KR100302174B1 - 완전폐쇄자속동작의비휘발성자기저항메모리 - Google Patents

완전폐쇄자속동작의비휘발성자기저항메모리 Download PDF

Info

Publication number
KR100302174B1
KR100302174B1 KR1019970705516A KR19970705516A KR100302174B1 KR 100302174 B1 KR100302174 B1 KR 100302174B1 KR 1019970705516 A KR1019970705516 A KR 1019970705516A KR 19970705516 A KR19970705516 A KR 19970705516A KR 100302174 B1 KR100302174 B1 KR 100302174B1
Authority
KR
South Korea
Prior art keywords
layers
memory
layer
gmr
memory cell
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
KR1019970705516A
Other languages
English (en)
Korean (ko)
Other versions
KR19980702121A (ko
Inventor
제임스 토로크
리차드 스프티저
Original Assignee
스핏져 리챠드
인티그레이티드 메그니토일렉트로닉스
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by 스핏져 리챠드, 인티그레이티드 메그니토일렉트로닉스 filed Critical 스핏져 리챠드
Publication of KR19980702121A publication Critical patent/KR19980702121A/ko
Application granted granted Critical
Publication of KR100302174B1 publication Critical patent/KR100302174B1/ko
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/02Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
    • G11C11/14Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements
    • G11C11/15Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using thin-film elements using multiple magnetic layers
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5607Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using magnetic storage elements

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Semiconductor Memories (AREA)
  • Mram Or Spin Memory Techniques (AREA)
  • Hall/Mr Elements (AREA)
KR1019970705516A 1995-02-13 1996-02-08 완전폐쇄자속동작의비휘발성자기저항메모리 Expired - Fee Related KR100302174B1 (ko)

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US08/388,035 US5587943A (en) 1995-02-13 1995-02-13 Nonvolatile magnetoresistive memory with fully closed flux operation
US8/388,035 1995-02-13
US08/388,035 1995-02-13
PCT/US1996/001653 WO1996025740A1 (en) 1995-02-13 1996-02-08 Nonvolatile magnetoresistive memory with fully closed-flux operation

Publications (2)

Publication Number Publication Date
KR19980702121A KR19980702121A (ko) 1998-07-15
KR100302174B1 true KR100302174B1 (ko) 2001-09-22

Family

ID=23532371

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019970705516A Expired - Fee Related KR100302174B1 (ko) 1995-02-13 1996-02-08 완전폐쇄자속동작의비휘발성자기저항메모리

Country Status (8)

Country Link
US (1) US5587943A (https=)
EP (1) EP0809846B1 (https=)
JP (1) JP4171067B2 (https=)
KR (1) KR100302174B1 (https=)
CA (1) CA2211699C (https=)
DE (1) DE69609165T2 (https=)
TW (1) TW287272B (https=)
WO (1) WO1996025740A1 (https=)

