KR900003940B1 - 상보형(相補形) 금속산화막 반도체 직접회로장치 - Google Patents
상보형(相補形) 금속산화막 반도체 직접회로장치 Download PDFInfo
- Publication number
- KR900003940B1 KR900003940B1 KR1019850001644A KR850001644A KR900003940B1 KR 900003940 B1 KR900003940 B1 KR 900003940B1 KR 1019850001644 A KR1019850001644 A KR 1019850001644A KR 850001644 A KR850001644 A KR 850001644A KR 900003940 B1 KR900003940 B1 KR 900003940B1
- Authority
- KR
- South Korea
- Prior art keywords
- well
- diffusion region
- type diffusion
- type
- substrate
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired
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Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/80—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs
- H10D84/82—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components
- H10D84/83—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00, e.g. integration of IGFETs of only field-effect components of only insulated-gate FETs [IGFET]
- H10D84/85—Complementary IGFETs, e.g. CMOS
- H10D84/854—Complementary IGFETs, e.g. CMOS comprising arrangements for preventing bipolar actions between the different IGFET regions, e.g. arrangements for latchup prevention
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/01—Manufacture or treatment
- H10D84/0123—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs
- H10D84/0126—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs
- H10D84/0165—Integrating together multiple components covered by H10D12/00 or H10D30/00, e.g. integrating multiple IGBTs the components including insulated gates, e.g. IGFETs the components including complementary IGFETs, e.g. CMOS devices
- H10D84/0186—Manufacturing their interconnections or electrodes, e.g. source or drain electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/01—Manufacture or treatment
- H10W20/021—Manufacture or treatment of interconnections within wafers or substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/20—Interconnections within wafers or substrates, e.g. through-silicon vias [TSV]
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10W—GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
- H10W20/00—Interconnections in chips, wafers or substrates
- H10W20/40—Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes
- H10W20/41—Interconnections external to wafers or substrates, e.g. back-end-of-line [BEOL] metallisations or vias connecting to gate electrodes characterised by their conductive parts
- H10W20/427—Power or ground buses
Landscapes
- Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
- Semiconductor Integrated Circuits (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP59086875A JPS60231356A (ja) | 1984-04-28 | 1984-04-28 | 相補形金属酸化膜半導体集積回路装置 |
| JP59-86875 | 1984-04-28 | ||
| JP86875 | 1984-04-28 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR850007315A KR850007315A (ko) | 1985-12-02 |
| KR900003940B1 true KR900003940B1 (ko) | 1990-06-04 |
Family
ID=13898998
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019850001644A Expired KR900003940B1 (ko) | 1984-04-28 | 1985-03-14 | 상보형(相補形) 금속산화막 반도체 직접회로장치 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US4772930A (enExample) |
| JP (1) | JPS60231356A (enExample) |
| KR (1) | KR900003940B1 (enExample) |
| GB (1) | GB2158640B (enExample) |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60231356A (ja) * | 1984-04-28 | 1985-11-16 | Mitsubishi Electric Corp | 相補形金属酸化膜半導体集積回路装置 |
| JPS648659A (en) * | 1987-06-30 | 1989-01-12 | Mitsubishi Electric Corp | Supplementary semiconductor integrated circuit device |
| US4866567A (en) * | 1989-01-06 | 1989-09-12 | Ncr Corporation | High frequency integrated circuit channel capacitor |
| US6563730B1 (en) | 2002-04-09 | 2003-05-13 | National Semiconductor Corporation | Low power static RAM architecture |
| US6711051B1 (en) | 2002-09-05 | 2004-03-23 | National Semiconductor Corporation | Static RAM architecture with bit line partitioning |
Family Cites Families (16)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS4836598B1 (enExample) * | 1969-09-05 | 1973-11-06 | ||
| JPS5534582B2 (enExample) * | 1974-06-24 | 1980-09-08 | ||
| US4006491A (en) * | 1975-05-15 | 1977-02-01 | Motorola, Inc. | Integrated circuit having internal main supply voltage regulator |
| GB1558502A (en) * | 1975-07-18 | 1980-01-03 | Tokyo Shibaura Electric Co | Semiconductor integrated circuit device |
| GB1559581A (en) * | 1975-07-18 | 1980-01-23 | Tokyo Shibaura Electric Co | Complementary mosfet device |
| JPS5234680A (en) * | 1975-09-12 | 1977-03-16 | Toshiba Corp | Integrated circuit |
| US4035826A (en) * | 1976-02-23 | 1977-07-12 | Rca Corporation | Reduction of parasitic bipolar effects in integrated circuits employing insulated gate field effect transistors via the use of low resistance substrate contacts extending through source region |
| US4100561A (en) * | 1976-05-24 | 1978-07-11 | Rca Corp. | Protective circuit for MOS devices |
| US4063274A (en) * | 1976-12-10 | 1977-12-13 | Rca Corporation | Integrated circuit device including both N-channel and P-channel insulated gate field effect transistors |
| FR2408914A1 (fr) * | 1977-11-14 | 1979-06-08 | Radiotechnique Compelec | Dispositif semi-conducteur monolithique comprenant deux transistors complementaires et son procede de fabrication |
| JPS5939904B2 (ja) * | 1978-09-28 | 1984-09-27 | 株式会社東芝 | 半導体装置 |
| EP0084000A3 (en) * | 1982-01-11 | 1985-07-10 | FAIRCHILD CAMERA & INSTRUMENT CORPORATION | Cmos device |
| JPS58127348A (ja) * | 1982-01-25 | 1983-07-29 | Mitsubishi Electric Corp | 大規模半導体集積回路装置 |
| JPS60152055A (ja) * | 1984-01-20 | 1985-08-10 | Matsushita Electric Ind Co Ltd | 相補型mos半導体装置 |
| JPS60231356A (ja) * | 1984-04-28 | 1985-11-16 | Mitsubishi Electric Corp | 相補形金属酸化膜半導体集積回路装置 |
| JPS6136946A (ja) * | 1984-07-30 | 1986-02-21 | Nec Corp | 半導体装置 |
-
1984
- 1984-04-28 JP JP59086875A patent/JPS60231356A/ja active Granted
-
1985
- 1985-03-14 KR KR1019850001644A patent/KR900003940B1/ko not_active Expired
- 1985-04-25 GB GB08510505A patent/GB2158640B/en not_active Expired
-
1987
- 1987-05-04 US US07/048,509 patent/US4772930A/en not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| GB2158640B (en) | 1988-02-24 |
| GB2158640A (en) | 1985-11-13 |
| US4772930A (en) | 1988-09-20 |
| GB8510505D0 (en) | 1985-05-30 |
| KR850007315A (ko) | 1985-12-02 |
| JPH0144023B2 (enExample) | 1989-09-25 |
| JPS60231356A (ja) | 1985-11-16 |
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