KR100590665B1 - 실란으로 개질된 연마제 입자를 함유하는 cmp 조성물 - Google Patents
실란으로 개질된 연마제 입자를 함유하는 cmp 조성물 Download PDFInfo
- Publication number
- KR100590665B1 KR100590665B1 KR20027000127A KR20027000127A KR100590665B1 KR 100590665 B1 KR100590665 B1 KR 100590665B1 KR 20027000127 A KR20027000127 A KR 20027000127A KR 20027000127 A KR20027000127 A KR 20027000127A KR 100590665 B1 KR100590665 B1 KR 100590665B1
- Authority
- KR
- South Korea
- Prior art keywords
- silane
- alkyl
- chemical mechanical
- group
- polishing composition
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1409—Abrasive particles per se
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1436—Composite particles, e.g. coated particles
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1454—Abrasive powders, suspensions and pastes for polishing
-
- H10P52/403—
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/04—Lapping machines or devices; Accessories designed for working plane surfaces
- B24B37/042—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor
- B24B37/044—Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor characterised by the composition of the lapping agent
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Composite Materials (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Polishing Bodies And Polishing Tools (AREA)
- Pigments, Carbon Blacks, Or Wood Stains (AREA)
- Manufacture Of Macromolecular Shaped Articles (AREA)
- Disintegrating Or Milling (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US14270699P | 1999-07-07 | 1999-07-07 | |
| US60/142,706 | 1999-07-07 | ||
| PCT/US2000/018342 WO2001004226A2 (en) | 1999-07-07 | 2000-07-05 | Cmp composition containing silane modified abrasive particles |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20020026940A KR20020026940A (ko) | 2002-04-12 |
| KR100590665B1 true KR100590665B1 (ko) | 2006-06-19 |
Family
ID=22500954
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR20027000127A Expired - Fee Related KR100590665B1 (ko) | 1999-07-07 | 2000-07-05 | 실란으로 개질된 연마제 입자를 함유하는 cmp 조성물 |
Country Status (14)
| Country | Link |
|---|---|
| US (2) | US6582623B1 (enExample) |
| EP (1) | EP1200532B1 (enExample) |
| JP (2) | JP2003520283A (enExample) |
| KR (1) | KR100590665B1 (enExample) |
| CN (1) | CN1209429C (enExample) |
| AT (1) | ATE338100T1 (enExample) |
| AU (1) | AU5785700A (enExample) |
| CA (1) | CA2378492A1 (enExample) |
| DE (1) | DE60030444T2 (enExample) |
| HK (1) | HK1046151A1 (enExample) |
| IL (1) | IL147039A0 (enExample) |
| MY (1) | MY126717A (enExample) |
| TW (1) | TW538110B (enExample) |
| WO (1) | WO2001004226A2 (enExample) |
Families Citing this family (115)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
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| EP1263906A1 (en) | 2000-02-02 | 2002-12-11 | Rodel Holdings, Inc. | Polishing composition |
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| US6656241B1 (en) * | 2001-06-14 | 2003-12-02 | Ppg Industries Ohio, Inc. | Silica-based slurry |
| US6953389B2 (en) * | 2001-08-09 | 2005-10-11 | Cheil Industries, Inc. | Metal CMP slurry compositions that favor mechanical removal of oxides with reduced susceptibility to micro-scratching |
