KR20250022896A - 차아염소산 이온을 포함하는 반도체 웨이퍼의 처리액 - Google Patents

차아염소산 이온을 포함하는 반도체 웨이퍼의 처리액 Download PDF

Info

Publication number
KR20250022896A
KR20250022896A KR1020257003365A KR20257003365A KR20250022896A KR 20250022896 A KR20250022896 A KR 20250022896A KR 1020257003365 A KR1020257003365 A KR 1020257003365A KR 20257003365 A KR20257003365 A KR 20257003365A KR 20250022896 A KR20250022896 A KR 20250022896A
Authority
KR
South Korea
Prior art keywords
treatment solution
ion
ions
hypochlorite
solution
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
KR1020257003365A
Other languages
English (en)
Korean (ko)
Inventor
타마후미 시모다
타카유키 네기시
유키 킥카와
세이지 토노
Original Assignee
가부시키가이샤 도쿠야마
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 가부시키가이샤 도쿠야마 filed Critical 가부시키가이샤 도쿠야마
Publication of KR20250022896A publication Critical patent/KR20250022896A/ko
Pending legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D3/00Other compounding ingredients of detergent compositions covered in group C11D1/00
    • C11D3/02Inorganic compounds ; Elemental compounds
    • C11D3/04Water-soluble compounds
    • C11D3/046Salts
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D17/00Detergent materials or soaps characterised by their shape or physical properties
    • C11D17/0008Detergent materials or soaps characterised by their shape or physical properties aqueous liquid non soap compositions
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D17/00Detergent materials or soaps characterised by their shape or physical properties
    • C11D17/08Liquid soap, e.g. for dispensers; capsuled
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D3/00Other compounding ingredients of detergent compositions covered in group C11D1/00
    • C11D3/16Organic compounds
    • C11D3/168Organometallic compounds or orgometallic complexes
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/02Inorganic compounds
    • C11D7/04Water-soluble compounds
    • C11D7/10Salts
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/22Organic compounds
    • C11D7/32Organic compounds containing nitrogen
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/22Organic compounds
    • C11D7/32Organic compounds containing nitrogen
    • C11D7/3209Amines or imines with one to four nitrogen atoms; Quaternized amines
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D7/00Compositions of detergents based essentially on non-surface-active compounds
    • C11D7/50Solvents
    • C11D7/5004Organic solvents
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02041Cleaning
    • H01L21/02057Cleaning during device manufacture
    • H01L21/02068Cleaning during device manufacture during, before or after processing of conductive layers, e.g. polysilicon or amorphous silicon layers
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02041Cleaning
    • H01L21/02082Cleaning product to be cleaned
    • H01L21/02087Cleaning of wafer edges
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/02041Cleaning
    • H01L21/02082Cleaning product to be cleaned
    • H01L21/0209Cleaning of wafer backside
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/04Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
    • H01L21/18Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
    • H01L21/30Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
    • H01L21/31Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26 to form insulating layers thereon, e.g. for masking or by using photolithographic techniques; After treatment of these layers; Selection of materials for these layers
    • H01L21/3205Deposition of non-insulating-, e.g. conductive- or resistive-, layers on insulating layers; After-treatment of these layers
    • H01L21/321After treatment
    • H01L21/3213Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer
    • H01L21/32133Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only
    • H01L21/32134Physical or chemical etching of the layers, e.g. to produce a patterned layer from a pre-deposited extensive layer by chemical means only by liquid etching only
    • CCHEMISTRY; METALLURGY
    • C11ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
    • C11DDETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
    • C11D2111/00Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
    • C11D2111/10Objects to be cleaned
    • C11D2111/14Hard surfaces
    • C11D2111/22Electronic devices, e.g. PCBs or semiconductors

