JP5396104B2 - プローブ組立体 - Google Patents
プローブ組立体 Download PDFInfo
- Publication number
- JP5396104B2 JP5396104B2 JP2009051665A JP2009051665A JP5396104B2 JP 5396104 B2 JP5396104 B2 JP 5396104B2 JP 2009051665 A JP2009051665 A JP 2009051665A JP 2009051665 A JP2009051665 A JP 2009051665A JP 5396104 B2 JP5396104 B2 JP 5396104B2
- Authority
- JP
- Japan
- Prior art keywords
- probe
- region
- slit
- support
- downward
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Images
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B66—HOISTING; LIFTING; HAULING
- B66B—ELEVATORS; ESCALATORS OR MOVING WALKWAYS
- B66B11/00—Main component parts of lifts in, or associated with, buildings or other structures
- B66B11/02—Cages, i.e. cars
- B66B11/0226—Constructional features, e.g. walls assembly, decorative panels, comfort equipment, thermal or sound insulation
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B66—HOISTING; LIFTING; HAULING
- B66B—ELEVATORS; ESCALATORS OR MOVING WALKWAYS
- B66B3/00—Applications of devices for indicating or signalling operating conditions of elevators
- B66B3/002—Indicators
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B66—HOISTING; LIFTING; HAULING
- B66B—ELEVATORS; ESCALATORS OR MOVING WALKWAYS
- B66B5/00—Applications of checking, fault-correcting, or safety devices in elevators
- B66B5/0006—Monitoring devices or performance analysers
- B66B5/0018—Devices monitoring the operating condition of the elevator system
- B66B5/0031—Devices monitoring the operating condition of the elevator system for safety reasons
-
- E—FIXED CONSTRUCTIONS
- E04—BUILDING
- E04G—SCAFFOLDING; FORMS; SHUTTERING; BUILDING IMPLEMENTS OR AIDS, OR THEIR USE; HANDLING BUILDING MATERIALS ON THE SITE; REPAIRING, BREAKING-UP OR OTHER WORK ON EXISTING BUILDINGS
- E04G21/00—Preparing, conveying, or working-up building materials or building elements in situ; Other devices or measures for constructional work
- E04G21/24—Safety or protective measures preventing damage to building parts or finishing work during construction
- E04G21/30—Safety or protective measures preventing damage to building parts or finishing work during construction against mechanical damage or dirt, e.g. guard covers of stairs
Landscapes
- Engineering & Computer Science (AREA)
- Architecture (AREA)
- Civil Engineering (AREA)
- Mechanical Engineering (AREA)
- Structural Engineering (AREA)
- Measuring Leads Or Probes (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Liquid Crystal (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009051665A JP5396104B2 (ja) | 2009-03-05 | 2009-03-05 | プローブ組立体 |
| KR1020100005834A KR101098957B1 (ko) | 2009-03-05 | 2010-01-22 | 프로브 조립체 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009051665A JP5396104B2 (ja) | 2009-03-05 | 2009-03-05 | プローブ組立体 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JP2010203994A JP2010203994A (ja) | 2010-09-16 |
| JP2010203994A5 JP2010203994A5 (https=) | 2012-03-15 |
| JP5396104B2 true JP5396104B2 (ja) | 2014-01-22 |
Family
ID=42965613
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009051665A Expired - Fee Related JP5396104B2 (ja) | 2009-03-05 | 2009-03-05 | プローブ組立体 |
Country Status (2)
| Country | Link |
|---|---|
| JP (1) | JP5396104B2 (https=) |
| KR (1) | KR101098957B1 (https=) |
Families Citing this family (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102565470B (zh) * | 2010-12-03 | 2014-06-04 | 日本麦可罗尼克斯股份有限公司 | 探针组合体 |
| JP5588892B2 (ja) * | 2010-12-03 | 2014-09-10 | 株式会社日本マイクロニクス | プローブ組立体 |
| KR102241059B1 (ko) * | 2020-01-14 | 2021-04-16 | (주)위드멤스 | 프로브 블록 조립체 |
