KR900008659A - 고성능 집적회로 칩 패키지 및 그 제조방법 - Google Patents

고성능 집적회로 칩 패키지 및 그 제조방법 Download PDF

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KR900008659A
KR900008659A KR1019890016330A KR890016330A KR900008659A KR 900008659 A KR900008659 A KR 900008659A KR 1019890016330 A KR1019890016330 A KR 1019890016330A KR 890016330 A KR890016330 A KR 890016330A KR 900008659 A KR900008659 A KR 900008659A
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South Korea
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integrated circuit
chip package
substrate
heat sink
circuit chip
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KR1019890016330A
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터어릭 이와나
레이스맨 아놀드
나약 디팤
황 리이-팅
디숀 기오라
엘. 제이콥스 스코트
프란시스 다보 로버트
엠. 폴리 니일
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원본미기재
마이크로 일렉트로닉스 센터 오브 노오스 캐롤라이너
아이비이엠 코오퍼레이션
노오던 텔레콤 리미티드
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Publication of KR900008659A publication Critical patent/KR900008659A/ko

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Abstract

내용 없음.

Description

고성능 집적회로 칩 패키지 및 그 제조방법
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
제1도는 본 발영의 고성능 집적회로 칩 패키지의 개략적인 단면도,
제4A-4E도는 본 발명에 따르는 하나의 다중층 와이어링 서브스트레이트에서 자기-정합된 도체면들을 형성시키는 방법을 설명하는 도면,
제5A-5E도는 본 발명에 따르는 하나의 다층 와이어링 서브스트레이트에서 자기-정합된 도체면들을 형성시키는 방법을 설명하는 도면.

Claims (18)

  1. 자신의 한면에서 그 반대면까지 뻗어있는 도체들을 가진 하나의 지지서브스트레이트, 상기 반대면상에 있으며 부착된 집적회로칩들의 앞면을 서로 전기적으로 연결시키고 또한 상기 도체들과도 전기적으로 연결시키는 하나의 다중층 와이어링 서브스트레이트, 마이크로채널들이 자체내에 형성되어 있는 하나의 히트싱크, 및 상기 히트싱크의 한면과 상기 집 적회로칩들의 뒷면들 사이에 있는 열전도쿠션물질들로 구성된 하나의 집직회로칩패키지.
  2. 제1항에 있어서, 상기 열전도쿠션물질이 리플로우된 땜납인 집적회로칩패키지.
  3. 제2항에 있어서, 상기 리플로후된 땜납이 무르고, 저용융점의 땜납인 집적회로칩패키지.
  4. 제2항에 있어서, 상기 땜납이 인듐인 집적회로패키지.
  5. 제5항에 있어서, 상기 인듐의 두께가 약 650㎛인 집적회로칩패키지
  6. 제2항에 있어서, 상기 땜납이 인듐의 합금인 집적회로칩패키지.
  7. 제1항에 있어서, 상기 열전도쿠션물질은 땜납 예비성형체를 구성하며 상기 히트싱크는 상기 예비성형체를 확보하기 위하여 상기 한끝에 다수의 공동을 가지는 집적회로칩패키지.
  8. 제1항에 있어서, 상기 열전도쿠션물질이 상기 집적회로칩들에서 상기 히트싱크로 열을 효과적으로 전도하기에는 충분히 엷지만, 상기 패키지에서 칫수변이 및 열팽창에 대한 쿠션을 가지기에는 충분히 두꺼운 집적회로칩 패키지.
  9. 제1항에 있어서, 상기 히트싱크로부터 열을 전달하기 위하여 상기 마이크로채널들에 걸쳐 유체흐름을 제공하는 수단이 추가로 포함된 집적회로칩패키지.
  10. 제9항에 있어서, 유체흐름을 제공하는 상기 수단이 상기 마이크로채널들에 걸쳐 유체 난류를 제공하는 수단를 포함하는 집적 회로칩 패키지.