Families Citing this family (133)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6322676B1 (en) 1998-03-25 2001-11-27 University Of Iowa Research Foundation Magnetic composites exhibiting distinct flux properties due to gradient interfaces
US7709115B2 (en) * 1994-08-25 2010-05-04 University Of Iowa Research Foundation Methods for forming magnetically modified electrodes and articles produced thereby
US6949179B2 (en) * 1994-08-25 2005-09-27 University Of Iowa Research Foundation Methods for forming magnetically modified electrodes and articles produced thereby
US6001248A (en) 1994-08-25 1999-12-14 The University Of Iowa Research Foundation Gradient interface magnetic composites and systems therefor
US6355166B1 (en) 1994-08-25 2002-03-12 The University Of Iowa Research Foundation Magnetically enhanced composite materials and methods for making and using the same
US5871625A (en) 1994-08-25 1999-02-16 University Of Iowa Research Foundation Magnetic composites for improved electrolysis
US20050213187A1 (en) * 1994-08-25 2005-09-29 University Of Iowa Research Foundation Methods for forming magnetically modified electrodes and articles produced thereby
US6741494B2 (en) * 1995-04-21 2004-05-25 Mark B. Johnson Magnetoelectronic memory element with inductively coupled write wires
US6169687B1 (en) * 1995-04-21 2001-01-02 Mark B. Johnson High density and speed magneto-electronic memory for use in computing system
JP3207094B2 (ja) * 1995-08-21 2001-09-10 松下電器産業株式会社 磁気抵抗効果素子及びメモリー素子
US5702831A (en) 1995-11-06 1997-12-30 Motorola Ferromagnetic GMR material
JP3767930B2 (ja) * 1995-11-13 2006-04-19 沖電気工業株式会社 情報の記録・再生方法および情報記憶装置
US5929636A (en) * 1996-05-02 1999-07-27 Integrated Magnetoelectronics All-metal giant magnetoresistive solid-state component
US5732016A (en) * 1996-07-02 1998-03-24 Motorola Memory cell structure in a magnetic random access memory and a method for fabricating thereof
US5920500A (en) * 1996-08-23 1999-07-06 Motorola, Inc. Magnetic random access memory having stacked memory cells and fabrication method therefor
DE19639910C2 (de) * 1996-09-27 1998-08-20 Siemens Ag Nichtflüchtiger Analogwertspeicher auf der Basis von GMR-Schichtsystemen
US5699293A (en) * 1996-10-09 1997-12-16 Motorola Method of operating a random access memory device having a plurality of pairs of memory cells as the memory device
EP0875901B1 (en) * 1997-04-28 2006-08-09 Canon Kabushiki Kaisha Magnetic thin-film memory element utilizing GMR effect, and magnetic thin-film memory
US5852574A (en) * 1997-12-24 1998-12-22 Motorola, Inc. High density magnetoresistive random access memory device and operating method thereof
EP0959475A3 (en) * 1998-05-18 2000-11-08 Canon Kabushiki Kaisha Magnetic thin film memory and recording and reproducing method and apparatus using such a memory
US6055179A (en) * 1998-05-19 2000-04-25 Canon Kk Memory device utilizing giant magnetoresistance effect
DE19823826A1 (de) 1998-05-28 1999-12-02 Burkhard Hillebrands MRAM-Speicher sowie Verfahren zum Lesen/Schreiben digitaler Information in einen derartigen Speicher
US5953248A (en) * 1998-07-20 1999-09-14 Motorola, Inc. Low switching field magnetic tunneling junction for high density arrays
US6083764A (en) * 1998-07-20 2000-07-04 Motorola, Inc. Method of fabricating an MTJ with low areal resistance
US5946227A (en) * 1998-07-20 1999-08-31 Motorola, Inc. Magnetoresistive random access memory with shared word and digit lines
US6130814A (en) * 1998-07-28 2000-10-10 International Business Machines Corporation Current-induced magnetic switching device and memory including the same
DE19836567C2 (de) 1998-08-12 2000-12-07 Siemens Ag Speicherzellenanordnung mit Speicherelementen mit magnetoresistivem Effekt und Verfahren zu deren Herstellung
US5982660A (en) * 1998-08-27 1999-11-09 Hewlett-Packard Company Magnetic memory cell with off-axis reference layer orientation for improved response
DE19840823C1 (de) * 1998-09-07 2000-07-13 Siemens Ag Magnetoresistives Element und dessen Verwendung als Speicherelement in einer Speicherzellenanordnung
TW454187B (en) * 1998-09-30 2001-09-11 Siemens Ag Magnetoresistive memory with low current density
