KR880002051A - 포지티브형 포토레지스트 조성물용 현상액 - Google Patents
포지티브형 포토레지스트 조성물용 현상액 Download PDFInfo
- Publication number
- KR880002051A KR880002051A KR1019870007790A KR870007790A KR880002051A KR 880002051 A KR880002051 A KR 880002051A KR 1019870007790 A KR1019870007790 A KR 1019870007790A KR 870007790 A KR870007790 A KR 870007790A KR 880002051 A KR880002051 A KR 880002051A
- Authority
- KR
- South Korea
- Prior art keywords
- photoresist composition
- developer
- positive photoresist
- composition according
- water
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03C—PHOTOSENSITIVE MATERIALS FOR PHOTOGRAPHIC PURPOSES; PHOTOGRAPHIC PROCESSES, e.g. CINE, X-RAY, COLOUR, STEREO-PHOTOGRAPHIC PROCESSES; AUXILIARY PROCESSES IN PHOTOGRAPHY
- G03C1/00—Photosensitive materials
- G03C1/005—Silver halide emulsions; Preparation thereof; Physical treatment thereof; Incorporation of additives therein
- G03C1/06—Silver halide emulsions; Preparation thereof; Physical treatment thereof; Incorporation of additives therein with non-macromolecular additives
- G03C1/08—Sensitivity-increasing substances
- G03C1/10—Organic substances
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/30—Imagewise removal using liquid means
- G03F7/32—Liquid compositions therefor, e.g. developers
- G03F7/322—Aqueous alkaline compositions
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/30—Imagewise removal using liquid means
- G03F7/32—Liquid compositions therefor, e.g. developers
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Chemical & Material Sciences (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Abstract
내용 없음
Description
본 내용은 요부공개 건이므로 전문내용을 수록하지 않았음
Claims (6)
- 포지티브형 포토레지스트조성물용 수성현상액에 있어서, (a) 용매로서 물; (b) 용매에 용해되는 수용성 유기염기화합물; 및 (c) 일반식(식 중 R1은 탄소수 5-15인 알킬기, R2는 수소원자, 또는 탄소수 1-15인 알킬기, n은 5-60의 양의 정수를 나타낸다)으로 표시되는 폴리옥시에틸렌알킬치환페닐에테르 또는 일반식(식 중 R3및 R4는 각각 수소원자, 또는 탄소수 1-15인 알킬기이며, R3과 R4는 같아도 되고 달라도 된다, m은 5-60의 양의 정수를 나타낸다)으로 표시되는 폴리옥시에틸렌 알킬치화 또는 치환되지 않은 나프틸에테르 등의 비이온성 계면활성제를 농도 50-5000중량ppm으로 용매에 용해시켜 구성되는 것을 특징으로 하는 포지티브형 포토레지스트조성물용 현상액.
- 제1항에 있어서, 비이온성 계면활성제는 폴리옥시에틸렌 디알킬페닐 에테르인 것을 특징으로 하는 포지티브형 포토레지스트조성물용 현상액.
- 제2항에 있어서, 폴리옥시에틸렌 디알킬페닐에테르는 폴리옥시에틸렌디노닐 페닐에테르인 것을 특징으로 하는 포지티브형 포토레지스트조성물용 현상액.
- 제1항에 있어서, 수용성 유기염기화합물이 수산화 테트라메틸 암모늄이거나 수산화트리메틸 2-히드록시에틸 암모늄인 것을 특징으로 하는 포지티브형 포토레지스트조성물용 현상액.
- 제1항에 있어서, 비이온성 계면활성제의 농도가 50-5000중량ppm의 범위에 있는 것을 특징으로 하는 포지티브형 포토레지스트조성물용 현상액.
