KR960042730A - 반도체기억장치 - Google Patents
반도체기억장치 Download PDFInfo
- Publication number
- KR960042730A KR960042730A KR1019960017604A KR19960017604A KR960042730A KR 960042730 A KR960042730 A KR 960042730A KR 1019960017604 A KR1019960017604 A KR 1019960017604A KR 19960017604 A KR19960017604 A KR 19960017604A KR 960042730 A KR960042730 A KR 960042730A
- Authority
- KR
- South Korea
- Prior art keywords
- signal
- address
- data
- write
- register
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Abandoned
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
- G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
- G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
- G11C11/41—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming static cells with positive feedback, i.e. cells not needing refreshing or charge regeneration, e.g. bistable multivibrator or Schmitt trigger
- G11C11/413—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction
- G11C11/417—Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing, timing or power reduction for memory cells of the field-effect type
- G11C11/418—Address circuits
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
- G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
- G11C7/1072—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers for memories with random access ports synchronised on clock signal pulse trains, e.g. synchronous memories, self timed memories
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C8/00—Arrangements for selecting an address in a digital store
- G11C8/06—Address interface arrangements, e.g. address buffers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2207/00—Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
- G11C2207/10—Aspects relating to interfaces of memory device to external buses
- G11C2207/105—Aspects related to pads, pins or terminals
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C2207/00—Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
- G11C2207/22—Control and timing of internal memory operations
- G11C2207/2218—Late write
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Computer Hardware Design (AREA)
- Static Random-Access Memory (AREA)
- Dram (AREA)
- Memory System (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020040111063A KR100574108B1 (ko) | 1995-05-24 | 2004-12-23 | 반도체기억장치 |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP95-124709 | 1995-05-24 | ||
| JP07124709A JP3102301B2 (ja) | 1995-05-24 | 1995-05-24 | 半導体記憶装置 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020040111063A Division KR100574108B1 (ko) | 1995-05-24 | 2004-12-23 | 반도체기억장치 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR960042730A true KR960042730A (ko) | 1996-12-21 |
Family
ID=14892169
Family Applications (6)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019960017604A Abandoned KR960042730A (ko) | 1995-05-24 | 1996-05-23 | 반도체기억장치 |
| KR1020040111063A Expired - Lifetime KR100574108B1 (ko) | 1995-05-24 | 2004-12-23 | 반도체기억장치 |
| KR1020050097450A Expired - Fee Related KR100783049B1 (ko) | 1995-05-24 | 2005-10-17 | 반도체기억장치 |
| KR1020050097447A Expired - Lifetime KR100694440B1 (ko) | 1995-05-24 | 2005-10-17 | 반도체기억장치 |
| KR1020070056051A Expired - Lifetime KR100915554B1 (ko) | 1995-05-24 | 2007-06-08 | 반도체기억장치 |
| KR1020090006544A Expired - Fee Related KR100945968B1 (ko) | 1995-05-24 | 2009-01-28 | 반도체기억장치 |
Family Applications After (5)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020040111063A Expired - Lifetime KR100574108B1 (ko) | 1995-05-24 | 2004-12-23 | 반도체기억장치 |
| KR1020050097450A Expired - Fee Related KR100783049B1 (ko) | 1995-05-24 | 2005-10-17 | 반도체기억장치 |
| KR1020050097447A Expired - Lifetime KR100694440B1 (ko) | 1995-05-24 | 2005-10-17 | 반도체기억장치 |
| KR1020070056051A Expired - Lifetime KR100915554B1 (ko) | 1995-05-24 | 2007-06-08 | 반도체기억장치 |
| KR1020090006544A Expired - Fee Related KR100945968B1 (ko) | 1995-05-24 | 2009-01-28 | 반도체기억장치 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US5761150A (https=) |
| JP (1) | JP3102301B2 (https=) |
| KR (6) | KR960042730A (https=) |
| TW (1) | TW317635B (https=) |
Families Citing this family (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5838631A (en) | 1996-04-19 | 1998-11-17 | Integrated Device Technology, Inc. | Fully synchronous pipelined ram |
| US6320785B1 (en) * | 1996-07-10 | 2001-11-20 | Hitachi, Ltd. | Nonvolatile semiconductor memory device and data writing method therefor |
