KR20040053292A - 디스플레이 디바이스, 수신기 및 테스트 장치 - Google Patents

디스플레이 디바이스, 수신기 및 테스트 장치 Download PDF

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Publication number
KR20040053292A
KR20040053292A KR10-2004-7007052A KR20047007052A KR20040053292A KR 20040053292 A KR20040053292 A KR 20040053292A KR 20047007052 A KR20047007052 A KR 20047007052A KR 20040053292 A KR20040053292 A KR 20040053292A
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KR
South Korea
Prior art keywords
unit
test
signal
inspection
data
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Withdrawn
Application number
KR10-2004-7007052A
Other languages
English (en)
Korean (ko)
Inventor
하사코사토시
마키마사히로
이가타유지
곤도쥰지
Original Assignee
마츠시타 덴끼 산교 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by 마츠시타 덴끼 산교 가부시키가이샤 filed Critical 마츠시타 덴끼 산교 가부시키가이샤
Publication of KR20040053292A publication Critical patent/KR20040053292A/ko
Withdrawn legal-status Critical Current

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Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N7/00—Television systems
    • H04N7/12—Systems in which the television signal is transmitted via one channel or a plurality of parallel channels, the bandwidth of each channel being less than the bandwidth of the television signal
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N17/00—Diagnosis, testing or measuring for television systems or their details
    • H04N17/04—Diagnosis, testing or measuring for television systems or their details for receivers

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Health & Medical Sciences (AREA)
  • Biomedical Technology (AREA)
  • General Health & Medical Sciences (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)
KR10-2004-7007052A 2001-11-09 2002-11-01 디스플레이 디바이스, 수신기 및 테스트 장치 Withdrawn KR20040053292A (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JPJP-P-2001-00344282 2001-11-09
JP2001344282 2001-11-09
PCT/JP2002/011476 WO2003041419A1 (en) 2001-11-09 2002-11-01 Display device, receiver, and test apparatus

Publications (1)

Publication Number Publication Date
KR20040053292A true KR20040053292A (ko) 2004-06-23

Family

ID=19157831

Family Applications (1)

Application Number Title Priority Date Filing Date
KR10-2004-7007052A Withdrawn KR20040053292A (ko) 2001-11-09 2002-11-01 디스플레이 디바이스, 수신기 및 테스트 장치

Country Status (6)

Country Link
US (1) US7103800B2 (https=)
EP (1) EP1442615B1 (https=)
JP (1) JP4295110B2 (https=)
KR (1) KR20040053292A (https=)
CN (1) CN1305320C (https=)
WO (1) WO2003041419A1 (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20240114697A (ko) 2023-01-17 2024-07-24 연세대학교 산학협력단 중합 고분자 전해질 기반 고체 후막 전극 및 그 제조방법

