KR20250022896A - 차아염소산 이온을 포함하는 반도체 웨이퍼의 처리액 - Google Patents
차아염소산 이온을 포함하는 반도체 웨이퍼의 처리액 Download PDFInfo
- Publication number
- KR20250022896A KR20250022896A KR1020257003365A KR20257003365A KR20250022896A KR 20250022896 A KR20250022896 A KR 20250022896A KR 1020257003365 A KR1020257003365 A KR 1020257003365A KR 20257003365 A KR20257003365 A KR 20257003365A KR 20250022896 A KR20250022896 A KR 20250022896A
- Authority
- KR
- South Korea
- Prior art keywords
- treatment solution
- ion
- ions
- hypochlorite
- solution
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D3/00—Other compounding ingredients of detergent compositions covered in group C11D1/00
- C11D3/02—Inorganic compounds ; Elemental compounds
- C11D3/04—Water-soluble compounds
- C11D3/046—Salts
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D17/00—Detergent materials or soaps characterised by their shape or physical properties
- C11D17/0008—Detergent materials or soaps characterised by their shape or physical properties aqueous liquid non soap compositions
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D17/00—Detergent materials or soaps characterised by their shape or physical properties
- C11D17/08—Liquid soap, e.g. for dispensers; capsuled
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D3/00—Other compounding ingredients of detergent compositions covered in group C11D1/00
- C11D3/16—Organic compounds
- C11D3/168—Organometallic compounds or orgometallic complexes
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/02—Inorganic compounds
- C11D7/04—Water-soluble compounds
- C11D7/10—Salts
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/32—Organic compounds containing nitrogen
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/32—Organic compounds containing nitrogen
- C11D7/3209—Amines or imines with one to four nitrogen atoms; Quaternized amines
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/50—Solvents
- C11D7/5004—Organic solvents
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02057—Cleaning during device manufacture
- H01L21/02068—Cleaning during device manufacture during, before or after processing of conductive layers, e.g. polysilicon or amorphous silicon layers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02082—Cleaning product to be cleaned
- H01L21/02087—Cleaning of wafer edges
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/02041—Cleaning
- H01L21/02082—Cleaning product to be cleaned
- H01L21/0209—Cleaning of wafer backside
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/31—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
- H01L21/3205—Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
- H01L21/321—After treatment
- H01L21/3213—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer
- H01L21/32133—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only
- H01L21/32134—Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only by liquid etching only
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D2111/00—Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
- C11D2111/10—Objects to be cleaned
- C11D2111/14—Hard surfaces
- C11D2111/22—Electronic devices, e.g. PCBs or semiconductors
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Organic Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Life Sciences & Earth Sciences (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Wood Science & Technology (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Inorganic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Detergent Compositions (AREA)
- Weting (AREA)
Applications Claiming Priority (8)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2018-005202 | 2018-01-16 | ||
| JPJP-P-2018-005201 | 2018-01-16 | ||
| JP2018005201 | 2018-01-16 | ||
| JP2018005202 | 2018-01-16 | ||
| JPJP-P-2018-199949 | 2018-10-24 | ||
| JP2018199949 | 2018-10-24 | ||
| KR1020207020591A KR102766830B1 (ko) | 2018-01-16 | 2019-01-15 | 차아염소산 이온을 포함하는 반도체 웨이퍼의 처리액 |
| PCT/JP2019/000938 WO2019142788A1 (ja) | 2018-01-16 | 2019-01-15 | 次亜塩素酸イオンを含む半導体ウェハの処理液 |
Related Parent Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020207020591A Division KR102766830B1 (ko) | 2018-01-16 | 2019-01-15 | 차아염소산 이온을 포함하는 반도체 웨이퍼의 처리액 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| KR20250022896A true KR20250022896A (ko) | 2025-02-17 |
