KR101832494B1 - Bga 반도체 패키지 및 그 제조 방법 - Google Patents

Bga 반도체 패키지 및 그 제조 방법 Download PDF

Info

Publication number
KR101832494B1
KR101832494B1 KR1020110095258A KR20110095258A KR101832494B1 KR 101832494 B1 KR101832494 B1 KR 101832494B1 KR 1020110095258 A KR1020110095258 A KR 1020110095258A KR 20110095258 A KR20110095258 A KR 20110095258A KR 101832494 B1 KR101832494 B1 KR 101832494B1
Authority
KR
South Korea
Prior art keywords
substrate
semiconductor element
microball
ball
micro
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1020110095258A
Other languages
English (en)
Korean (ko)
Other versions
KR20120031147A (ko
Inventor
노리유키 기무라
Original Assignee
에스아이아이 세미컨덕터 가부시키가이샤
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 에스아이아이 세미컨덕터 가부시키가이샤 filed Critical 에스아이아이 세미컨덕터 가부시키가이샤
Publication of KR20120031147A publication Critical patent/KR20120031147A/ko
Application granted granted Critical
Publication of KR101832494B1 publication Critical patent/KR101832494B1/ko
Expired - Fee Related legal-status Critical Current
Anticipated expiration legal-status Critical

Links

Images

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • H10W74/10Encapsulations, e.g. protective coatings characterised by their shape or disposition
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W20/00Interconnections in chips, wafers or substrates
    • H10W20/20Interconnections within wafers or substrates, e.g. through-silicon vias [TSV]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W70/00Package substrates; Interposers; Redistribution layers [RDL]
    • H10W70/60Insulating or insulated package substrates; Interposers; Redistribution layers
    • H10W70/62Insulating or insulated package substrates; Interposers; Redistribution layers characterised by their interconnections
    • H10W70/63Vias, e.g. via plugs
    • H10W70/635Through-vias
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • H10W74/01Manufacture or treatment
    • H10W74/016Manufacture or treatment using moulds
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/01Manufacture or treatment
    • H10W72/0198Manufacture or treatment batch processes
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/073Connecting or disconnecting of die-attach connectors
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/075Connecting or disconnecting of bond wires
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/071Connecting or disconnecting
    • H10W72/075Connecting or disconnecting of bond wires
    • H10W72/07531Techniques
    • H10W72/07532Compression bonding, e.g. thermocompression bonding
    • H10W72/07533Ultrasonic bonding, e.g. thermosonic bonding
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/20Bump connectors, e.g. solder bumps or copper pillars; Dummy bumps; Thermal bumps
    • H10W72/241Dispositions, e.g. layouts
    • H10W72/247Dispositions of multiple bumps
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/531Shapes of wire connectors
    • H10W72/536Shapes of wire connectors the connected ends being ball-shaped
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/531Shapes of wire connectors
    • H10W72/5363Shapes of wire connectors the connected ends being wedge-shaped
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/541Dispositions of bond wires
    • H10W72/5434Dispositions of bond wires the connected ends being on auxiliary connecting means on bond pads, e.g. on other bond wires
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/541Dispositions of bond wires
    • H10W72/5449Dispositions of bond wires not being orthogonal to a side surface of the chip, e.g. fan-out arrangements
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/551Materials of bond wires
    • H10W72/552Materials of bond wires comprising metals or metalloids, e.g. silver
    • H10W72/5522Materials of bond wires comprising metals or metalloids, e.g. silver comprising gold [Au]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/551Materials of bond wires
    • H10W72/552Materials of bond wires comprising metals or metalloids, e.g. silver
    • H10W72/5524Materials of bond wires comprising metals or metalloids, e.g. silver comprising aluminium [Al]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W72/00Interconnections or connectors in packages
    • H10W72/50Bond wires
    • H10W72/551Materials of bond wires
    • H10W72/552Materials of bond wires comprising metals or metalloids, e.g. silver
    • H10W72/5525Materials of bond wires comprising metals or metalloids, e.g. silver comprising copper [Cu]
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W74/00Encapsulations, e.g. protective coatings
    • H10W74/10Encapsulations, e.g. protective coatings characterised by their shape or disposition
    • H10W74/111Encapsulations, e.g. protective coatings characterised by their shape or disposition the semiconductor body being completely enclosed
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10WGENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10
    • H10W90/00Package configurations
    • H10W90/701Package configurations characterised by the relative positions of pads or connectors relative to package parts
    • H10W90/751Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires
    • H10W90/754Package configurations characterised by the relative positions of pads or connectors relative to package parts of bond wires between a chip and a stacked insulating package substrate, interposer or RDL

