KR100282692B1 - 반도체 기억 장치 - Google Patents

반도체 기억 장치 Download PDF

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Publication number
KR100282692B1
KR100282692B1 KR1019980005277A KR19980005277A KR100282692B1 KR 100282692 B1 KR100282692 B1 KR 100282692B1 KR 1019980005277 A KR1019980005277 A KR 1019980005277A KR 19980005277 A KR19980005277 A KR 19980005277A KR 100282692 B1 KR100282692 B1 KR 100282692B1
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KR
South Korea
Prior art keywords
signal
circuit
data
write
response
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
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KR1019980005277A
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English (en)
Korean (ko)
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KR19990006349A (ko
Inventor
히로요시 도미타
Original Assignee
아끼쿠사 나오유끼
후지쯔 가부시키가이샤
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Publication of KR19990006349A publication Critical patent/KR19990006349A/ko
Application granted granted Critical
Publication of KR100282692B1 publication Critical patent/KR100282692B1/ko
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

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Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C29/00Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/70Masking faults in memories by using spares or by reconfiguring
    • G11C29/78Masking faults in memories by using spares or by reconfiguring using programmable devices
    • G11C29/84Masking faults in memories by using spares or by reconfiguring using programmable devices with improved access time or stability
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • G11C7/1015Read-write modes for single port memories, i.e. having either a random port or a serial port
    • G11C7/1039Read-write modes for single port memories, i.e. having either a random port or a serial port using pipelining techniques, i.e. using latches between functional memory parts, e.g. row/column decoders, I/O buffers, sense amplifiers
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/22Read-write [R-W] timing or clocking circuits; Read-write [R-W] control signal generators or management 
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C2207/00Indexing scheme relating to arrangements for writing information into, or reading information out from, a digital store
    • G11C2207/22Control and timing of internal memory operations
    • G11C2207/229Timing of a write operation

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Dram (AREA)
KR1019980005277A 1997-06-24 1998-02-20 반도체 기억 장치 Expired - Fee Related KR100282692B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP16745197A JP3695902B2 (ja) 1997-06-24 1997-06-24 半導体記憶装置
JP97-167451 1997-06-24

Publications (2)

Publication Number Publication Date
KR19990006349A KR19990006349A (ko) 1999-01-25
KR100282692B1 true KR100282692B1 (ko) 2001-02-15

Family

ID=15849946

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019980005277A Expired - Fee Related KR100282692B1 (ko) 1997-06-24 1998-02-20 반도체 기억 장치

Country Status (3)

Country Link
US (1) US6064625A (enExample)
JP (1) JP3695902B2 (enExample)
KR (1) KR100282692B1 (enExample)

Families Citing this family (54)

