CN105899958B - 用于针对电池的电流感测电路中的放大器的补偿技术 - Google Patents

用于针对电池的电流感测电路中的放大器的补偿技术 Download PDF

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Publication number
CN105899958B
CN105899958B CN201580003828.5A CN201580003828A CN105899958B CN 105899958 B CN105899958 B CN 105899958B CN 201580003828 A CN201580003828 A CN 201580003828A CN 105899958 B CN105899958 B CN 105899958B
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CN
China
Prior art keywords
amplifier
offset error
phase
input end
differential input
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Expired - Fee Related
Application number
CN201580003828.5A
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English (en)
Chinese (zh)
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CN105899958A (zh
Inventor
A·巴夏
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Qualcomm Inc
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Qualcomm Inc
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Publication date
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Publication of CN105899958A publication Critical patent/CN105899958A/zh
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Publication of CN105899958B publication Critical patent/CN105899958B/zh
Expired - Fee Related legal-status Critical Current
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • G01R31/374—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC] with means for correcting the measurement for temperature or ageing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/36—Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
    • G01R31/382—Arrangements for monitoring battery or accumulator variables, e.g. SoC
    • G01R31/3842—Arrangements for monitoring battery or accumulator variables, e.g. SoC combining voltage and current measurements
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/0046—Arrangements for measuring currents or voltages or for indicating presence or sign thereof characterised by a specific application or detail not covered by any other subgroup of G01R19/00
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R19/00—Arrangements for measuring currents or voltages or for indicating presence or sign thereof
    • G01R19/32—Compensating for temperature change
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M10/00—Secondary cells; Manufacture thereof
    • H01M10/42—Methods or arrangements for servicing or maintenance of secondary cells or secondary half-cells
    • H01M10/48—Accumulators combined with arrangements for measuring, testing or indicating the condition of cells, e.g. the level or density of the electrolyte
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
    • H03F3/45179—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using MOSFET transistors as the active amplifying circuit
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H03F3/45076—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier
    • H03F3/45475—Differential amplifiers with semiconductor devices only characterised by the way of implementation of the active amplifying circuit in the differential amplifier using IC blocks as the active amplifying circuit
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/45—Indexing scheme relating to differential amplifiers
    • H03F2203/45048—Calibrating and standardising a dif amp
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2203/00—Indexing scheme relating to amplifiers with only discharge tubes or only semiconductor devices as amplifying elements covered by H03F3/00
    • H03F2203/45—Indexing scheme relating to differential amplifiers
    • H03F2203/45138—Two or more differential amplifiers in IC-block form are combined, e.g. measuring amplifiers
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10—Energy storage using batteries

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Amplifiers (AREA)
  • Measurement Of Current Or Voltage (AREA)
CN201580003828.5A 2014-01-07 2015-01-07 用于针对电池的电流感测电路中的放大器的补偿技术 Expired - Fee Related CN105899958B (zh)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14/149,739 US9217780B2 (en) 2014-01-07 2014-01-07 Compensation technique for amplifiers in a current sensing circuit for a battery
US14/149,739 2014-01-07
PCT/US2015/010529 WO2015105915A1 (en) 2014-01-07 2015-01-07 Compensation technique for amplifiers in a current sensing circuit for a battery

Publications (2)

Publication Number Publication Date
CN105899958A CN105899958A (zh) 2016-08-24
CN105899958B true CN105899958B (zh) 2018-11-23

Family

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Family Applications (1)

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CN201580003828.5A Expired - Fee Related CN105899958B (zh) 2014-01-07 2015-01-07 用于针对电池的电流感测电路中的放大器的补偿技术

Country Status (6)

Country Link
US (1) US9217780B2 (enExample)
EP (1) EP3092501B1 (enExample)
JP (1) JP6602766B2 (enExample)
KR (1) KR101740581B1 (enExample)
CN (1) CN105899958B (enExample)
WO (1) WO2015105915A1 (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11095258B2 (en) * 2017-11-13 2021-08-17 Mitsubishi Electric Corporation Class AB amplifier and operational amplifier
KR102717913B1 (ko) * 2020-07-08 2024-10-18 한국전력공사 축전지 성능 진단장치 및 방법
US11422168B2 (en) 2020-09-16 2022-08-23 Nxp Usa, Inc. On-chip, low-voltage, current sensing circuit
EP4260457A4 (en) * 2021-02-04 2024-11-20 Semiconductor Components Industries, LLC PRECISION OPERATIONAL AMPLIFIER WITH FLOATING INPUT STAGE
EP4170906B1 (en) 2021-10-20 2024-06-19 STMicroelectronics S.r.l. Current sensing in switched electronic devices
JP2023121617A (ja) * 2022-02-21 2023-08-31 富士電機株式会社 半導体装置

Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5498984A (en) * 1994-09-30 1996-03-12 Maxim Integrated Products High side, current sense amplifier using a symmetric amplifier
EP0622892B1 (en) * 1993-04-29 1996-11-27 STMicroelectronics, Inc. Method and apparatus for kelvin current sensing in a multi-phase driver for a polyphase dc motor
US5945853A (en) * 1997-04-24 1999-08-31 Sanyo Electric Co., Ltd. Current sensing circuit with automatic offset compensation
US20020180418A1 (en) * 2001-05-30 2002-12-05 Texas Instruments Incorporated Current sense amplifier and method
CN1697979A (zh) * 2003-04-29 2005-11-16 泰拉丁公司 具有改进精度的测量电路
CN102187575A (zh) * 2008-10-15 2011-09-14 Nxp股份有限公司 低压自校准cmos峰值检测器
WO2012117275A2 (en) * 2011-03-01 2012-09-07 Sendyne Corp. Current sensor

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
NL8503394A (nl) * 1985-12-10 1987-07-01 Philips Nv Stroomaftastschakeling voor een vermogenshalfgeleiderinrichting, in het bijzonder geintegreerde intelligente vermogenshalfgeleiderschakelaar voor met name automobieltoepassingen.
JP3102020B2 (ja) * 1990-08-15 2000-10-23 日本電気株式会社 演算増幅回路
DE19706946C2 (de) * 1997-02-21 2000-06-21 Daimler Chrysler Ag Battierüberwachungseinheit
JP2000004129A (ja) * 1998-06-17 2000-01-07 Toshiba Ave Co Ltd Ｃｍｏｓアナログ回路
US7382183B2 (en) * 2006-07-18 2008-06-03 Microchip Technology Incorporated Minimizing switching noise and its effects in auto-zeroed amplifiers
JP2009081749A (ja) * 2007-09-27 2009-04-16 Hitachi Ltd 低オフセット入力回路
US7869769B2 (en) * 2007-11-28 2011-01-11 Motorola, Inc. Method and apparatus for reconfigurable frequency generation
US8476890B2 (en) 2008-02-05 2013-07-02 Qualcomm Incorporated Circuits and methods for controlling a switching regulator based on a derived input current
JP4976323B2 (ja) * 2008-03-06 2012-07-18 株式会社リコー 充電制御回路
DE102008032556B3 (de) * 2008-07-10 2009-09-10 Infineon Technologies Austria Ag Leistungsschalter mit einer Überstromschutzvorrichtung
US8901891B2 (en) * 2009-02-25 2014-12-02 Panasonic Corporation Voltage polarity determination circuit and charge amount measurement circuit
TWI388113B (zh) 2010-02-04 2013-03-01 Richtek Technology Corp 減輕相電流之拍頻振盪的多相交錯式電壓調節器
JP5456940B2 (ja) * 2010-05-21 2014-04-02 フリースケール セミコンダクター インコーポレイテッド 電力スイッチング装置および電流センス確度を向上させるための方法
JP5825260B2 (ja) * 2010-09-15 2015-12-02 ミツミ電機株式会社 差動回路
US8698556B2 (en) 2011-03-30 2014-04-15 Microchip Technology Incorporated Low switching error, small capacitors, auto-zero offset buffer amplifier
KR101896412B1 (ko) 2011-08-01 2018-09-07 페어차일드코리아반도체 주식회사 폴리 실리콘 저항, 이를 포함하는 기준 전압 회로, 및 폴리 실리콘 저항 제조 방법
US8653829B2 (en) * 2011-11-30 2014-02-18 Standard Microsystems Corporation Method and system for high gain auto-zeroing arrangement for electronic circuits
JP5926081B2 (ja) * 2012-03-22 2016-05-25 エスアイアイ・セミコンダクタ株式会社 センサ装置
JP6180752B2 (ja) * 2012-04-27 2017-08-16 エスアイアイ・セミコンダクタ株式会社 センサ装置
US9213351B2 (en) * 2013-11-22 2015-12-15 Analog Devices, Inc. Bi-directional current sensor

Patent Citations (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0622892B1 (en) * 1993-04-29 1996-11-27 STMicroelectronics, Inc. Method and apparatus for kelvin current sensing in a multi-phase driver for a polyphase dc motor
US5498984A (en) * 1994-09-30 1996-03-12 Maxim Integrated Products High side, current sense amplifier using a symmetric amplifier
US5945853A (en) * 1997-04-24 1999-08-31 Sanyo Electric Co., Ltd. Current sensing circuit with automatic offset compensation
US20020180418A1 (en) * 2001-05-30 2002-12-05 Texas Instruments Incorporated Current sense amplifier and method
CN1697979A (zh) * 2003-04-29 2005-11-16 泰拉丁公司 具有改进精度的测量电路
CN102187575A (zh) * 2008-10-15 2011-09-14 Nxp股份有限公司 低压自校准cmos峰值检测器
WO2012117275A2 (en) * 2011-03-01 2012-09-07 Sendyne Corp. Current sensor

Also Published As

Publication number Publication date
US9217780B2 (en) 2015-12-22
JP6602766B2 (ja) 2019-11-06
WO2015105915A1 (en) 2015-07-16
JP2017503416A (ja) 2017-01-26
CN105899958A (zh) 2016-08-24
EP3092501A1 (en) 2016-11-16
US20150192642A1 (en) 2015-07-09
KR101740581B1 (ko) 2017-05-26
KR20160098518A (ko) 2016-08-18
EP3092501B1 (en) 2017-09-13

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Granted publication date: 20181123

Termination date: 20220107