KR100987470B1 - 실리콘 단결정의 제조방법 및 실리콘 단결정과 실리콘웨이퍼 - Google Patents
실리콘 단결정의 제조방법 및 실리콘 단결정과 실리콘웨이퍼 Download PDFInfo
- Publication number
- KR100987470B1 KR100987470B1 KR1020047016852A KR20047016852A KR100987470B1 KR 100987470 B1 KR100987470 B1 KR 100987470B1 KR 1020047016852 A KR1020047016852 A KR 1020047016852A KR 20047016852 A KR20047016852 A KR 20047016852A KR 100987470 B1 KR100987470 B1 KR 100987470B1
- Authority
- KR
- South Korea
- Prior art keywords
- crystal
- silicon
- single crystal
- silicon melt
- seed
- Prior art date
Links
- 239000013078 crystal Substances 0.000 title claims abstract description 562
- 229910052710 silicon Inorganic materials 0.000 title claims abstract description 315
- 239000010703 silicon Substances 0.000 title claims abstract description 315
- XUIMIQQOPSSXEZ-UHFFFAOYSA-N Silicon Chemical compound [Si] XUIMIQQOPSSXEZ-UHFFFAOYSA-N 0.000 title claims abstract description 314
- 238000004519 manufacturing process Methods 0.000 title claims abstract description 58
- 238000000034 method Methods 0.000 claims abstract description 123
- 230000008569 process Effects 0.000 claims abstract description 25
- 230000015572 biosynthetic process Effects 0.000 claims description 17
- 239000000155 melt Substances 0.000 description 49
- 235000012431 wafers Nutrition 0.000 description 31
- 238000002474 experimental method Methods 0.000 description 29
- 238000000151 deposition Methods 0.000 description 17
- 230000035939 shock Effects 0.000 description 16
- 230000008021 deposition Effects 0.000 description 14
- 230000009467 reduction Effects 0.000 description 10
- 239000004065 semiconductor Substances 0.000 description 10
- 238000010438 heat treatment Methods 0.000 description 9
- 229910021420 polycrystalline silicon Inorganic materials 0.000 description 9
- 239000002994 raw material Substances 0.000 description 8
- 206010033307 Overweight Diseases 0.000 description 6
- 239000010453 quartz Substances 0.000 description 6
- VYPSYNLAJGMNEJ-UHFFFAOYSA-N silicon dioxide Inorganic materials O=[Si]=O VYPSYNLAJGMNEJ-UHFFFAOYSA-N 0.000 description 6
- 238000002425 crystallisation Methods 0.000 description 5
- 230000008025 crystallization Effects 0.000 description 5
- 230000000694 effects Effects 0.000 description 5
- 238000012545 processing Methods 0.000 description 5
- XKRFYHLGVUSROY-UHFFFAOYSA-N Argon Chemical compound [Ar] XKRFYHLGVUSROY-UHFFFAOYSA-N 0.000 description 4
- OKTJSMMVPCPJKN-UHFFFAOYSA-N Carbon Chemical compound [C] OKTJSMMVPCPJKN-UHFFFAOYSA-N 0.000 description 4
- 239000007789 gas Substances 0.000 description 4
- 229910002804 graphite Inorganic materials 0.000 description 4
- 239000010439 graphite Substances 0.000 description 4
- 239000011261 inert gas Substances 0.000 description 4
- 230000007246 mechanism Effects 0.000 description 4
- 238000010586 diagram Methods 0.000 description 3
- 239000002019 doping agent Substances 0.000 description 3
- 230000002068 genetic effect Effects 0.000 description 3
- 239000000463 material Substances 0.000 description 3
