KR920000552B1 - 전자부품인식방법 - Google Patents
전자부품인식방법 Download PDFInfo
- Publication number
- KR920000552B1 KR920000552B1 KR1019870012621A KR870012621A KR920000552B1 KR 920000552 B1 KR920000552 B1 KR 920000552B1 KR 1019870012621 A KR1019870012621 A KR 1019870012621A KR 870012621 A KR870012621 A KR 870012621A KR 920000552 B1 KR920000552 B1 KR 920000552B1
- Authority
- KR
- South Korea
- Prior art keywords
- feature
- screen
- shape
- recognizing
- screen area
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/10—Image acquisition
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/70—Determining position or orientation of objects or cameras
- G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
- G06V10/00—Arrangements for image or video recognition or understanding
- G06V10/40—Extraction of image or video features
- G06V10/44—Local feature extraction by analysis of parts of the pattern, e.g. by detecting edges, contours, loops, corners, strokes or intersections; Connectivity analysis, e.g. of connected components
- G06V10/443—Local feature extraction by analysis of parts of the pattern, e.g. by detecting edges, contours, loops, corners, strokes or intersections; Connectivity analysis, e.g. of connected components by matching or filtering
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- G—PHYSICS
- G06—COMPUTING OR CALCULATING; COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/30—Subject of image; Context of image processing
- G06T2207/30108—Industrial image inspection
- G06T2207/30148—Semiconductor; IC; Wafer
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- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Theoretical Computer Science (AREA)
- Computer Vision & Pattern Recognition (AREA)
- Multimedia (AREA)
- Image Analysis (AREA)
- Image Processing (AREA)
- Length Measuring Devices By Optical Means (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Character Input (AREA)
Abstract
Description
Claims (2)
- 화면 영역내에서 전자부품의 분할된 형상의 화상을 비데오 수단에 의해 촬상하여 화상신호를 발생하고 상기 화상신호로부터 특징부를 검출하는 단계와, 한 화면영역의 일단부에서의 특징부와 다음 화면영역의 개시부에서의 특징부가 일치하도록 상기 전자제품의 소정의 중심부 둘레의 소정의 순환방향으로 상기 전자부품의 특징부를 따라 화면영역을 이동하는 단계와, 상기 비데오 수단의 화상신호를 2치화신호로 변환하는 단계와, 상기 2치화신호에 의거해서 특징부의 윤곽을 나타내는 경계구획을 검출하는 단계와, 소정의 많은 경계구획과 서로 떨어져 있는 두경계구획의 중점을 연결하는 선과 기준선사이의 각을 계산하는 단계와, 이웃하는 두선사이의 각 중분을 계산하는 단계와, 최대각에 의거해서 특징부에 있어서 코오너의 형상과 위치를 인식하는 단계와, 상기 코오너의 형상과 위치에 의거해서 특징부를 인식하는 단계와, 상기 화면영역의 일단부에 위치하는 특징부의 형상에 의거해서 화면영역의 이동 방향을 결정하는 단계와, 앞의 화면영역의 일단부에 위치하여 후속화면영역의 일단부와 일치하는 특징부를 기준으로해서 상기 특징부의 형상과 위치를 인식하는 단계로 이루어진 전자부품 인식방법.
- 화면영역내에서 전자부품의 분할된 형상의 화상을 비데오 수단에 의해 촬상하여 화상신호를 발생하고 상기 하상신호로부터 특징부를 검출하는 단계와, 한 화면영역의 일단부에서의 특징부와 그 다음 화면영역의 개시부에서의 특징부가 일치하도록, 복수의 특징부의 화면영역의 특징부에서의 차이에 의거해서 검출될 전자부품의 경사에 상당하는 소정의 순환방향으로 상기 전자부품의 특징부를 따라 화면영역을 이동하는 단계와, 상기 비데오수단의 화상신호를 2치 화신호로 변환하는 단계와, 상기 2치화 신호에 의거해서 특징부의 윤곽을 나타내는 경계구획을 검출하는 단계와, 소정의 많은 경계구획과 서로 떨어져 있는 두 경계구획의 중점을 연결하는 선과 기준선사이의 각을 계산하는 단계와, 이웃하는 두선사이의 각중분을 계산하는 단계와, 최대각에 의거해서 특징부에 있어서 코오너의 형상과 위치를 인식하는 단계와, 상기 코오너의 형상과 위치에 의거해서 특징부를 인식하는 단계와, 상기 화면영역의 일단부에 위치하는 특징부의 형상에 의거해서 화면영역의 의동방향을 결정하는 단계와, 앞의 화면영역의 일단부에 위치하여 후속화면영역의 일단부와 일치하는 특징부를 기준으로해서 상기 특징부의 형상과 위치를 인식하는 단계로 이루어진 전자부품 인식방법.