- 제1항에 있어서, 수용성 유기염기화합물의 농도가 0.5-5중량%의 범위에 있는 것을 특징으로 하는 포지티브형 포토레지스트조성물용 현상액.※ 참고사항 : 최초출원 내용에 의하여 공개하는 것임.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP61167897A JPH0638159B2 (ja) | 1986-07-18 | 1986-07-18 | ポジ型ホトレジスト用現像液 |
JP167897 | 1986-07-18 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR880002051A true KR880002051A (ko) | 1988-04-28 |
KR900005850B1 KR900005850B1 (ko) | 1990-08-13 |
Family
ID=15858086
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1019870007790A KR900005850B1 (ko) | 1986-07-18 | 1987-07-18 | 포지티브형(型) 포토레지스트 조성물용(用) 현상액 |
Country Status (5)
Country | Link |
---|---|
US (1) | US4820621A (ko) |
JP (1) | JPH0638159B2 (ko) |
KR (1) | KR900005850B1 (ko) |
DE (1) | DE3723429A1 (ko) |
GB (1) | GB2193335B (ko) |
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100483371B1 (ko) * | 2001-10-10 | 2005-04-15 | 주식회사 아담스테크놀로지 | 포토레지스트용 수계 현상액 |
KR100863732B1 (ko) * | 2001-02-21 | 2008-10-16 | 후지필름 가부시키가이샤 | 포지티브 전자선 레지스트 조성물 및 이를 이용한 패턴형성방법 |
Families Citing this family (40)
Publication number | Priority date | Publication date | Assignee | Title |
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DE3886971T2 (de) * | 1987-04-06 | 1994-05-19 | Hoechst Celanese Corp | Hochkontrastreicher Positiv-Photolack-Entwickler mit Alkanolamin. |
US5094934A (en) * | 1987-04-06 | 1992-03-10 | Morton International, Inc. | Method of developing a high contrast, positive photoresist using a developer containing alkanolamine |
JP2626992B2 (ja) * | 1988-05-10 | 1997-07-02 | 富士写真フイルム株式会社 | 感光性平版印刷版用現像液組成物及び現像方法 |
DE3827567A1 (de) * | 1988-08-13 | 1990-02-22 | Basf Ag | Waessrige entwicklerloesung fuer positiv arbeitende photoresists |
US4997748A (en) * | 1988-08-26 | 1991-03-05 | Tokyo Ohka Kogyo Co., Ltd. | Developer solution for positive-working resist composition |
US5175078A (en) * | 1988-10-20 | 1992-12-29 | Mitsubishi Gas Chemical Company, Inc. | Positive type photoresist developer |
DE3836404A1 (de) * | 1988-10-26 | 1990-05-03 | Hoechst Ag | Entwicklungsloesemittel fuer durch photopolymerisation vernetzbare schichten sowie verfahren zur herstellung von reliefformen |
GB2226150A (en) * | 1988-12-15 | 1990-06-20 | Nordisk Tidningsplat Ab | A developer for use with lithographic printing plates |
DE3941394A1 (de) * | 1989-12-15 | 1991-06-20 | Basf Ag | Waessrige entwicklerloesung und verfahren zum entwickeln von photoresisten |
US5252436A (en) * | 1989-12-15 | 1993-10-12 | Basf Aktiengesellschaft | Process for developing a positive-working photoresist containing poly(p-hydroxystyrene) and sulfonium salt with an aqueous developer containing basic organic compounds |
US5164286A (en) * | 1991-02-01 | 1992-11-17 | Ocg Microelectronic Materials, Inc. | Photoresist developer containing fluorinated amphoteric surfactant |
US5532116A (en) * | 1992-01-13 | 1996-07-02 | Fuji Photo Film Co., Ltd. | Aqueous alkaline developing solution |
US5543268A (en) * | 1992-05-14 | 1996-08-06 | Tokyo Ohka Kogyo Co., Ltd. | Developer solution for actinic ray-sensitive resist |
JP3104939B2 (ja) * | 1992-10-01 | 2000-10-30 | 東京応化工業株式会社 | 半導体デバイス製造用レジスト現像液組成物 |
