KR20070008583A - 질화갈륨 단결정의 육성 방법 및 질화갈륨 단결정 - Google Patents
질화갈륨 단결정의 육성 방법 및 질화갈륨 단결정 Download PDFInfo
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- KR20070008583A KR20070008583A KR1020067017932A KR20067017932A KR20070008583A KR 20070008583 A KR20070008583 A KR 20070008583A KR 1020067017932 A KR1020067017932 A KR 1020067017932A KR 20067017932 A KR20067017932 A KR 20067017932A KR 20070008583 A KR20070008583 A KR 20070008583A
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- South Korea
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- single crystal
- gallium nitride
- nitride single
- growing
- atm
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- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B9/00—Single-crystal growth from melt solutions using molten solvents
- C30B9/04—Single-crystal growth from melt solutions using molten solvents by cooling of the solution
- C30B9/08—Single-crystal growth from melt solutions using molten solvents by cooling of the solution using other solvents
- C30B9/10—Metal solvents
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/38—Nitrides
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/10—Inorganic compounds or compositions
- C30B29/40—AIIIBV compounds wherein A is B, Al, Ga, In or Tl and B is N, P, As, Sb or Bi
- C30B29/403—AIII-nitrides
- C30B29/406—Gallium nitride
Abstract
Description
금속 나트륨 | 질소 | 아르곤 | |
800℃·1기압 | 0.75 | 0.0003 | 0.0004 |
927℃·300기압 | 0.08 | 0.11 | |
927℃·1000기압 | 0.21 | 0.33 | |
927℃·2000기압 | 0.3(추정) | 0.5(추정) |
Claims (7)
- 적어도 나트륨 금속을 함유하는 플럭스를 사용하여 질화갈륨 단결정을 육성하는 방법으로서,질소 가스를 함유하는 혼합 가스로 이루어진 분위기 하에서 전압(全壓)이 300 기압 이상, 2000 기압 이하의 압력 하에서 상기 질화갈륨 단결정을 육성하는 것을 특징으로 하는 질화갈륨 단결정의 육성 방법.
- 제1항에 있어서, 상기 분위기 중의 질소 분압이 100 기압 이상, 2000 기압 이하인 것을 특징으로 하는 질화갈륨 단결정의 육성 방법.
- 제1항 또는 제2항에 있어서, 육성 온도가 900℃ 이상, 1500℃ 이하인 것을 특징으로 하는 질화갈륨 단결정의 육성 방법.
- 제1항 또는 제2항에 있어서, 육성 온도가 950℃ 이상, 1200℃ 이하인 것을 특징으로 하는 질화갈륨 단결정의 육성 방법.
- 제1항 또는 제2항에 있어서, 상기 플럭스가 수용된 도가니를 상승시킴으로써, 상기 플럭스에 종(種)결정을 접촉시키는 것을 특징으로 하는 질화갈륨 단결정의 육성 방법.
- 제1항 또는 제2항에 있어서, 열간 등방압 프레스 장치를 이용하여 상기 질화갈륨 단결정을 육성하는 것을 특징으로 하는 질화갈륨 단결정의 육성 방법.
- 제1항 또는 제2항에 기재한 방법에 의해 육성되는 것을 특징으로 하는 질화갈륨 단결정.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2004103093 | 2004-03-31 | ||
JPJP-P-2004-00103093 | 2004-03-31 |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20070008583A true KR20070008583A (ko) | 2007-01-17 |
KR100894460B1 KR100894460B1 (ko) | 2009-04-22 |
Family
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Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
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KR1020067017932A KR100894460B1 (ko) | 2004-03-31 | 2005-03-30 | 질화갈륨 단결정의 육성 방법 및 질화갈륨 단결정 |
Country Status (6)
Country | Link |
---|---|
US (1) | US8241422B2 (ko) |
EP (1) | EP1734158B1 (ko) |
JP (1) | JP4753869B2 (ko) |
KR (1) | KR100894460B1 (ko) |
CN (1) | CN1938457B (ko) |
WO (1) | WO2005095682A1 (ko) |
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JP5024898B2 (ja) | 2006-02-13 | 2012-09-12 | 日本碍子株式会社 | フラックスからナトリウム金属を回収する方法 |
JP4968708B2 (ja) * | 2006-03-06 | 2012-07-04 | 日本碍子株式会社 | 窒化物単結晶の製造方法 |
CN101395305B (zh) | 2006-03-06 | 2011-12-28 | 日本碍子株式会社 | 单晶的生长方法 |
JP5187846B2 (ja) | 2006-03-23 | 2013-04-24 | 日本碍子株式会社 | 窒化物単結晶の製造方法および装置 |
JP2007254201A (ja) * | 2006-03-23 | 2007-10-04 | Ngk Insulators Ltd | 単結晶の製造方法 |
JP4766620B2 (ja) * | 2006-03-23 | 2011-09-07 | 日本碍子株式会社 | 窒化物単結晶の製造装置 |
JP5177557B2 (ja) | 2006-03-23 | 2013-04-03 | 日本碍子株式会社 | 窒化物単結晶の製造装置 |
JP5187848B2 (ja) | 2006-03-23 | 2013-04-24 | 日本碍子株式会社 | 単結晶の製造方法 |
JP5078129B2 (ja) * | 2007-03-14 | 2012-11-21 | 日本碍子株式会社 | Iii族金属窒化物単結晶の育成方法 |
JP5235864B2 (ja) | 2007-03-27 | 2013-07-10 | 日本碍子株式会社 | 窒化物単結晶の製造方法 |
JP4624381B2 (ja) * | 2007-07-12 | 2011-02-02 | 住友電気工業株式会社 | GaN結晶の製造方法 |
WO2009081687A1 (ja) * | 2007-12-21 | 2009-07-02 | Ngk Insulators, Ltd. | 窒化物単結晶の育成装置 |
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CN102575384B (zh) * | 2009-10-16 | 2015-10-14 | 日本碍子株式会社 | 基底基板、第13族氮化物结晶及其制法 |
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CN101395305B (zh) * | 2006-03-06 | 2011-12-28 | 日本碍子株式会社 | 单晶的生长方法 |
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2005
- 2005-03-30 WO PCT/JP2005/006692 patent/WO2005095682A1/ja active Application Filing
- 2005-03-30 KR KR1020067017932A patent/KR100894460B1/ko active IP Right Grant
- 2005-03-30 JP JP2006511867A patent/JP4753869B2/ja active Active
- 2005-03-30 EP EP05728649A patent/EP1734158B1/en not_active Expired - Fee Related
- 2005-03-30 US US10/594,846 patent/US8241422B2/en not_active Expired - Fee Related
- 2005-03-30 CN CN2005800100507A patent/CN1938457B/zh not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
WO2005095682A1 (ja) | 2005-10-13 |
CN1938457A (zh) | 2007-03-28 |
EP1734158A4 (en) | 2009-01-28 |
US20070209575A1 (en) | 2007-09-13 |
CN1938457B (zh) | 2011-11-30 |
EP1734158A1 (en) | 2006-12-20 |
JPWO2005095682A1 (ja) | 2008-02-21 |
JP4753869B2 (ja) | 2011-08-24 |
KR100894460B1 (ko) | 2009-04-22 |
US8241422B2 (en) | 2012-08-14 |
EP1734158B1 (en) | 2012-01-04 |
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