KR101596227B1 - 반도체 장치 - Google Patents

반도체 장치 Download PDF

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Publication number
KR101596227B1
KR101596227B1 KR1020117009827A KR20117009827A KR101596227B1 KR 101596227 B1 KR101596227 B1 KR 101596227B1 KR 1020117009827 A KR1020117009827 A KR 1020117009827A KR 20117009827 A KR20117009827 A KR 20117009827A KR 101596227 B1 KR101596227 B1 KR 101596227B1
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KR
South Korea
Prior art keywords
transistor
terminal
electrically connected
capacitor
film
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Expired - Fee Related
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KR1020117009827A
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English (en)
Korean (ko)
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KR20110084412A (ko
Inventor
다카노리 마츠쟈키
Original Assignee
가부시키가이샤 한도오따이 에네루기 켄큐쇼
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Publication of KR20110084412A publication Critical patent/KR20110084412A/ko
Application granted granted Critical
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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/402—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells with charge regeneration individual to each memory cell, i.e. internal refresh
    • G11C11/4023—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells with charge regeneration individual to each memory cell, i.e. internal refresh using field effect transistors
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B12/00—Dynamic random access memory [DRAM] devices
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B12/00—Dynamic random access memory [DRAM] devices
    • H10B12/01—Manufacture or treatment
    • H10B12/09—Manufacture or treatment with simultaneous manufacture of the peripheral circuit region and memory cells
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10B—ELECTRONIC MEMORY DEVICES
    • H10B99/00—Subject matter not provided for in other groups of this subclass

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  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Manufacturing & Machinery (AREA)
  • Semiconductor Memories (AREA)
  • Thin Film Transistor (AREA)
  • Dram (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Semiconductor Integrated Circuits (AREA)
KR1020117009827A 2008-10-02 2009-09-01 반도체 장치 Expired - Fee Related KR101596227B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JPJP-P-2008-257339 2008-10-02
JP2008257339 2008-10-02

Related Child Applications (1)

Application Number Title Priority Date Filing Date
KR1020147024504A Division KR101596228B1 (ko) 2008-10-02 2009-09-01 반도체 장치

Publications (2)

Publication Number Publication Date
KR20110084412A KR20110084412A (ko) 2011-07-22
KR101596227B1 true KR101596227B1 (ko) 2016-02-22

Family

ID=42073354

Family Applications (2)

Application Number Title Priority Date Filing Date
KR1020117009827A Expired - Fee Related KR101596227B1 (ko) 2008-10-02 2009-09-01 반도체 장치
KR1020147024504A Expired - Fee Related KR101596228B1 (ko) 2008-10-02 2009-09-01 반도체 장치

Family Applications After (1)

Application Number Title Priority Date Filing Date
KR1020147024504A Expired - Fee Related KR101596228B1 (ko) 2008-10-02 2009-09-01 반도체 장치

Country Status (6)

Country Link
US (2) US8199551B2 (enExample)
JP (2) JP5604071B2 (enExample)
KR (2) KR101596227B1 (enExample)
CN (1) CN102171812B (enExample)
TW (1) TWI501383B (enExample)
WO (1) WO2010038581A1 (enExample)

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KR101596227B1 (ko) * 2008-10-02 2016-02-22 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
JP5470054B2 (ja) * 2009-01-22 2014-04-16 株式会社半導体エネルギー研究所 半導体装置
US8928466B2 (en) * 2010-08-04 2015-01-06 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
JP2012059958A (ja) * 2010-09-09 2012-03-22 Rohm Co Ltd 半導体装置およびその製造方法
US8659015B2 (en) * 2011-03-04 2014-02-25 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US8488387B2 (en) * 2011-05-02 2013-07-16 Macronix International Co., Ltd. Thermally assisted dielectric charge trapping flash
WO2014199507A1 (ja) * 2013-06-14 2014-12-18 ルネサスエレクトロニクス株式会社 通信制御装置及び実装基板
US9437752B2 (en) * 2014-03-12 2016-09-06 QuTel, Inc. Compact memory structure including tunneling diode
US9460788B2 (en) * 2014-07-09 2016-10-04 Crossbar, Inc. Non-volatile memory cell utilizing volatile switching two terminal device and a MOS transistor
US10263065B2 (en) * 2015-11-04 2019-04-16 Globalfoundries Inc. Metal resistor forming method using ion implantation
JP6789729B2 (ja) * 2016-08-31 2020-11-25 キヤノン株式会社 半導体装置、液体吐出ヘッド用基板、液体吐出ヘッド、及び液体吐出装置
US10217723B2 (en) 2016-10-07 2019-02-26 Mediatek Inc. Semiconductor package with improved bandwidth
US10685983B2 (en) 2016-11-11 2020-06-16 Semiconductor Energy Laboratory Co., Ltd. Transistor, semiconductor device, and electronic device
JP7090473B2 (ja) 2018-05-24 2022-06-24 ラピスセミコンダクタ株式会社 フラグ保持回路及びフラグ保持方法
JP7079661B2 (ja) 2018-05-24 2022-06-02 ラピスセミコンダクタ株式会社 フラグ保持回路及びフラグ保持方法
JP2025088973A (ja) * 2023-12-01 2025-06-12 東芝テック株式会社 無線タグ通信装置、無線タグ通信システム及びプログラム