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Organic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Oil, Petroleum & Natural Gas (AREA)
  • Wood Science & Technology (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Inorganic Chemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Cleaning Or Drying Semiconductors (AREA)
  • Detergent Compositions (AREA)
  • Weting (AREA)
KR1020257003365A 2018-01-16 2019-01-15 차아염소산 이온을 포함하는 반도체 웨이퍼의 처리액 Pending KR20250022896A (ko)

Applications Claiming Priority (8)

Application Number Priority Date Filing Date Title
JPJP-P-2018-005202 2018-01-16
JPJP-P-2018-005201 2018-01-16
JP2018005201 2018-01-16
JP2018005202 2018-01-16
JPJP-P-2018-199949 2018-10-24
JP2018199949 2018-10-24
KR1020207020591A KR102766830B1 (ko) 2018-01-16 2019-01-15 차아염소산 이온을 포함하는 반도체 웨이퍼의 처리액
PCT/JP2019/000938 WO2019142788A1 (ja) 2018-01-16 2019-01-15 次亜塩素酸イオンを含む半導体ウェハの処理液

Related Parent Applications (1)

Application Number Title Priority Date Filing Date
KR1020207020591A Division KR102766830B1 (ko) 2018-01-16 2019-01-15 차아염소산 이온을 포함하는 반도체 웨이퍼의 처리액

Publications (1)

Publication Number Publication Date
KR20250022896A true KR20250022896A (ko) 2025-02-17

Family

ID=67301793

Family Applications (2)

Application Number Title Priority Date Filing Date
KR1020257003365A Pending KR20250022896A (ko) 2018-01-16 2019-01-15 차아염소산 이온을 포함하는 반도체 웨이퍼의 처리액
KR1020207020591A Active KR102766830B1 (ko) 2018-01-16 2019-01-15 차아염소산 이온을 포함하는 반도체 웨이퍼의 처리액

Family Applications After (1)

Application Number Title Priority Date Filing Date
KR1020207020591A Active KR102766830B1 (ko) 2018-01-16 2019-01-15 차아염소산 이온을 포함하는 반도체 웨이퍼의 처리액

Country Status (8)

Country Link
US (2) US11390829B2 (enExample)
EP (1) EP3726565A4 (enExample)
JP (3) JP6798045B2 (enExample)
KR (2) KR20250022896A (enExample)
CN (1) CN111684570B (enExample)
SG (1) SG11202006733TA (enExample)
TW (4) TWI877955B (enExample)
WO (1) WO2019142788A1 (enExample)

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2019142788A1 (ja) * 2018-01-16 2019-07-25 株式会社トクヤマ 次亜塩素酸イオンを含む半導体ウェハの処理液
KR102764031B1 (ko) * 2018-05-23 2025-02-07 가부시키가이샤 도쿠야마 차아염소산 제4급 알킬 암모늄 용액, 그 제조 방법 및 반도체 웨이퍼의 세정 방법
JP7219061B2 (ja) 2018-11-14 2023-02-07 関東化学株式会社 ルテニウム除去用組成物
WO2021060234A1 (ja) 2019-09-27 2021-04-01 株式会社トクヤマ RuO4ガスの発生抑制剤及びRuO4ガスの発生抑制方法
KR102784165B1 (ko) 2019-09-27 2025-03-19 가부시끼가이샤 도꾸야마 루테늄의 반도체용 처리액 및 그 제조 방법
KR102769981B1 (ko) * 2019-11-22 2025-02-18 가부시끼가이샤 도꾸야마 차아염소산 제 4 급 알킬암모늄 용액, 그 제조 방법 및 반도체 웨이퍼의 처리 방법
JP7496410B2 (ja) * 2020-02-25 2024-06-06 株式会社トクヤマ ルテニウムの半導体用処理液
US20230126771A1 (en) 2020-03-31 2023-04-27 Tokuyama Corporation Treatment liquid for semiconductors and method for producing same
KR20230048318A (ko) 2020-08-07 2023-04-11 가부시끼가이샤 도꾸야마 반도체 웨이퍼용 처리액
KR20230047416A (ko) * 2020-09-03 2023-04-07 후지필름 가부시키가이샤 조성물, 기판의 처리 방법
US12247298B2 (en) 2020-11-26 2025-03-11 Tokuyama Corporation Semiconductor wafer treatment liquid and production method thereof
JP7342288B2 (ja) * 2020-12-18 2023-09-11 株式会社トクヤマ 遷移金属の半導体の処理方法、および遷移金属酸化物の還元剤含有処理液
KR20230104741A (ko) 2020-12-18 2023-07-10 가부시끼가이샤 도꾸야마 천이 금속의 반도체의 처리 방법, 및 천이 금속 산화물의 환원제 함유 처리액
JP7638119B2 (ja) * 2021-03-15 2025-03-03 株式会社Screenホールディングス 基板処理方法および基板処理装置
US20220328320A1 (en) 2021-03-31 2022-10-13 Tokuyama Corporation Semiconductor treatment liquid
TW202424172A (zh) 2022-09-29 2024-06-16 日商德山股份有限公司 乾式蝕刻殘渣去除液
WO2024075704A1 (ja) * 2022-10-03 2024-04-11 株式会社トクヤマ 半導体用処理液