WO2000052771A1 (de) * 1999-02-26 2000-09-08 Infineon Technologies Ag Speicherzellenanordnung und verfahren zu deren herstellung
JP4138254B2 (ja) * 1999-02-26 2008-08-27 インフィネオン テクノロジーズ アクチエンゲゼルシャフト 記憶セル構造、およびこれを製造する方法
US6266289B1 (en) 1999-03-09 2001-07-24 Amphora Method of toroid write and read, memory cell and memory device for realizing the same
US6872993B1 (en) 1999-05-25 2005-03-29 Micron Technology, Inc. Thin film memory device having local and external magnetic shielding
US6111783A (en) * 1999-06-16 2000-08-29 Hewlett-Packard Company MRAM device including write circuit for supplying word and bit line current having unequal magnitudes
US6134139A (en) * 1999-07-28 2000-10-17 Hewlett-Packard Magnetic memory structure with improved half-select margin
US6215644B1 (en) 1999-09-09 2001-04-10 Jds Uniphase Inc. High frequency tunable capacitors
US6611405B1 (en) * 1999-09-16 2003-08-26 Kabushiki Kaisha Toshiba Magnetoresistive element and magnetic memory device
US6052302A (en) * 1999-09-27 2000-04-18 Motorola, Inc. Bit-wise conditional write method and system for an MRAM
US6178111B1 (en) 1999-12-07 2001-01-23 Honeywell Inc. Method and apparatus for writing data states to non-volatile storage devices
US6480365B1 (en) * 1999-12-09 2002-11-12 International Business Machines Corporation Spin valve transistor using a magnetic tunnel junction
EP1107329B1 (en) 1999-12-10 2011-07-06 Sharp Kabushiki Kaisha Magnetic tunnel junction device, magnetic memory adopting the same, magnetic memory cell and access method of the same
US6496351B2 (en) 1999-12-15 2002-12-17 Jds Uniphase Inc. MEMS device members having portions that contact a substrate and associated methods of operating
US6229684B1 (en) 1999-12-15 2001-05-08 Jds Uniphase Inc. Variable capacitor and associated fabrication method
US6215707B1 (en) * 2000-04-10 2001-04-10 Motorola Inc. Charge conserving write method and system for an MRAM
CN1437772A (zh) * 2000-06-22 2003-08-20 松下电器产业株式会社 磁阻效应元件与利用此磁阻效应元件的磁阻效应型磁头及磁存储与还原装置
US6594175B2 (en) * 2000-07-11 2003-07-15 Integrated Magnetoelectronics Corp High density giant magnetoresistive memory cell
US6483740B2 (en) * 2000-07-11 2002-11-19 Integrated Magnetoelectronics Corporation All metal giant magnetoresistive memory
US6469927B2 (en) * 2000-07-11 2002-10-22 Integrated Magnetoelectronics Magnetoresistive trimming of GMR circuits
US6396733B1 (en) 2000-07-17 2002-05-28 Micron Technology, Inc. Magneto-resistive memory having sense amplifier with offset control
US6493258B1 (en) 2000-07-18 2002-12-10 Micron Technology, Inc. Magneto-resistive memory array
US6724654B1 (en) * 2000-08-14 2004-04-20 Micron Technology, Inc. Pulsed write techniques for magneto-resistive memories
US6493259B1 (en) 2000-08-14 2002-12-10 Micron Technology, Inc. Pulse write techniques for magneto-resistive memories
US6363007B1 (en) 2000-08-14 2002-03-26 Micron Technology, Inc. Magneto-resistive memory with shared wordline and sense line
US6392922B1 (en) * 2000-08-14 2002-05-21 Micron Technology, Inc. Passivated magneto-resistive bit structure and passivation method therefor
US6579625B1 (en) * 2000-10-24 2003-06-17 Motorola, Inc. Magnetoelectronics element having a magnetic layer formed of multiple sub-element layers
TW544677B (en) * 2000-12-26 2003-08-01 Matsushita Electric Industrial Co Ltd Magneto-resistance memory device
US6413788B1 (en) * 2001-02-28 2002-07-02 Micron Technology, Inc. Keepers for MRAM electrodes
US6653154B2 (en) * 2001-03-15 2003-11-25 Micron Technology, Inc. Method of forming self-aligned, trenchless mangetoresistive random-access memory (MRAM) structure with sidewall containment of MRAM structure
US6738284B2 (en) 2001-03-23 2004-05-18 Integrated Magnetoelectronics Corporation Transpinnor-based sample-and-hold circuit and applications
WO2002078100A1 (en) 2001-03-23 2002-10-03 Integrated Magnetoelectronics Corporation A transpinnor-based switch and applications
US6593833B2 (en) 2001-04-04 2003-07-15 Mcnc Tunable microwave components utilizing ferroelectric and ferromagnetic composite dielectrics and methods for making same
