KR900008918A - 배선기판과 그 제조방법, 박막 캐리어, 반도체 장치 및 그 장착구조와 반도체 장치장착 방법 - Google Patents
배선기판과 그 제조방법, 박막 캐리어, 반도체 장치 및 그 장착구조와 반도체 장치장착 방법Info
- Publication number
- KR900008918A KR900008918A KR1019890016132A KR890016132A KR900008918A KR 900008918 A KR900008918 A KR 900008918A KR 1019890016132 A KR1019890016132 A KR 1019890016132A KR 890016132 A KR890016132 A KR 890016132A KR 900008918 A KR900008918 A KR 900008918A
- Authority
- KR
- South Korea
- Prior art keywords
- semiconductor device
- manufacturing
- thin film
- wiring substrate
- film carrier
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title 2
- 238000004519 manufacturing process Methods 0.000 title 1
- 238000000034 method Methods 0.000 title 1
- 239000000758 substrate Substances 0.000 title 1
- 239000010409 thin film Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/16—Printed circuits incorporating printed electric components, e.g. printed resistor, capacitor, inductor
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/11—Printed elements for providing electric connections to or between printed circuits
- H05K1/111—Pads for surface mounting, e.g. lay-out
- H05K1/112—Pads for surface mounting, e.g. lay-out directly combined with via connections
- H05K1/113—Via provided in pad; Pad over filled via
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/48—Manufacture or treatment of parts, e.g. containers, prior to assembly of the devices, using processes not provided for in a single one of the subgroups H01L21/06 - H01L21/326
- H01L21/4814—Conductive parts
- H01L21/4846—Leads on or in insulating or insulated substrates, e.g. metallisation
- H01L21/486—Via connections through the substrate with or without pins
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L23/00—Details of semiconductor or other solid state devices
- H01L23/48—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor
- H01L23/488—Arrangements for conducting electric current to or from the solid state body in operation, e.g. leads, terminal arrangements ; Selection of materials therefor consisting of soldered or bonded constructions
- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
- H01L23/49827—Via connections through the substrates, e.g. pins going through the substrate, coaxial cables
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2224/00—Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
- H01L2224/01—Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
- H01L2224/10—Bump connectors; Manufacturing methods related thereto
- H01L2224/15—Structure, shape, material or disposition of the bump connectors after the connecting process
- H01L2224/16—Structure, shape, material or disposition of the bump connectors after the connecting process of an individual bump connector
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01014—Silicon [Si]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01046—Palladium [Pd]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01078—Platinum [Pt]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/01—Chemical elements
- H01L2924/01079—Gold [Au]
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L2924/00—Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
- H01L2924/30—Technical effects
- H01L2924/301—Electrical effects
- H01L2924/3025—Electromagnetic shielding
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K1/00—Printed circuits
- H05K1/02—Details
- H05K1/03—Use of materials for the substrate
- H05K1/0393—Flexible materials
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/01—Dielectrics
- H05K2201/0137—Materials
- H05K2201/0154—Polyimide
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/03—Conductive materials
- H05K2201/0332—Structure of the conductor
- H05K2201/0388—Other aspects of conductors
- H05K2201/0394—Conductor crossing over a hole in the substrate or a gap between two separate substrate parts
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09209—Shape and layout details of conductors
- H05K2201/095—Conductive through-holes or vias