  11. 집적회로칩들에 전력, 그라운드 및 신호 연결들을 제공하기 위해 상호연결 와이어링을 가지는 서브스트레이트의 한면상에 상기 집적회로칩들의 앞면들을 부착시키는 단계, 상기 집적회로칩들의 뒷면들 가까이 히크싱크를 놀아 열전도물질의 예비성형체가 상기 집적직회로칩들의 뒷면과 상기 히트싱크 사이에 있게하는 단계, 조립된 지지서브스드레이트, 집쩍회로칩들, 히트싱크 및 예비성형체를 가열하여 상기 예비성형체를 녹이는 단계, 및 그 조립된 지지서브스트레이트, 질적회로칩들, 히트싱크 및 예비성형채를 냉각시켜 상기 집적회로칩들과 상기 히트싱크 사이에 상기 열전도물질의 일치하는 층을 형성시키는 단계들로 구성된 집적회로칩패키지 제작방법.
  12. 제11항에 있어서, 자신의 한면에서 그 반대면까지 뻗어있는 다수의 토체들을 갖는 하나의 지지서브스트레이트를 형성시키고 또한 지지서브스트레이트의 상기 반대면상에 있으며 집적회로칩들의 앞면을 자신의 노출된 표면에 전기 적으로 연결시키는 하나의 다중층 와이어링 서브스트레이트를 형성시킴으로써 서브스트레이트를 형성시키는 단계가 상기 부착단계를 선행하는 집적회로칩패키지 제작방법.
  13. 제11항에 있어서, 상기 서브스트레이트를 형성시키는 단계가 상기 부착단계를 선행하며, 상기 서브스트레이트를 형성시키는 단계는 다음 두 단계 즉, 자신의 한면에서 그 반대면까지 뻗어있는 채널들을 가지는 단일체블록의 세라믹을 소성시키고 그 채널들을 도체로 채움으로써 하나의 지지서브스트레이트를 형성시키는 단계, 및 상기 반대면상에 있으며 자기위에 다수의 절연층들 즉, 그들 각각이 하층의 전도경로상에 전기적으로 부착된 하나 혹은그 이상의 전도경로들 및 하층의 전도경로상에 전기적으로 부착된 하나의 전도평면을 포함하는 절연층들을 형성시킴으로써 하나의 다중층 와이어링 서브스트레이트를 형성시키는 단계들로 구성된 집적회로칩패키지 제작방법.
  14. 제13항에 있어서, 상기 전도경로들이 그들의 옆면상에 제2도체로 피복된 제1도체를 포함하는 집적회로칩 패키지 제작방법.
  15. 제1l항에 있어서, 상기 부착단계가 서브스트레이트의 상기 한면과 상기 집적회로칩들 사이에 땜납범프들을 제공하는 단계, 가열하여 상기 땜납범프들을 녹이고 리플로우시키는 단계, 상기 리플로우된 땜납범프들을 냉각시키는 단계틀로 구성된 집직회로칩패키시 제작방법.
  16. 제15항에 있어서, 상기 땜납범프들을 가열하는 단계가 조립된 서브스트레이트 집적회로칩들, 히트싱크 및 예비성형체를 가열하는 단계보다 더욱 높은 온도에서 일어나는 집적회로칩괘키지 제작방법.
  17. 제11항에 있어서, 히트싱크를 집적회로칩들 뒷면들 가까이 놓은 단계가 상기 예비성형체를 그들 사이에 놓고 또한 상기 노출된 면들과 히트싱크 사이의 거리를 약 60㎛로 유지시키는 단계를 포함하는 집적 회로칩 패키지 제작방법.
  18. 제11항에 있어서, 자체 내에 마이크로채 널들을 가지는 히트싱크를 형성시키는 단계가 히트싱크를 집적 회로 칩들의 뒷면들 가까이 놓은 단계를 선행하고, 상기 냉각시켜 열전도물질의 일치하는 층을 형성시키는 단계 다음에 상기 마이크로채널들에 걸쳐 유체흐름을 제공하는 단계가 있는 집적회로칩패키지 제작방법.