- 230000008018 melting Effects 0.000 description 3
- 238000002844 melting Methods 0.000 description 3
- 230000005855 radiation Effects 0.000 description 3
- 238000004804 winding Methods 0.000 description 3
- 229910052786 argon Inorganic materials 0.000 description 2
- 230000008859 change Effects 0.000 description 2
- 230000007423 decrease Effects 0.000 description 2
- 238000007654 immersion Methods 0.000 description 2
- 230000006872 improvement Effects 0.000 description 2
- 239000011810 insulating material Substances 0.000 description 2
- 239000007788 liquid Substances 0.000 description 2
- 239000004973 liquid crystal related substance Substances 0.000 description 2
- 238000005259 measurement Methods 0.000 description 2
- 238000005498 polishing Methods 0.000 description 2
- 239000000758 substrate Substances 0.000 description 2
- 230000001629 suppression Effects 0.000 description 2
- HIVGXUNKSAJJDN-UHFFFAOYSA-N [Si].[P] Chemical compound [Si].[P] HIVGXUNKSAJJDN-UHFFFAOYSA-N 0.000 description 1
- 230000002159 abnormal effect Effects 0.000 description 1
- 239000000969 carrier Substances 0.000 description 1
- 238000007796 conventional method Methods 0.000 description 1
- 238000005520 cutting process Methods 0.000 description 1
- 230000003247 decreasing effect Effects 0.000 description 1
- 230000008034 disappearance Effects 0.000 description 1
- 230000004064 dysfunction Effects 0.000 description 1
- 238000005516 engineering process Methods 0.000 description 1
- 238000007429 general method Methods 0.000 description 1
- 239000011521 glass Substances 0.000 description 1
- 238000003754 machining Methods 0.000 description 1
- 238000010899 nucleation Methods 0.000 description 1
- 230000003647 oxidation Effects 0.000 description 1
- 238000007254 oxidation reaction Methods 0.000 description 1
- 229920001296 polysiloxane Polymers 0.000 description 1
- 230000000630 rising effect Effects 0.000 description 1
- 150000003376 silicon Chemical class 0.000 description 1
- 238000007711 solidification Methods 0.000 description 1
- 230000008023 solidification Effects 0.000 description 1
- 230000000087 stabilizing effect Effects 0.000 description 1
- 230000000007 visual effect Effects 0.000 description 1
Images
Classifications
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B29/00—Single crystals or homogeneous polycrystalline material with defined structure characterised by the material or by their shape
- C30B29/02—Elements
- C30B29/06—Silicon
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/20—Controlling or regulating
- C30B15/22—Stabilisation or shape controlling of the molten zone near the pulled crystal; Controlling the section of the crystal
-
- C—CHEMISTRY; METALLURGY
- C30—CRYSTAL GROWTH
- C30B—SINGLE-CRYSTAL GROWTH; UNIDIRECTIONAL SOLIDIFICATION OF EUTECTIC MATERIAL OR UNIDIRECTIONAL DEMIXING OF EUTECTOID MATERIAL; REFINING BY ZONE-MELTING OF MATERIAL; PRODUCTION OF A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; SINGLE CRYSTALS OR HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; AFTER-TREATMENT OF SINGLE CRYSTALS OR A HOMOGENEOUS POLYCRYSTALLINE MATERIAL WITH DEFINED STRUCTURE; APPARATUS THEREFOR