- H05K2201/09563—Metal filled via
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K2201/00—Indexing scheme relating to printed circuits covered by H05K1/00
- H05K2201/09—Shape and layout
- H05K2201/09209—Shape and layout details of conductors
- H05K2201/09654—Shape and layout details of conductors covering at least two types of conductors provided for in H05K2201/09218 - H05K2201/095
- H05K2201/0979—Redundant conductors or connections, i.e. more than one current path between two points
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/36—Assembling printed circuits with other printed circuits
- H05K3/361—Assembling flexible printed circuits with other printed circuits
- H05K3/363—Assembling flexible printed circuits with other printed circuits by soldering
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/40—Forming printed elements for providing electric connections to or between printed circuits
- H05K3/42—Plated through-holes or plated via connections
- H05K3/423—Plated through-holes or plated via connections characterised by electroplating method
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Ceramic Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Wire Bonding (AREA)
Applications Claiming Priority (16)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP63-283207 | 1988-11-09 | ||
JP28320788A JPH0760840B2 (ja) | 1988-11-09 | 1988-11-09 | 配線基板およびその製法 |
JP50,792 | 1989-03-01 | ||
JP1050792A JP2815113B2 (ja) | 1989-03-01 | 1989-03-01 | フィルムキャリアおよび半導体装置の製造方法 |
JP50,793 | 1989-03-01 | ||
JP1050793A JP2785832B2 (ja) | 1989-03-01 | 1989-03-01 | 半導体装置の実装構造 |
JP1181272A JP2634672B2 (ja) | 1989-07-13 | 1989-07-13 | 半導体装置 |
JP181,272 | 1989-07-14 | ||
JP19768289A JP2654191B2 (ja) | 1989-07-28 | 1989-07-28 | 半導体装置の実装方法 |
JP197,582 | 1989-07-28 | ||
JP197,681 | 1989-07-28 | ||
JP19768089A JP2654189B2 (ja) | 1989-07-28 | 1989-07-28 | 半導体装置の実装方法 |
JP197,680 | 1989-07-28 | ||
JP19768189A JP2654190B2 (ja) | 1989-07-28 | 1989-07-28 | 半導体装置の実装方法 |
JP1200847A JP2808703B2 (ja) | 1989-08-02 | 1989-08-02 | フィルムキャリアおよび半導体装置 |
JP200,847 | 1989-08-02 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR900008918A true KR900008918A (ko) | 1990-06-03 |
KR960006763B1 KR960006763B1 (ko) | 1996-05-23 |
Family
ID=27572395
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019890016132A KR960006763B1 (ko) | 1988-11-09 | 1989-11-08 | 배선기판과 그 제조방법, 박막 캐리어, 반도체 장치 및 그 장착구조와 반도체 장치장착 방법 |
Country Status (5)
Country | Link |
---|---|
US (1) | US5072289A (ko) |
EP (1) | EP0368262B1 (ko) |
KR (1) | KR960006763B1 (ko) |
DE (1) | DE68929282T2 (ko) |
SG (1) | SG49842A1 (ko) |
Families Citing this family (75)
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US5640762A (en) | 1988-09-30 | 1997-06-24 | Micron Technology, Inc. | Method and apparatus for manufacturing known good semiconductor die |
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JP3154713B2 (ja) * | 1990-03-16 | 2001-04-09 | 株式会社リコー | 異方性導電膜およびその製造方法 |
DE69233088T2 (de) * | 1991-02-25 | 2003-12-24 | Canon K.K., Tokio/Tokyo | Elektrisches Verbindungsteil und sein Herstellungsverfahren |
DE69216658T2 (de) * | 1991-02-25 | 1997-08-07 | Canon Kk | Vorrichtung und Verfahren zur Verbindung elektrischer Bauelemente |
JPH04301817A (ja) * | 1991-03-29 | 1992-10-26 | Rohm Co Ltd | 液晶表示装置とその製造方法 |
US6998860B1 (en) | 1991-06-04 | 2006-02-14 | Micron Technology, Inc. | Method for burn-in testing semiconductor dice |
US5716218A (en) | 1991-06-04 | 1998-02-10 | Micron Technology, Inc. | Process for manufacturing an interconnect for testing a semiconductor die |
US5487999A (en) * | 1991-06-04 | 1996-01-30 | Micron Technology, Inc. | Method for fabricating a penetration limited contact having a rough textured surface |
US5302891A (en) * | 1991-06-04 | 1994-04-12 | Micron Technology, Inc. | Discrete die burn-in for non-packaged die |
US6219908B1 (en) | 1991-06-04 | 2001-04-24 | Micron Technology, Inc. | Method and apparatus for manufacturing known good semiconductor die |
