KR102158666B1 - 센서 회로 - Google Patents

센서 회로 Download PDF

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Publication number
KR102158666B1
KR102158666B1 KR1020140014039A KR20140014039A KR102158666B1 KR 102158666 B1 KR102158666 B1 KR 102158666B1 KR 1020140014039 A KR1020140014039 A KR 1020140014039A KR 20140014039 A KR20140014039 A KR 20140014039A KR 102158666 B1 KR102158666 B1 KR 102158666B1
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KR
South Korea
Prior art keywords
terminal
output terminal
sensor element
sensor
resistor
Prior art date
Application number
KR1020140014039A
Other languages
English (en)
Korean (ko)
Other versions
KR20140102603A (ko
Inventor
기요시 요시카와
Original Assignee
에이블릭 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Application filed by 에이블릭 가부시키가이샤 filed Critical 에이블릭 가부시키가이샤
Publication of KR20140102603A publication Critical patent/KR20140102603A/ko
Application granted granted Critical
Publication of KR102158666B1 publication Critical patent/KR102158666B1/ko

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    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K5/00—Manipulating of pulses not covered by one of the other main groups of this subclass
    • H03K5/22—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral
    • H03K5/24—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude
    • H03K5/2472—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors
    • H03K5/2481—Circuits having more than one input and one output for comparing pulses or pulse trains with each other according to input signal characteristics, e.g. slope, integral the characteristic being amplitude using field effect transistors with at least one differential stage

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  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Amplifiers (AREA)
  • Measuring Instrument Details And Bridges, And Automatic Balancing Devices (AREA)
KR1020140014039A 2013-02-14 2014-02-07 센서 회로 KR102158666B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2013-026905 2013-02-14
JP2013026905A JP6049488B2 (ja) 2013-02-14 2013-02-14 センサ回路

Publications (2)

Publication Number Publication Date
KR20140102603A KR20140102603A (ko) 2014-08-22
KR102158666B1 true KR102158666B1 (ko) 2020-09-22

Family

ID=51297079

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020140014039A KR102158666B1 (ko) 2013-02-14 2014-02-07 센서 회로

Country Status (5)

Country Link
US (1) US8901966B2 (zh)
JP (1) JP6049488B2 (zh)
KR (1) KR102158666B1 (zh)
CN (1) CN103997307B (zh)
TW (1) TWI591958B (zh)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102014114636A1 (de) * 2014-10-09 2016-04-14 Infineon Technologies Ag Verstärker für Sensoren
JP6511336B2 (ja) * 2015-06-02 2019-05-15 エイブリック株式会社 温度補償回路およびセンサ装置
JP6805192B2 (ja) * 2018-02-06 2020-12-23 株式会社東芝 電流検出回路
US11175359B2 (en) * 2019-08-28 2021-11-16 Allegro Microsystems, Llc Reducing voltage non-linearity in a bridge having tunneling magnetoresistance (TMR) elements

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6276306A (ja) * 1985-09-28 1987-04-08 Kyowa Electronic Instr Corp Ltd 差動増幅回路
US5402064A (en) * 1992-09-02 1995-03-28 Santa Barbara Research Center Magnetoresistive sensor circuit with high output voltage swing and temperature compensation
EP0592205B1 (en) * 1992-10-07 1998-01-07 Nec Corporation Semiconductor sensor with fault detecting circuit
JPH07212139A (ja) * 1994-01-26 1995-08-11 Matsushita Electric Works Ltd センサ用検出回路
US5578962A (en) * 1995-05-10 1996-11-26 Mca Technologies, Inc. Instrumentation amplifier for sensor signal conditioning using low-cost, high-accuracy analog circuitry
JPH09205330A (ja) * 1996-01-26 1997-08-05 Matsushita Electric Works Ltd センサ用出力増幅回路
JP2002286747A (ja) * 2001-03-27 2002-10-03 Aisin Seiki Co Ltd センサ装置及びセンサ用信号処理装置
JP4227070B2 (ja) * 2004-05-14 2009-02-18 東光株式会社 レギュレータ用温度センサ回路
JP5060871B2 (ja) * 2007-08-22 2012-10-31 セイコーインスツル株式会社 可変分圧回路及び磁気センサ回路
JP5363075B2 (ja) * 2008-11-13 2013-12-11 セイコーインスツル株式会社 センサ回路
JP5213175B2 (ja) * 2008-11-14 2013-06-19 セイコーインスツル株式会社 温度センサ
JP2010181211A (ja) 2009-02-04 2010-08-19 Tdk Corp 電流センサ及びそれに用いられる磁気検出素子の温度特性補償方法
CN101820256A (zh) * 2010-04-21 2010-09-01 无锡伯顿电子科技有限公司 传感器信号放大调理电路
JP5695338B2 (ja) * 2010-04-22 2015-04-01 セイコーインスツル株式会社 照度センサ
US8330537B1 (en) * 2010-07-23 2012-12-11 National Semiconductor Corporation Low noise, high CMRR and PSRR input buffer
US8451063B2 (en) * 2010-09-29 2013-05-28 Hitachi, Ltd. Wideband low noise sensor amplifier circuit
JP5969237B2 (ja) * 2012-03-23 2016-08-17 エスアイアイ・セミコンダクタ株式会社 半導体装置

Also Published As

Publication number Publication date
CN103997307B (zh) 2018-05-08
KR20140102603A (ko) 2014-08-22
US8901966B2 (en) 2014-12-02
JP6049488B2 (ja) 2016-12-21
TW201444276A (zh) 2014-11-16
CN103997307A (zh) 2014-08-20
JP2014158095A (ja) 2014-08-28
TWI591958B (zh) 2017-07-11
US20140225649A1 (en) 2014-08-14

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A201 Request for examination
E902 Notification of reason for refusal
E90F Notification of reason for final refusal
E701 Decision to grant or registration of patent right
GRNT Written decision to grant