DE10118197C2 (de) * 2001-04-11 2003-04-03 Infineon Technologies Ag Integrierte magnetoresistive Halbleiterspeicheranordnung und Verfahren zum Beschreiben derselben
JP5019681B2 (ja) 2001-04-26 2012-09-05 ルネサスエレクトロニクス株式会社 薄膜磁性体記憶装置
US6744086B2 (en) * 2001-05-15 2004-06-01 Nve Corporation Current switched magnetoresistive memory cell
US6466471B1 (en) * 2001-05-29 2002-10-15 Hewlett-Packard Company Low power MRAM memory array
JP2003007980A (ja) * 2001-06-20 2003-01-10 Sony Corp 磁気特性の変調方法および磁気機能装置
US6510080B1 (en) 2001-08-28 2003-01-21 Micron Technology Inc. Three terminal magnetic random access memory
US6485989B1 (en) 2001-08-30 2002-11-26 Micron Technology, Inc. MRAM sense layer isolation
US6627913B2 (en) 2001-09-10 2003-09-30 Micron Technology, Inc. Insulation of an MRAM device through a self-aligned spacer
US6538917B1 (en) * 2001-09-25 2003-03-25 Hewlett-Packard Development Company, L.P. Read methods for magneto-resistive device having soft reference layer
US6576969B2 (en) * 2001-09-25 2003-06-10 Hewlett-Packard Development Company, L.P. Magneto-resistive device having soft reference layer
US6741496B2 (en) * 2001-09-27 2004-05-25 Intel Corporation Electron spin mechanisms for inducing magnetic-polarization reversal
US6545906B1 (en) 2001-10-16 2003-04-08 Motorola, Inc. Method of writing to scalable magnetoresistance random access memory element
JP2003151262A (ja) * 2001-11-15 2003-05-23 Toshiba Corp 磁気ランダムアクセスメモリ
JP3661652B2 (ja) * 2002-02-15 2005-06-15 ソニー株式会社 磁気抵抗効果素子および磁気メモリ装置
US20030161180A1 (en) * 2002-02-22 2003-08-28 Bloomquist Darrel R. Shared bit lines in stacked MRAM arrays
US6906947B2 (en) * 2002-02-22 2005-06-14 Hewlett-Packard Development Company, L.P. In-plane toroidal memory cell with vertically stepped conductors
US6859063B2 (en) * 2002-04-11 2005-02-22 Integrated Magnetoelectronics Corporation Transpinnor-based transmission line transceivers and applications
US7224566B2 (en) * 2002-04-19 2007-05-29 Integrated Magnetoelectronics Corporation Interfaces between semiconductor circuitry and transpinnor-based circuitry
US6783995B2 (en) * 2002-04-30 2004-08-31 Micron Technology, Inc. Protective layers for MRAM devices
US6724652B2 (en) * 2002-05-02 2004-04-20 Micron Technology, Inc. Low remanence flux concentrator for MRAM devices
US6927073B2 (en) * 2002-05-16 2005-08-09 Nova Research, Inc. Methods of fabricating magnetoresistive memory devices
US6879512B2 (en) * 2002-05-24 2005-04-12 International Business Machines Corporation Nonvolatile memory device utilizing spin-valve-type designs and current pulses
US6780653B2 (en) * 2002-06-06 2004-08-24 Micron Technology, Inc. Methods of forming magnetoresistive memory device assemblies
US6744663B2 (en) * 2002-06-28 2004-06-01 Motorola, Inc. Circuit and method for reading a toggle memory cell
US7095646B2 (en) 2002-07-17 2006-08-22 Freescale Semiconductor, Inc. Multi-state magnetoresistance random access cell with improved memory storage density
US6654278B1 (en) * 2002-07-31 2003-11-25 Motorola, Inc. Magnetoresistance random access memory
US6770491B2 (en) * 2002-08-07 2004-08-03 Micron Technology, Inc. Magnetoresistive memory and method of manufacturing the same
US6885576B2 (en) * 2002-08-13 2005-04-26 Micron Technology, Inc. Closed flux magnetic memory
US6914805B2 (en) * 2002-08-21 2005-07-05 Micron Technology, Inc. Method for building a magnetic keeper or flux concentrator used for writing magnetic bits on a MRAM device
JP3788964B2 (ja) * 2002-09-10 2006-06-21 株式会社東芝 磁気ランダムアクセスメモリ
US6809958B2 (en) * 2002-09-13 2004-10-26 Hewlett-Packard Development Company, L.P. MRAM parallel conductor orientation for improved write performance
KR100515053B1 (ko) * 2002-10-02 2005-09-14 삼성전자주식회사 비트라인 클램핑 전압 레벨에 대해 안정적인 독출 동작이가능한 마그네틱 메모리 장치
JP3893456B2 (ja) * 2002-10-18 2007-03-14 国立大学法人大阪大学 磁性メモリ及び磁性メモリアレイ
AU2003276533A1 (en) * 2002-11-28 2004-06-18 Koninklijke Philips Electronics N.V. Method and device for improved magnetic field generation during a write operation of a magnetoresistive memory device
US6992919B2 (en) * 2002-12-20 2006-01-31 Integrated Magnetoelectronics Corporation All-metal three-dimensional circuits and memories
