorrichtung |
DE19830356C1 (de) * | 1998-07-07 | 1999-11-11 | Siemens Ag | Verfahren zum Abgleichen eines Widerstands in einer integrierten Schaltung und Vorrichtung zur Durchführung dieses Verfahrens |
DE19838657B4 (de) * | 1998-08-25 | 2008-01-24 | Infineon Technologies Ag | Schaltungsanordnung zum Erfassen des Laststromes eines Leistungs-Feldeffekt-Halbleiterbauelementes |
JP3628576B2 (ja) * | 1999-02-14 | 2005-03-16 | 矢崎総業株式会社 | 微少電流検出装置 |
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DE10032260B4 (de) * | 2000-07-03 | 2004-04-29 | Texas Instruments Deutschland Gmbh | Schaltungsanordnung zur Verdoppelung der Spannung einer Batterie |
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US6407532B1 (en) * | 2000-12-29 | 2002-06-18 | Nokia Mobile Phones, Ltd. | Method and apparatus for measuring battery charge and discharge current |
DE50114154D1 (de) | 2001-01-23 | 2008-09-04 | Continental Teves Ag & Co Ohg | Schaltungsanordnung und verfahren zur messung des stroms in kraftfahrzeugbremssystemen |
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JP2016200570A (ja) | 2015-04-14 | 2016-12-01 | ルネサスエレクトロニクス株式会社 | 半導体装置の電流検出方法および半導体装置 |
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JP2018031705A (ja) * | 2016-08-25 | 2018-03-01 | 株式会社デンソー | 半導体装置 |
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-
1995
- 1995-06-07 DE DE19520735A patent/DE19520735C2/de not_active Expired - Fee Related
-
1996
- 1996-05-28 EP EP96108434A patent/EP0747713B1/de not_active Expired - Lifetime
- 1996-05-28 DE DE59611364T patent/DE59611364D1/de not_active Expired - Lifetime
- 1996-06-05 JP JP8165204A patent/JPH08334534A/ja active Pending
- 1996-06-05 KR KR1019960019929A patent/KR970002339A/ko active IP Right Grant
- 1996-06-07 US US08/660,500 patent/US5815027A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE19520735A1 (de) | 1996-12-12 |
EP0747713B1 (de) | 2006-07-12 |
DE59611364D1 (de) | 2006-08-24 |
DE19520735C2 (de) | 1999-07-01 |
EP0747713A2 (de) | 1996-12-11 |
EP0747713A3 (de) | 1998-01-07 |
US5815027A (en) | 1998-09-29 |
JPH08334534A (ja) | 1996-12-17 |
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