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003526148A (ja) 2000-02-28 2003-09-02 マゼラン テクノロジー ピーティーワイ．エルティーディー． 無線周波数識別トランスポンダ

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JP2819520B2 (ja) 1991-05-07 1998-10-30 インターナショナル・ビジネス・マシーンズ・コーポレイション Ｄｒａｍセル
US7071910B1 (en) 1991-10-16 2006-07-04 Semiconductor Energy Laboratory Co., Ltd. Electrooptical device and method of driving and manufacturing the same
US7253440B1 (en) 1991-10-16 2007-08-07 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device having at least first and second thin film transistors
US6759680B1 (en) 1991-10-16 2004-07-06 Semiconductor Energy Laboratory Co., Ltd. Display device having thin film transistors
JP3448248B2 (ja) * 1991-10-16 2003-09-22 株式会社半導体エネルギー研究所 アクティブマトリクス型電気光学表示装置の駆動方法
JP2784615B2 (ja) 1991-10-16 1998-08-06 株式会社半導体エネルギー研究所 電気光学表示装置およびその駆動方法
JPH06310673A (ja) * 1993-04-27 1994-11-04 Toshiba Corp 半導体記憶装置
JP3397516B2 (ja) * 1995-06-08 2003-04-14 三菱電機株式会社 半導体記憶装置及び半導体集積回路装置
US5883829A (en) * 1997-06-27 1999-03-16 Texas Instruments Incorporated Memory cell having negative differential resistance devices
JP3770721B2 (ja) * 1998-01-13 2006-04-26 沖電気工業株式会社 キャパシタ寄生抵抗の測定方法、およびその評価方法
KR100298439B1 (ko) * 1998-06-30 2001-08-07 김영환 비휘발성 강유전체 메모리
DE19854418C2 (de) * 1998-11-25 2002-04-25 Infineon Technologies Ag Halbleiterbauelement mit zumindest einem Kondensator sowie Verfahren zu dessen Herstellung
US7259654B2 (en) 2000-02-28 2007-08-21 Magellan Technology Pty Limited Radio frequency identification transponder
US7248145B2 (en) 2000-02-28 2007-07-24 Magellan Technology Oty Limited Radio frequency identification transponder
JP2002093154A (ja) * 2000-09-11 2002-03-29 Oki Electric Ind Co Ltd 強誘電体メモリ
US6980459B2 (en) * 2002-10-24 2005-12-27 Texas Instruments Incorporated Non-volatile SRAM
US6955967B2 (en) * 2003-06-27 2005-10-18 Freescale Semiconductor, Inc. Non-volatile memory having a reference transistor and method for forming
US7130234B2 (en) * 2003-12-12 2006-10-31 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US7319633B2 (en) * 2003-12-19 2008-01-15 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device
US7082073B2 (en) * 2004-12-03 2006-07-25 Micron Technology, Inc. System and method for reducing power consumption during extended refresh periods of dynamic random access memory devices
KR101219068B1 (ko) * 2005-05-19 2013-01-18 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 이를 이용한 무선 통신 시스템
FR2891653A1 (fr) * 2005-10-05 2007-04-06 St Microelectronics Sa Procede d'ecriture par bloc dans une memoire
US7209384B1 (en) * 2005-12-08 2007-04-24 Juhan Kim Planar capacitor memory cell and its applications
KR101299932B1 (ko) * 2006-03-10 2013-08-27 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
EP1914669B1 (en) * 2006-10-18 2011-04-20 Semiconductor Energy Laboratory Co., Ltd. RFID tag
JP2008123074A (ja) 2006-11-09 2008-05-29 Renesas Technology Corp 半導体集積回路装置
JP5094099B2 (ja) * 2006-12-04 2012-12-12 株式会社半導体エネルギー研究所 半導体装置の作製方法
KR101596227B1 (ko) * 2008-10-02 2016-02-22 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치
JP5470054B2 (ja) * 2009-01-22 2014-04-16 株式会社半導体エネルギー研究所 半導体装置

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2003526148A (ja) 2000-02-28 2003-09-02 マゼラン テクノロジー ピーティーワイ．エルティーディー． 無線周波数識別トランスポンダ

Also Published As

Publication number Publication date
KR20140124811A (ko) 2014-10-27
JP5604071B2 (ja) 2014-10-08
JP2010109340A (ja) 2010-05-13
WO2010038581A1 (en) 2010-04-08
US8199551B2 (en) 2012-06-12
KR20110084412A (ko) 2011-07-22
KR101596228B1 (ko) 2016-02-22
JP5763817B2 (ja) 2015-08-12
TWI501383B (zh) 2015-09-21
US8842459B2 (en) 2014-09-23
CN102171812B (zh) 2014-02-12
TW201030943A (en) 2010-08-16
JP2015015484A (ja) 2015-01-22
US20100085792A1 (en) 2010-04-08
US20120236621A1 (en) 2012-09-20
CN102171812A (zh) 2011-08-31

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