US6340894B1 (en) | 1991-06-04 | 2002-01-22 | Micron Technology, Inc. | Semiconductor testing apparatus including substrate with contact members and conductive polymer interconnect |
US5559444A (en) * | 1991-06-04 | 1996-09-24 | Micron Technology, Inc. | Method and apparatus for testing unpackaged semiconductor dice |
US5578934A (en) * | 1991-06-04 | 1996-11-26 | Micron Technology, Inc. | Method and apparatus for testing unpackaged semiconductor dice |
US5678301A (en) * | 1991-06-04 | 1997-10-21 | Micron Technology, Inc. | Method for forming an interconnect for testing unpackaged semiconductor dice |
US5252850A (en) * | 1992-01-27 | 1993-10-12 | Photometrics Ltd. | Apparatus for contouring a semiconductor, light responsive array with a prescribed physical profile |
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US5751059A (en) * | 1992-06-19 | 1998-05-12 | Thomson-Csf Semiconducteurs Specifiques | Pyroelectric sensor |
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US5476818A (en) * | 1994-08-19 | 1995-12-19 | Motorola, Inc. | Semiconductor structure and method of manufacture |
US5962815A (en) | 1995-01-18 | 1999-10-05 | Prolinx Labs Corporation | Antifuse interconnect between two conducting layers of a printed circuit board |
KR100218996B1 (ko) * | 1995-03-24 | 1999-09-01 | 모기 쥰이찌 | 반도체장치 |
JP3015712B2 (ja) * | 1995-06-30 | 2000-03-06 | 日東電工株式会社 | フィルムキャリアおよびそれを用いてなる半導体装置 |
WO1997011591A1 (en) * | 1995-09-22 | 1997-03-27 | Minnesota Mining And Manufacturing Company | Flexible circuits with bumped interconnection capability |
US5886877A (en) * | 1995-10-13 | 1999-03-23 | Meiko Electronics Co., Ltd. | Circuit board, manufacturing method therefor, and bump-type contact head and semiconductor component packaging module using the circuit board |
KR100201383B1 (ko) * | 1995-10-19 | 1999-06-15 | 구본준 | 인터페이스 조립체를 구비한 유에프비지에이 패키지 |
JP2736042B2 (ja) * | 1995-12-12 | 1998-04-02 | 山一電機株式会社 | 回路基板 |
WO1997027490A1 (en) * | 1996-01-25 | 1997-07-31 | General Dynamics Information Systems, Inc. | Performing an operation on an integrated circuit |
US5756370A (en) * | 1996-02-08 | 1998-05-26 | Micron Technology, Inc. | Compliant contact system with alignment structure for testing unpackaged semiconductor dice |
US6460245B1 (en) * | 1996-03-07 | 2002-10-08 | Tessera, Inc. | Method of fabricating semiconductor chip assemblies |
US5789271A (en) * | 1996-03-18 | 1998-08-04 | Micron Technology, Inc. | Method for fabricating microbump interconnect for bare semiconductor dice |
US5726075A (en) * | 1996-03-29 | 1998-03-10 | Micron Technology, Inc. | Method for fabricating microbump interconnect for bare semiconductor dice |
US5808360A (en) * | 1996-05-15 | 1998-09-15 | Micron Technology, Inc. | Microbump interconnect for bore semiconductor dice |
US5789278A (en) * | 1996-07-30 | 1998-08-04 | Micron Technology, Inc. | Method for fabricating chip modules |
JP3284262B2 (ja) * | 1996-09-05 | 2002-05-20 | セイコーエプソン株式会社 | 液晶表示装置及びそれを用いた電子機器 |
US6121689A (en) * | 1997-07-21 | 2000-09-19 | Miguel Albert Capote | Semiconductor flip-chip package and method for the fabrication thereof |
US5989935A (en) * | 1996-11-19 | 1999-11-23 | Texas Instruments Incorporated | Column grid array for semiconductor packaging and method |
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US6016060A (en) * | 1997-03-25 | 2000-01-18 | Micron Technology, Inc. | Method, apparatus and system for testing bumped semiconductor components |
US5962921A (en) * | 1997-03-31 | 1999-10-05 | Micron Technology, Inc. | Interconnect having recessed contact members with penetrating blades for testing semiconductor dice and packages with contact bumps |
US5931685A (en) * | 1997-06-02 | 1999-08-03 | Micron Technology, Inc. | Interconnect for making temporary electrical connections with bumped semiconductor components |
WO1999021224A1 (fr) | 1997-10-17 | 1999-04-29 | Ibiden Co., Ltd. | Substrat d'un boitier |
JP2000106482A (ja) * | 1998-07-29 | 2000-04-11 | Sony Chem Corp | フレキシブル基板製造方法 |