JP4720067B2 (ja) * 2003-01-24 2011-07-13 Tdk株式会社 磁気記憶セルおよび磁気メモリデバイスならびに磁気メモリデバイスの製造方法
US7002228B2 (en) * 2003-02-18 2006-02-21 Micron Technology, Inc. Diffusion barrier for improving the thermal stability of MRAM devices
JP4419408B2 (ja) * 2003-03-14 2010-02-24 Tdk株式会社 磁気抵抗効果素子および磁気メモリデバイス
JP4729836B2 (ja) * 2003-03-28 2011-07-20 Tdk株式会社 磁気記憶セルおよび磁気メモリデバイスならびに磁気メモリデバイスの製造方法
US7005852B2 (en) 2003-04-04 2006-02-28 Integrated Magnetoelectronics Corporation Displays with all-metal electronics
JP4556385B2 (ja) * 2003-05-27 2010-10-06 Tdk株式会社 磁気メモリデバイスの製造方法
US6956763B2 (en) 2003-06-27 2005-10-18 Freescale Semiconductor, Inc. MRAM element and methods for writing the MRAM element
US6967366B2 (en) 2003-08-25 2005-11-22 Freescale Semiconductor, Inc. Magnetoresistive random access memory with reduced switching field variation
US7078239B2 (en) * 2003-09-05 2006-07-18 Micron Technology, Inc. Integrated circuit structure formed by damascene process
JP4868431B2 (ja) * 2003-10-10 2012-02-01 Tdk株式会社 磁気記憶セルおよび磁気メモリデバイス
US7112454B2 (en) * 2003-10-14 2006-09-26 Micron Technology, Inc. System and method for reducing shorting in memory cells
US7045838B2 (en) 2003-10-31 2006-05-16 International Business Machines Corporation Techniques for coupling in semiconductor devices and magnetic device using these techniques
CN1902685A (zh) * 2003-11-10 2007-01-24 Cm创新公司 固态磁存储系统和方法
TWI226636B (en) * 2003-12-19 2005-01-11 Ind Tech Res Inst Magnetic random access memory with high selectivity and low power and production method thereof
US7072209B2 (en) * 2003-12-29 2006-07-04 Micron Technology, Inc. Magnetic memory having synthetic antiferromagnetic pinned layer
US20050269612A1 (en) * 2004-05-11 2005-12-08 Integrated Magnetoelectronics Solid-state component based on current-induced magnetization reversal
US7027324B2 (en) * 2004-06-09 2006-04-11 Headway Technologies, Inc. Method and system for providing common read and write word lines for a segmented word line MRAM array
JP2006100423A (ja) * 2004-09-28 2006-04-13 Tdk Corp 磁気記憶装置
JP2006100424A (ja) * 2004-09-28 2006-04-13 Tdk Corp 磁気記憶装置
US7129098B2 (en) 2004-11-24 2006-10-31 Freescale Semiconductor, Inc. Reduced power magnetoresistive random access memory elements
WO2006078720A2 (en) * 2005-01-19 2006-07-27 Integrated Magnetoelectronics Corporation Radiation detector
JP2007059865A (ja) * 2005-07-27 2007-03-08 Tdk Corp 磁気記憶装置
WO2007043358A1 (ja) * 2005-10-07 2007-04-19 Konica Minolta Opto, Inc. セルロースエステルフィルムの製造方法、セルロースエステルフィルム、偏光板及び液晶表示装置
US7745893B2 (en) 2005-10-17 2010-06-29 Northern Lights Semiconductor Corp. Magnetic transistor structure
JP2007165449A (ja) * 2005-12-12 2007-06-28 Tdk Corp 磁気記憶装置
US7768749B2 (en) * 2006-02-10 2010-08-03 Hitachi Global Storage Technologies Netherlands B.V. Tunnel MR head with long stripe height stabilized through side-extended bias layer
US7630177B2 (en) * 2006-02-14 2009-12-08 Hitachi Global Storage Technologies Netherlands B.V. Tunnel MR head with closed-edge laminated free layer
US20070236978A1 (en) * 2006-04-06 2007-10-11 Wilson Jannier M R Non-volatile Reactive Magnetic Memory device (REMM)
US7715224B2 (en) * 2007-04-16 2010-05-11 Magic Technologies, Inc. MRAM with enhanced programming margin
US7911830B2 (en) * 2007-05-17 2011-03-22 Integrated Magnetoelectronics Scalable nonvolatile memory
ES2328996B1 (es) * 2007-10-02 2010-08-30 Diseño De Sistemas En Silicio, S.A. Dispositivo de multiinyeccion inductiva sobre multiples conductores.
EP2539896B1 (en) * 2010-02-22 2016-10-19 Integrated Magnetoelectronics Corporation A high gmr structure with low drive fields
US9741923B2 (en) 2015-09-25 2017-08-22 Integrated Magnetoelectronics Corporation SpinRAM
US10762940B2 (en) 2016-12-09 2020-09-01 Integrated Magnetoelectronics Corporation Narrow etched gaps or features in multi-period thin-film structures
US10755759B2 (en) 2018-06-28 2020-08-25 International Business Machines Corporation Symmetrically programmable resistive synapse for RPU using current-programmed single domain wall ferroelectric
US12563740B2 (en) 2022-03-21 2026-02-24 Seagate Technology Llc Mechanical magnetoresistance device

