KR910006733A - 이방 도전성 시트를 사용한 전기적 검사 장치 및 이방 도전성 시트의 제조방법 - Google Patents

이방 도전성 시트를 사용한 전기적 검사 장치 및 이방 도전성 시트의 제조방법 Download PDF

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Publication number
KR910006733A
KR910006733A KR1019900015511A KR900015511A KR910006733A KR 910006733 A KR910006733 A KR 910006733A KR 1019900015511 A KR1019900015511 A KR 1019900015511A KR 900015511 A KR900015511 A KR 900015511A KR 910006733 A KR910006733 A KR 910006733A
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KR
South Korea
Prior art keywords
anisotropic conductive
conductive sheet
sheet
molding material
electrical inspection
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Application number
KR1019900015511A
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English (en)
Inventor
싱이찌 쯔야마
유이찌 하루따
Original Assignee
고바야시 사또시
가부시끼가이샤 소우겐 인터내쇼널
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 고바야시 사또시, 가부시끼가이샤 소우겐 인터내쇼널 filed Critical 고바야시 사또시
Publication of KR910006733A publication Critical patent/KR910006733A/ko

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/0735—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card arranged on a flexible frame or film
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07342—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card the body of the probe being at an angle other than perpendicular to test object, e.g. probe card
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B1/00—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
    • H01B1/20—Conductive material dispersed in non-conductive organic material
    • H01B1/22—Conductive material dispersed in non-conductive organic material the conductive material comprising metals or alloys
    • H—ELECTRICITY
    • H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00—Apparatus or processes for manufacturing printed circuits
    • H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/325—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by abutting or pinching, i.e. without alloying process; mechanical auxiliary parts therefor

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  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Metallurgy (AREA)
  • Dispersion Chemistry (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Chemical & Material Sciences (AREA)
  • Non-Insulated Conductors (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)

Abstract

내용 없음

Description

이방 도전성 시트를 사용한 전기적 검사 장치 및 이방 도전성 시트의 제조방법.
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도 본 발명의 전기적 검사 장치에 사용하는 RCR 시트의 일부를 도시한 중단 정면도.
제2도는 본 발명의 전기적 검사 장치에 사용하는 RCR 시트의 일부를 도시한 평면도.
제3도는 RCR시트의 제조장치의 한 예를 도시한 개략도.

Claims (2)

  1. 다수의 검사 전극과, 검사대상인 기판과의 사이에 이방 도전성 시트를 개재시켜서 당해 기판의 전기적 검사를 행하는 전기적 검사 장치에 있어서, 상기 이방 도전성 시트는 시트의 두께방향으로 퍼지는 복수의 도전부가 절연부에 의하여 상호 절연된 상태에서 배치되어지고, 각 도전부는 적어도 시트의 일면측에서 절연부의 표면으로부터 돌출하는 돌출부중에 형성되며, 또한 절연성으로 탄성을 갖는 고분자 물질중에 도전성 입자가 조밀하게 충전되어지는 것을 특징으로하는 이방 도전성 시트를 사용한 전기적 검사장치.
  2. 제1항에 기재한 이방 도전성 시트를 제조하는 방법에 있어서 성형면이 평탄하든가 혹은 이방 도전성 시트 돌출부의 돌출높이에 비하여 미미한을 갖는 상하 한쌍의 금형을 사용하고, 이 금형의 캐비티내에 자성을 갖는 도전성 입자와 고분자 재료의 혼합물로 된 성형 재료층을 형성하며 상기 금형의 상형 성형면과 상기 성형재료층의 상면 사이에 틈이 형성된 상태에서 당해 성형재료층에 강도분포를 갖는 자장을 당해 층의 두께방향에 걸어서 그 자력에 의하여 도전성 입자를 이동시키면서 성형재료를 유동시키고 그 외형을 변화시켜 경화하여 제1항에 개재한 이방 도전성 시트를 제조하는 것을 특징으로 하는 이방 도전성 시트의 제조방법.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019900015511A 1989-09-29 1990-09-28 이방 도전성 시트를 사용한 전기적 검사 장치 및 이방 도전성 시트의 제조방법 KR910006733A (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP1-252214 1989-09-29
JP25221489 1989-09-29

Publications (1)

Publication Number Publication Date
KR910006733A true KR910006733A (ko) 1991-04-29

Family

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019900015511A KR910006733A (ko) 1989-09-29 1990-09-28 이방 도전성 시트를 사용한 전기적 검사 장치 및 이방 도전성 시트의 제조방법

Country Status (5)

Country Link
US (2) US5132058A (ko)
EP (1) EP0420690B1 (ko)
JP (3) JP3087294B2 (ko)
KR (1) KR910006733A (ko)
DE (1) DE69027171T2 (ko)

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Also Published As

Publication number Publication date
JP3038859B2 (ja) 2000-05-08
US5317255A (en) 1994-05-31
JPH03183974A (ja) 1991-08-09
JP3332006B2 (ja) 2002-10-07
JPH11353948A (ja) 1999-12-24
EP0420690A2 (en) 1991-04-03
JPH03196416A (ja) 1991-08-27
DE69027171T2 (de) 1996-10-10
US5132058A (en) 1992-07-21
JP3087294B2 (ja) 2000-09-11
DE69027171D1 (de) 1996-07-04
EP0420690B1 (en) 1996-05-29
EP0420690A3 (en) 1992-03-11

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