KR840000082A - 반도체 기억장치와 그 제조법 - Google Patents
반도체 기억장치와 그 제조법 Download PDFInfo
- Publication number
- KR840000082A KR840000082A KR1019820002028A KR820002028A KR840000082A KR 840000082 A KR840000082 A KR 840000082A KR 1019820002028 A KR1019820002028 A KR 1019820002028A KR 820002028 A KR820002028 A KR 820002028A KR 840000082 A KR840000082 A KR 840000082A
- Authority
- KR
- South Korea
- Prior art keywords
- capacitor
- film
- semiconductor substrate
- reference level
- semiconductor
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Withdrawn
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/60—Electrodes characterised by their materials
- H10D64/66—Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes
- H10D64/68—Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes characterised by the insulator, e.g. by the gate insulator
- H10D64/681—Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes characterised by the insulator, e.g. by the gate insulator having a compositional variation, e.g. multilayered
- H10D64/685—Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes characterised by the insulator, e.g. by the gate insulator having a compositional variation, e.g. multilayered being perpendicular to the channel plane
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B12/00—Dynamic random access memory [DRAM] devices
- H10B12/30—DRAM devices comprising one-transistor - one-capacitor [1T-1C] memory cells
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D64/00—Electrodes of devices having potential barriers
- H10D64/60—Electrodes characterised by their materials
- H10D64/66—Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes
- H10D64/68—Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes characterised by the insulator, e.g. by the gate insulator
- H10D64/693—Electrodes having a conductor capacitively coupled to a semiconductor by an insulator, e.g. MIS electrodes characterised by the insulator, e.g. by the gate insulator the insulator comprising nitrogen, e.g. nitrides, oxynitrides or nitrogen-doped materials
-
- H10D64/01346—
Landscapes
- Semiconductor Integrated Circuits (AREA)
- Semiconductor Memories (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP81-70732 | 1981-05-13 | ||
| JP56070732A JPS57186354A (en) | 1981-05-13 | 1981-05-13 | Semiconductor memory storage and manufacture thereof |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR840000082A true KR840000082A (ko) | 1984-01-30 |
Family
ID=13439994
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019820002028A Withdrawn KR840000082A (ko) | 1981-05-13 | 1982-05-10 | 반도체 기억장치와 그 제조법 |
Country Status (6)
| Country | Link |
|---|---|
| JP (1) | JPS57186354A (enExample) |
| KR (1) | KR840000082A (enExample) |
| DE (1) | DE3217896A1 (enExample) |
| FR (1) | FR2506058A1 (enExample) |
| GB (1) | GB2098397A (enExample) |
| IT (1) | IT1152129B (enExample) |
Families Citing this family (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| FR2519461A1 (fr) * | 1982-01-06 | 1983-07-08 | Hitachi Ltd | Dispositif de memoire a semi-conducteurs et procede de fabrication d'un tel dispositif |
| JPS58181319A (ja) * | 1982-04-19 | 1983-10-24 | Hitachi Ltd | タイミング発生回路 |
| JPH0612619B2 (ja) * | 1982-09-22 | 1994-02-16 | 株式会社日立製作所 | 半導体メモリ装置 |
| JPS59172761A (ja) * | 1983-03-23 | 1984-09-29 | Hitachi Ltd | 半導体装置 |
| US4617471A (en) * | 1983-12-27 | 1986-10-14 | Kabushiki Kaisha Toshiba | Image sensing device |