DE4419166A1 (de) * | 1994-06-01 | 1995-12-07 | Hoechst Ag | Entwickler für Photoresistschichten |
JP3707856B2 (ja) * | 1996-03-07 | 2005-10-19 | 富士通株式会社 | レジストパターンの形成方法 |
KR100573560B1 (ko) | 1997-10-30 | 2006-08-30 | 가오가부시끼가이샤 | 레지스트용현상액 |
KR19990037527A (ko) * | 1997-10-31 | 1999-05-25 | 후지쯔 가부시끼가이샤 | 폴리이미드계 감광성 수지조성물용 현상액 |
DE19755131C2 (de) * | 1997-12-11 | 2002-10-31 | Infineon Technologies Ag | Lösung von Tetramethylammoniumhydroxid in Wasser und Verfahren zur Herstellung der Lösung |
US6063550A (en) * | 1998-04-29 | 2000-05-16 | Morton International, Inc. | Aqueous developing solutions for reduced developer residue |
TWI221946B (en) | 1999-01-07 | 2004-10-11 | Kao Corp | Resist developer |
US6686126B2 (en) * | 2000-07-14 | 2004-02-03 | Fuji Photo Film Co., Ltd. | Developing solution for photosensitive lithographic printing plate, plate-making method of lithographic printing plate, and photosensitive lithographic printing plate |
US6503694B1 (en) * | 2001-06-12 | 2003-01-07 | Chi Mei Corporation | Developer solution and edge bead remover composition |
JP4230130B2 (ja) * | 2001-07-04 | 2009-02-25 | 富士フイルム株式会社 | 感光性平版印刷版用現像液及び平版印刷版の製版方法 |
US20030196685A1 (en) * | 2001-12-18 | 2003-10-23 | Shipley Company, L.L.C. | Cleaning composition and method |
EP1335016A1 (en) * | 2002-02-06 | 2003-08-13 | Shipley Company LLC | Cleaning composition |
US6599683B1 (en) * | 2002-02-13 | 2003-07-29 | Micron Technology, Inc. | Photoresist developer with reduced resist toppling and method of using same |
US6900003B2 (en) * | 2002-04-12 | 2005-05-31 | Shipley Company, L.L.C. | Photoresist processing aid and method |
US6887654B2 (en) * | 2002-05-07 | 2005-05-03 | Shipley Company, L.L.C. | Residue and scum reducing composition and method |
EP1361480A1 (en) * | 2002-05-07 | 2003-11-12 | Shipley Co. L.L.C. | Residue reducing stable concentrate |
WO2004016571A2 (en) * | 2002-08-16 | 2004-02-26 | Sachem, Inc. | Lewis acid ionic liquids |
US7750166B2 (en) * | 2002-08-16 | 2010-07-06 | University Of South Alabama | Ionic liquids containing a sulfonate anion |
KR101020164B1 (ko) | 2003-07-17 | 2011-03-08 | 허니웰 인터내셔날 인코포레이티드 | 진보된 마이크로전자적 응용을 위한 평탄화 막, 및 이를제조하기 위한 장치 및 방법 |
CN1928724B (zh) * | 2005-09-05 | 2010-09-29 | 比亚迪股份有限公司 | 一种光阻显影液 |
WO2007028294A1 (en) * | 2005-09-05 | 2007-03-15 | Byd Company Limited | A developer solution for photoresist |
JP4657899B2 (ja) * | 2005-11-30 | 2011-03-23 | 富士通株式会社 | レジストパターン厚肉化材料、レジストパターンの形成方法、半導体装置及びその製造方法 |
KR101161029B1 (ko) * | 2006-01-06 | 2012-06-28 | 에버라이트 유에스에이, 인코오포레이티드 | 현상제 조성물 |
KR101682005B1 (ko) * | 2011-09-02 | 2016-12-02 | 주식회사 엘지화학 | 포토레지스트용 스트리퍼 조성물 |
KR102378341B1 (ko) * | 2015-06-11 | 2022-03-24 | 주식회사 이엔에프테크놀로지 | 포토레지스트 현상액 |
CN107145044A (zh) * | 2017-06-17 | 2017-09-08 | 广州西陇精细化工技术有限公司 | 一种平板显示使用的显影液组合物 |
Family Cites Families (18)
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US3868254A (en) * | 1972-11-29 | 1975-02-25 | Gaf Corp | Positive working quinone diazide lithographic plate compositions and articles having non-ionic surfactants |
US4141733A (en) * | 1977-10-25 | 1979-02-27 | Eastman Kodak Company | Development of light-sensitive quinone diazide compositions |