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US5838631A (en) * 1996-04-19 1998-11-17 Integrated Device Technology, Inc. Fully synchronous pipelined ram
US6292428B1 (en) 1998-02-03 2001-09-18 Fujitsu Limited Semiconductor device reconciling different timing signals
US6198688B1 (en) * 1998-04-02 2001-03-06 Hyundai Electronics Industries, Co., Ltd. Interface for synchronous semiconductor memories
JP3522116B2 (ja) * 1998-08-04 2004-04-26 富士通株式会社 複数ビットのデータプリフェッチ機能をもつメモリデバイス
KR100301047B1 (ko) * 1998-10-02 2001-09-06 윤종용 2비트프리페치용칼럼어드레스디코더를갖는반도체메모리장치
EP1031988A1 (en) 1999-02-26 2000-08-30 Texas Instruments Incorporated Method and apparatus for accessing a memory core
KR100306882B1 (ko) * 1998-10-28 2001-12-01 박종섭 반도체메모리소자에서데이터스트로브신호를버퍼링하기위한방법및장치
KR100306883B1 (ko) * 1998-12-22 2001-11-02 박종섭 반도체메모리장치의입력버퍼
JP2000268565A (ja) 1999-03-16 2000-09-29 Toshiba Corp 同期型半導体記憶装置
JP2000285694A (ja) * 1999-03-30 2000-10-13 Mitsubishi Electric Corp 半導体記憶装置および半導体記憶装置を搭載する半導体集積回路装置
JP3289701B2 (ja) * 1999-04-12 2002-06-10 日本電気株式会社 半導体記憶装置
JP4216415B2 (ja) * 1999-08-31 2009-01-28 株式会社ルネサステクノロジ 半導体装置
US6407963B1 (en) * 1999-10-19 2002-06-18 Hitachi, Ltd. Semiconductor memory device of DDR configuration having improvement in glitch immunity
US6292402B1 (en) * 1999-12-08 2001-09-18 International Business Machines Corporation Prefetch write driver for a random access memory
KR100407361B1 (ko) * 1999-12-16 2003-11-28 닛뽄덴끼 가부시끼가이샤 동기식 더블 데이터 속도용 디램
KR100340071B1 (ko) * 1999-12-24 2002-06-12 박종섭 고속의 라이트 동작을 수행하는 디디알 동기식 메모리 장치
US6373778B1 (en) 2000-01-28 2002-04-16 Mosel Vitelic, Inc. Burst operations in memories
US6191997B1 (en) * 2000-03-10 2001-02-20 Mosel Vitelic Inc. Memory burst operations in which address count bits are used as column address bits for one, but not both, of the odd and even columns selected in parallel.
KR100387523B1 (ko) * 2000-07-27 2003-06-18 삼성전자주식회사 데이터와 에코 클럭간 트래킹을 위한 장치 및 방법
US6807613B1 (en) 2000-08-21 2004-10-19 Mircon Technology, Inc. Synchronized write data on a high speed memory bus
KR100360409B1 (ko) * 2000-09-16 2002-11-13 삼성전자 주식회사 명령 및 어드레스 전용 스트로브 신호를 이용하는 반도체메모리장치 및 이의 명령 및 어드레스 입력방법
KR100425446B1 (ko) * 2001-04-27 2004-03-30 삼성전자주식회사 캘리브레이션 될 소정의 클럭신호를 선택하는클럭선택회로를 구비하는 반도체 메모리 장치의 입력회로및 소정의 클럭신호를 선택하는 방법
KR100408406B1 (ko) * 2001-05-15 2003-12-06 삼성전자주식회사 복수개의 제어 신호들에 동기되어 입력된 데이터를출력하는 데이터 래치 회로를 갖는 동기식 디램 반도체 장치
KR100403345B1 (ko) * 2001-09-14 2003-11-01 주식회사 하이닉스반도체 반도체 메모리 장치의 라이트 동작회로
US6512704B1 (en) * 2001-09-14 2003-01-28 Sun Microsystems, Inc. Data strobe receiver
KR100470995B1 (ko) * 2002-04-23 2005-03-08 삼성전자주식회사 클럭수신 동기회로를 갖는 멀티클럭 도메인 데이터 입력처리장치 및 그에 따른 클럭신호 인가방법
KR100532956B1 (ko) * 2003-06-28 2005-12-01 주식회사 하이닉스반도체 Ddr sdram에서의 링잉 현상 방지 방법
KR100548563B1 (ko) * 2003-06-30 2006-02-02 주식회사 하이닉스반도체 Ddr sdram 에서의 라이트 링잉 현상을 마스크하기위한 데이타 패스 제어 장치 및 방법
US6922367B2 (en) * 2003-07-09 2005-07-26 Micron Technology, Inc. Data strobe synchronization circuit and method for double data rate, multi-bit writes