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JP4617302B2 (ja) * 2004-03-22 2011-01-26 株式会社デジタル 表示器、コンピュータを表示器として機能させるためのプログラムプロダクト、およびそのプログラムプロダクトを格納した記録媒体
FR2875309B1 (fr) * 2004-09-15 2006-12-22 Alstom Transport Sa Dispositif et procede de controle d'une console
DE102005024649B4 (de) * 2005-05-25 2007-04-12 Infineon Technologies Ag Vorrichtung und Verfahren zum Messen von Jitter
KR100711739B1 (ko) * 2005-07-21 2007-04-25 삼성전자주식회사 테스트 시스템 및 그것의 테스트 방법
US7546507B1 (en) * 2005-12-02 2009-06-09 Altera Corporation Method and apparatus for debugging semiconductor devices
CN100584046C (zh) * 2005-12-27 2010-01-20 鸿富锦精密工业（深圳）有限公司 多媒体装置测试系统及其方法
JP4923786B2 (ja) * 2006-06-30 2012-04-25 カシオ計算機株式会社 ディスプレイ検査装置
EP3200189B1 (en) * 2007-04-12 2021-06-02 Rambus Inc. Memory system with point-to-point request interconnect
US20080275662A1 (en) * 2007-05-01 2008-11-06 Vladimir Dmitriev-Zdorov Generating transmission-code compliant test sequences
CN101039443B (zh) * 2007-05-15 2010-08-18 中兴通讯股份有限公司 一种数字电视接收终端电视功能故障的定位和显示方法
JP5161484B2 (ja) * 2007-05-17 2013-03-13 オンセミコンダクター・トレーディング・リミテッド 映像信号処理集積回路
TW200924385A (en) 2007-11-28 2009-06-01 Realtek Semiconductor Corp Jitter generator for generating jittered clock signal
CN102006160B (zh) * 2007-12-24 2013-09-11 瑞昱半导体股份有限公司 用来产生抖动时钟信号的抖动产生器
TWI406216B (zh) * 2008-09-02 2013-08-21 Himax Tech Ltd 電壓寫入裝置及電壓寫入方法
KR101651285B1 (ko) * 2009-07-28 2016-08-26 삼성전자 주식회사 전자기기, 원격제어장치 및 오류검출방법
KR101918627B1 (ko) 2012-04-04 2018-11-15 삼성전자 주식회사 데이터 수신장치 및 그 테스트 방법
US9436543B2 (en) * 2012-09-13 2016-09-06 Freescale Semiconductor, Inc. Electronic device and method for protecting an electronic device against unauthorized use
CN103905513A (zh) * 2012-12-28 2014-07-02 鸿富锦精密工业（深圳）有限公司 电子装置远程控制系统及方法
TWI569238B (zh) * 2014-10-13 2017-02-01 群創光電股份有限公司 顯示面板及顯示面板自動化檢測方法
KR102317897B1 (ko) 2015-06-04 2021-10-28 삼성디스플레이 주식회사 테스트 보드 및 그의 구동방법
JP6726999B2 (ja) * 2016-03-30 2020-07-22 Ｄｘアンテナ株式会社 検査システム
CN109522165B (zh) * 2018-09-19 2020-05-15 昆山国显光电有限公司 显示模组测试平台
JP7102450B2 (ja) * 2020-01-31 2022-07-19 アンリツ株式会社 誤り率測定システム及び誤り率測定方法
CN115118958A (zh) * 2022-06-14 2022-09-27 国营芜湖机械厂 一种机载任务处理机的视频信号检测装置及其检测方法
CN114910733B (zh) * 2022-07-15 2022-09-30 深圳益实科技有限公司 一种基于人工智能的显示器故障智能诊断分析系统
CN115118961B (zh) * 2022-08-26 2022-10-28 北京数字光芯集成电路设计有限公司 视频数据测试系统、方法及其应用
KR20240125824A (ko) * 2023-02-10 2024-08-20 삼성디스플레이 주식회사 표시 장치

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JPH07170179A (ja) 1993-12-16 1995-07-04 Matsushita Electric Ind Co Ltd Ｐｌｌロック検出装置
US5565897A (en) * 1994-01-14 1996-10-15 Elonex Technologies, Inc. Interactive system for calibration of display monitors
US5969756A (en) * 1994-06-13 1999-10-19 Image Processing Systems Inc. Test and alignment system for electronic display devices and test fixture for same
US5537145A (en) * 1994-12-06 1996-07-16 Sun Microsystems, Inc. Evaluation method and system for performance of flat panel displays and interface hardware
KR0151353B1 (ko) * 1995-06-14 1998-10-15 김광호 모니터의 자기진단회로 및 그 방법
US6326996B1 (en) * 1995-11-06 2001-12-04 Gateway, Inc. Display device having self contained diagnostic image generation capability
KR100206764B1 (ko) * 1995-12-05 1999-07-01 구자홍 영상기기의 예비점검 장치 및 방법
KR0182922B1 (ko) 1996-03-28 1999-04-15 김광호 동기 신호 자기 진단 장치 및 진단 방법
JPH10132901A (ja) * 1996-10-30 1998-05-22 Ricoh Co Ltd 画像形成装置
JP2950370B2 (ja) 1997-03-27 1999-09-20 日本電気株式会社 Ｐｌｌジッタ測定方法及び集積回路
US20030036866A1 (en) * 2001-08-14 2003-02-20 Dinesh Nair System and method for creating a test executive sequence to perform display inspection

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20240114697A (ko) 2023-01-17 2024-07-24 연세대학교 산학협력단 중합 고분자 전해질 기반 고체 후막 전극 및 그 제조방법

Also Published As

Publication number Publication date
JP4295110B2 (ja) 2009-07-15
US20030093715A1 (en) 2003-05-15
EP1442615A1 (en) 2004-08-04
JP2005509379A (ja) 2005-04-07
CN1305320C (zh) 2007-03-14
EP1442615B1 (en) 2013-10-23
CN1586083A (zh) 2005-02-23
WO2003041419A1 (en) 2003-05-15
US7103800B2 (en) 2006-09-05

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Date Code Title Description
PA0105 International application

Patent event date: 20040508

Patent event code: PA01051R01D

Comment text: International Patent Application

PG1501 Laying open of application
PC1203 Withdrawal of no request for examination
WITN Application deemed withdrawn, e.g. because no request for examination was filed or no examination fee was paid