Landscapes

  • Wire Bonding (AREA)
  • Encapsulation Of And Coatings For Semiconductor Or Solid State Devices (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
KR1020110095258A 2010-09-22 2011-09-21 Bga 반도체 패키지 및 그 제조 방법 Expired - Fee Related KR101832494B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2010-212555 2010-09-22
JP2010212555A JP5642473B2 (ja) 2010-09-22 2010-09-22 Bga半導体パッケージおよびその製造方法

Publications (2)

Publication Number Publication Date
KR20120031147A KR20120031147A (ko) 2012-03-30
KR101832494B1 true KR101832494B1 (ko) 2018-02-26

Family

ID=45817017

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020110095258A Expired - Fee Related KR101832494B1 (ko) 2010-09-22 2011-09-21 Bga 반도체 패키지 및 그 제조 방법

Country Status (5)

Country Link
US (2) US8940629B2 (enExample)
JP (1) JP5642473B2 (enExample)
KR (1) KR101832494B1 (enExample)
CN (1) CN102412225B (enExample)
TW (1) TW201232731A (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR102062108B1 (ko) 2013-06-10 2020-01-03 삼성전자주식회사 반도체 패키지 및 이의 제조 방법
AT14221U1 (de) * 2014-05-19 2015-06-15 Tridonic Gmbh & Co Kg Leuchtmittel mit LED und Verfahren zur Montage
TW201602715A (zh) * 2014-07-07 2016-01-16 日立麥克賽爾股份有限公司 配列用遮罩及其製造方法
KR20170020002A (ko) 2015-08-13 2017-02-22 삼성전기주식회사 인쇄회로기판 및 이를 포함한 칩 패키지
IT201700073501A1 (it) 2017-06-30 2018-12-30 St Microelectronics Srl Prodotto a semiconduttore e corrispondente procedimento
JP7063718B2 (ja) * 2018-05-17 2022-05-09 エイブリック株式会社 プリモールド基板とその製造方法および中空型半導体装置とその製造方法

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001024033A (ja) * 1999-07-07 2001-01-26 Oki Electric Ind Co Ltd 半導体素子実装用テープ、半導体装置及びそれらの製造方法
JP2010206162A (ja) * 2009-02-06 2010-09-16 Seiko Instruments Inc 樹脂封止型半導体装置およびその製造方法