- C30B15/00—Single-crystal growth by pulling from a melt, e.g. Czochralski method
- C30B15/36—Single-crystal growth by pulling from a melt, e.g. Czochralski method characterised by the seed, e.g. its crystallographic orientation
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10T—TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION
- Y10T117/00—Single-crystal, oriented-crystal, and epitaxy growth processes; non-coating apparatus therefor
- Y10T117/10—Apparatus
- Y10T117/1024—Apparatus for crystallization from liquid or supercritical state
- Y10T117/1032—Seed pulling
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Crystallography & Structural Chemistry (AREA)
- Materials Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- Crystals, And After-Treatments Of Crystals (AREA)
Abstract
Description
인가자장강도(평균자장) | 육성결정직경 | 씨드단면 감소방법 |
씨드 부착 실패수 |
융액온도 변동폭 | 결정인상 성공의 유무 |
|
실험1 | 무인가 | 15cm | 대쉬 네킹법 | 6회 | ±6℃ | × |
실험2 | 무인가 | 20cm | 무전위 씨드 부착법 | 9회 | ±8℃ | × |
실시예1 | 4000G | 20cm | 무전위 씨드 부착법 | 0회 | ±1.5℃ | ○ |
자장인가강도 (수평자장) |
석영 도가니 구경 |
실리콘 멜트의 양 |
융액온도 변동폭 |
유전위화의 상황 | |
실험3 | 500G | 600mm | 150kg | ±10℃ | 유전위 |
실험4 | 750G | 600mm | 150kg | ±5.6℃ | 유전위 |
실험5 | 0G | 600mm | 150kg | ±4.3℃ | 무전위 |
Claims (7)
- 삭제
- 대쉬 네킹법을 행하지 않고 쵸크랄스키법에 의한 실리콘 단결정의 제조방법에 있어서, 선단부의 각도가 28°이하인 선단이 뾰족하거나 또는 뾰족한 선단을 절취한 형상의 종결정을 이용하여, 상기 종결정의 선단부를 실리콘 융액에 접촉시키기 전에 실리콘 융액의 직상에서 멈추어 가온(加溫)하고, 그 후, 상기 종결정의 선단부를 실리콘 융액에 접촉시켜서, 원하는 직경까지 실리콘 융액에 침적하고, 그 후, 인상과정으로 전환하여 단결정의 인상을 행하는 경우에, 적어도 상기 종결정의 선단부를 실리콘 융액에 접촉시켜 인상과정으로 전환할 때까지의 사이는, 실리콘 융액표면의 온도변동을 ±5℃ 이하로 유지하고, 상기 종결정의 선단부를 실리콘 융액에 접촉시킬 때의 실리콘 융액의 온도를, 대쉬 네킹법을 이용한 실리콘 단결정의 제조방법으로 종결정을 실리콘 융액에 접촉하기에 적합한 온도로 되는 온도보다도, 10~20℃ 높은 실리콘 융액온도로 하여 종결정을 실리콘 융액에 접촉시켜 침적을 행하고, 적어도 상기 종결정의 강하(降下)를 멈추어 인상과정으로 전환한 직후부터, 종결정 아래쪽에 형성되는 결정직경의 확대가 개시되는 사이의 감경부의 형성에서는, 인상속도를 0.5mm/min 이하로 하여, 단결정을 인상하는 것을 특징으로 하는 실리콘 단결정의 제조방법.
- 제 2 항에 있어서, 적어도 상기 종결정의 선단부를 실리콘 융액에 접촉하는 시점부터, 종결정 아래쪽에 형성되는 감경부의 형성이 종료하여 결정직경의 확대가 시작될 때까지의 사이는, 중심자장강도가 1000G 이상으로 되는 수평자장을 실리콘 융액에 인가하여, 단결정을 인상하는 것을 특징으로 하는 실리콘 단결정의 제조방법.
- 제 2 항 또는 제 3 항에 있어서, 결정방위가 <110>인 상기 종결정을 이용하여, 결정방위가 <110>인 실리콘 단결정을 인상하는 것을 특징으로 하는 실리콘 단결정의 제조방법.
- 삭제
- 삭제
- 삭제
Applications Claiming Priority (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002122250 | 2002-04-24 | ||
JPJP-P-2002-00122250 | 2002-04-24 | ||
PCT/JP2003/005167 WO2003091483A1 (fr) | 2002-04-24 | 2003-04-23 | Procede de production de silicium monocristallin, silicium monocristallin et plaquette de silicium |
Publications (2)
Publication Number | Publication Date |
---|---|
KR20040104569A KR20040104569A (ko) | 2004-12-10 |
KR100987470B1 true KR100987470B1 (ko) | 2010-10-13 |
Family
ID=29267437
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
KR1020047016852A KR100987470B1 (ko) | 2002-04-24 | 2003-04-23 | 실리콘 단결정의 제조방법 및 실리콘 단결정과 실리콘웨이퍼 |
Country Status (7)
Country | Link |
---|---|
US (2) | US7179330B2 (ko) |