    ※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
KR1019890016330A 1988-11-10 1989-11-10 고성능 집적회로 칩 패키지 및 그 제조방법 KR900008659A (ko)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20000039046A (ko) * 1998-12-10 2000-07-05 밍 루 히트싱크 부착방법

Families Citing this family (133)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2246471B (en) * 1988-08-23 1993-07-28 Nobuo Mikoshiba Cooling semiconductor devices
JPH03257953A (ja) * 1990-03-08 1991-11-18 Nobuo Mikoshiba 半導体素子
US5057908A (en) * 1990-07-10 1991-10-15 Iowa State University Research Foundation, Inc. High power semiconductor device with integral heat sink
DE4038168C2 (de) * 1990-11-30 1998-09-24 Daimler Benz Ag Verfahren zur Herstellung eines Multichip-Moduls
JP2960560B2 (ja) 1991-02-28 1999-10-06 株式会社日立製作所 超小型電子機器
DE4326207A1 (de) * 1992-10-06 1994-04-07 Hewlett Packard Co Mechanisch schwimmendes Mehr-Chip-Substrat
US5430611A (en) * 1993-07-06 1995-07-04 Hewlett-Packard Company Spring-biased heat sink assembly for a plurality of integrated circuits on a substrate
US5396403A (en) * 1993-07-06 1995-03-07 Hewlett-Packard Company Heat sink assembly with thermally-conductive plate for a plurality of integrated circuits on a substrate
WO1996001497A1 (de) * 1994-07-05 1996-01-18 Siemens Aktiengesellschaft Verfahren zur herstellung einer dreidimensionalen schaltungsanordnung
US5557501A (en) * 1994-11-18 1996-09-17 Tessera, Inc. Compliant thermal connectors and assemblies incorporating the same
US5757620A (en) * 1994-12-05 1998-05-26 International Business Machines Corporation Apparatus for cooling of chips using blind holes with customized depth
US5604978A (en) * 1994-12-05 1997-02-25 International Business Machines Corporation Method for cooling of chips using a plurality of materials
US5573171A (en) * 1995-02-16 1996-11-12 Trw Inc. Method of thin film patterning by reflow
US6388203B1 (en) 1995-04-04 2002-05-14 Unitive International Limited Controlled-shaped solder reservoirs for increasing the volume of solder bumps, and structures formed thereby
AU5316996A (en) 1995-04-05 1996-10-23 Mcnc A solder bump structure for a microelectronic substrate
US5744752A (en) * 1995-06-05 1998-04-28 International Business Machines Corporation Hermetic thin film metallized sealband for SCM and MCM-D modules
US5768104A (en) * 1996-02-22 1998-06-16 Cray Research, Inc. Cooling approach for high power integrated circuits mounted on printed circuit boards
US5808874A (en) * 1996-05-02 1998-09-15 Tessera, Inc. Microelectronic connections with liquid conductive elements
JP2917909B2 (ja) * 1996-05-07 1999-07-12 日本電気株式会社 多層配線基板の製造方法
JP2783259B2 (ja) * 1996-07-18 1998-08-06 日本電気株式会社 半導体パッケージとその製造方法
US5801442A (en) * 1996-07-22 1998-09-01 Northrop Grumman Corporation Microchannel cooling of high power semiconductor devices
US6025767A (en) * 1996-08-05 2000-02-15 Mcnc Encapsulated micro-relay modules and methods of fabricating same
US6323549B1 (en) * 1996-08-29 2001-11-27 L. Pierre deRochemont Ceramic composite wiring structures for semiconductor devices and method of manufacture
US5739586A (en) * 1996-08-30 1998-04-14 Scientific-Atlanta, Inc. Heat sink assembly including a printed wiring board and a metal case
US5900675A (en) * 1997-04-21 1999-05-04 International Business Machines Corporation Organic controlled collapse chip connector (C4) ball grid array (BGA) chip carrier with dual thermal expansion rates