Family Cites Families (34)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5241133A (en) 1990-12-21 1993-08-31 Motorola, Inc. Leadless pad array chip carrier
JP3632930B2 (ja) 1993-12-27 2005-03-30 株式会社ルネサステクノロジ ボールグリッドアレイ半導体装置
JPH08316359A (ja) * 1995-05-16 1996-11-29 Hitachi Ltd 半導体集積回路装置およびその製造方法
JP3080579B2 (ja) * 1996-03-06 2000-08-28 富士機工電子株式会社 エアリア・グリッド・アレイ・パッケージの製造方法
JPH1012760A (ja) * 1996-06-24 1998-01-16 Hitachi Cable Ltd 半導体装置
KR100234694B1 (ko) * 1996-10-29 1999-12-15 김영환 비지에이 패키지의 제조방법
US20020106832A1 (en) * 1996-11-26 2002-08-08 Gregory B. Hotchkiss Method and apparatus for attaching solder members to a substrate
US5990545A (en) * 1996-12-02 1999-11-23 3M Innovative Properties Company Chip scale ball grid array for integrated circuit package
US5950070A (en) * 1997-05-15 1999-09-07 Kulicke & Soffa Investments Method of forming a chip scale package, and a tool used in forming the chip scale package
US6066512A (en) * 1998-01-12 2000-05-23 Seiko Epson Corporation Semiconductor device, method of fabricating the same, and electronic apparatus
JP3876953B2 (ja) * 1998-03-27 2007-02-07 セイコーエプソン株式会社 半導体装置及びその製造方法、回路基板並びに電子機器
JPH11284006A (ja) * 1998-03-31 1999-10-15 Fujitsu Ltd 半導体装置
US6498099B1 (en) * 1998-06-10 2002-12-24 Asat Ltd. Leadless plastic chip carrier with etch back pad singulation
US6329228B1 (en) * 1999-04-28 2001-12-11 Citizen Watch Co., Ltd. Semiconductor device and method of fabricating the same
JP3398721B2 (ja) * 1999-05-20 2003-04-21 アムコー テクノロジー コリア インコーポレーティド 半導体パッケージ及びその製造方法
EP1744609B1 (en) * 1999-06-02 2012-12-12 Ibiden Co., Ltd. Multi-layer printed circuit board and method of manufacturing multi-layer printed circuit board
TW512467B (en) * 1999-10-12 2002-12-01 North Kk Wiring circuit substrate and manufacturing method therefor
US6400574B1 (en) * 2000-05-11 2002-06-04 Micron Technology, Inc. Molded ball grid array
KR100443504B1 (ko) * 2001-06-12 2004-08-09 주식회사 하이닉스반도체 볼 그리드 어레이 패키지 구조 및 그 제조방법
US6617680B2 (en) * 2001-08-22 2003-09-09 Siliconware Precision Industries Co., Ltd. Chip carrier, semiconductor package and fabricating method thereof
US7485951B2 (en) * 2001-10-26 2009-02-03 Entorian Technologies, Lp Modularized die stacking system and method
US6940729B2 (en) * 2001-10-26 2005-09-06 Staktek Group L.P. Integrated circuit stacking system and method
JP2004119726A (ja) * 2002-09-26 2004-04-15 Sanyo Electric Co Ltd 回路装置の製造方法
WO2005031861A1 (en) * 2003-09-26 2005-04-07 Tessera, Inc. Structure and method of making capped chips including a flowable conductive medium
JP2005203390A (ja) * 2004-01-13 2005-07-28 Seiko Instruments Inc 樹脂封止型半導体装置の製造方法
US7205178B2 (en) * 2004-03-24 2007-04-17 Freescale Semiconductor, Inc. Land grid array packaged device and method of forming same
JP4528100B2 (ja) * 2004-11-25 2010-08-18 新光電気工業株式会社 半導体装置及びその製造方法
JP2007194436A (ja) * 2006-01-19 2007-08-02 Elpida Memory Inc 半導体パッケージ、導電性ポスト付き基板、積層型半導体装置、半導体パッケージの製造方法及び積層型半導体装置の製造方法
JP4282724B2 (ja) * 2007-02-20 2009-06-24 日本テキサス・インスツルメンツ株式会社 マイクロボールマウンタ用の振込みマスク
JP4809308B2 (ja) * 2007-09-21 2011-11-09 新光電気工業株式会社 基板の製造方法
CN101483163B (zh) * 2008-01-07 2011-11-16 力成科技股份有限公司 窗口型球格阵列封装构造及其基板
JP2010272734A (ja) * 2009-05-22 2010-12-02 Elpida Memory Inc 半導体装置及びその製造方法
JP2011082345A (ja) * 2009-10-07 2011-04-21 Panasonic Corp 半導体装置
US8456021B2 (en) * 2010-11-24 2013-06-04 Texas Instruments Incorporated Integrated circuit device having die bonded to the polymer side of a polymer substrate

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2001024033A (ja) * 1999-07-07 2001-01-26 Oki Electric Ind Co Ltd 半導体素子実装用テープ、半導体装置及びそれらの製造方法
JP2010206162A (ja) * 2009-02-06 2010-09-16 Seiko Instruments Inc 樹脂封止型半導体装置およびその製造方法