EP (1) | EP1498517B1 (ko) |
JP (1) | JP4151580B2 (ko) |
KR (1) | KR100987470B1 (ko) |
CN (1) | CN1323196C (ko) |
TW (1) | TW200305664A (ko) |
WO (1) | WO2003091483A1 (ko) |
Families Citing this family (20)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN100585031C (zh) * | 2006-12-06 | 2010-01-27 | 天津市环欧半导体材料技术有限公司 | <110>无位错硅单晶的制造方法 |
JP4946590B2 (ja) * | 2007-04-19 | 2012-06-06 | 株式会社Sumco | シリコン単結晶の育成方法、評価方法および生産方法 |
JP5083001B2 (ja) * | 2008-04-08 | 2012-11-28 | 株式会社Sumco | シリコン単結晶の引上げ方法 |
JP4862884B2 (ja) * | 2008-05-21 | 2012-01-25 | 信越半導体株式会社 | シリコン単結晶の製造方法 |
JP5229017B2 (ja) * | 2009-03-11 | 2013-07-03 | 信越半導体株式会社 | 単結晶の製造方法 |
WO2011010394A1 (ja) * | 2009-07-21 | 2011-01-27 | トヨタ自動車株式会社 | 溶液法による単結晶成長用種結晶軸 |
JP5482547B2 (ja) * | 2010-07-30 | 2014-05-07 | 信越半導体株式会社 | シリコン単結晶の製造方法 |
CN102134739A (zh) * | 2011-03-08 | 2011-07-27 | 宁夏日晶新能源装备股份有限公司 | 单晶炉自动引晶系统及方法 |
CN102181916B (zh) * | 2011-03-29 | 2013-04-10 | 浙江晨方光电科技有限公司 | 一种提高n型111晶向电阻率均匀性的方法 |
GB2497120A (en) * | 2011-12-01 | 2013-06-05 | Rec Wafer Norway As | Production of mono-crystalline silicon |
JP5660020B2 (ja) | 2011-12-16 | 2015-01-28 | 信越半導体株式会社 | シリコン単結晶の製造方法 |
JP5819185B2 (ja) * | 2011-12-29 | 2015-11-18 | グローバルウェーハズ・ジャパン株式会社 | シリコン単結晶の製造方法 |
US9102035B2 (en) * | 2012-03-12 | 2015-08-11 | MEMC Electronics Materials S.p.A. | Method for machining seed rods for use in a chemical vapor deposition polysilicon reactor |
US20150044467A1 (en) * | 2012-04-23 | 2015-02-12 | Hwajin Jo | Method of growing ingot and ingot |
JP5831436B2 (ja) | 2012-12-11 | 2015-12-09 | 信越半導体株式会社 | シリコン単結晶の製造方法 |
CN103436954A (zh) * | 2013-09-11 | 2013-12-11 | 英利能源(中国)有限公司 | 制单晶硅棒时引晶用的籽晶和单晶硅棒的制作方法 |
DE102017215332A1 (de) * | 2017-09-01 | 2019-03-07 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Einkristall aus Silizium mit <100>-Orientierung, der mit Dotierstoff vom n-Typ dotiert ist, und Verfahren zur Herstellung eines solchen Einkristalls |
CN111139520A (zh) * | 2018-11-05 | 2020-05-12 | 上海新昇半导体科技有限公司 | 一种直拉法引晶方法 |
JP7124938B1 (ja) | 2021-07-29 | 2022-08-24 | 信越半導体株式会社 | シリコン単結晶の製造方法 |
EP4428272A1 (de) | 2023-03-10 | 2024-09-11 | Siltronic AG | Verfahren zum ziehen eines einkristallstabs aus halbleitermaterial und scheibe aus halbleitermaterial |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09165298A (ja) * | 1995-12-13 | 1997-06-24 | Komatsu Electron Metals Co Ltd | シリコン単結晶の引き上げ方法 |
JPH10203898A (ja) * | 1997-01-17 | 1998-08-04 | Shin Etsu Handotai Co Ltd | シリコン単結晶の製造方法および種結晶 |
JP2000203287A (ja) * | 1999-01-13 | 2000-07-25 | Toyota Motor Corp | 動力出力装置およびこれを備えるハイブリッド車 |
US6197108B1 (en) | 1997-05-21 | 2001-03-06 | Shin-Etsu Handotai, Co. Ltd. | Silicon seed crystal, method of manufacturing the same, and method of manufacturing silicon monocrystal through use of the seed crystal |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4002523A (en) * | 1973-09-12 | 1977-01-11 | Texas Instruments Incorporated | Dislocation-free growth of silicon semiconductor crystals with <110> orientation |
