KR102278837B1 - 패턴 형성 방법 - Google Patents

패턴 형성 방법 Download PDF

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Publication number
KR102278837B1
KR102278837B1 KR1020170029434A KR20170029434A KR102278837B1 KR 102278837 B1 KR102278837 B1 KR 102278837B1 KR 1020170029434 A KR1020170029434 A KR 1020170029434A KR 20170029434 A KR20170029434 A KR 20170029434A KR 102278837 B1 KR102278837 B1 KR 102278837B1
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KR
South Korea
Prior art keywords
group
region
coating film
acid
substrate
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KR1020170029434A
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English (en)
Korean (ko)
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KR20170107376A (ko
Inventor
히토시 하마구치
켄로우 다나카
카즈오 가와구치
Original Assignee
제이에스알 가부시끼가이샤
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Publication of KR20170107376A publication Critical patent/KR20170107376A/ko
Application granted granted Critical
Publication of KR102278837B1 publication Critical patent/KR102278837B1/ko

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    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/0002—Lithographic processes using patterning methods other than those involving the exposure to radiation, e.g. by stamping
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/20—Exposure; Apparatus therefor
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/004—Photosensitive materials
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26—Processing photosensitive materials; Apparatus therefor
    • G03F7/30—Imagewise removal using liquid means
    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/26—Processing photosensitive materials; Apparatus therefor
    • G03F7/42—Stripping or agents therefor
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
    • H01L21/027—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34
    • H01L21/0271—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers
    • H01L21/0273—Making masks on semiconductor bodies for further photolithographic processing not provided for in group H01L21/18 or H01L21/34 comprising organic layers characterised by the treatment of photoresist layers
    • H01L21/0274—Photolithographic processes

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Materials For Photolithography (AREA)
  • Photosensitive Polymer And Photoresist Processing (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
KR1020170029434A 2016-03-15 2017-03-08 패턴 형성 방법 KR102278837B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2016051217A JP6776565B2 (ja) 2016-03-15 2016-03-15 親撥材を用いたパターン形成方法
JPJP-P-2016-051217 2016-03-15

Publications (2)

Publication Number Publication Date
KR20170107376A KR20170107376A (ko) 2017-09-25
KR102278837B1 true KR102278837B1 (ko) 2021-07-16

Family

ID=59871362

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020170029434A KR102278837B1 (ko) 2016-03-15 2017-03-08 패턴 형성 방법

Country Status (4)

Country Link
JP (1) JP6776565B2 (ja)
KR (1) KR102278837B1 (ja)
CN (1) CN107193186B (ja)
TW (1) TWI728067B (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN109843452A (zh) * 2016-10-21 2019-06-04 Jsr株式会社 硬化膜的形成方法、感放射线树脂组合物、具备硬化膜的显示元件及传感器

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007081269A (ja) 2005-09-16 2007-03-29 Dainippon Printing Co Ltd パターン形成体の製造方法、および有機薄膜トランジスタ
JP2007324510A (ja) 2006-06-05 2007-12-13 Sony Corp 半導体装置の製造方法
JP2009088135A (ja) 2007-09-28 2009-04-23 Tokyo Ohka Kogyo Co Ltd レジストパターン形成方法
JP2012089857A (ja) 2011-11-28 2012-05-10 Dainippon Printing Co Ltd パターン形成体の製造方法、および有機薄膜トランジスタ
JP2015072455A (ja) * 2013-09-04 2015-04-16 Jsr株式会社 感放射線性樹脂組成物、重合体組成物、硬化膜、その形成方法、及び電子デバイス

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3720970B2 (ja) * 1998-01-13 2005-11-30 株式会社東芝 感光性組成物、およびこれを用いたパターン形成方法、半導体装置の製造方法
CN1905782A (zh) * 2002-03-27 2007-01-31 精工爱普生株式会社 表面处理方法及膜图案的形成方法
CN103250100A (zh) * 2010-12-01 2013-08-14 Jsr株式会社 放射线敏感树脂组合物、使用其的图案形成方法、聚合物及化合物
TWI617629B (zh) * 2013-05-01 2018-03-11 Jsr股份有限公司 具有凹圖案的基材的製造方法、組成物、導電膜的形成方法、電子電路及電子元件
JP6126570B2 (ja) * 2013-12-13 2017-05-10 富士フイルム株式会社 パターン形成方法、電子デバイスの製造方法
CN105573053B (zh) * 2014-10-31 2020-12-29 Jsr株式会社 具有亲液部与疏液部的基材的制造方法及其应用及组合物

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2007081269A (ja) 2005-09-16 2007-03-29 Dainippon Printing Co Ltd パターン形成体の製造方法、および有機薄膜トランジスタ
JP2007324510A (ja) 2006-06-05 2007-12-13 Sony Corp 半導体装置の製造方法
JP2009088135A (ja) 2007-09-28 2009-04-23 Tokyo Ohka Kogyo Co Ltd レジストパターン形成方法
JP2012089857A (ja) 2011-11-28 2012-05-10 Dainippon Printing Co Ltd パターン形成体の製造方法、および有機薄膜トランジスタ
JP2015072455A (ja) * 2013-09-04 2015-04-16 Jsr株式会社 感放射線性樹脂組成物、重合体組成物、硬化膜、その形成方法、及び電子デバイス

Also Published As

Publication number Publication date
CN107193186B (zh) 2020-11-24
JP2017167277A (ja) 2017-09-21
TW201800859A (zh) 2018-01-01
TWI728067B (zh) 2021-05-21
CN107193186A (zh) 2017-09-22
KR20170107376A (ko) 2017-09-25
JP6776565B2 (ja) 2020-10-28

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