KR102226441B1 - 연마용 조성물, 연마용 조성물 제조 방법 및 연마물 제조 방법 - Google Patents

연마용 조성물, 연마용 조성물 제조 방법 및 연마물 제조 방법 Download PDF

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KR102226441B1
KR102226441B1 KR1020157024572A KR20157024572A KR102226441B1 KR 102226441 B1 KR102226441 B1 KR 102226441B1 KR 1020157024572 A KR1020157024572 A KR 1020157024572A KR 20157024572 A KR20157024572 A KR 20157024572A KR 102226441 B1 KR102226441 B1 KR 102226441B1
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South Korea
Prior art keywords
polishing
water
polishing composition
abrasive
soluble polymer
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Korean (ko)
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KR20150119062A (ko
Inventor
고오스케 츠치야
히사노리 단쇼
마키 아사다
유스케 스가
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가부시키가이샤 후지미인코퍼레이티드
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    • C—CHEMISTRY; METALLURGY
    • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09G—POLISHING COMPOSITIONS; SKI WAXES
    • C09G1/00—Polishing compositions
    • C09G1/02—Polishing compositions containing abrasives or grinding agents
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00—Lapping machines or devices; Accessories
    • B—PERFORMING OPERATIONS; TRANSPORTING
    • B24—GRINDING; POLISHING
    • B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00—Lapping machines or devices; Accessories
    • B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
    • B24B37/042—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
    • B24B37/044—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor characterised by the composition of the lapping agent
    • C—CHEMISTRY; METALLURGY
    • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K3/00—Materials not provided for elsewhere
    • C09K3/14—Anti-slip materials; Abrasives
    • C09K3/1436—Composite particles, e.g. coated particles
    • C—CHEMISTRY; METALLURGY
    • C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
    • C09K3/00—Materials not provided for elsewhere
    • C09K3/14—Anti-slip materials; Abrasives
    • C09K3/1454—Abrasive powders, suspensions and pastes for polishing
    • C09K3/1463—Aqueous liquid suspensions
    • H01L21/02024—
    • H01L21/02052—
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P70/00—Cleaning of wafers, substrates or parts of devices
    • H10P70/10—Cleaning before device manufacture, i.e. Begin-Of-Line process
    • H10P70/15—Cleaning before device manufacture, i.e. Begin-Of-Line process by wet cleaning only
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P90/00—Preparation of wafers not covered by a single main group of this subclass, e.g. wafer reinforcement
    • H10P90/12—Preparing bulk and homogeneous wafers
    • H10P90/129—Preparing bulk and homogeneous wafers by polishing

Landscapes

  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Organic Chemistry (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Composite Materials (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
KR1020157024572A 2013-02-13 2014-02-10 연마용 조성물, 연마용 조성물 제조 방법 및 연마물 제조 방법 Active KR102226441B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JPJP-P-2013-026020 2013-02-13
JP2013026020 2013-02-13
PCT/JP2014/053065 WO2014126051A1 (ja) 2013-02-13 2014-02-10 研磨用組成物、研磨用組成物製造方法および研磨物製造方法

Publications (2)

Publication Number Publication Date
KR20150119062A KR20150119062A (ko) 2015-10-23
KR102226441B1 true KR102226441B1 (ko) 2021-03-12

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Country Status (8)

Country Link
US (1) US20150376464A1 (https=)
EP (1) EP2957613B1 (https=)
JP (2) JP5897200B2 (https=)
KR (1) KR102226441B1 (https=)
CN (1) CN104995277B (https=)
SG (1) SG11201506001VA (https=)
TW (1) TWI624536B (https=)
WO (1) WO2014126051A1 (https=)