JPH11121666A (ja) 1997-10-20 1999-04-30 Fujitsu Ltd マルチチップモジュールの冷却装置
US5981310A (en) * 1998-01-22 1999-11-09 International Business Machines Corporation Multi-chip heat-sink cap assembly
DE19805492C2 (de) * 1998-02-11 1999-12-02 Siemens Ag Leiterplatte
US6281573B1 (en) 1998-03-31 2001-08-28 International Business Machines Corporation Thermal enhancement approach using solder compositions in the liquid state
RU2129320C1 (ru) * 1998-05-22 1999-04-20 Гурович Борис Аронович Способ формирования проводящей структуры
US6196307B1 (en) 1998-06-17 2001-03-06 Intersil Americas Inc. High performance heat exchanger and method
JP3681542B2 (ja) * 1998-07-01 2005-08-10 富士通株式会社 プリント回路基板および多段バンプ用中継基板
JP2000031360A (ja) 1998-07-08 2000-01-28 Hitachi Ltd マルチチップモジュール
US6220499B1 (en) * 1998-09-29 2001-04-24 International Business Machines Corporation Method for assembling a chip carrier to a semiconductor device
US6275381B1 (en) * 1998-12-10 2001-08-14 International Business Machines Corporation Thermal paste preforms as a heat transfer media between a chip and a heat sink and method thereof
US6246583B1 (en) 1999-03-04 2001-06-12 International Business Machines Corporation Method and apparatus for removing heat from a semiconductor device
US6821571B2 (en) * 1999-06-18 2004-11-23 Applied Materials Inc. Plasma treatment to enhance adhesion and to minimize oxidation of carbon-containing layers
JP2001053205A (ja) 1999-08-05 2001-02-23 Hitachi Ltd マルチチップモジュールの封止冷却装置
JP3518434B2 (ja) 1999-08-11 2004-04-12 株式会社日立製作所 マルチチップモジュールの冷却装置
US6461891B1 (en) 1999-09-13 2002-10-08 Intel Corporation Method of constructing an electronic assembly having an indium thermal couple and an electronic assembly having an indium thermal couple
US6730998B1 (en) * 2000-02-10 2004-05-04 Micron Technology, Inc. Stereolithographic method for fabricating heat sinks, stereolithographically fabricated heat sinks, and semiconductor devices including same
US6372997B1 (en) 2000-02-25 2002-04-16 Thermagon, Inc. Multi-layer structure and method for forming a thermal interface with low contact resistance between a microelectronic component package and heat sink
CN1315822A (zh) * 2000-03-30 2001-10-03 日本胜利株式会社 印刷电路板的薄膜电阻体元件及其形成方法
AU2002228926A1 (en) * 2000-11-10 2002-05-21 Unitive Electronics, Inc. Methods of positioning components using liquid prime movers and related structures
US6863209B2 (en) 2000-12-15 2005-03-08 Unitivie International Limited Low temperature methods of bonding components
GB0110447D0 (en) * 2001-04-28 2001-06-20 Genevac Ltd Improvements in and relating to the heating of microtitre well plates in centrifugal evaporators
US6810583B2 (en) * 2001-08-07 2004-11-02 International Business Machines Corporation Coupling of conductive vias to complex power-signal substructures
US7134486B2 (en) * 2001-09-28 2006-11-14 The Board Of Trustees Of The Leeland Stanford Junior University Control of electrolysis gases in electroosmotic pump systems
US6942018B2 (en) * 2001-09-28 2005-09-13 The Board Of Trustees Of The Leland Stanford Junior University Electroosmotic microchannel cooling system
US6504242B1 (en) 2001-11-15 2003-01-07 Intel Corporation Electronic assembly having a wetting layer on a thermally conductive heat spreader
US6606251B1 (en) 2002-02-07 2003-08-12 Cooligy Inc. Power conditioning module