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP61269112A JPH077446B2 (ja) | 1986-11-12 | 1986-11-12 | 部品認識方法 |
| JP61-269112 | 1986-11-12 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR880006621A KR880006621A (ko) | 1988-07-23 |
| KR920000552B1 true KR920000552B1 (ko) | 1992-01-16 |
Family
ID=17467838
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019870012621A Expired KR920000552B1 (ko) | 1986-11-12 | 1987-11-10 | 전자부품인식방법 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US4847911A (ko) |
| JP (1) | JPH077446B2 (ko) |
| KR (1) | KR920000552B1 (ko) |
Families Citing this family (26)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0690725B2 (ja) * | 1988-07-18 | 1994-11-14 | 日本電装株式会社 | 位置検出装置 |
| JPH0271179A (ja) * | 1988-09-07 | 1990-03-09 | Hitachi Ltd | 半導体集積回路装置、その製造方法、検査方法及び補修方法 |
| US4972495A (en) * | 1988-12-21 | 1990-11-20 | General Electric Company | Feature extraction processor |
| JP2840306B2 (ja) * | 1989-08-02 | 1998-12-24 | キヤノン株式会社 | 画像処理装置の領域処理方法 |
| US5157734A (en) * | 1989-12-19 | 1992-10-20 | Industrial Technology Research Institute | Method and apparatus for picking and placing a surface mounted device with the aid of machine vision |
| US5216726A (en) * | 1990-03-23 | 1993-06-01 | United Silicon Structures, Inc. | Data compression process |
| US5137362A (en) * | 1990-03-26 | 1992-08-11 | Motorola, Inc. | Automatic package inspection method |
| US5119436A (en) * | 1990-09-24 | 1992-06-02 | Kulicke And Soffa Industries, Inc | Method of centering bond positions |
| US5406700A (en) * | 1990-11-20 | 1995-04-18 | Seiko Epson Corporation | Method for producing pin integrated circuit lead frame |
| US5185811A (en) * | 1990-12-27 | 1993-02-09 | International Business Machines Corporation | Automated visual inspection of electronic component leads prior to placement |
| JP2851023B2 (ja) * | 1992-06-29 | 1999-01-27 | 株式会社鷹山 | Icの傾き検査方法 |
| US5418862A (en) * | 1992-08-10 | 1995-05-23 | United Parcel Service Of America | Method and apparatus for detecting artifact corners in two-dimensional images |
| US5805722A (en) * | 1993-11-22 | 1998-09-08 | Cognex Corporation | Method and apparatus for locating, inspecting, and placing large leaded devices |
| US5550583A (en) * | 1994-10-03 | 1996-08-27 | Lucent Technologies Inc. | Inspection apparatus and method |
| JPH08240536A (ja) * | 1995-01-03 | 1996-09-17 | Texas Instr Inc <Ti> | 集積回路のリードのバリを検査する方法および装置 |
| US6035066A (en) * | 1995-06-02 | 2000-03-07 | Cognex Corporation | Boundary tracking method and apparatus to find leads |
| JP3366497B2 (ja) * | 1995-07-12 | 2003-01-14 | 松下電器産業株式会社 | 部品検出方法 |
| US5768443A (en) * | 1995-12-19 | 1998-06-16 | Cognex Corporation | Method for coordinating multiple fields of view in multi-camera |
| KR970053283A (ko) * | 1995-12-26 | 1997-07-31 | 윌리엄 이. 힐러 | 반도체 패키지 윤곽 측정용 측정 유니트 |
| US5969339A (en) * | 1996-02-26 | 1999-10-19 | Georgia Tech Research Corporation Office Of Technology Licensing | Conveyor tracking system for part detection using an array of photoelectric sensors |
| US6633663B1 (en) * | 1998-05-05 | 2003-10-14 | International Business Machines Corporation | Method and system for determining component dimensional information |
| US6571006B1 (en) * | 1998-11-30 | 2003-05-27 | Cognex Corporation | Methods and apparatuses for measuring an extent of a group of objects within an image |
| JP2005093623A (ja) * | 2003-09-17 | 2005-04-07 | Juki Corp | 基板マークの認識方法及び装置 |