JPH01203287A (ja) * | 1988-02-08 | 1989-08-16 | Nec Corp | 単結晶引き上げ方法 |
US4891255A (en) * | 1988-09-29 | 1990-01-02 | The United States Of America As Represented By The United States Department Of Energy | (110) Oriented silicon wafer latch accelerometer and process for forming the same |
JP2601930B2 (ja) * | 1990-03-29 | 1997-04-23 | 信越半導体株式会社 | 単結晶ネツク部直径制御方法及び装置 |
DE4106589C2 (de) * | 1991-03-01 | 1997-04-24 | Wacker Siltronic Halbleitermat | Kontinuierliches Nachchargierverfahren mit flüssigem Silicium beim Tiegelziehen nach Czochralski |
US5487355A (en) * | 1995-03-03 | 1996-01-30 | Motorola, Inc. | Semiconductor crystal growth method |
US5840120A (en) * | 1996-01-22 | 1998-11-24 | Memc Electronic Materials, Inc. | Apparatus for controlling nucleation of oxygen precipitates in silicon crystals |
US6217663B1 (en) * | 1996-06-21 | 2001-04-17 | Kokusai Electric Co., Ltd. | Substrate processing apparatus and substrate processing method |
JPH10101482A (ja) * | 1996-10-01 | 1998-04-21 | Komatsu Electron Metals Co Ltd | 単結晶シリコンの製造装置および製造方法 |
JP3387364B2 (ja) | 1997-05-21 | 2003-03-17 | 信越半導体株式会社 | シリコン種結晶およびその製造方法、並びにこれらの種結晶を用いてシリコン単結晶を製造する方法 |
JP3684769B2 (ja) * | 1997-06-23 | 2005-08-17 | 信越半導体株式会社 | シリコン単結晶の製造方法および保持する方法 |
JP3440802B2 (ja) * | 1998-01-14 | 2003-08-25 | 信越半導体株式会社 | シリコン単結晶の製造方法 |
DE19938340C1 (de) * | 1999-08-13 | 2001-02-15 | Wacker Siltronic Halbleitermat | Verfahren zur Herstellung einer epitaxierten Halbleiterscheibe |
US6869477B2 (en) * | 2000-02-22 | 2005-03-22 | Memc Electronic Materials, Inc. | Controlled neck growth process for single crystal silicon |
US6506251B1 (en) * | 2000-02-25 | 2003-01-14 | Shin-Etsu Handotai Co., Ltd. | Method for producing silicon single crystal |
JP4808832B2 (ja) * | 2000-03-23 | 2011-11-02 | Sumco Techxiv株式会社 | 無欠陥結晶の製造方法 |
DE10052411B4 (de) * | 2000-10-23 | 2008-07-31 | Mitsubishi Materials Silicon Corp. | Wärmebehandlungsverfahren eines Siliciumwafers und der wärmebehandelte Siliciumwafer |
JP3994665B2 (ja) * | 2000-12-28 | 2007-10-24 | 信越半導体株式会社 | シリコン単結晶ウエーハおよびシリコン単結晶の製造方法 |
JP4215249B2 (ja) * | 2003-08-21 | 2009-01-28 | コバレントマテリアル株式会社 | シリコン種結晶およびシリコン単結晶の製造方法 |
-
2003
- 2003-04-23 EP EP03719172.3A patent/EP1498517B1/en not_active Expired - Lifetime
- 2003-04-23 WO PCT/JP2003/005167 patent/WO2003091483A1/ja active Application Filing
- 2003-04-23 CN CNB038089580A patent/CN1323196C/zh not_active Expired - Lifetime
- 2003-04-23 JP JP2003588003A patent/JP4151580B2/ja not_active Expired - Fee Related
- 2003-04-23 US US10/510,695 patent/US7179330B2/en not_active Expired - Lifetime
- 2003-04-23 KR KR1020047016852A patent/KR100987470B1/ko active IP Right Grant
- 2003-04-24 TW TW092109624A patent/TW200305664A/zh not_active IP Right Cessation
-
2007
- 2007-01-04 US US11/620,024 patent/US20070101926A1/en not_active Abandoned
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH09165298A (ja) * | 1995-12-13 | 1997-06-24 | Komatsu Electron Metals Co Ltd | シリコン単結晶の引き上げ方法 |
JPH10203898A (ja) * | 1997-01-17 | 1998-08-04 | Shin Etsu Handotai Co Ltd | シリコン単結晶の製造方法および種結晶 |