US20030160319A1 (en) * 2002-02-27 2003-08-28 Wen-Chun Zheng Solid assembly of flip-chip package attached to heat removal device and method of manufacturing same
US6746823B2 (en) * 2002-06-01 2004-06-08 Industrial Technology Research Institute Fabricating process of non-gap 3-D microstructure array mold core
US7147367B2 (en) * 2002-06-11 2006-12-12 Saint-Gobain Performance Plastics Corporation Thermal interface material with low melting alloy
US7547623B2 (en) * 2002-06-25 2009-06-16 Unitive International Limited Methods of forming lead free solder bumps
US7531898B2 (en) * 2002-06-25 2009-05-12 Unitive International Limited Non-Circular via holes for bumping pads and related structures
US6960828B2 (en) * 2002-06-25 2005-11-01 Unitive International Limited Electronic structures including conductive shunt layers
US6988534B2 (en) * 2002-11-01 2006-01-24 Cooligy, Inc. Method and apparatus for flexible fluid delivery for cooling desired hot spots in a heat producing device
US6665187B1 (en) * 2002-07-16 2003-12-16 International Business Machines Corporation Thermally enhanced lid for multichip modules
US7022192B2 (en) * 2002-09-04 2006-04-04 Tokyo Electron Limited Semiconductor wafer susceptor
US7086839B2 (en) * 2002-09-23 2006-08-08 Cooligy, Inc. Micro-fabricated electrokinetic pump with on-frit electrode
US7511443B2 (en) * 2002-09-26 2009-03-31 Barrett Technology, Inc. Ultra-compact, high-performance motor controller and method of using same
US6994151B2 (en) * 2002-10-22 2006-02-07 Cooligy, Inc. Vapor escape microchannel heat exchanger
AU2003286855A1 (en) 2002-11-01 2004-06-07 Cooligy, Inc. Method and apparatus for achieving temperature uniformity and hot spot cooling in a heat producing device
US7806168B2 (en) * 2002-11-01 2010-10-05 Cooligy Inc Optimal spreader system, device and method for fluid cooled micro-scaled heat exchange
US8464781B2 (en) * 2002-11-01 2013-06-18 Cooligy Inc. Cooling systems incorporating heat exchangers and thermoelectric layers
US6986382B2 (en) 2002-11-01 2006-01-17 Cooligy Inc. Interwoven manifolds for pressure drop reduction in microchannel heat exchangers
US7000684B2 (en) * 2002-11-01 2006-02-21 Cooligy, Inc. Method and apparatus for efficient vertical fluid delivery for cooling a heat producing device
US7836597B2 (en) 2002-11-01 2010-11-23 Cooligy Inc. Method of fabricating high surface to volume ratio structures and their integration in microheat exchangers for liquid cooling system
US7156159B2 (en) * 2003-03-17 2007-01-02 Cooligy, Inc. Multi-level microchannel heat exchangers
SG143934A1 (en) 2002-11-08 2008-07-29 Semiconductor Energy Lab Display appliance
EP1333492B1 (en) * 2002-11-08 2006-03-01 Agilent Technologies Inc. a Delaware Corporation Cooling a microchip on a circuit board
TW549573U (en) * 2002-11-27 2003-08-21 Via Tech Inc IC package for a multi-chip module
US7201012B2 (en) * 2003-01-31 2007-04-10 Cooligy, Inc. Remedies to prevent cracking in a liquid system
US7090001B2 (en) * 2003-01-31 2006-08-15 Cooligy, Inc. Optimized multiple heat pipe blocks for electronics cooling
US7293423B2 (en) 2004-06-04 2007-11-13 Cooligy Inc. Method and apparatus for controlling freezing nucleation and propagation
US7044196B2 (en) * 2003-01-31 2006-05-16 Cooligy,Inc Decoupled spring-loaded mounting apparatus and method of manufacturing thereof
