KR100383205B1 - 차지 펌프 회로를 구비한 반도체 디바이스 - Google Patents
차지 펌프 회로를 구비한 반도체 디바이스 Download PDFInfo
- Publication number
- KR100383205B1 KR100383205B1 KR10-2000-0013555A KR20000013555A KR100383205B1 KR 100383205 B1 KR100383205 B1 KR 100383205B1 KR 20000013555 A KR20000013555 A KR 20000013555A KR 100383205 B1 KR100383205 B1 KR 100383205B1
- Authority
- KR
- South Korea
- Prior art keywords
- charge pump
- circuit
- pump circuit
- capacitor
- voltage
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C5/00—Details of stores covered by group G11C11/00
- G11C5/14—Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
- G11C5/145—Applications of charge pumps; Boosted voltage circuits; Clamp circuits therefor
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C16/00—Erasable programmable read-only memories
- G11C16/02—Erasable programmable read-only memories electrically programmable
- G11C16/06—Auxiliary circuits, e.g. for writing into memory
- G11C16/30—Power supply circuits
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Dc-Dc Converters (AREA)
- Dram (AREA)
- Read Only Memory (AREA)
- Static Random-Access Memory (AREA)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP1999-073491 | 1999-03-18 | ||
| JP7349199A JP3713401B2 (ja) | 1999-03-18 | 1999-03-18 | チャージポンプ回路 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20010029599A KR20010029599A (ko) | 2001-04-06 |
| KR100383205B1 true KR100383205B1 (ko) | 2003-05-12 |
Family
ID=13519805
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR10-2000-0013555A Expired - Fee Related KR100383205B1 (ko) | 1999-03-18 | 2000-03-17 | 차지 펌프 회로를 구비한 반도체 디바이스 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US6373325B1 (enExample) |
| JP (1) | JP3713401B2 (enExample) |
| KR (1) | KR100383205B1 (enExample) |
| TW (1) | TW451490B (enExample) |
Families Citing this family (42)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4149637B2 (ja) * | 2000-05-25 | 2008-09-10 | 株式会社東芝 | 半導体装置 |
| JP2002208290A (ja) * | 2001-01-09 | 2002-07-26 | Mitsubishi Electric Corp | チャージポンプ回路およびこれを用いた不揮発性メモリの動作方法 |
| JP4627920B2 (ja) * | 2001-04-24 | 2011-02-09 | Okiセミコンダクタ株式会社 | 電源装置 |
| US6515902B1 (en) * | 2001-06-04 | 2003-02-04 | Advanced Micro Devices, Inc. | Method and apparatus for boosting bitlines for low VCC read |
| US7180322B1 (en) | 2002-04-16 | 2007-02-20 | Transmeta Corporation | Closed loop feedback control of integrated circuits |
| US7941675B2 (en) * | 2002-12-31 | 2011-05-10 | Burr James B | Adaptive power control |
| JP3873838B2 (ja) * | 2002-07-25 | 2007-01-31 | ソニー株式会社 | 電池電圧動作回路 |
| US7953990B2 (en) | 2002-12-31 | 2011-05-31 | Stewart Thomas E | Adaptive power control based on post package characterization of integrated circuits |
| US7228242B2 (en) | 2002-12-31 | 2007-06-05 | Transmeta Corporation | Adaptive power control based on pre package characterization of integrated circuits |
| US6965264B1 (en) * | 2003-06-30 | 2005-11-15 | National Semiconductor Corporation | Adaptive threshold scaling circuit |
| KR100498505B1 (ko) * | 2003-07-15 | 2005-07-01 | 삼성전자주식회사 | 승압전압 발생회로 및 승압전압 발생방법 |
| JP2005151468A (ja) | 2003-11-19 | 2005-06-09 | Sanyo Electric Co Ltd | アンプ |
| US7692477B1 (en) | 2003-12-23 | 2010-04-06 | Tien-Min Chen | Precise control component for a substrate potential regulation circuit |