Families Citing this family (29)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5900913B2 (ja) 2013-03-19 2016-04-06 株式会社フジミインコーポレーテッド 研磨用組成物、研磨用組成物製造方法および研磨用組成物調製用キット
US10717899B2 (en) 2013-03-19 2020-07-21 Fujimi Incorporated Polishing composition, method for producing polishing composition and polishing composition preparation kit
JP6314019B2 (ja) * 2014-03-31 2018-04-18 ニッタ・ハース株式会社 半導体基板の研磨方法
JP6185432B2 (ja) 2014-06-24 2017-08-23 株式会社フジミインコーポレーテッド シリコンウェーハ研磨用組成物
CN107001916B (zh) * 2014-12-05 2019-01-22 3M创新有限公司 磨料组合物
KR102594932B1 (ko) * 2015-05-08 2023-10-27 가부시키가이샤 후지미인코퍼레이티드 연마용 조성물
JP6582601B2 (ja) * 2015-06-22 2019-10-02 日立化成株式会社 研磨液、貯蔵液及び研磨方法
JP6797796B2 (ja) * 2015-07-01 2020-12-09 東亞合成株式会社 研磨用濡れ剤及び研磨液組成物
CN109476116B (zh) 2016-04-28 2021-07-16 自然工作有限责任公司 具有包含耐热聚合物层和聚丙交酯树脂层的多层片材的饰面的聚合物泡沫隔热结构
WO2018061365A1 (ja) * 2016-09-28 2018-04-05 株式会社フジミインコーポレーテッド 表面処理組成物
CN110167879A (zh) * 2016-10-28 2019-08-23 株式会社德山 气相二氧化硅及其制备方法
JP6792413B2 (ja) * 2016-10-31 2020-11-25 花王株式会社 シリコンウェーハ用研磨液組成物
EP3546542A4 (en) * 2016-11-22 2020-07-22 Fujimi Incorporated POLISHING COMPOSITION
US20200010727A1 (en) * 2017-02-20 2020-01-09 Fujimi Incorporated Intermediate polishing composition for silicon substrate and polishing composition set for silicon substrate
JP6879798B2 (ja) * 2017-03-30 2021-06-02 株式会社フジミインコーポレーテッド 研磨用組成物および研磨方法
JP7074525B2 (ja) * 2017-03-30 2022-05-24 株式会社フジミインコーポレーテッド 研磨用組成物および研磨方法
EP3605588A4 (en) * 2017-03-31 2021-01-13 Fujimi Incorporated POLISHING COMPOSITION
JP7148506B2 (ja) * 2017-05-26 2022-10-05 株式会社フジミインコーポレーテッド 研磨用組成物およびこれを用いた研磨方法
EP3410236B1 (fr) * 2017-05-29 2021-02-17 The Swatch Group Research and Development Ltd Dispositif et procede d'ajustement de marche et correction d'etat d'une montre
KR102617007B1 (ko) * 2017-07-21 2023-12-27 가부시키가이샤 후지미인코퍼레이티드 기판의 연마 방법 및 연마용 조성물 세트
US11649377B2 (en) * 2017-08-14 2023-05-16 Resonac Corporation Polishing liquid, polishing liquid set and polishing method
JP6929239B2 (ja) * 2018-03-30 2021-09-01 株式会社フジミインコーポレーテッド 研磨用組成物および研磨方法
EP3819353A4 (en) * 2018-07-04 2022-03-30 Sumitomo Seika Chemicals Co., Ltd. POLISHING COMPOSITION
JP7424768B2 (ja) * 2019-08-08 2024-01-30 株式会社フジミインコーポレーテッド 研磨用添加剤含有液の濾過方法、研磨用添加剤含有液、研磨用組成物、研磨用組成物の製造方法およびフィルタ
EP3792327B1 (en) * 2019-09-11 2025-05-28 Fujimi Incorporated Polishing composition, polishing method and method for manufacturing semiconductor substrate
EP4119292B1 (en) * 2020-03-13 2026-02-18 Fujimi Incorporated Polishing composition and polishing method
CN112175524B (zh) * 2020-09-21 2022-02-15 万华化学集团电子材料有限公司 一种蓝宝石抛光组合物及其应用
KR102492236B1 (ko) * 2020-12-17 2023-01-26 에스케이실트론 주식회사 연마장치 및 웨이퍼의 연마방법
WO2023181928A1 (ja) 2022-03-23 2023-09-28 株式会社フジミインコーポレーテッド 研磨用組成物

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006086462A (ja) * 2004-09-17 2006-03-30 Fujimi Inc 研磨用組成物およびそれを用いた配線構造体の製造法

