KR101098957B1 - 프로브 조립체 - Google Patents
프로브 조립체 Download PDFInfo
- Publication number
- KR101098957B1 KR101098957B1 KR1020100005834A KR20100005834A KR101098957B1 KR 101098957 B1 KR101098957 B1 KR 101098957B1 KR 1020100005834 A KR1020100005834 A KR 1020100005834A KR 20100005834 A KR20100005834 A KR 20100005834A KR 101098957 B1 KR101098957 B1 KR 101098957B1
- Authority
- KR
- South Korea
- Prior art keywords
- probe
- slit
- region
- support
- bar
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B66—HOISTING; LIFTING; HAULING
- B66B—ELEVATORS; ESCALATORS OR MOVING WALKWAYS
- B66B11/00—Main component parts of lifts in, or associated with, buildings or other structures
- B66B11/02—Cages, i.e. cars
- B66B11/0226—Constructional features, e.g. walls assembly, decorative panels, comfort equipment, thermal or sound insulation
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B66—HOISTING; LIFTING; HAULING
- B66B—ELEVATORS; ESCALATORS OR MOVING WALKWAYS
- B66B3/00—Applications of devices for indicating or signalling operating conditions of elevators
- B66B3/002—Indicators
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B66—HOISTING; LIFTING; HAULING
- B66B—ELEVATORS; ESCALATORS OR MOVING WALKWAYS
- B66B5/00—Applications of checking, fault-correcting, or safety devices in elevators
- B66B5/0006—Monitoring devices or performance analysers
- B66B5/0018—Devices monitoring the operating condition of the elevator system
- B66B5/0031—Devices monitoring the operating condition of the elevator system for safety reasons
-
- E—FIXED CONSTRUCTIONS
- E04—BUILDING
- E04G—SCAFFOLDING; FORMS; SHUTTERING; BUILDING IMPLEMENTS OR AIDS, OR THEIR USE; HANDLING BUILDING MATERIALS ON THE SITE; REPAIRING, BREAKING-UP OR OTHER WORK ON EXISTING BUILDINGS
- E04G21/00—Preparing, conveying, or working-up building materials or building elements in situ; Other devices or measures for constructional work
- E04G21/24—Safety or protective measures preventing damage to building parts or finishing work during construction
- E04G21/30—Safety or protective measures preventing damage to building parts or finishing work during construction against mechanical damage or dirt, e.g. guard covers of stairs
Landscapes
- Engineering & Computer Science (AREA)
- Architecture (AREA)
- Civil Engineering (AREA)
- Mechanical Engineering (AREA)
- Structural Engineering (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Liquid Crystal (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JPJP-P-2009-051665 | 2009-03-05 | ||
| JP2009051665A JP5396104B2 (ja) | 2009-03-05 | 2009-03-05 | プローブ組立体 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20100100596A KR20100100596A (ko) | 2010-09-15 |
| KR101098957B1 true KR101098957B1 (ko) | 2011-12-28 |
Family
ID=42965613
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1020100005834A Expired - Fee Related KR101098957B1 (ko) | 2009-03-05 | 2010-01-22 | 프로브 조립체 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JP5396104B2 (https=) |
| KR (1) | KR101098957B1 (https=) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102565470B (zh) * | 2010-12-03 | 2014-06-04 | 日本麦可罗尼克斯股份有限公司 | 探针组合体 |
| JP5588892B2 (ja) * | 2010-12-03 | 2014-09-10 | 株式会社日本マイクロニクス | プローブ組立体 |
| KR102241059B1 (ko) * | 2020-01-14 | 2021-04-16 | (주)위드멤스 | 프로브 블록 조립체 |
| KR102367175B1 (ko) * | 2022-01-07 | 2022-02-25 | 이시훈 | 프로브 블록 |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR200254022Y1 (ko) | 2001-08-29 | 2001-11-23 | 윤수 | 엘시디 검사용 프로브 카드 |
| KR200415777Y1 (ko) | 2006-02-06 | 2006-05-08 | (주) 마이크로티엔 | 엘시디 검사용 프로브 카드 |
| KR100692179B1 (ko) | 2006-05-01 | 2007-03-12 | 주식회사 코디에스 | 평판디스플레이 검사를 위한 프로브 조립체 |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100545189B1 (ko) * | 2001-11-01 | 2006-01-24 | 주식회사 유림하이테크산업 | 엘시디 검사용 프로브 카드 |
| JP4916763B2 (ja) * | 2006-05-08 | 2012-04-18 | 株式会社日本マイクロニクス | プローブ組立体 |
| JP4909803B2 (ja) * | 2007-05-16 | 2012-04-04 | 株式会社日本マイクロニクス | プローブ組立体及び検査装置 |
-
2009
- 2009-03-05 JP JP2009051665A patent/JP5396104B2/ja not_active Expired - Fee Related
-
2010
- 2010-01-22 KR KR1020100005834A patent/KR101098957B1/ko not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR200254022Y1 (ko) | 2001-08-29 | 2001-11-23 | 윤수 | 엘시디 검사용 프로브 카드 |
| KR200415777Y1 (ko) | 2006-02-06 | 2006-05-08 | (주) 마이크로티엔 | 엘시디 검사용 프로브 카드 |
| KR100692179B1 (ko) | 2006-05-01 | 2007-03-12 | 주식회사 코디에스 | 평판디스플레이 검사를 위한 프로브 조립체 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP2010203994A (ja) | 2010-09-16 |
| KR20100100596A (ko) | 2010-09-15 |
| JP5396104B2 (ja) | 2014-01-22 |
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