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5173873A (en) * 1990-06-28 1992-12-22 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration High speed magneto-resistive random access memory

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
BE540911A (https=) * 1954-08-31
WO1987000959A1 (en) * 1985-08-08 1987-02-12 David Cope Data storage apparatus for digital data processing system
US4780848A (en) * 1986-06-03 1988-10-25 Honeywell Inc. Magnetoresistive memory with multi-layer storage cells having layers of limited thickness
US5251170A (en) * 1991-11-04 1993-10-05 Nonvolatile Electronics, Incorporated Offset magnetoresistive memory structures
US5343422A (en) * 1993-02-23 1994-08-30 International Business Machines Corporation Nonvolatile magnetoresistive storage device using spin valve effect
JPH0766033A (ja) * 1993-08-30 1995-03-10 Mitsubishi Electric Corp 磁気抵抗素子ならびにその磁気抵抗素子を用いた磁性薄膜メモリおよび磁気抵抗センサ
US5477482A (en) * 1993-10-01 1995-12-19 The United States Of America As Represented By The Secretary Of The Navy Ultra high density, non-volatile ferromagnetic random access memory
US5442508A (en) * 1994-05-25 1995-08-15 Eastman Kodak Company Giant magnetoresistive reproduce head having dual magnetoresistive sensor