TWI225899B (en) * 2003-02-18 2005-01-01 Unitive Semiconductor Taiwan C Etching solution and method for manufacturing conductive bump using the etching solution to selectively remove barrier layer
WO2004075291A1 (ja) * 2003-02-24 2004-09-02 Fujitsu Limited 電子部品と放熱部材および、それらを使用した半導体装置の製造方法
US20040182551A1 (en) * 2003-03-17 2004-09-23 Cooligy, Inc. Boiling temperature design in pumped microchannel cooling loops
US7017654B2 (en) * 2003-03-17 2006-03-28 Cooligy, Inc. Apparatus and method of forming channels in a heat-exchanging device
US6903929B2 (en) * 2003-03-31 2005-06-07 Intel Corporation Two-phase cooling utilizing microchannel heat exchangers and channeled heat sink
US7591302B1 (en) 2003-07-23 2009-09-22 Cooligy Inc. Pump and fan control concepts in a cooling system
US7021369B2 (en) 2003-07-23 2006-04-04 Cooligy, Inc. Hermetic closed loop fluid system
US7132746B2 (en) * 2003-08-18 2006-11-07 Delphi Technologies, Inc. Electronic assembly with solder-bonded heat sink
CN100477180C (zh) * 2003-09-24 2009-04-08 揖斐电株式会社 中继基板及多层印刷电路板
JP4771808B2 (ja) * 2003-09-24 2011-09-14 イビデン株式会社 半導体装置
US7049216B2 (en) * 2003-10-14 2006-05-23 Unitive International Limited Methods of providing solder structures for out plane connections
US7269005B2 (en) * 2003-11-21 2007-09-11 Intel Corporation Pumped loop cooling with remote heat exchanger and display cooling
US20050141195A1 (en) * 2003-12-31 2005-06-30 Himanshu Pokharna Folded fin microchannel heat exchanger
US7358174B2 (en) 2004-04-13 2008-04-15 Amkor Technology, Inc. Methods of forming solder bumps on exposed metal pads
US7616444B2 (en) 2004-06-04 2009-11-10 Cooligy Inc. Gimballed attachment for multiple heat exchangers
US7188662B2 (en) * 2004-06-04 2007-03-13 Cooligy, Inc. Apparatus and method of efficient fluid delivery for cooling a heat producing device
JP4343044B2 (ja) * 2004-06-30 2009-10-14 新光電気工業株式会社 インターポーザ及びその製造方法並びに半導体装置
US7727815B2 (en) * 2004-09-29 2010-06-01 Intel Corporation Reactive gettering in phase change solders to inhibit oxidation at contact surfaces
US20060118601A1 (en) * 2004-12-06 2006-06-08 Brandenburg Scott D Epoxy-solder thermally conductive structure for an integrated circuit
US7310233B2 (en) * 2005-01-28 2007-12-18 Tyco Electronics Power Systems Apparatus and method for transferring heat from an electrical module
US20060205170A1 (en) * 2005-03-09 2006-09-14 Rinne Glenn A Methods of forming self-healing metal-insulator-metal (MIM) structures and related devices
WO2006095436A1 (ja) * 2005-03-11 2006-09-14 Fujitsu Limited 吸熱部材、冷却装置及び電子機器
US7265445B2 (en) * 2005-03-23 2007-09-04 Texas Instruments Incorporated Integrated circuit package
US7913719B2 (en) 2006-01-30 2011-03-29 Cooligy Inc. Tape-wrapped multilayer tubing and methods for making the same
US20070175621A1 (en) * 2006-01-31 2007-08-02 Cooligy, Inc. Re-workable metallic TIM for efficient heat exchange
US7932615B2 (en) * 2006-02-08 2011-04-26 Amkor Technology, Inc. Electronic devices including solder bumps on compliant dielectric layers
US7674701B2 (en) 2006-02-08 2010-03-09 Amkor Technology, Inc. Methods of forming metal layers using multi-layer lift-off patterns
WO2007098077A2 (en) 2006-02-16 2007-08-30 Cooligy, Inc. Liquid cooling loops for server applications
US8157001B2 (en) 2006-03-30 2012-04-17 Cooligy Inc. Integrated liquid to air conduction module
US20070227698A1 (en) * 2006-03-30 2007-10-04 Conway Bruce R Integrated fluid pump and radiator reservoir