| TW591089B (en) * | 2001-08-09 | 2004-06-11 | Cheil Ind Inc | Slurry composition for use in chemical mechanical polishing of metal wiring |
| DE60215095T2 (de) | 2001-09-19 | 2007-05-10 | Parker-Hannifin Corp., Cleveland | Motorantrieb und System |
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| US6716771B2 (en) * | 2002-04-09 | 2004-04-06 | Intel Corporation | Method for post-CMP conversion of a hydrophobic surface of a low-k dielectric layer to a hydrophilic surface |
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| US6706398B1 (en) * | 2002-09-13 | 2004-03-16 | Dow Corning Corporation | Organosilicon compounds and blends for treating silica |
| KR100442549B1 (ko) * | 2002-10-16 | 2004-07-30 | 제일모직주식회사 | 연마성능이 우수하고 안정성이 향상된, 금속 연마를 위한cmp용 슬러리 조성물 및 그 제조방법 |
| US6893476B2 (en) | 2002-12-09 | 2005-05-17 | Dupont Air Products Nanomaterials Llc | Composition and associated methods for chemical mechanical planarization having high selectivity for metal removal |
| US7044836B2 (en) | 2003-04-21 | 2006-05-16 | Cabot Microelectronics Corporation | Coated metal oxide particles for CMP |
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| CN101802116B (zh) * | 2007-09-21 | 2014-03-12 | 卡伯特微电子公司 | 利用经氨基硅烷处理的研磨剂颗粒的抛光组合物和方法 |
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| WO2021133876A1 (en) | 2019-12-27 | 2021-07-01 | Saint-Gobain Ceramics & Plastics, Inc. | Abrasive articles and methods of forming same |
| WO2021133888A1 (en) | 2019-12-27 | 2021-07-01 | Saint-Gobain Ceramics & Plastics, Inc. | Abrasive articles and methods of forming same |
| CN119238386A (zh) | 2019-12-27 | 2025-01-03 | 圣戈本陶瓷及塑料股份有限公司 | 磨料制品及其形成方法 |
| KR102589505B1 (ko) * | 2020-03-03 | 2023-10-13 | 삼성에스디아이 주식회사 | 구리 연마용 cmp 슬러리 조성물 및 이를 이용한 구리 막 연마 방법 |
| KR102619857B1 (ko) * | 2020-05-20 | 2023-12-29 | 삼성에스디아이 주식회사 | 텅스텐 연마용 cmp 슬러리 조성물 및 이를 이용한 텅스텐 연마 방법 |
| KR102415203B1 (ko) * | 2020-08-24 | 2022-06-30 | 에스케이씨솔믹스 주식회사 | 연마패드 및 이를 이용한 반도체 소자의 제조방법 |
| KR102577164B1 (ko) * | 2020-12-29 | 2023-09-08 | 에스케이엔펄스 주식회사 | 반도체 공정용 연마 조성물 및 연마 조성물을 적용한 기판의 연마방법 |
| CN112680187A (zh) * | 2021-01-04 | 2021-04-20 | 上海晖研材料科技有限公司 | 一种表面改性的二氧化硅及含其的磨料组合物 |
| KR20220131152A (ko) * | 2021-03-19 | 2022-09-27 | 가부시키가이샤 후지미인코퍼레이티드 | 연마용 조성물, 연마 방법, 및 반도체 기판의 제조 방법 |
| KR20230055586A (ko) * | 2021-10-19 | 2023-04-26 | 에스케이하이닉스 주식회사 | 보론 실리콘 화합물 연마용 cmp 슬러리 조성물과 이를 이용한 cmp 방법 및 반도체 소자의 제조 방법 |
| KR102765056B1 (ko) * | 2021-10-21 | 2025-02-06 | 한남대학교 산학협력단 | 화학-기계적 연마 슬러리용 무기산화물 입자의 산화제 기능화를 위한 실란 링커의 제조방법 |
| US12496686B2 (en) | 2021-12-30 | 2025-12-16 | Saint-Gobain Abrasives, Inc. | Abrasive articles and methods of forming same |
| EP4457055A4 (en) | 2021-12-30 | 2025-12-24 | Saint Gobain Abrasives Inc | ABRASIVE ARTICLES AND THEIR FORMATION PROCESSES |
| MX2024007593A (es) | 2021-12-30 | 2024-08-20 | Saint Gobain Abrasives Inc | Artículos abrasivos y métodos de formación de los mismos. |
| KR20230106938A (ko) * | 2022-01-07 | 2023-07-14 | 삼성에스디아이 주식회사 | 텅스텐 패턴 웨이퍼 연마용 cmp 슬러리 조성물 및 이를 이용한 텅스텐 패턴 웨이퍼의 연마 방법 |
| WO2025111218A1 (en) | 2023-11-20 | 2025-05-30 | Versum Materials Us, Llc | Cmp formulations and methods for polishing polysilicon films |
