KR880006621A - 부품 인식방법 - Google Patents

부품 인식방법 Download PDF

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Publication number
KR880006621A
KR880006621A KR870012621A KR870012621A KR880006621A KR 880006621 A KR880006621 A KR 880006621A KR 870012621 A KR870012621 A KR 870012621A KR 870012621 A KR870012621 A KR 870012621A KR 880006621 A KR880006621 A KR 880006621A
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KR
South Korea
Prior art keywords
screen
feature
features
moving
moving direction
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Application number
KR870012621A
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English (en)
Other versions
KR920000552B1 (ko
Inventor
마사미찌 모리모또
가즈마사 오꾸무라
요시가즈 오까하시
Original Assignee
다니이 아끼오
마쯔시다덴기산교 가부시기가이샤
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Application filed by 다니이 아끼오, 마쯔시다덴기산교 가부시기가이샤 filed Critical 다니이 아끼오
Publication of KR880006621A publication Critical patent/KR880006621A/ko
Application granted granted Critical
Publication of KR920000552B1 publication Critical patent/KR920000552B1/ko

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Classifications

    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/10—Image acquisition
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/70—Determining position or orientation of objects or cameras
    • G06T7/73—Determining position or orientation of objects or cameras using feature-based methods
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/40—Extraction of image or video features
    • G06V10/44—Local feature extraction by analysis of parts of the pattern, e.g. by detecting edges, contours, loops, corners, strokes or intersections; Connectivity analysis, e.g. of connected components
    • G06V10/443—Local feature extraction by analysis of parts of the pattern, e.g. by detecting edges, contours, loops, corners, strokes or intersections; Connectivity analysis, e.g. of connected components by matching or filtering
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T2207/00—Indexing scheme for image analysis or image enhancement
    • G06T2207/30—Subject of image; Context of image processing
    • G06T2207/30108—Industrial image inspection
    • G06T2207/30148—Semiconductor; IC; Wafer

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  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Theoretical Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Multimedia (AREA)
  • Image Analysis (AREA)
  • Image Processing (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Character Input (AREA)

Abstract

내용 없음

Description

부품 인식방법
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도 N 제7도는 본 발명의 일실시예를 표시하며, 제1도 는 화면이동에 의한 각 화면의 상태를 표시한 설명도,
제2도는 IC 부품과 화면의 시야를 표시한 평면도,
제3도는 1화면에 있어서의 인식방법의 설명도.

Claims (2)

  1. 부품 주위의 다수의 특징부를 순차적으로 화면을 이동시켜서 인식하는 부품 인식방법으로서, 화면중의 특징부의 위치를 검출하고, 이 화면중의 특징부중에서, 미리 결정되어 있는 부품의 중심 둘레의 화면 이동방향의 말미에 위치하는 특징부에 형태에 따라서 화면의 이동방향으로 결정함과 동시에 상기 말미에 위치하는 특징부가 다음의 화면에 포함되도록 화면의 이동량을 결정하고, 앞에 화면에서의 말미의 특징부를 기준으로 해서 다음의 화면중의 특징부를 인식하는 것을 특징으로 하는 부품인식방법.
  2. 부품 주위의 다수의 특징부를 순차적으로 화면을 이동시켜서 인식하는 부품 인식 방법으로서, 화면중의 특징부의 위치를 검출하고, 이 화면중의 특징부 중에서, 미리 결정되어 있는 부품의 중심둘레의 화면이동 방향의 말미에 위치하는 특징부의 형태에 따라서 화면의 이동방향을 결정함과 동시에 상기 말미에 위치하는 특징부가 다음 화면에 포함되도록 화면의 이동량을 결정하고, 또한 복수의 특징부의 위치로부터 부품의 화면 이동방향에 대한 경사를 검출하고, 부품의 경사에 대응시켜서 이동방향을 수정하여 화면을 이동하고, 앞에 화면에서의 말미의 특징부를 기준으로 해서 다음의 화면중의 특징부를 인식하는 것을 특징으로 하는 부품 인식방법.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019870012621A 1986-11-12 1987-11-10 전자부품인식방법 KR920000552B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP61-269112 1986-11-12
JP61269112A JPH077446B2 (ja) 1986-11-12 1986-11-12 部品認識方法

Publications (2)

Publication Number Publication Date
KR880006621A true KR880006621A (ko) 1988-07-23
KR920000552B1 KR920000552B1 (ko) 1992-01-16

Family

ID=17467838

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019870012621A KR920000552B1 (ko) 1986-11-12 1987-11-10 전자부품인식방법

Country Status (3)

Country Link
US (1) US4847911A (ko)
JP (1) JPH077446B2 (ko)
KR (1) KR920000552B1 (ko)