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5523325U (enExample) 1978-07-28 1980-02-15
JP2001234373A (ja) 2000-02-23 2001-08-31 Nec Corp ルテニウム系金属の除去液及びその使用方法
JP2002161381A (ja) 2000-11-22 2002-06-04 Ebara Corp ルテニウム膜のエッチング方法
JP2003119494A (ja) 2001-10-05 2003-04-23 Nec Corp 洗浄組成物およびこれを用いた洗浄方法と洗浄装置
JP2005227749A (ja) 2004-02-11 2005-08-25 Mallinckrodt Baker Inc ハロゲン酸素酸、その塩及び誘導体含有、マイクロエレクトロニクス洗浄組成物
JP2009081247A (ja) 2007-09-26 2009-04-16 Panasonic Corp ルテニウム膜のエッチング方法

Family Cites Families (39)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE2517187C3 (de) 1975-04-18 1980-11-13 Aeg-Kanis Turbinenfabrik Gmbh, 8500 Nuernberg Hydraulische Turbinendrehvorrichtung
IT1203814B (it) * 1986-06-30 1989-02-23 Fidia Farmaceutici Esteri dell'acido alginico
JP3649771B2 (ja) * 1995-05-15 2005-05-18 栗田工業株式会社 洗浄方法
JP3619745B2 (ja) * 1999-12-20 2005-02-16 株式会社日立製作所 固体表面の処理方法及び処理液並びにこれらを用いた電子デバイスの製造方法
JP2001231373A (ja) 2000-02-22 2001-08-28 Gumma Prefecture 植物の栽培方法及びその装置
JP3664967B2 (ja) 2000-10-20 2005-06-29 シャープ株式会社 半導体集積回路
TW200413522A (en) * 2002-11-08 2004-08-01 Sumitomo Chemical Co Washing liquid for semiconductor substrate
JP2005101479A (ja) * 2002-11-08 2005-04-14 Sumitomo Chemical Co Ltd 半導体基板用洗浄液
JP4232002B2 (ja) * 2003-01-16 2009-03-04 日本電気株式会社 デバイス基板用の洗浄組成物及び該洗浄組成物を用いた洗浄方法並びに洗浄装置
KR101056544B1 (ko) * 2003-08-19 2011-08-11 아반토르 퍼포먼스 머티리얼스, 인크. 마이크로전자 기판용 박리 및 세정 조성물
EP2128897B1 (en) 2007-03-16 2015-05-06 Fujitsu Limited Silicon dielectric treating agent for use after etching, process for producing semiconductor device, and semiconductor device
US20090130849A1 (en) 2007-10-29 2009-05-21 Wai Mun Lee Chemical mechanical polishing and wafer cleaning composition comprising amidoxime compounds and associated method for use
US7976638B2 (en) * 2007-11-13 2011-07-12 Sachem, Inc. High negative zeta potential polyhedral silsesquioxane composition and method for damage free semiconductor wet clean
JP2009231354A (ja) * 2008-03-19 2009-10-08 Fujifilm Corp 半導体デバイス用洗浄液、および洗浄方法
JP5086893B2 (ja) * 2008-05-26 2012-11-28 花王株式会社 半導体デバイス用基板用の洗浄液
WO2010029867A1 (ja) 2008-09-09 2010-03-18 昭和電工株式会社 チタン系金属、タングステン系金属、チタンタングステン系金属またはそれらの窒化物のエッチング液
CN102652188A (zh) * 2009-12-17 2012-08-29 昭和电工株式会社 钌类金属的蚀刻用组合物及其配制方法