JPS608494B2 (ja) * | 1978-03-01 | 1985-03-04 | 富士通株式会社 | ポジ型レジスト像の形成法 |
DE2925363C2 (de) * | 1978-06-23 | 1985-09-05 | Fuji Photo Film Co., Ltd., Minami-Ashigara, Kanagawa | Schutzmittel vom Emulsionstyp für die Oberfläche von lithographischen Druckplatten |
DE2925362C2 (de) * | 1978-06-23 | 1985-08-14 | Fuji Photo Film Co., Ltd., Minami-Ashigara, Kanagawa | Schutzmittel vom Emulsionstyp für die Oberfläche von lithographischen Druckplatten |
US4294911A (en) * | 1979-06-18 | 1981-10-13 | Eastman Kodak Company | Development of light-sensitive quinone diazide compositions using sulfite stabilizer |
US4308340A (en) * | 1980-08-08 | 1981-12-29 | American Hoechst Corporation | Aqueous 2-propoxyethanol containing processing composition for lithographic printing plates |
US4374920A (en) * | 1981-07-27 | 1983-02-22 | American Hoechst Corporation | Positive developer containing non-ionic surfactants |
JPS5854341A (ja) * | 1981-09-28 | 1983-03-31 | Fuji Photo Film Co Ltd | 現像方法および現像液 |
DE3230171A1 (de) * | 1982-08-13 | 1984-02-16 | Hoechst Ag, 6230 Frankfurt | Waessrig-alkalische loesung und verfahren zum entwickeln von positiv-arbeitenden reproduktionsschichten |
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JPS59220732A (ja) * | 1983-05-31 | 1984-12-12 | Toshiba Corp | フオトレジスト現像液 |
US4556629A (en) * | 1983-12-21 | 1985-12-03 | Morton Thiokol, Inc. | Developer composition for positive photoresists using solution with cyclic quaternary ammonium hydroxides |
DE3346979A1 (de) * | 1983-12-24 | 1985-07-04 | Merck Patent Gmbh, 6100 Darmstadt | Entwickler fuer positivfotoresists |
KR850008058A (ko) * | 1984-05-16 | 1985-12-11 | 로이 에이취, 맷신길 | 양성 포토레지스트 전개제 및 전개방법 |
US4711836A (en) * | 1984-09-10 | 1987-12-08 | Olin Hunt Specialty Products, Inc. | Development of positive-working photoresist compositions |
US4613561A (en) * | 1984-10-17 | 1986-09-23 | James Marvin Lewis | Method of high contrast positive O-quinone diazide photoresist developing using pretreatment solution |
-
1986
- 1986-07-18 JP JP61167897A patent/JPH0638159B2/ja not_active Expired - Lifetime
-
1987
- 1987-06-26 US US07/067,312 patent/US4820621A/en not_active Expired - Lifetime
- 1987-07-01 GB GB8715459A patent/GB2193335B/en not_active Expired - Fee Related
- 1987-07-15 DE DE19873723429 patent/DE3723429A1/de active Granted
- 1987-07-18 KR KR1019870007790A patent/KR900005850B1/ko not_active IP Right Cessation
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
KR100863732B1 (ko) * | 2001-02-21 | 2008-10-16 | 후지필름 가부시키가이샤 | 포지티브 전자선 레지스트 조성물 및 이를 이용한 패턴형성방법 |
KR100483371B1 (ko) * | 2001-10-10 | 2005-04-15 | 주식회사 아담스테크놀로지 | 포토레지스트용 수계 현상액 |
Also Published As
Publication number | Publication date |
---|---|
KR900005850B1 (ko) | 1990-08-13 |
GB8715459D0 (en) | 1987-08-05 |
JPS6325650A (ja) | 1988-02-03 |
JPH0638159B2 (ja) | 1994-05-18 |
DE3723429A1 (de) | 1988-01-28 |
GB2193335A (en) | 1988-02-03 |
US4820621B1 (ko) | 1991-03-12 |
US4820621A (en) | 1989-04-11 |
GB2193335B (en) | 1990-02-14 |
DE3723429C2 (ko) | 1992-12-17 |
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