| US7649402B1 (en) * | 2003-12-23 | 2010-01-19 | Tien-Min Chen | Feedback-controlled body-bias voltage source |
| US7012461B1 (en) | 2003-12-23 | 2006-03-14 | Transmeta Corporation | Stabilization component for a substrate potential regulation circuit |
| US7129771B1 (en) | 2003-12-23 | 2006-10-31 | Transmeta Corporation | Servo loop for well bias voltage source |
| US7562233B1 (en) | 2004-06-22 | 2009-07-14 | Transmeta Corporation | Adaptive control of operating and body bias voltages |
| US7774625B1 (en) | 2004-06-22 | 2010-08-10 | Eric Chien-Li Sheng | Adaptive voltage control by accessing information stored within and specific to a microprocessor |
| KR100680503B1 (ko) * | 2004-11-08 | 2007-02-08 | 주식회사 하이닉스반도체 | 반도체 메모리 장치의 내부전압 발생기 |
| KR100636508B1 (ko) * | 2004-11-11 | 2006-10-18 | 삼성에스디아이 주식회사 | 차지펌프 회로와 이를 이용한 직류 변환장치 |
| KR100805542B1 (ko) * | 2004-12-24 | 2008-02-20 | 삼성에스디아이 주식회사 | 발광 표시장치 및 그의 구동방법 |
| KR100723488B1 (ko) * | 2005-06-16 | 2007-05-31 | 삼성전자주식회사 | 플래쉬 메모리 장치의 프로그램 동작을 위한 고전압 발생회로 및 고전압 발생 방법 |
| KR100703460B1 (ko) * | 2005-11-07 | 2007-04-03 | 삼성에스디아이 주식회사 | Dcdc 변환기 및 그를 이용한 유기발광표시장치 |
| KR100762691B1 (ko) * | 2005-11-07 | 2007-10-01 | 삼성에스디아이 주식회사 | Dcdc 변환기 및 그를 이용한 유기발광표시장치 |
| KR100713995B1 (ko) * | 2005-11-07 | 2007-05-04 | 삼성에스디아이 주식회사 | Dcdc 변환기 및 그를 이용한 유기발광표시장치 |
| KR100762690B1 (ko) * | 2005-11-07 | 2007-10-01 | 삼성에스디아이 주식회사 | 데이터구동회로와 이를 이용한 유기발광표시장치 |
| KR100729353B1 (ko) * | 2005-11-22 | 2007-06-15 | 삼성전자주식회사 | 통합된 레귤레이터/펌프 구조를 갖는 플래시 메모리 장치 |
| JP4692327B2 (ja) * | 2006-02-24 | 2011-06-01 | 株式会社デンソー | 負荷駆動装置 |
| US7348832B2 (en) * | 2006-03-20 | 2008-03-25 | Taiwan Semiconductor Manufacturing Co., Ltd. | Dual-voltage generation system |
| US7626865B2 (en) | 2006-06-13 | 2009-12-01 | Micron Technology, Inc. | Charge pump operation in a non-volatile memory device |
| US8547756B2 (en) | 2010-10-04 | 2013-10-01 | Zeno Semiconductor, Inc. | Semiconductor memory device having an electrically floating body transistor |
| US8130547B2 (en) | 2007-11-29 | 2012-03-06 | Zeno Semiconductor, Inc. | Method of maintaining the state of semiconductor memory having electrically floating body transistor |
| US7839689B2 (en) | 2008-01-31 | 2010-11-23 | Mosaid Technologies Incorporated | Power supplies in flash memory devices and systems |
| JP5011182B2 (ja) * | 2008-03-24 | 2012-08-29 | ルネサスエレクトロニクス株式会社 | チャージポンプ回路 |
| KR100902060B1 (ko) * | 2008-05-08 | 2009-06-15 | 주식회사 하이닉스반도체 | 반도체 메모리 장치의 펌핑 전압 생성 회로 및 방법 |
| JP5535600B2 (ja) | 2009-11-30 | 2014-07-02 | ピーエスフォー ルクスコ エスエイアールエル | 半導体装置 |
| US10340276B2 (en) | 2010-03-02 | 2019-07-02 | Zeno Semiconductor, Inc. | Method of maintaining the state of semiconductor memory having electrically floating body transistor |
| US8648654B1 (en) * | 2012-09-25 | 2014-02-11 | Arm Limited | Integrated circuit and method for generating a layout of such an integrated circuit |
| TWI663820B (zh) | 2013-08-21 | 2019-06-21 | 日商半導體能源研究所股份有限公司 | 電荷泵電路以及具備電荷泵電路的半導體裝置 |
| KR102267237B1 (ko) | 2014-03-07 | 2021-06-18 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 전자 기기 |