| CN1130575C (zh) | 1997-05-16 | 2003-12-10 | 保谷株式会社 | 具有抗反射膜的塑料光学器件以及用来使抗反射膜的厚度均一的机构 |
| US6075730A (en) * | 1997-10-10 | 2000-06-13 | Rambus Incorporated | High performance cost optimized memory with delayed memory writes |
| US6115320A (en) | 1998-02-23 | 2000-09-05 | Integrated Device Technology, Inc. | Separate byte control on fully synchronous pipelined SRAM |
| JP4107716B2 (ja) * | 1998-06-16 | 2008-06-25 | 株式会社ルネサステクノロジ | Fifo型記憶装置 |
| KR100270959B1 (ko) * | 1998-07-07 | 2000-11-01 | 윤종용 | 반도체 메모리 장치 |
| KR100283470B1 (ko) * | 1998-12-09 | 2001-03-02 | 윤종용 | 반도체 메모리 장치의 어드레스 발생회로 |
| US7069406B2 (en) * | 1999-07-02 | 2006-06-27 | Integrated Device Technology, Inc. | Double data rate synchronous SRAM with 100% bus utilization |
| TW522399B (en) * | 1999-12-08 | 2003-03-01 | Hitachi Ltd | Semiconductor device |
| US6501698B1 (en) * | 2000-11-01 | 2002-12-31 | Enhanced Memory Systems, Inc. | Structure and method for hiding DRAM cycle time behind a burst access |
| US7403446B1 (en) * | 2005-09-27 | 2008-07-22 | Cypress Semiconductor Corporation | Single late-write for standard synchronous SRAMs |
| WO2008002645A2 (en) * | 2006-06-28 | 2008-01-03 | Cypress Semiconductor Corporation | Memory device and method for selective write based on input data value |
| KR101033464B1 (ko) | 2008-12-22 | 2011-05-09 | 주식회사 하이닉스반도체 | 반도체 집적 회로 |
| US8644088B2 (en) | 2010-10-28 | 2014-02-04 | Hynix Semiconductor Inc. | Semiconductor memory device and semiconductor system including the same |
| US20180189374A1 (en) * | 2016-12-30 | 2018-07-05 | Arrow Devices Private Limited | System and method for fast reading of signal databases |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5172379A (en) * | 1989-02-24 | 1992-12-15 | Data General Corporation | High performance memory system |
| US5258952A (en) * | 1990-12-14 | 1993-11-02 | Sgs-Thomson Microelectronics, Inc. | Semiconductor memory with separate time-out control for read and write operations |
| JP3179788B2 (ja) * | 1991-01-17 | 2001-06-25 | 三菱電機株式会社 | 半導体記憶装置 |
| US5587961A (en) * | 1996-02-16 | 1996-12-24 | Micron Technology, Inc. | Synchronous memory allowing early read command in write to read transitions |
| JP2005007598A (ja) * | 2003-06-16 | 2005-01-13 | Aoki Technical Laboratory Inc | 細口筒状容器の射出延伸ブロー成形方法及び容器 |
-
1995
- 1995-05-24 JP JP07124709A patent/JP3102301B2/ja not_active Expired - Lifetime
-
1996
- 1996-05-01 TW TW085105205A patent/TW317635B/zh not_active IP Right Cessation
- 1996-05-21 US US08/651,873 patent/US5761150A/en not_active Expired - Lifetime
- 1996-05-23 KR KR1019960017604A patent/KR960042730A/ko not_active Abandoned
-
2004
- 2004-12-23 KR KR1020040111063A patent/KR100574108B1/ko not_active Expired - Lifetime
-
2005
- 2005-10-17 KR KR1020050097450A patent/KR100783049B1/ko not_active Expired - Fee Related
- 2005-10-17 KR KR1020050097447A patent/KR100694440B1/ko not_active Expired - Lifetime
-
2007
- 2007-06-08 KR KR1020070056051A patent/KR100915554B1/ko not_active Expired - Lifetime
-
2009
- 2009-01-28 KR KR1020090006544A patent/KR100945968B1/ko not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| KR100945968B1 (ko) | 2010-03-09 |
| KR20070108331A (ko) | 2007-11-09 |
| JPH08321180A (ja) | 1996-12-03 |
| US5761150A (en) | 1998-06-02 |
| KR100783049B1 (ko) | 2007-12-07 |
| KR100574108B1 (ko) | 2006-04-26 |
| KR20090028585A (ko) | 2009-03-18 |
| JP3102301B2 (ja) | 2000-10-23 |
| KR20070108293A (ko) | 2007-11-09 |
| KR100915554B1 (ko) | 2009-09-03 |
| KR100694440B1 (ko) | 2007-03-12 |
| TW317635B (https=) | 1997-10-11 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
Patent event code: PA01091R01D Comment text: Patent Application Patent event date: 19960523 |
|
| PG1501 | Laying open of application | ||
| A201 | Request for examination | ||
| PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 20010503 Comment text: Request for Examination of Application Patent event code: PA02011R01I Patent event date: 19960523 Comment text: Patent Application |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 20030724 Patent event code: PE09021S01D |
|
| A107 | Divisional application of patent | ||
| PA0107 | Divisional application |
Comment text: Divisional Application of Patent Patent event date: 20041223 Patent event code: PA01071R01D |
|
| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
Patent event code: PE07011S01D Comment text: Decision to Grant Registration Patent event date: 20050330 |
|
| NORF | Unpaid initial registration fee | ||
| PC1904 | Unpaid initial registration fee |