DE19912240A1 (de) * | 1999-03-18 | 2000-09-28 | Siemens Ag | Bauelement und Verfahren zur Herstellung des Bauelementes |
US6263566B1 (en) * | 1999-05-03 | 2001-07-24 | Micron Technology, Inc. | Flexible semiconductor interconnect fabricated by backslide thinning |
JP3973340B2 (ja) * | 1999-10-05 | 2007-09-12 | Necエレクトロニクス株式会社 | 半導体装置、配線基板、及び、それらの製造方法 |
AU2003233029A1 (en) * | 2002-06-07 | 2003-12-22 | Koninklijke Philips Electronics N.V. | Method of manufacturing an electronic device |
JP3935091B2 (ja) | 2003-02-27 | 2007-06-20 | 浜松ホトニクス株式会社 | 半導体装置、及びそれを用いた放射線検出器 |
US7658994B2 (en) * | 2003-12-30 | 2010-02-09 | 3M Innovative Properties Company | Substrates and compounds bonded thereto |
TWI255466B (en) * | 2004-10-08 | 2006-05-21 | Ind Tech Res Inst | Polymer-matrix conductive film and method for fabricating the same |
US20070103412A1 (en) * | 2005-11-09 | 2007-05-10 | Pao-Yun Tang | Liquid crystal display having a voltage divider with a thermistor |
JP5425404B2 (ja) * | 2008-01-18 | 2014-02-26 | 東京エレクトロン株式会社 | アモルファスカーボン膜の処理方法およびそれを用いた半導体装置の製造方法 |
EP2352168A1 (en) * | 2008-11-25 | 2011-08-03 | Sumitomo Bakelite Co., Ltd. | Electronic component package and electronic component package manufacturing method |
US8198131B2 (en) * | 2009-11-18 | 2012-06-12 | Advanced Semiconductor Engineering, Inc. | Stackable semiconductor device packages |
TWI408785B (zh) | 2009-12-31 | 2013-09-11 | Advanced Semiconductor Eng | 半導體封裝結構 |
US8569894B2 (en) | 2010-01-13 | 2013-10-29 | Advanced Semiconductor Engineering, Inc. | Semiconductor package with single sided substrate design and manufacturing methods thereof |
TWI419283B (zh) | 2010-02-10 | 2013-12-11 | Advanced Semiconductor Eng | 封裝結構 |
TWI411075B (zh) | 2010-03-22 | 2013-10-01 | Advanced Semiconductor Eng | 半導體封裝件及其製造方法 |
US8624374B2 (en) | 2010-04-02 | 2014-01-07 | Advanced Semiconductor Engineering, Inc. | Semiconductor device packages with fan-out and with connecting elements for stacking and manufacturing methods thereof |
US8278746B2 (en) | 2010-04-02 | 2012-10-02 | Advanced Semiconductor Engineering, Inc. | Semiconductor device packages including connecting elements |
CN102986314B (zh) * | 2010-07-06 | 2016-10-12 | 株式会社藤仓 | 层叠配线基板及其制造方法 |
TWI451546B (zh) | 2010-10-29 | 2014-09-01 | Advanced Semiconductor Eng | 堆疊式封裝結構、其封裝結構及封裝結構之製造方法 |
US9171792B2 (en) | 2011-02-28 | 2015-10-27 | Advanced Semiconductor Engineering, Inc. | Semiconductor device packages having a side-by-side device arrangement and stacking functionality |
CN103402309B (zh) * | 2013-07-31 | 2016-05-04 | 无锡市伟丰印刷机械厂 | 一种具有垂直支撑结构的印刷电路板弹性焊盘 |
Family Cites Families (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3868724A (en) * | 1973-11-21 | 1975-02-25 | Fairchild Camera Instr Co | Multi-layer connecting structures for packaging semiconductor devices mounted on a flexible carrier |
JPS6148952A (ja) * | 1984-08-16 | 1986-03-10 | Toshiba Corp | 半導体装置 |
JPS61111561A (ja) * | 1984-10-05 | 1986-05-29 | Fujitsu Ltd | 半導体装置 |
FR2584235B1 (fr) * | 1985-06-26 | 1988-04-22 | Bull Sa | Procede de montage d'un circuit integre sur un support, dispositif en resultant et son application a une carte a microcircuits electroniques |
US4926241A (en) * | 1988-02-19 | 1990-05-15 | Microelectronics And Computer Technology Corporation | Flip substrate for chip mount |
-
1989
- 1989-11-07 SG SG1996007397A patent/SG49842A1/en unknown
- 1989-11-07 EP EP89120640A patent/EP0368262B1/en not_active Expired - Lifetime
- 1989-11-07 DE DE68929282T patent/DE68929282T2/de not_active Expired - Lifetime
- 1989-11-08 KR KR1019890016132A patent/KR960006763B1/ko not_active IP Right Cessation
- 1989-11-08 US US07/433,108 patent/US5072289A/en not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
DE68929282D1 (de) | 2001-03-22 |
SG49842A1 (en) | 1998-06-15 |
DE68929282T2 (de) | 2001-06-07 |
KR960006763B1 (ko) | 1996-05-23 |
EP0368262A3 (en) | 1990-11-28 |
EP0368262B1 (en) | 2001-02-14 |
US5072289A (en) | 1991-12-10 |
EP0368262A2 (en) | 1990-05-16 |
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