| US9312280B2 (en) | 2014-07-25 | 2016-04-12 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| KR102858232B1 (ko) * | 2019-05-28 | 2025-09-10 | 삼성전자주식회사 | 전하 펌프 장치 및 이를 포함하는 이미지 센서 |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57130293A (en) * | 1981-02-05 | 1982-08-12 | Toshiba Corp | Semiconductor boosting circuit |
| JPH01133294A (ja) * | 1987-11-18 | 1989-05-25 | Ricoh Co Ltd | メモリ用昇圧回路装置 |
| JPH04268294A (ja) * | 1991-02-25 | 1992-09-24 | Nec Corp | 昇圧回路 |
| JPH05189970A (ja) * | 1992-01-10 | 1993-07-30 | Hitachi Ltd | 昇圧回路 |
Family Cites Families (8)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0453260A (ja) | 1990-06-20 | 1992-02-20 | Mitsubishi Electric Corp | 半導体装置 |
| US5168174A (en) * | 1991-07-12 | 1992-12-01 | Texas Instruments Incorporated | Negative-voltage charge pump with feedback control |
| US5291446A (en) * | 1992-10-22 | 1994-03-01 | Advanced Micro Devices, Inc. | VPP power supply having a regulator circuit for controlling a regulated positive potential |
| JPH0721790A (ja) * | 1993-07-05 | 1995-01-24 | Mitsubishi Electric Corp | 半導体集積回路 |
| JP3378457B2 (ja) * | 1997-02-26 | 2003-02-17 | 株式会社東芝 | 半導体装置 |
| JPH114575A (ja) * | 1997-06-11 | 1999-01-06 | Nec Corp | 昇圧回路 |
| JPH1146138A (ja) | 1997-07-24 | 1999-02-16 | Sharp Corp | 電流を充放電させる装置 |
| US6002630A (en) * | 1997-11-21 | 1999-12-14 | Macronix International Co., Ltd. | On chip voltage generation for low power integrated circuits |
-
1999
- 1999-03-18 JP JP7349199A patent/JP3713401B2/ja not_active Expired - Fee Related
-
2000
- 2000-02-24 TW TW089103238A patent/TW451490B/zh not_active IP Right Cessation
- 2000-03-13 US US09/523,729 patent/US6373325B1/en not_active Expired - Fee Related
- 2000-03-17 KR KR10-2000-0013555A patent/KR100383205B1/ko not_active Expired - Fee Related
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS57130293A (en) * | 1981-02-05 | 1982-08-12 | Toshiba Corp | Semiconductor boosting circuit |
| JPH01133294A (ja) * | 1987-11-18 | 1989-05-25 | Ricoh Co Ltd | メモリ用昇圧回路装置 |
| JPH04268294A (ja) * | 1991-02-25 | 1992-09-24 | Nec Corp | 昇圧回路 |
| JPH05189970A (ja) * | 1992-01-10 | 1993-07-30 | Hitachi Ltd | 昇圧回路 |
Also Published As
| Publication number | Publication date |
|---|---|
| TW451490B (en) | 2001-08-21 |
| US6373325B1 (en) | 2002-04-16 |
| KR20010029599A (ko) | 2001-04-06 |
| JP3713401B2 (ja) | 2005-11-09 |
| JP2000270541A (ja) | 2000-09-29 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| KR100383205B1 (ko) | 차지 펌프 회로를 구비한 반도체 디바이스 | |
| KR100427739B1 (ko) | 전원 회로 및 그 전원 회로를 구비한 반도체 기억 장치 | |
| US6278316B1 (en) | Pump circuit with reset circuitry | |
| US5594360A (en) | Low current reduced area programming voltage detector for flash memory | |
| KR0127494B1 (ko) | 반도체 기억 장치 | |
| US5495453A (en) | Low power voltage detector circuit including a flash memory cell | |
| JP4094104B2 (ja) | 半導体集積回路装置および記憶装置 | |
| KR100471185B1 (ko) | 내부 공급 전압의 파워-업 기울기를 제어하기 위한 내부전압 변환기 구조 | |
| KR0159448B1 (ko) | 반도체 기억장치 | |
| KR19980071694A (ko) | 승압 회로 및 반도체 기억 장치 | |
| KR0167872B1 (ko) | 반도체장치의 내부전원회로 | |
| JPH0793022B2 (ja) | 半導体メモリ集積回路 | |
| JPH0696593A (ja) | 半導体記憶装置 | |
| JP3207768B2 (ja) | 半導体装置 | |
| JP2001014877A (ja) | 電圧発生回路およびそれを備えた半導体記憶装置 | |
| KR100274590B1 (ko) | 낮은전원전압에서안정된독출동작이가능한플래시메모리장치 | |
| JP3935592B2 (ja) | 内部電位発生回路 | |