| WO2025231281A1 (en) | 2024-05-03 | 2025-11-06 | Versum Materials Us, Llc | Cmp formulations and methods for polishing ruthenium films |
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| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4563483A (en) | 1983-07-06 | 1986-01-07 | Creative Products Resource Ltd. | Concrete cleaning composition |
| US5226930A (en) * | 1988-06-03 | 1993-07-13 | Monsanto Japan, Ltd. | Method for preventing agglomeration of colloidal silica and silicon wafer polishing composition using the same |
| JP3303544B2 (ja) | 1994-07-27 | 2002-07-22 | ソニー株式会社 | 半導体装置の製造方法および配線層表面研磨用のスラリーおよび配線層表面研磨用のスラリーの製造方法 |
| US5645736A (en) | 1995-12-29 | 1997-07-08 | Symbios Logic Inc. | Method for polishing a wafer |
| JP3927270B2 (ja) * | 1996-12-27 | 2007-06-06 | 富士通株式会社 | 研磨剤、研磨方法および半導体装置の製造方法 |
| US6299659B1 (en) * | 1998-08-05 | 2001-10-09 | Showa Denko K.K. | Polishing material composition and polishing method for polishing LSI devices |
| US6372648B1 (en) | 1998-11-16 | 2002-04-16 | Texas Instruments Incorporated | Integrated circuit planarization method |
| KR100590665B1 (ko) * | 1999-07-07 | 2006-06-19 | 캐보트 마이크로일렉트로닉스 코포레이션 | 실란으로 개질된 연마제 입자를 함유하는 cmp 조성물 |
-
2000
- 2000-07-05 KR KR20027000127A patent/KR100590665B1/ko not_active Expired - Fee Related
- 2000-07-05 IL IL14703900A patent/IL147039A0/xx unknown
- 2000-07-05 EP EP00943380A patent/EP1200532B1/en not_active Expired - Lifetime
- 2000-07-05 US US09/609,884 patent/US6582623B1/en not_active Expired - Lifetime
- 2000-07-05 HK HK02107771.8A patent/HK1046151A1/zh unknown
- 2000-07-05 JP JP2001509432A patent/JP2003520283A/ja not_active Withdrawn
- 2000-07-05 CA CA002378492A patent/CA2378492A1/en not_active Abandoned
- 2000-07-05 AT AT00943380T patent/ATE338100T1/de not_active IP Right Cessation
- 2000-07-05 DE DE60030444T patent/DE60030444T2/de not_active Expired - Lifetime
- 2000-07-05 AU AU57857/00A patent/AU5785700A/en not_active Abandoned
- 2000-07-05 WO PCT/US2000/018342 patent/WO2001004226A2/en not_active Ceased
- 2000-07-05 CN CNB008092818A patent/CN1209429C/zh not_active Expired - Lifetime
- 2000-07-07 TW TW089113522A patent/TW538110B/zh not_active IP Right Cessation
- 2000-07-07 MY MYPI20003110 patent/MY126717A/en unknown
-
2003
- 2003-06-06 US US10/456,858 patent/US20030209522A1/en not_active Abandoned
-
2006
- 2006-11-13 JP JP2006306726A patent/JP2007088499A/ja not_active Withdrawn
Also Published As
| Publication number | Publication date |
|---|---|
| TW538110B (en) | 2003-06-21 |
| HK1046151A1 (zh) | 2002-12-27 |
| DE60030444T2 (de) | 2006-12-14 |
| EP1200532A1 (en) | 2002-05-02 |
| DE60030444D1 (de) | 2006-10-12 |
| ATE338100T1 (de) | 2006-09-15 |
| CN1367809A (zh) | 2002-09-04 |
| WO2001004226A3 (en) | 2002-10-03 |
| KR20020026940A (ko) | 2002-04-12 |
| EP1200532B1 (en) | 2006-08-30 |
| IL147039A0 (en) | 2002-08-14 |
| JP2003520283A (ja) | 2003-07-02 |
| MY126717A (en) | 2006-10-31 |
| US20030209522A1 (en) | 2003-11-13 |
| JP2007088499A (ja) | 2007-04-05 |
| AU5785700A (en) | 2001-01-30 |
| US6582623B1 (en) | 2003-06-24 |
| CA2378492A1 (en) | 2001-01-18 |
| CN1209429C (zh) | 2005-07-06 |
| WO2001004226A2 (en) | 2001-01-18 |
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