Family
ID=67301793
Family Applications (2)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020257003365A Pending KR20250022896A (ko) | 2018-01-16 | 2019-01-15 | 차아염소산 이온을 포함하는 반도체 웨이퍼의 처리액 |
| KR1020207020591A Active KR102766830B1 (ko) | 2018-01-16 | 2019-01-15 | 차아염소산 이온을 포함하는 반도체 웨이퍼의 처리액 |
Family Applications After (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020207020591A Active KR102766830B1 (ko) | 2018-01-16 | 2019-01-15 | 차아염소산 이온을 포함하는 반도체 웨이퍼의 처리액 |
Country Status (8)
| Country | Link |
|---|---|
| US (2) | US11390829B2 (enExample) |
| EP (1) | EP3726565A4 (enExample) |
| JP (3) | JP6798045B2 (enExample) |
| KR (2) | KR20250022896A (enExample) |
| CN (1) | CN111684570B (enExample) |
| SG (1) | SG11202006733TA (enExample) |
| TW (4) | TWI877955B (enExample) |
| WO (1) | WO2019142788A1 (enExample) |
Families Citing this family (17)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2019142788A1 (ja) * | 2018-01-16 | 2019-07-25 | 株式会社トクヤマ | 次亜塩素酸イオンを含む半導体ウェハの処理液 |
| KR102764031B1 (ko) * | 2018-05-23 | 2025-02-07 | 가부시키가이샤 도쿠야마 | 차아염소산 제4급 알킬 암모늄 용액, 그 제조 방법 및 반도체 웨이퍼의 세정 방법 |
| JP7219061B2 (ja) | 2018-11-14 | 2023-02-07 | 関東化学株式会社 | ルテニウム除去用組成物 |
| WO2021060234A1 (ja) | 2019-09-27 | 2021-04-01 | 株式会社トクヤマ | RuO4ガスの発生抑制剤及びRuO4ガスの発生抑制方法 |
| KR102784165B1 (ko) | 2019-09-27 | 2025-03-19 | 가부시끼가이샤 도꾸야마 | 루테늄의 반도체용 처리액 및 그 제조 방법 |
| KR102769981B1 (ko) * | 2019-11-22 | 2025-02-18 | 가부시끼가이샤 도꾸야마 | 차아염소산 제 4 급 알킬암모늄 용액, 그 제조 방법 및 반도체 웨이퍼의 처리 방법 |
| JP7496410B2 (ja) * | 2020-02-25 | 2024-06-06 | 株式会社トクヤマ | ルテニウムの半導体用処理液 |
| US20230126771A1 (en) | 2020-03-31 | 2023-04-27 | Tokuyama Corporation | Treatment liquid for semiconductors and method for producing same |
| KR20230048318A (ko) | 2020-08-07 | 2023-04-11 | 가부시끼가이샤 도꾸야마 | 반도체 웨이퍼용 처리액 |
| KR20230047416A (ko) * | 2020-09-03 | 2023-04-07 | 후지필름 가부시키가이샤 | 조성물, 기판의 처리 방법 |
| US12247298B2 (en) | 2020-11-26 | 2025-03-11 | Tokuyama Corporation | Semiconductor wafer treatment liquid and production method thereof |
| JP7342288B2 (ja) * | 2020-12-18 | 2023-09-11 | 株式会社トクヤマ | 遷移金属の半導体の処理方法、および遷移金属酸化物の還元剤含有処理液 |
| KR20230104741A (ko) | 2020-12-18 | 2023-07-10 | 가부시끼가이샤 도꾸야마 | 천이 금속의 반도체의 처리 방법, 및 천이 금속 산화물의 환원제 함유 처리액 |
| JP7638119B2 (ja) * | 2021-03-15 | 2025-03-03 | 株式会社Screenホールディングス | 基板処理方法および基板処理装置 |
| US20220328320A1 (en) | 2021-03-31 | 2022-10-13 | Tokuyama Corporation | Semiconductor treatment liquid |
| TW202424172A (zh) | 2022-09-29 | 2024-06-16 | 日商德山股份有限公司 | 乾式蝕刻殘渣去除液 |
| WO2024075704A1 (ja) * | 2022-10-03 | 2024-04-11 | 株式会社トクヤマ | 半導体用処理液 |
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| WO2020054296A1 (ja) * | 2018-09-12 | 2020-03-19 | 富士フイルム株式会社 | 薬液、基板の処理方法 |
| US11898081B2 (en) * | 2019-11-21 | 2024-02-13 | Tokyo Ohka Kogyo Co., Ltd. | Ruthenium-etching solution, method for manufacturing ruthenium-etching solution, method for processing object to be processed, and method for manufacturing ruthenium-containing wiring |
| KR102769981B1 (ko) * | 2019-11-22 | 2025-02-18 | 가부시끼가이샤 도꾸야마 | 차아염소산 제 4 급 알킬암모늄 용액, 그 제조 방법 및 반도체 웨이퍼의 처리 방법 |
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2019
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| KR20200110335A (ko) | 2020-09-23 |
| JP7590504B2 (ja) | 2024-11-26 |
| EP3726565A4 (en) | 2021-10-13 |
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| TWI877955B (zh) | 2025-03-21 |
| TW201932588A (zh) | 2019-08-16 |
| JP6798045B2 (ja) | 2020-12-09 |
| TW202210663A (zh) | 2022-03-16 |
| JP2021040151A (ja) | 2021-03-11 |
| CN111684570B (zh) | 2024-02-27 |
| TW202521677A (zh) | 2025-06-01 |
| TWI899006B (zh) | 2025-09-21 |
| TW202417601A (zh) | 2024-05-01 |
| JP2023126320A (ja) | 2023-09-07 |
| CN111684570A (zh) | 2020-09-18 |
| WO2019142788A1 (ja) | 2019-07-25 |
| US20210062115A1 (en) | 2021-03-04 |
| US11390829B2 (en) | 2022-07-19 |
| US20220325205A1 (en) | 2022-10-13 |
| SG11202006733TA (en) | 2020-08-28 |
| KR102766830B1 (ko) | 2025-02-14 |
| EP3726565A1 (en) | 2020-10-21 |
| TWI843026B (zh) | 2024-05-21 |
| JPWO2019142788A1 (ja) | 2020-11-19 |
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