| JPS60206163A (ja) * | 1984-03-30 | 1985-10-17 | Toshiba Corp | 半導体記憶装置 |
| JPS6421788A (en) * | 1987-07-16 | 1989-01-25 | Nec Corp | Semiconductor memory device |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE2130908A1 (de) * | 1970-06-22 | 1971-12-30 | Cogar Corp | Speicherzelle mit Metalloxidhalbleiter-Einrichtungen mit verschiedenen Steilheiten |
| DE2646245A1 (de) * | 1975-10-28 | 1977-05-05 | Motorola Inc | Speicherschaltung |
| DE2633558C2 (de) * | 1976-07-26 | 1978-08-03 | Siemens Ag, 1000 Berlin Und 8000 Muenchen | Speicherbaustein |
| JPS53112686A (en) * | 1977-03-14 | 1978-10-02 | Oki Electric Ind Co Ltd | Manufacture for semiconductor device |
| JPS5559759A (en) * | 1978-10-27 | 1980-05-06 | Hitachi Ltd | Semiconductor device |
-
1981
- 1981-05-13 JP JP56070732A patent/JPS57186354A/ja active Pending
-
1982
- 1982-04-27 GB GB8212113A patent/GB2098397A/en not_active Withdrawn
- 1982-05-07 FR FR8207966A patent/FR2506058A1/fr active Granted
- 1982-05-10 KR KR1019820002028A patent/KR840000082A/ko not_active Withdrawn
- 1982-05-12 DE DE19823217896 patent/DE3217896A1/de not_active Withdrawn
- 1982-05-12 IT IT21211/82A patent/IT1152129B/it active
Also Published As
| Publication number | Publication date |
|---|---|
| FR2506058B1 (enExample) | 1985-04-12 |
| IT1152129B (it) | 1986-12-31 |
| JPS57186354A (en) | 1982-11-16 |
| GB2098397A (en) | 1982-11-17 |
| FR2506058A1 (fr) | 1982-11-19 |
| IT8221211A0 (it) | 1982-05-12 |
| DE3217896A1 (de) | 1983-05-26 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US4794563A (en) | Semiconductor memory device having a high capacitance storage capacitor | |
| US4178674A (en) | Process for forming a contact region between layers of polysilicon with an integral polysilicon resistor | |
| KR910019230A (ko) | 반도체기억장치 및 그 제조방법 | |
| KR910020904A (ko) | 반도체기억장치 및 그 제조 방법 | |
| KR860008609A (ko) | 반도체 기억장치와 제조방법 | |
| KR890702254A (ko) | 집적회로 트랜치 셀 | |
| KR930006930A (ko) | 수직형 트랜지스터를 갖는 dram셀 및 그 제조방법 | |
| KR950010095A (ko) | 반도체기억장치 및 그 제조방법(Semiconductor Memory Device and Manufacturing Method Thereof) | |
| KR950034790A (ko) | 반도체 장치와 그 제조방법 | |
| KR900017196A (ko) | 동적 메모리 셀을 구비한 반도체 메모리 장치 | |
| KR970054137A (ko) | 반도체 메모리 셀 구조 및 그 제조방법 | |
| KR890013777A (ko) | 반도체 집적회로장치 및 그 제조방법 | |
| KR840007312A (ko) | 적층 캐패시터형 메모리셀을 갖춘 반도체 기억장치 | |
| KR860000716A (ko) | 다이내믹형 메모리셀과 그 제조방법 | |
| KR880005686A (ko) | 반도체 기억장치 및 그의 제조 방법 | |
| KR970024197A (ko) | 반도체 메모리 장치 및 제조방법 | |
| KR910003813A (ko) | 적층된 캐패시터 및 매립된 측방향 접촉부를 갖는 dram 셀 | |
| KR950034731A (ko) | 비휘발성 반도체 메모리장치의 제조방법 | |
| KR960009182A (ko) | 반도체 메모리장치 및 그의 제조방법 | |
| KR890003032A (ko) | 반도체기억장치 및 그 제조방법 | |
| KR860008612A (ko) | 반도체 기억장치와 그 제조방법 | |
| KR910013571A (ko) | 유전물질에 의해 분리되어 있는 전극쌍이 포함된 다양한 소자를 구비한 직접회로의 제조방법 | |
| KR0140044B1 (ko) | 메모리 셀중에 절연 구조를 가지는 반도체 메모리 소자 | |
| KR840000082A (ko) | 반도체 기억장치와 그 제조법 | |
| US4513304A (en) | Semiconductor memory device and process for producing the same |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| R17-X000 | Change to representative recorded |
St.27 status event code: A-3-3-R10-R17-oth-X000 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| PC1203 | Withdrawal of no request for examination |
St.27 status event code: N-1-6-B10-B12-nap-PC1203 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |
|
| P22-X000 | Classification modified |
St.27 status event code: A-2-2-P10-P22-nap-X000 |