US7715194B2 (en) 2006-04-11 2010-05-11 Cooligy Inc. Methodology of cooling multiple heat sources in a personal computer through the use of multiple fluid-based heat exchanging loops coupled via modular bus-type heat exchangers
US7651938B2 (en) * 2006-06-07 2010-01-26 Advanced Micro Devices, Inc. Void reduction in indium thermal interface material
DE102007006125B3 (de) * 2007-02-02 2008-10-16 Micropelt Gmbh Verfahren zum Herstellen einer Anordnung aus Bauelementen und Anordnung von Bauelementen
TW200934352A (en) 2007-08-07 2009-08-01 Cooligy Inc Internal access mechanism for a server rack
US7535714B1 (en) * 2007-10-31 2009-05-19 International Business Machines Corporation Apparatus and method providing metallic thermal interface between metal capped module and heat sink
TWI354529B (en) * 2007-11-23 2011-12-11 Ind Tech Res Inst Metal thermal interface material and thermal modul
US7834442B2 (en) * 2007-12-12 2010-11-16 International Business Machines Corporation Electronic package method and structure with cure-melt hierarchy
US8250877B2 (en) 2008-03-10 2012-08-28 Cooligy Inc. Device and methodology for the removal of heat from an equipment rack by means of heat exchangers mounted to a door
US9297571B1 (en) 2008-03-10 2016-03-29 Liebert Corporation Device and methodology for the removal of heat from an equipment rack by means of heat exchangers mounted to a door
US7952874B2 (en) * 2008-07-01 2011-05-31 Dell Products L.P. Planer board with integrated cold plate
CN102171378A (zh) 2008-08-05 2011-08-31 固利吉股份有限公司 用于光学和电子器件的热管理的键合金属和陶瓷板
US8232636B2 (en) * 2010-01-26 2012-07-31 International Business Machines Corporation Reliability enhancement of metal thermal interface
KR101394205B1 (ko) * 2010-06-09 2014-05-14 에스케이하이닉스 주식회사 반도체 패키지
US20130027885A1 (en) * 2011-07-25 2013-01-31 International Business Machines Corporation Heat spreader for multi-chip modules
US9029259B2 (en) 2012-02-17 2015-05-12 Teledyne Scientific & Imaging, Llc Self-aligning hybridization method
US8946871B2 (en) * 2012-11-07 2015-02-03 Lsi Corporation Thermal improvement of integrated circuit packages
US8847409B1 (en) 2013-06-03 2014-09-30 Teledyne Scientific & Imaging, Llc Compliant micro-socket hybridization method
US10148155B2 (en) 2013-12-04 2018-12-04 Barrett Technology, Llc Method and apparatus for connecting an ultracompact, high-performance motor controller to an ultracompact, high-performance brushless DC motor
US9559036B1 (en) 2014-08-01 2017-01-31 Altera Corporation Integrated circuit package with plated heat spreader
US9848498B2 (en) * 2014-08-13 2017-12-19 Finisar Corporation Optoelectronic subassembly with components mounted on top and bottom of substrate
KR102280477B1 (ko) 2015-10-08 2021-07-22 삼성전자주식회사 히트 싱크 및 이를 갖는 메모리 모듈
DE102016211967B3 (de) * 2016-06-30 2017-09-07 Schweizer Electronic Ag Elektronisches Bauteil und Verfahren zum Herstellen eines elektronischen Bauteils
JP7163583B2 (ja) * 2018-01-30 2022-11-01 株式会社デンソー 半導体装置
US10490482B1 (en) * 2018-12-05 2019-11-26 Toyota Motor Engineering & Manufacturing North America, Inc. Cooling devices including jet cooling with an intermediate mesh and methods for using the same
US11735495B2 (en) * 2019-02-27 2023-08-22 Intel Corporation Active package cooling structures using molded substrate packaging technology
CN114975405A (zh) * 2022-05-27 2022-08-30 盛合晶微半导体(江阴)有限公司 一种晶圆封装系统及其制备方法