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5173873A (en) * 1990-06-28 1992-12-22 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration High speed magneto-resistive random access memory

Also Published As

Publication number Publication date
EP0809846A4 (en) 1998-08-26
JP4171067B2 (ja) 2008-10-22
DE69609165D1 (de) 2000-08-10
DE69609165T2 (de) 2001-03-22
KR19980702121A (ko) 1998-07-15
CA2211699A1 (en) 1996-08-22
US5587943A (en) 1996-12-24
JPH11501438A (ja) 1999-02-02
WO1996025740A1 (en) 1996-08-22
EP0809846A1 (en) 1997-12-03
CA2211699C (en) 2001-07-24
EP0809846B1 (en) 2000-07-05
TW287272B (https=) 1996-10-01

Similar Documents

Publication Publication Date Title
KR100302174B1 (ko) 완전폐쇄자속동작의비휘발성자기저항메모리
KR100439288B1 (ko) 자기저항 효과 메모리 셀에 정보를 기입하거나 판독하는방법
US6480411B1 (en) Magnetoresistance effect type memory, and method and device for reproducing information from the memory
KR100450794B1 (ko) 마그네틱 랜덤 엑세스 메모리 및 그 작동 방법
US6381171B1 (en) Magnetic element, magnetic read head, magnetic storage device, magnetic memory device
US6069820A (en) Spin dependent conduction device
KR100533299B1 (ko) 자기 스위칭 소자 및 자기 메모리
CN100447892C (zh) 具有软基准层的磁存储器件
US5541868A (en) Annular GMR-based memory element
US6052263A (en) Low moment/high coercivity pinned layer for magnetic tunnel junction sensors
US5432373A (en) Magnetic spin transistor
US20020186582A1 (en) Cladded read conductor for a pinned-on-the-fly soft reference layer
JP2005294376A (ja) 磁気記録素子及び磁気メモリ
KR100598634B1 (ko) 자기 메모리 유닛 및 자기 메모리 어레이
JP4076197B2 (ja) 磁性素子、記憶装置、磁気再生ヘッド、3端子素子、及び磁気ディスク装置
EP1411525B1 (en) Magnetic memory array, its fabrication and write/read methods
KR20050004160A (ko) 매트릭스 및 이의 동작 방법 및 판독 기록 동시 수행mram 메모리
JP3977576B2 (ja) 磁気メモリ装置
US20040021539A1 (en) Magnetic element with switchable domain structure
US7042036B2 (en) Magnetic memory using single domain switching by direct current
KR20040068300A (ko) 자기 디바이스, 어레이, 자기 메모리 소자, 자기 센서,자기 판독 헤드 및 자기 디바이스 판독 방법
Cockburn The emergence of high-density semiconductor-compatible spintronic memory
Freitas Spin—Valve and Spin—Tunneling Devices: Read Heads, MRAMs, Field Sensors
Vasil'eva et al. Magnetic random access memory devices
Heads et al. 19 Spin–Valve and Spin–Tunneling Devices

Legal Events

Date Code Title Description
PA0105 International application

St.27 status event code: A-0-1-A10-A15-nap-PA0105

R17-X000 Change to representative recorded

St.27 status event code: A-3-3-R10-R17-oth-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

A201 Request for examination
P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

PA0201 Request for examination

St.27 status event code: A-1-2-D10-D11-exm-PA0201

PG1501 Laying open of application

St.27 status event code: A-1-1-Q10-Q12-nap-PG1501

PN2301 Change of applicant

St.27 status event code: A-3-3-R10-R13-asn-PN2301

St.27 status event code: A-3-3-R10-R11-asn-PN2301

PN2301 Change of applicant

St.27 status event code: A-3-3-R10-R13-asn-PN2301

St.27 status event code: A-3-3-R10-R11-asn-PN2301

E902 Notification of reason for refusal
PE0902 Notice of grounds for rejection

St.27 status event code: A-1-2-D10-D21-exm-PE0902

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

T11-X000 Administrative time limit extension requested

St.27 status event code: U-3-3-T10-T11-oth-X000

P11-X000 Amendment of application requested

St.27 status event code: A-2-2-P10-P11-nap-X000

P13-X000 Application amended

St.27 status event code: A-2-2-P10-P13-nap-X000

E701 Decision to grant or registration of patent right
PE0701 Decision of registration

St.27 status event code: A-1-2-D10-D22-exm-PE0701

GRNT Written decision to grant
PR0701 Registration of establishment

St.27 status event code: A-2-4-F10-F11-exm-PR0701

PR1002 Payment of registration fee

St.27 status event code: A-2-2-U10-U12-oth-PR1002

Fee payment year number: 1

PG1601 Publication of registration

St.27 status event code: A-4-4-Q10-Q13-nap-PG1601

LAPS Lapse due to unpaid annual fee
PC1903 Unpaid annual fee

St.27 status event code: A-4-4-U10-U13-oth-PC1903

Not in force date: 20040703

Payment event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

PC1903 Unpaid annual fee

St.27 status event code: N-4-6-H10-H13-oth-PC1903

Ip right cessation event data comment text: Termination Category : DEFAULT_OF_REGISTRATION_FEE

Not in force date: 20040703