| JP2006261162A (ja) * | 2005-03-15 | 2006-09-28 | Hitachi High-Technologies Corp | レビュー装置及びレビュー装置における検査方法 |
| US7344273B2 (en) | 2005-03-22 | 2008-03-18 | Binary Works, Inc. | Ring light with user manipulable control |
| KR102484353B1 (ko) * | 2018-02-09 | 2023-01-04 | 한화정밀기계 주식회사 | 대형 부품 인식 방법 |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS6083328A (ja) * | 1983-10-13 | 1985-05-11 | Fujitsu Ltd | フオトマスクの検査方法 |
| JPS60247106A (ja) * | 1984-05-22 | 1985-12-06 | Fujitsu Ltd | 形状検査装置 |
| US4604648A (en) * | 1984-10-12 | 1986-08-05 | Kley Victor B | Electronic viewing system for integrated circuit packages |
| JPS61290311A (ja) * | 1985-06-19 | 1986-12-20 | Hitachi Ltd | はんだ付部の検査装置及びその方法 |
| US4651203A (en) * | 1985-10-29 | 1987-03-17 | At&T Technologies, Inc. | Video controlled article positioning system |
| US4799268A (en) * | 1985-11-12 | 1989-01-17 | Usm Corporation | Lead sense system for component insertion machine |
| US4783826A (en) * | 1986-08-18 | 1988-11-08 | The Gerber Scientific Company, Inc. | Pattern inspection system |
-
1986
- 1986-11-12 JP JP61269112A patent/JPH077446B2/ja not_active Expired - Lifetime
-
1987
- 1987-11-10 KR KR1019870012621A patent/KR920000552B1/ko not_active Expired
- 1987-11-10 US US07/118,913 patent/US4847911A/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| US4847911A (en) | 1989-07-11 |
| KR880006621A (ko) | 1988-07-23 |
| JPH077446B2 (ja) | 1995-01-30 |
| JPS63123167A (ja) | 1988-05-26 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A201 | Request for examination | ||
| PA0109 | Patent application |
Patent event code: PA01091R01D Comment text: Patent Application Patent event date: 19871110 |
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| PA0201 | Request for examination |
Patent event code: PA02012R01D Patent event date: 19871110 Comment text: Request for Examination of Application |
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| PG1501 | Laying open of application | ||
| E601 | Decision to refuse application | ||
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| PE0601 | Decision on rejection of patent |
Patent event date: 19901113 Comment text: Decision to Refuse Application Patent event code: PE06012S01D |
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| PE0902 | Notice of grounds for rejection |
Comment text: Notification of reason for refusal Patent event date: 19901113 Patent event code: PE09021S01D |
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| J2X1 | Appeal (before the patent court) |
Free format text: APPEAL AGAINST DECISION TO DECLINE REFUSAL |
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| PJ2001 | Appeal |
Appeal kind category: Appeal against decision to decline refusal Decision date: 19920330 Appeal identifier: 1991201001473 Request date: 19910911 |
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| G160 | Decision to publish patent application | ||
| PG1605 | Publication of application before grant of patent |
Comment text: Decision on Publication of Application Patent event code: PG16051S01I Patent event date: 19911209 |
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| E701 | Decision to grant or registration of patent right | ||
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Patent event code: PE07011S01D Comment text: Decision to Grant Registration Patent event date: 19920330 |
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