Family Cites Families (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3968193A (en) * 1971-08-27 1976-07-06 International Business Machines Corporation Firing process for forming a multilayer glass-metal module
FR2328286A1 (fr) * 1975-10-14 1977-05-13 Thomson Csf Procede de fabrication de dispositifs a semiconducteurs, presentant une tres faible resistance thermique, et dispositifs obtenus par ledit procede
JPS52116185A (en) * 1976-03-26 1977-09-29 Hitachi Ltd Mesa-type semiconductor laser
US4034468A (en) * 1976-09-03 1977-07-12 Ibm Corporation Method for making conduction-cooled circuit package
US4092697A (en) * 1976-12-06 1978-05-30 International Business Machines Corporation Heat transfer mechanism for integrated circuit package
GB1598174A (en) * 1977-05-31 1981-09-16 Ibm Cooling electrical apparatus
US4180414A (en) * 1978-07-10 1979-12-25 Optical Coating Laboratory, Inc. Concentrator solar cell array module
JPS5936827B2 (ja) * 1979-01-12 1984-09-06 日本電信電話株式会社 集積回路素子の冷却装置
US4295183A (en) * 1979-06-29 1981-10-13 International Business Machines Corporation Thin film metal package for LSI chips
US4322778A (en) * 1980-01-25 1982-03-30 International Business Machines Corp. High performance semiconductor package assembly
US4349862A (en) * 1980-08-11 1982-09-14 International Business Machines Corporation Capacitive chip carrier and multilayer ceramic capacitors
US4498530A (en) * 1981-08-03 1985-02-12 International Business Machines Corporation Flexible thermal conduction element for cooling semiconductor devices
JPS59213151A (ja) * 1983-05-18 1984-12-03 Hitachi Ltd 半導体素子の冷却装置
US4717591A (en) * 1983-06-30 1988-01-05 International Business Machines Corporation Prevention of mechanical and electronic failures in heat-treated structures
US4612601A (en) * 1983-11-30 1986-09-16 Nec Corporation Heat dissipative integrated circuit chip package
JPS60160149A (ja) * 1984-01-26 1985-08-21 Fujitsu Ltd 集積回路装置の冷却方式
US4639829A (en) * 1984-06-29 1987-01-27 International Business Machines Corporation Thermal conduction disc-chip cooling enhancement means
JPS6118159A (ja) * 1984-07-04 1986-01-27 Hitachi Ltd 半導体装置
JPS6129161A (ja) * 1984-07-20 1986-02-10 Hitachi Ltd 熱伝導冷却モジユ−ル装置
US4617730A (en) * 1984-08-13 1986-10-21 International Business Machines Corporation Method of fabricating a chip interposer
US4652977A (en) * 1984-09-13 1987-03-24 Schlumberger Technology Corporation Microelectronics module
JPS6197953A (ja) * 1984-10-19 1986-05-16 Fujitsu Ltd 集積回路部品パツケ−ジの伝導冷却構造
JPS61220359A (ja) * 1985-03-26 1986-09-30 Hitachi Ltd 半導体モジユ−ル冷却構造体
US4758926A (en) * 1986-03-31 1988-07-19 Microelectronics And Computer Technology Corporation Fluid-cooled integrated circuit package
JPH0777247B2 (ja) * 1986-09-17 1995-08-16 富士通株式会社 半導体装置の製造方法
JPS63289847A (ja) * 1987-05-21 1988-11-28 Nec Corp Lsiパッケ−ジの放熱構造
US4926241A (en) * 1988-02-19 1990-05-15 Microelectronics And Computer Technology Corporation Flip substrate for chip mount
US4942076A (en) * 1988-11-03 1990-07-17 Micro Substrates, Inc. Ceramic substrate with metal filled via holes for hybrid microcircuits and method of making the same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20000039046A (ko) * 1998-12-10 2000-07-05 밍 루 히트싱크 부착방법

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US5325265A (en) 1994-06-28

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