Families Citing this family (26)

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JPH0690725B2 (ja) * 1988-07-18 1994-11-14 日本電装株式会社 位置検出装置
JPH0271179A (ja) * 1988-09-07 1990-03-09 Hitachi Ltd 半導体集積回路装置、その製造方法、検査方法及び補修方法
US4972495A (en) * 1988-12-21 1990-11-20 General Electric Company Feature extraction processor
JP2840306B2 (ja) * 1989-08-02 1998-12-24 キヤノン株式会社 画像処理装置の領域処理方法
US5157734A (en) * 1989-12-19 1992-10-20 Industrial Technology Research Institute Method and apparatus for picking and placing a surface mounted device with the aid of machine vision
US5216726A (en) * 1990-03-23 1993-06-01 United Silicon Structures, Inc. Data compression process
US5137362A (en) * 1990-03-26 1992-08-11 Motorola, Inc. Automatic package inspection method
US5119436A (en) * 1990-09-24 1992-06-02 Kulicke And Soffa Industries, Inc Method of centering bond positions
US5406700A (en) * 1990-11-20 1995-04-18 Seiko Epson Corporation Method for producing pin integrated circuit lead frame
US5185811A (en) * 1990-12-27 1993-02-09 International Business Machines Corporation Automated visual inspection of electronic component leads prior to placement
JP2851023B2 (ja) * 1992-06-29 1999-01-27 株式会社鷹山 Ｉｃの傾き検査方法
US5418862A (en) * 1992-08-10 1995-05-23 United Parcel Service Of America Method and apparatus for detecting artifact corners in two-dimensional images
US5805722A (en) * 1993-11-22 1998-09-08 Cognex Corporation Method and apparatus for locating, inspecting, and placing large leaded devices
US5550583A (en) * 1994-10-03 1996-08-27 Lucent Technologies Inc. Inspection apparatus and method
JPH08240536A (ja) * 1995-01-03 1996-09-17 Texas Instr Inc <Ti> 集積回路のリードのバリを検査する方法および装置
US6035066A (en) * 1995-06-02 2000-03-07 Cognex Corporation Boundary tracking method and apparatus to find leads
JP3366497B2 (ja) * 1995-07-12 2003-01-14 松下電器産業株式会社 部品検出方法
US5768443A (en) * 1995-12-19 1998-06-16 Cognex Corporation Method for coordinating multiple fields of view in multi-camera
KR970053283A (ko) * 1995-12-26 1997-07-31 윌리엄 이. 힐러 반도체 패키지 윤곽 측정용 측정 유니트
US5969339A (en) * 1996-02-26 1999-10-19 Georgia Tech Research Corporation Office Of Technology Licensing Conveyor tracking system for part detection using an array of photoelectric sensors
US6633663B1 (en) * 1998-05-05 2003-10-14 International Business Machines Corporation Method and system for determining component dimensional information
US6571006B1 (en) * 1998-11-30 2003-05-27 Cognex Corporation Methods and apparatuses for measuring an extent of a group of objects within an image
JP2005093623A (ja) * 2003-09-17 2005-04-07 Juki Corp 基板マークの認識方法及び装置
JP2006261162A (ja) * 2005-03-15 2006-09-28 Hitachi High-Technologies Corp レビュー装置及びレビュー装置における検査方法
US7344273B2 (en) 2005-03-22 2008-03-18 Binary Works, Inc. Ring light with user manipulable control
KR102484353B1 (ko) * 2018-02-09 2023-01-04 한화정밀기계 주식회사 대형 부품 인식 방법

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6083328A (ja) * 1983-10-13 1985-05-11 Fujitsu Ltd フオトマスクの検査方法
JPS60247106A (ja) * 1984-05-22 1985-12-06 Fujitsu Ltd 形状検査装置
US4604648A (en) * 1984-10-12 1986-08-05 Kley Victor B Electronic viewing system for integrated circuit packages
JPS61290311A (ja) * 1985-06-19 1986-12-20 Hitachi Ltd はんだ付部の検査装置及びその方法
US4651203A (en) * 1985-10-29 1987-03-17 At&T Technologies, Inc. Video controlled article positioning system
US4799268A (en) * 1985-11-12 1989-01-17 Usm Corporation Lead sense system for component insertion machine
US4783826A (en) * 1986-08-18 1988-11-08 The Gerber Scientific Company, Inc. Pattern inspection system

Also Published As

Publication number Publication date
US4847911A (en) 1989-07-11
JPH077446B2 (ja) 1995-01-30
JPS63123167A (ja) 1988-05-26
KR920000552B1 (ko) 1992-01-16

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