Family Cites Families (37)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001185516A (ja) * 1999-12-24 2001-07-06 Kao Corp 研磨助剤
JP2004051756A (ja) * 2002-07-19 2004-02-19 Sanyo Chem Ind Ltd Ｃｍｐプロセス用研磨組成物
JP4212861B2 (ja) * 2002-09-30 2009-01-21 株式会社フジミインコーポレーテッド 研磨用組成物及びそれを用いたシリコンウエハの研磨方法、並びにリンス用組成物及びそれを用いたシリコンウエハのリンス方法
JP4593064B2 (ja) 2002-09-30 2010-12-08 株式会社フジミインコーポレーテッド 研磨用組成物及びそれを用いた研磨方法
JP4668528B2 (ja) 2003-09-05 2011-04-13 株式会社フジミインコーポレーテッド 研磨用組成物
JP2005268664A (ja) * 2004-03-19 2005-09-29 Fujimi Inc 研磨用組成物
CN100503167C (zh) * 2004-05-19 2009-06-24 日产化学工业株式会社 研磨用组合物
US20060000808A1 (en) * 2004-07-01 2006-01-05 Fuji Photo Film Co., Ltd. Polishing solution of metal and chemical mechanical polishing method
JP4814502B2 (ja) * 2004-09-09 2011-11-16 株式会社フジミインコーポレーテッド 研磨用組成物及びそれを用いた研磨方法
JP5026665B2 (ja) * 2004-10-15 2012-09-12 株式会社フジミインコーポレーテッド 研磨用組成物及びそれを用いた研磨方法
JP4027929B2 (ja) * 2004-11-30 2007-12-26 花王株式会社 半導体基板用研磨液組成物
JP2006352043A (ja) * 2005-06-20 2006-12-28 Nitta Haas Inc 半導体研磨用組成物
JP2007073548A (ja) * 2005-09-02 2007-03-22 Fujimi Inc 研磨方法
JP2007095946A (ja) * 2005-09-28 2007-04-12 Fujifilm Corp 金属用研磨液及び研磨方法
EP1813656A3 (en) * 2006-01-30 2009-09-02 FUJIFILM Corporation Metal-polishing liquid and chemical mechanical polishing method using the same
JP2007214205A (ja) * 2006-02-07 2007-08-23 Fujimi Inc 研磨用組成物
JP5204960B2 (ja) * 2006-08-24 2013-06-05 株式会社フジミインコーポレーテッド 研磨用組成物及び研磨方法
JP5335183B2 (ja) * 2006-08-24 2013-11-06 株式会社フジミインコーポレーテッド 研磨用組成物及び研磨方法
JP2008091524A (ja) * 2006-09-29 2008-04-17 Fujifilm Corp 金属用研磨液
JP5196819B2 (ja) * 2007-03-19 2013-05-15 ニッタ・ハース株式会社 研磨用組成物
US10144849B2 (en) * 2008-02-01 2018-12-04 Fujimi Incorporated Polishing composition and polishing method using the same
US9202709B2 (en) * 2008-03-19 2015-12-01 Fujifilm Corporation Polishing liquid for metal and polishing method using the same
JP2009231486A (ja) * 2008-03-21 2009-10-08 Kao Corp シリコンウエハ用研磨液組成物
MY155495A (en) * 2008-06-18 2015-10-30 Fujimi Inc Polishing composition and polishing method using the same
JP5474400B2 (ja) 2008-07-03 2014-04-16 株式会社フジミインコーポレーテッド 半導体用濡れ剤、それを用いた研磨用組成物および研磨方法
JP5362319B2 (ja) * 2008-10-21 2013-12-11 花王株式会社 研磨液組成物
US20100164106A1 (en) * 2008-12-31 2010-07-01 Cheil Industries Inc. CMP Slurry Composition for Barrier Polishing for Manufacturing Copper Interconnects, Polishing Method Using the Composition, and Semiconductor Device Manufactured by the Method
JP2011171689A (ja) * 2009-07-07 2011-09-01 Kao Corp シリコンウエハ用研磨液組成物
JP5493528B2 (ja) * 2009-07-15 2014-05-14 日立化成株式会社 Ｃｍｐ研磨液及びこのｃｍｐ研磨液を用いた研磨方法
JP5441578B2 (ja) * 2009-09-11 2014-03-12 花王株式会社 研磨液組成物
JP5321430B2 (ja) * 2009-12-02 2013-10-23 信越半導体株式会社 シリコンウェーハ研磨用研磨剤およびシリコンウェーハの研磨方法
JP5492603B2 (ja) * 2010-03-02 2014-05-14 株式会社フジミインコーポレーテッド 研磨用組成物及びそれを用いた研磨方法
JP5544244B2 (ja) * 2010-08-09 2014-07-09 株式会社フジミインコーポレーテッド 研磨用組成物および研磨方法
JP2012079964A (ja) * 2010-10-04 2012-04-19 Nissan Chem Ind Ltd 半導体ウェーハ用研磨液組成物
US20130302984A1 (en) * 2011-01-26 2013-11-14 Fujimi Incorporated Polishing composition, polishing method using same, and substrate production method
KR20140034231A (ko) * 2011-05-24 2014-03-19 가부시키가이샤 구라레 화학 기계 연마용 부식 방지제, 화학 기계 연마용 슬러리, 및 화학 기계 연마 방법
JP2014041978A (ja) * 2012-08-23 2014-03-06 Fujimi Inc 研磨用組成物、研磨用組成物の製造方法、及び研磨用組成物原液の製造方法

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006086462A (ja) * 2004-09-17 2006-03-30 Fujimi Inc 研磨用組成物およびそれを用いた配線構造体の製造法

Also Published As

Publication number Publication date
WO2014126051A1 (ja) 2014-08-21
JP2016138278A (ja) 2016-08-04
CN104995277A (zh) 2015-10-21
US20150376464A1 (en) 2015-12-31
EP2957613A4 (en) 2016-11-09
SG11201506001VA (en) 2015-09-29
TW201443212A (zh) 2014-11-16
JP6387032B2 (ja) 2018-09-05
JP5897200B2 (ja) 2016-03-30
TWI624536B (zh) 2018-05-21
KR20150119062A (ko) 2015-10-23
EP2957613A1 (en) 2015-12-23
EP2957613B1 (en) 2020-11-18
JPWO2014126051A1 (ja) 2017-02-02
CN104995277B (zh) 2018-05-08

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