| US6781439B2 (en) | Memory device pump circuit with two booster circuits | |
| JP3869690B2 (ja) | 内部電圧レベル制御回路および半導体記憶装置並びにそれらの制御方法 | |
| US5696461A (en) | Power-on reset circuit | |
| JP2001160295A (ja) | 半導体集積回路 | |
| JP4435203B2 (ja) | 半導体集積回路装置 | |
| JP4895867B2 (ja) | 内部電圧発生回路 | |
| JP2916364B2 (ja) | 半導体装置の内部電源回路 | |
| JP3600396B2 (ja) | 半導体記憶装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| A201 | Request for examination | ||
| PA0109 | Patent application |
St.27 status event code: A-0-1-A10-A12-nap-PA0109 |
|
| PA0201 | Request for examination |
St.27 status event code: A-1-2-D10-D11-exm-PA0201 |
|
| PG1501 | Laying open of application |
St.27 status event code: A-1-1-Q10-Q12-nap-PG1501 |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-3-3-R10-R18-oth-X000 |
|
| D13-X000 | Search requested |
St.27 status event code: A-1-2-D10-D13-srh-X000 |
|
| D14-X000 | Search report completed |
St.27 status event code: A-1-2-D10-D14-srh-X000 |
|
| E902 | Notification of reason for refusal | ||
| PE0902 | Notice of grounds for rejection |
St.27 status event code: A-1-2-D10-D21-exm-PE0902 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| T11-X000 | Administrative time limit extension requested |
St.27 status event code: U-3-3-T10-T11-oth-X000 |
|
| P11-X000 | Amendment of application requested |
St.27 status event code: A-2-2-P10-P11-nap-X000 |
|
| P13-X000 | Application amended |
St.27 status event code: A-2-2-P10-P13-nap-X000 |
|
| E701 | Decision to grant or registration of patent right | ||
| PE0701 | Decision of registration |
St.27 status event code: A-1-2-D10-D22-exm-PE0701 |
|
| GRNT | Written decision to grant | ||
| PR0701 | Registration of establishment |
St.27 status event code: A-2-4-F10-F11-exm-PR0701 |
|
| PR1002 | Payment of registration fee |
St.27 status event code: A-2-2-U10-U11-oth-PR1002 Fee payment year number: 1 |
|
| PG1601 | Publication of registration |
St.27 status event code: A-4-4-Q10-Q13-nap-PG1601 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 4 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 5 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 6 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 7 |
|
| R17-X000 | Change to representative recorded |
St.27 status event code: A-5-5-R10-R17-oth-X000 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 8 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 9 |
|
| FPAY | Annual fee payment |
Payment date: 20120418 Year of fee payment: 10 |
|
| PR1001 | Payment of annual fee |
St.27 status event code: A-4-4-U10-U11-oth-PR1001 Fee payment year number: 10 |
|
| LAPS | Lapse due to unpaid annual fee | ||
| PC1903 | Unpaid annual fee |
St.27 status event code: A-4-4-U10-U13-oth-PC1903 Not in force date: 20130425 Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE |
|
| PC1903 | Unpaid annual fee |
St.27 status event code: N-4-6-H10-H13-oth-PC1903 Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE Not in force date: 20130425 |
|
| R18 | Changes to party contact information recorded |
Free format text: ST27 STATUS EVENT CODE: A-5-5-R10-R18-OTH-X000 (AS PROVIDED BY THE NATIONAL OFFICE) |
|
| R18-X000 | Changes to party contact information recorded |
St.27 status event code: A-5-5-R10-R18-oth-X000 |