KR101740581B1 - 배터리에 대한 전류 감지 회로에서 증폭기들에 대한 보상 기술 - Google Patents

배터리에 대한 전류 감지 회로에서 증폭기들에 대한 보상 기술 Download PDF

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KR101740581B1
KR101740581B1 KR1020167021298A KR20167021298A KR101740581B1 KR 101740581 B1 KR101740581 B1 KR 101740581B1 KR 1020167021298 A KR1020167021298 A KR 1020167021298A KR 20167021298 A KR20167021298 A KR 20167021298A KR 101740581 B1 KR101740581 B1 KR 101740581B1
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South Korea
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amplifier
offset error
phase
during
output
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Korean (ko)
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KR20160098518A (ko
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아루릇다 바사르
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퀄컴 인코포레이티드
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • G01R31/374—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC] with means for correcting the measurement for temperature or ageing
    • G01R31/3624—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • G01R31/382—Arrangements for monitoring battery or accumulator variables, e.g. SoC
    • G01R31/3842—Arrangements for monitoring battery or accumulator variables, e.g. SoC combining voltage and current measurements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0046—Arrangements for measuring currents or voltages or for indicating presence or sign thereof characterised by a specific application or detail not covered by any other subgroup of G01R19/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/32—Compensating for temperature change
    • G01R31/3655—
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M10/00—Secondary cells; Manufacture thereof
    • H01M10/42—Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
    • H01M10/48—Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
    • H03F3/45179—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using MOSFET transistors as the active amplifying circuit
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
    • H03F3/45475—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using IC blocks as the active amplifying circuit
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/45—Indexing scheme relating to differential amplifiers
    • H03F2203/45048—Calibrating and standardising a dif amp
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/45—Indexing scheme relating to differential amplifiers
    • H03F2203/45138—Two or more differential amplifiers in IC-block form are combined, e.g. measuring amplifiers
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10—Energy storage using batteries

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  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Amplifiers (AREA)
  • Measurement Of Current Or Voltage (AREA)
KR1020167021298A 2014-01-07 2015-01-07 배터리에 대한 전류 감지 회로에서 증폭기들에 대한 보상 기술 Active KR101740581B1 (ko)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14/149,739 US9217780B2 (en) 2014-01-07 2014-01-07 Compensation technique for amplifiers in a current sensing circuit for a battery
US14/149,739 2014-01-07
PCT/US2015/010529 WO2015105915A1 (en) 2014-01-07 2015-01-07 Compensation technique for amplifiers in a current sensing circuit for a battery

Publications (2)

Publication Number Publication Date
KR20160098518A KR20160098518A (ko) 2016-08-18
KR101740581B1 true KR101740581B1 (ko) 2017-05-26

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Family Applications (1)

Application Number Title Priority Date Filing Date
KR1020167021298A Active KR101740581B1 (ko) 2014-01-07 2015-01-07 배터리에 대한 전류 감지 회로에서 증폭기들에 대한 보상 기술

Country Status (6)

Country Link
US (1) US9217780B2 (enExample)
EP (1) EP3092501B1 (enExample)
JP (1) JP6602766B2 (enExample)
KR (1) KR101740581B1 (enExample)
CN (1) CN105899958B (enExample)
WO (1) WO2015105915A1 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP6338807B1 (ja) * 2017-11-13 2018-06-06 三菱電機株式会社 Ａｂ級アンプおよびオペアンプ
KR102717913B1 (ko) * 2020-07-08 2024-10-18 한국전력공사 축전지 성능 진단장치 및 방법
US11422168B2 (en) 2020-09-16 2022-08-23 Nxp Usa, Inc. On-chip, low-voltage, current sensing circuit
EP4260457A4 (en) * 2021-02-04 2024-11-20 Semiconductor Components Industries, LLC PRECISION OPERATIONAL AMPLIFIER WITH FLOATING INPUT STAGE
EP4170906B1 (en) * 2021-10-20 2024-06-19 STMicroelectronics S.r.l. Current sensing in switched electronic devices
JP2023121617A (ja) * 2022-02-21 2023-08-31 富士電機株式会社 半導体装置

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JP3102020B2 (ja) * 1990-08-15 2000-10-23 日本電気株式会社 演算増幅回路
US5495154A (en) * 1993-04-29 1996-02-27 Sgs-Thomson Microelectronics, Inc. Method and apparatus for Kelvin current sensing in a multi-phase driver for a polyphase DC motor
US5498984A (en) 1994-09-30 1996-03-12 Maxim Integrated Products High side, current sense amplifier using a symmetric amplifier
DE19706946C2 (de) * 1997-02-21 2000-06-21 Daimler Chrysler Ag Battierüberwachungseinheit
JPH10300798A (ja) 1997-04-24 1998-11-13 Sanyo Electric Co Ltd オフセットの自動補正回路を備える電流検出回路
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US6621259B2 (en) 2001-05-30 2003-09-16 Texas Instruments Incorporated Current sense amplifier and method
US6914425B2 (en) * 2003-04-29 2005-07-05 Teradyne, Inc. Measurement circuit with improved accuracy
US7382183B2 (en) * 2006-07-18 2008-06-03 Microchip Technology Incorporated Minimizing switching noise and its effects in auto-zeroed amplifiers
JP2009081749A (ja) * 2007-09-27 2009-04-16 Hitachi Ltd 低オフセット入力回路
US7869769B2 (en) * 2007-11-28 2011-01-11 Motorola, Inc. Method and apparatus for reconfigurable frequency generation
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JP4976323B2 (ja) * 2008-03-06 2012-07-18 株式会社リコー 充電制御回路
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Also Published As

Publication number Publication date
KR20160098518A (ko) 2016-08-18
CN105899958B (zh) 2018-11-23
US9217780B2 (en) 2015-12-22
JP6602766B2 (ja) 2019-11-06
EP3092501B1 (en) 2017-09-13
EP3092501A1 (en) 2016-11-16
WO2015105915A1 (en) 2015-07-16
JP2017503416A (ja) 2017-01-26
US20150192642A1 (en) 2015-07-09
CN105899958A (zh) 2016-08-24

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