Also Published As

Publication number Publication date
US9245864B2 (en) 2016-01-26
KR20120031147A (ko) 2012-03-30
CN102412225B (zh) 2016-06-22
US20120068340A1 (en) 2012-03-22
JP2012069690A (ja) 2012-04-05
CN102412225A (zh) 2012-04-11
JP5642473B2 (ja) 2014-12-17
US20150123277A1 (en) 2015-05-07
TW201232731A (en) 2012-08-01
US8940629B2 (en) 2015-01-27

Similar Documents

Publication Publication Date Title
US8344492B2 (en) Semiconductor device and method of manufacturing the same, and electronic apparatus
US8294253B2 (en) Semiconductor device, electronic device and method of manufacturing semiconductor device, having electronic component, sealing resin and multilayer wiring structure
US8415789B2 (en) Three-dimensionally integrated semicondutor device and method for manufacturing the same
CN100576531C (zh) 半导体封装及其制造方法
US9490224B2 (en) Semiconductor device and manufacturing method thereof
KR101832494B1 (ko) Bga 반도체 패키지 및 그 제조 방법
US8836102B2 (en) Multilayered semiconductor device, printed circuit board, and method of manufacturing multilayered semiconductor device
KR100271676B1 (ko) 반도체장치용패키지및반도체장치와그들의제조방법
US9935030B2 (en) Resin-encapsulated semiconductor device
TWI390684B (zh) 半導體封裝及其製造方法
KR20170124769A (ko) 전자 소자 모듈 및 그 제조 방법
CN101958292B (zh) 印刷电路板、封装件及其制造方法
KR100831481B1 (ko) 반도체 장치와 그것을 이용한 반도체 패키지 및 회로 장치
KR100456482B1 (ko) 패터닝된 리드 프레임을 이용한 볼 그리드 어레이 패키지
JP2001127196A (ja) ターミナルランドフレーム及びその製造方法、並びに樹脂封止型半導体装置及びその製造方法
KR101185854B1 (ko) 반도체 패키지
JP2001127195A (ja) ターミナルランドフレーム及びその製造方法、並びに樹脂封止型半導体装置及びその製造方法
TWI474413B (zh) 晶片封裝結構的製程
US7750450B2 (en) Stacked die package with stud spacers
JP2006173376A (ja) 半導体装置及び半導体装置の製造方法
KR20040048451A (ko) 반도체 패키지 제조 방법

Legal Events

Date Code Title Description
PA0109 Patent application

St.27 status event code: A-0-1-A10-A12-nap-PA0109

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

PN2301 Change of applicant

St.27 status event code: A-3-3-R10-R13-asn-PN2301

St.27 status event code: A-3-3-R10-R11-asn-PN2301

N231 Notification of change of applicant
PN2301 Change of applicant

St.27 status event code: A-3-3-R10-R13-asn-PN2301

St.27 status event code: A-3-3-R10-R11-asn-PN2301

A201 Request for examination
PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

D13-X000 Search requested

St.27 status event code: A-1-2-D10-D13-srh-X000

D14-X000 Search report completed

St.27 status event code: A-1-2-D10-D14-srh-X000

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

E13-X000 Pre-grant limitation requested

St.27 status event code: A-2-3-E10-E13-lim-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U11-oth-PR1002

Fee payment year number: 1

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

PN2301 Change of applicant

St.27 status event code: A-5-5-R10-R13-asn-PN2301

St.27 status event code: A-5-5-R10-R11-asn-PN2301

PN2301 Change of applicant

St.27 status event code: A-5-5-R10-R13-asn-PN2301

St.27 status event code: A-5-5-R10-R11-asn-PN2301

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

PR1001 Payment of annual fee

St.27 status event code: A-4-4-U10-U11-oth-PR1001

Fee payment year number: 4

PC1903 Unpaid annual fee

St.27 status event code: A-4-4-U10-U13-oth-PC1903

Not in force date: 20220221

Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

PC1903 Unpaid annual fee

St.27 status event code: N-4-6-H10-H13-oth-PC1903

Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

Not in force date: 20220221

R18-X000 Changes to party contact information recorded

St.27 status event code: A-5-5-R10-R18-oth-X000

P22-X000 Classification modified

St.27 status event code: A-4-4-P10-P22-nap-X000