CN102234597B (zh) * 2010-04-26 2015-05-27 东友精细化工有限公司 清洗组合物
US8211800B2 (en) * 2010-08-23 2012-07-03 Kabushiki Kaisha Toshiba Ru cap metal post cleaning method and cleaning chemical
JP2013001620A (ja) * 2011-06-20 2013-01-07 Evatech Corp 弱酸性次亜塩素酸、並びにその製造装置および製造方法
WO2013101907A1 (en) * 2011-12-28 2013-07-04 Advanced Technology Materials, Inc. Compositions and methods for selectively etching titanium nitride
JP2014062297A (ja) 2012-09-20 2014-04-10 Toshiba Corp 処理装置、処理液の製造方法、および電子デバイスの製造方法
WO2014138064A1 (en) * 2013-03-04 2014-09-12 Advanced Technology Materials, Inc. Compositions and methods for selectively etching titanium nitride
JP6723152B2 (ja) * 2013-06-06 2020-07-15 インテグリス・インコーポレーテッド 窒化チタンを選択的にエッチングするための組成物及び方法
CN107155367B (zh) * 2014-06-30 2021-12-21 恩特格里斯公司 利用钨及钴兼容性移除蚀刻后残余物的含水及半含水清洁剂
WO2016042408A2 (en) * 2014-09-17 2016-03-24 Atmi Taiwan Co., Ltd. Compositions for etching titanium nitride having compatability with silicon germanide and tungsten
WO2016069576A1 (en) * 2014-10-31 2016-05-06 Entegris, Inc. Non-amine post-cmp compositions and method of use
JP6555273B2 (ja) * 2014-11-13 2019-08-07 三菱瓦斯化学株式会社 タングステンを含む材料のダメージを抑制した半導体素子の洗浄液、およびこれを用いた半導体素子の洗浄方法
WO2016140246A1 (ja) * 2015-03-04 2016-09-09 日立化成株式会社 Cmp用研磨液、及び、これを用いた研磨方法
TWI816635B (zh) * 2015-10-15 2023-10-01 日商三菱瓦斯化學股份有限公司 半導體元件之洗淨用液體組成物、半導體元件之洗淨方法及半導體元件之製造方法
JP6713044B2 (ja) 2016-06-02 2020-06-24 富士フイルム株式会社 処理液、基板の洗浄方法及びレジストの除去方法
CN110177903A (zh) * 2017-01-17 2019-08-27 恩特格里斯公司 高阶节点工艺后端处理的蚀刻后残留物去除
WO2019142788A1 (ja) * 2018-01-16 2019-07-25 株式会社トクヤマ 次亜塩素酸イオンを含む半導体ウェハの処理液
US11017995B2 (en) * 2018-07-26 2021-05-25 Versum Materials Us, Llc Composition for TiN hard mask removal and etch residue cleaning
US11085011B2 (en) * 2018-08-28 2021-08-10 Entegris, Inc. Post CMP cleaning compositions for ceria particles
WO2020049955A1 (ja) * 2018-09-06 2020-03-12 富士フイルム株式会社 薬液、基板の処理方法
WO2020054296A1 (ja) * 2018-09-12 2020-03-19 富士フイルム株式会社 薬液、基板の処理方法
US11898081B2 (en) * 2019-11-21 2024-02-13 Tokyo Ohka Kogyo Co., Ltd. Ruthenium-etching solution, method for manufacturing ruthenium-etching solution, method for processing object to be processed, and method for manufacturing ruthenium-containing wiring
KR102769981B1 (ko) * 2019-11-22 2025-02-18 가부시끼가이샤 도꾸야마 차아염소산 제 4 급 알킬암모늄 용액, 그 제조 방법 및 반도체 웨이퍼의 처리 방법