US6197108B1 (en) | 1997-05-21 | 2001-03-06 | Shin-Etsu Handotai, Co. Ltd. | Silicon seed crystal, method of manufacturing the same, and method of manufacturing silicon monocrystal through use of the seed crystal |
JP2000203287A (ja) * | 1999-01-13 | 2000-07-25 | Toyota Motor Corp | 動力出力装置およびこれを備えるハイブリッド車 |
Also Published As
Publication number | Publication date |
---|---|
KR20040104569A (ko) | 2004-12-10 |
US20050160966A1 (en) | 2005-07-28 |
EP1498517B1 (en) | 2016-08-31 |
US7179330B2 (en) | 2007-02-20 |
JP4151580B2 (ja) | 2008-09-17 |
EP1498517A1 (en) | 2005-01-19 |
TWI324643B (ko) | 2010-05-11 |
CN1323196C (zh) | 2007-06-27 |
WO2003091483A1 (fr) | 2003-11-06 |
JPWO2003091483A1 (ja) | 2005-09-02 |
CN1646736A (zh) | 2005-07-27 |
EP1498517A4 (en) | 2008-09-17 |
US20070101926A1 (en) | 2007-05-10 |
TW200305664A (en) | 2003-11-01 |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
KR100987470B1 (ko) | 실리콘 단결정의 제조방법 및 실리콘 단결정과 실리콘웨이퍼 | |
JPH1095698A (ja) | チョクラルスキー成長型シリコンの熱履歴を制御する方法 | |
US5474020A (en) | Oxygen precipitation control in czochralski-grown silicon cyrstals | |
JP4142332B2 (ja) | 単結晶シリコンの製造方法、単結晶シリコンウェーハの製造方法、単結晶シリコン製造用種結晶、単結晶シリコンインゴットおよび単結晶シリコンウェーハ | |
JP2012513950A (ja) | シリコン溶融物から多結晶シリコンインゴットを引き上げるための方法及び引上アセンブリ | |
TW202113168A (zh) | 一種矽單晶的生長方法 | |
JP4060106B2 (ja) | 一方向凝固シリコンインゴット及びこの製造方法並びにシリコン板及び太陽電池用基板及びスパッタリング用ターゲット素材 | |
JP3760769B2 (ja) | シリコン単結晶の製造方法 | |
JP3016126B2 (ja) | 単結晶の引き上げ方法 | |
JP4224906B2 (ja) | シリコン単結晶の引上げ方法 | |
US5820672A (en) | OISF control in czochralski-grown crystals | |
KR100714215B1 (ko) | 고품질 실리콘 단결정 잉곳 및 그로부터 제조된 고 품질 실리콘 웨이퍼 | |
US5968260A (en) | Method for fabricating a single-crystal semiconductor | |
JP2004292288A (ja) | シリコン単結晶原料の溶解方法 | |
JP3885245B2 (ja) | 単結晶引上方法 | |
JP4341379B2 (ja) | 単結晶の製造方法 | |
EP4130348A1 (en) | Device and method for producing a monocrystalline silicon rod | |
JPH09249489A (ja) | 種結晶保持具及び該種結晶保持具を用いた単結晶の引き上げ方法 | |
KR101625431B1 (ko) | 쵸크랄스키법을 이용한 실리콘 단결정의 성장 방법 및 실리콘 단결정 잉곳 | |
JPH11130579A (ja) | 化合物半導体単結晶の製造方法及びその製造装置 | |
JPH08333189A (ja) | 結晶引き上げ装置 | |
KR101472354B1 (ko) | 실리콘 단결정의 성장 방법 및 실리콘 단결정 잉곳 | |
JPH11106292A (ja) | 半導体単結晶の製造方法 | |
JP2010248019A (ja) | シリコン単結晶の引き上げ方法 | |
KR20100040043A (ko) | 단결정 잉곳 성장방법 및 이의 전위제어방법 |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
A201 | Request for examination | ||
E902 | Notification of reason for refusal | ||
E701 | Decision to grant or registration of patent right | ||
GRNT | Written decision to grant | ||
FPAY | Annual fee payment |
Payment date: 20130924 Year of fee payment: 4 |
|
FPAY | Annual fee payment |
Payment date: 20141001 Year of fee payment: 5 |
|
FPAY | Annual fee payment |
Payment date: 20150917 Year of fee payment: 6 |
|
FPAY | Annual fee payment |
Payment date: 20160921 Year of fee payment: 7 |
|
FPAY | Annual fee payment |
Payment date: 20170920 Year of fee payment: 8 |
|
FPAY | Annual fee payment |
Payment date: 20180920 Year of fee payment: 9 |
|
FPAY | Annual fee payment |
Payment date: 20190919 Year of fee payment: 10 |