| KR102367175B1 (ko) * | 2022-01-07 | 2022-02-25 | 이시훈 | 프로브 블록 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR200254022Y1 (ko) | 2001-08-29 | 2001-11-23 | 윤수 | 엘시디 검사용 프로브 카드 |
| KR100545189B1 (ko) * | 2001-11-01 | 2006-01-24 | 주식회사 유림하이테크산업 | 엘시디 검사용 프로브 카드 |
| KR200415777Y1 (ko) | 2006-02-06 | 2006-05-08 | (주) 마이크로티엔 | 엘시디 검사용 프로브 카드 |
| KR100692179B1 (ko) | 2006-05-01 | 2007-03-12 | 주식회사 코디에스 | 평판디스플레이 검사를 위한 프로브 조립체 |
| JP4916763B2 (ja) * | 2006-05-08 | 2012-04-18 | 株式会社日本マイクロニクス | プローブ組立体 |
| JP4909803B2 (ja) * | 2007-05-16 | 2012-04-04 | 株式会社日本マイクロニクス | プローブ組立体及び検査装置 |
-
2009
- 2009-03-05 JP JP2009051665A patent/JP5396104B2/ja not_active Expired - Fee Related
-
2010
- 2010-01-22 KR KR1020100005834A patent/KR101098957B1/ko not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP2010203994A (ja) | 2010-09-16 |
| KR20100100596A (ko) | 2010-09-15 |
| KR101098957B1 (ko) | 2011-12-28 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101523229B (zh) | 电连接装置 | |
| TWI276266B (en) | Electrical connecting apparatus | |
| JP5396104B2 (ja) | プローブ組立体 | |
| TW200909815A (en) | Probe unit and inspection apparatus | |
| CN101430344A (zh) | 探针组合体以及检查装置 | |
| KR100863987B1 (ko) | 프로브 조립체 | |
| KR100966499B1 (ko) | 프로브 조립체 | |
| CN100439925C (zh) | 探针组装体 | |
| JP5947139B2 (ja) | プローブ及び電気的接続装置 | |
| JP2008185570A (ja) | プローブユニット及び検査装置 | |
| JP2010160083A (ja) | プローブ組立体 | |
| TW200405628A (en) | Connector in which contact force can be maintained during a long period | |
| JP5491790B2 (ja) | プローブ装置 | |
| KR100866644B1 (ko) | 프로브 및 프로브 조립체 | |
| WO2006085388A1 (ja) | 電気的接続装置 | |
| CN102565470B (zh) | 探针组合体 | |
| JP5491789B2 (ja) | プローブ装置 | |
| KR102951642B1 (ko) | 프로브 핀 | |
| JP2013148433A (ja) | コンタクトプローブおよびプローブユニット | |
| KR100638106B1 (ko) | 평판형 디스플레이장치 검사용 프로브장치 | |
| KR200455152Y1 (ko) | 메모리 모듈 테스트 소켓용 접촉단자 | |
| KR100872966B1 (ko) | 디스플레이 패널 검사용 프로브 유니트 | |
| JP2006098278A (ja) | プローブ及びプローブ組立体 | |
| KR20070107737A (ko) | 통전 테스트용 프로브 및 이를 사용한 전기적 접속 장치 | |
| JP2011203275A (ja) | プローブおよびプローブ組立体 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20120126 |
|
| A621 | Written request for application examination |
Free format text: JAPANESE INTERMEDIATE CODE: A621 Effective date: 20120126 |
|
| A977 | Report on retrieval |
Free format text: JAPANESE INTERMEDIATE CODE: A971007 Effective date: 20130826 |
|
| A131 | Notification of reasons for refusal |
Free format text: JAPANESE INTERMEDIATE CODE: A131 Effective date: 20130903 |
|
| A521 | Request for written amendment filed |
Free format text: JAPANESE INTERMEDIATE CODE: A523 Effective date: 20130917 |
|
| RD03 | Notification of appointment of power of attorney |
Free format text: JAPANESE INTERMEDIATE CODE: A7423 Effective date: 20130917 |
|
| TRDD | Decision of grant or rejection written | ||
| A01 | Written decision to grant a patent or to grant a registration (utility model) |
Free format text: JAPANESE INTERMEDIATE CODE: A01 Effective date: 20131008 |
|
| A61 | First payment of annual fees (during grant procedure) |
Free format text: JAPANESE INTERMEDIATE CODE: A61 Effective date: 20131021 |
|
| R150 | Certificate of patent or registration of utility model |
Ref document number: 5396104 Country of ref document: JP Free format text: JAPANESE INTERMEDIATE CODE: R150 Free format text: JAPANESE INTERMEDIATE CODE: R150 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| R250 | Receipt of annual fees |
Free format text: JAPANESE INTERMEDIATE CODE: R250 |
|
| LAPS | Cancellation because of no payment of annual fees |