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5523325U (enExample) 1978-07-28 1980-02-15
JP2001234373A (ja) 2000-02-23 2001-08-31 Nec Corp ルテニウム系金属の除去液及びその使用方法
JP2002161381A (ja) 2000-11-22 2002-06-04 Ebara Corp ルテニウム膜のエッチング方法
JP2003119494A (ja) 2001-10-05 2003-04-23 Nec Corp 洗浄組成物およびこれを用いた洗浄方法と洗浄装置
JP2005227749A (ja) 2004-02-11 2005-08-25 Mallinckrodt Baker Inc ハロゲン酸素酸、その塩及び誘導体含有、マイクロエレクトロニクス洗浄組成物
JP2009081247A (ja) 2007-09-26 2009-04-16 Panasonic Corp ルテニウム膜のエッチング方法

Also Published As

Publication number Publication date
KR20200110335A (ko) 2020-09-23
JP7590504B2 (ja) 2024-11-26
EP3726565A4 (en) 2021-10-13
JP7311477B2 (ja) 2023-07-19
TWI877955B (zh) 2025-03-21
TW201932588A (zh) 2019-08-16
JP6798045B2 (ja) 2020-12-09
TW202210663A (zh) 2022-03-16
JP2021040151A (ja) 2021-03-11
CN111684570B (zh) 2024-02-27
TW202521677A (zh) 2025-06-01
TWI899006B (zh) 2025-09-21
TW202417601A (zh) 2024-05-01
JP2023126320A (ja) 2023-09-07
CN111684570A (zh) 2020-09-18
WO2019142788A1 (ja) 2019-07-25
US20210062115A1 (en) 2021-03-04
US11390829B2 (en) 2022-07-19
US20220325205A1 (en) 2022-10-13
SG11202006733TA (en) 2020-08-28
KR102766830B1 (ko) 2025-02-14
EP3726565A1 (en) 2020-10-21
TWI843026B (zh) 2024-05-21
JPWO2019142788A1 (ja) 2020-11-19

Similar Documents

Publication Publication Date Title
KR102766830B1 (ko) 차아염소산 이온을 포함하는 반도체 웨이퍼의 처리액
JP7735233B2 (ja) 半導体ウエハ用処理液
JP7477466B2 (ja) オニウム塩を含む半導体ウェハの処理液
US20250257264A1 (en) Semiconductor wafer treatment liquid containing hypochlorite ions and ph buffer
US20220328320A1 (en) Semiconductor treatment liquid
TW202124694A (zh) 次氯酸四級烷基銨溶液、其製造方法及半導體晶圓的處理方法
KR20230048015A (ko) 차아브롬산 이온 및 pH 완충제를 함유하는 반도체 웨이퍼의 처리액
TWI904082B (zh) 含有鎓鹽的半導體晶圓之處理液
KR20230127774A (ko) 마스크 세정액 조성물

Legal Events

Date Code Title Description
A107 Divisional application of patent
PA0104 Divisional application for international application

Comment text: Divisional Application for International Patent

Patent event code: PA01041R01D

Patent event date: 20250203

Application number text: 1020207020591

Filing date: 20200715

PA0201 Request for examination
PG1501 Laying open of application