KR100558557B1 (ko) * 2004-01-20 2006-03-10 삼성전자주식회사 반도체 메모리 장치에서의 데이터 샘플링 방법 및 그에따른 데이터 샘플링 회로
WO2005081257A1 (ja) * 2004-02-20 2005-09-01 Spansion Llc 半導体記憶装置および半導体記憶装置の制御方法
KR100624261B1 (ko) * 2004-04-20 2006-09-18 주식회사 하이닉스반도체 디디알 에스디램의 데이터 입력 장치 및 방법
TWI260019B (en) 2004-05-21 2006-08-11 Fujitsu Ltd Semiconductor memory device and memory system
KR100624296B1 (ko) * 2004-11-08 2006-09-19 주식회사 하이닉스반도체 반도체 메모리 소자
US7082073B2 (en) 2004-12-03 2006-07-25 Micron Technology, Inc. System and method for reducing power consumption during extended refresh periods of dynamic random access memory devices
US7120067B2 (en) * 2005-03-14 2006-10-10 Infineon Technologies Ag Memory with data latching circuit including a selector
KR100642394B1 (ko) 2005-04-01 2006-11-03 주식회사 하이닉스반도체 어드레스 래치신호 생성회로 및 어드레스 디코딩회로
JP4516483B2 (ja) 2005-06-07 2010-08-04 富士通セミコンダクター株式会社 半導体記憶装置及び情報処理システム
TW200717246A (en) * 2005-06-24 2007-05-01 Koninkl Philips Electronics Nv Self-synchronizing data streaming between address-based producer and consumer circuits
KR100613460B1 (ko) 2005-06-29 2006-08-17 주식회사 하이닉스반도체 라이트 데이타 스트로빙 방법 및 그 회로
JP4936421B2 (ja) * 2005-09-14 2012-05-23 エルピーダメモリ株式会社 Dram、入力制御回路、及び入力制御方法
US7362629B2 (en) 2005-09-29 2008-04-22 Hynix Semiconductor, Inc. Redundant circuit for semiconductor memory device
KR100863000B1 (ko) * 2007-01-12 2008-10-13 주식회사 하이닉스반도체 반도체 메모리 장치 및 이를 포함하는 반도체 집적 회로
KR20080114359A (ko) * 2007-06-27 2008-12-31 주식회사 하이닉스반도체 반도체 집적 회로 및 그의 불량 경로 검출 방법
JP4771432B2 (ja) * 2007-09-25 2011-09-14 ルネサスエレクトロニクス株式会社 半導体装置
US8185701B2 (en) * 2008-02-05 2012-05-22 International Business Machines Corporation System and method for an adaptive list prefetch
US7920431B2 (en) * 2008-06-02 2011-04-05 Micron Technology, Inc. Asynchronous/synchronous interface
JP5687412B2 (ja) * 2009-01-16 2015-03-18 ピーエスフォー ルクスコ エスエイアールエルPS4 Luxco S.a.r.l. 半導体記憶装置及びそのリード待ち時間調整方法、メモリシステム、並びに半導体装置
US8380680B2 (en) 2010-06-23 2013-02-19 International Business Machines Corporation Piecemeal list prefetch
JP5311507B2 (ja) * 2010-09-30 2013-10-09 ルネサスエレクトロニクス株式会社 同期型半導体記憶装置
JP5344657B2 (ja) * 2012-11-19 2013-11-20 ルネサスエレクトロニクス株式会社 Ddr型半導体記憶装置
US10326257B2 (en) 2014-04-25 2019-06-18 Sumitomo Electric Device Innovations, Inc. Semiconductor laser device and manufacturing method of the same
JP6697521B2 (ja) 2018-09-27 2020-05-20 華邦電子股▲ふん▼有限公司Winbond Electronics Corp. メモリデバイス
KR20250053434A (ko) * 2023-10-13 2025-04-22 에스케이하이닉스 주식회사 파이프 래치를 포함하는 메모리 장치

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JP2875476B2 (ja) * 1993-12-06 1999-03-31 松下電器産業株式会社 半導体メモリ装置
JPH08221981A (ja) * 1994-12-15 1996-08-30 Mitsubishi Electric Corp 同期型半導体記憶装置
JPH0963262A (ja) * 1995-08-17 1997-03-07 Fujitsu Ltd シンクロナスdram

Also Published As

Publication number Publication date
US6064625A (en) 2000-05-16
JP3695902B2 (ja) 2005-09-14
KR19990006349A (ko) 1999-01-25
JPH1116346A (ja) 1999-01-22

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