KR100223394B1 - 플라즈마 처리장치 - Google Patents
플라즈마 처리장치 Download PDFInfo
- Publication number
- KR100223394B1 KR100223394B1 KR1019960003289A KR19960003289A KR100223394B1 KR 100223394 B1 KR100223394 B1 KR 100223394B1 KR 1019960003289 A KR1019960003289 A KR 1019960003289A KR 19960003289 A KR19960003289 A KR 19960003289A KR 100223394 B1 KR100223394 B1 KR 100223394B1
- Authority
- KR
- South Korea
- Prior art keywords
- plasma
- electrode
- magnetic field
- magnet
- workpiece
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32623—Mechanical discharge control means
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10P—GENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
- H10P50/00—Etching of wafers, substrates or parts of devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/3266—Magnetic control means
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Plasma & Fusion (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Drying Of Semiconductors (AREA)
- Plasma Technology (AREA)
- Physical Vapour Deposition (AREA)
- Chemical Vapour Deposition (AREA)
- ing And Chemical Polishing (AREA)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP95-24050 | 1995-02-13 | ||
| JP2405095 | 1995-02-13 | ||
| JP7340682A JPH08288096A (ja) | 1995-02-13 | 1995-12-27 | プラズマ処理装置 |
| JP95-340682 | 1995-12-27 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR960032626A KR960032626A (ko) | 1996-09-17 |
| KR100223394B1 true KR100223394B1 (ko) | 1999-10-15 |
Family
ID=26361528
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR1019960003289A Expired - Fee Related KR100223394B1 (ko) | 1995-02-13 | 1996-02-12 | 플라즈마 처리장치 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US5733405A (https=) |
| JP (1) | JPH08288096A (https=) |
| KR (1) | KR100223394B1 (https=) |
| TW (1) | TW314685B (https=) |
Families Citing this family (59)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6000360A (en) * | 1996-07-03 | 1999-12-14 | Tokyo Electron Limited | Plasma processing apparatus |
| US6168690B1 (en) * | 1997-09-29 | 2001-01-02 | Lam Research Corporation | Methods and apparatus for physical vapor deposition |
| JP3364675B2 (ja) * | 1997-09-30 | 2003-01-08 | 東京エレクトロンエイ・ティー株式会社 | プラズマ処理装置 |
| US6645353B2 (en) * | 1997-12-31 | 2003-11-11 | Intel Corporation | Approach to optimizing an ILD argon sputter process |
| US6216632B1 (en) * | 1998-01-29 | 2001-04-17 | Anelva Corporation | Plasma processing system |
| US6125789A (en) * | 1998-01-30 | 2000-10-03 | Applied Materials, Inc. | Increasing the sensitivity of an in-situ particle monitor |
| US6146462A (en) * | 1998-05-08 | 2000-11-14 | Astenjohnson, Inc. | Structures and components thereof having a desired surface characteristic together with methods and apparatuses for producing the same |
| US6287687B1 (en) | 1998-05-08 | 2001-09-11 | Asten, Inc. | Structures and components thereof having a desired surface characteristic together with methods and apparatuses for producing the same |
| US5935272A (en) * | 1999-02-02 | 1999-08-10 | Milliken & Company | Compositions comprising aryloxypolyoxyalkylene naphthalimide derivative colorants |
| JP4307628B2 (ja) * | 1999-05-19 | 2009-08-05 | キヤノンアネルバ株式会社 | Ccp反応容器の平板型ガス導入装置 |
| JP2001023959A (ja) | 1999-07-05 | 2001-01-26 | Mitsubishi Electric Corp | プラズマ処理装置 |
| US6610184B2 (en) * | 2001-11-14 | 2003-08-26 | Applied Materials, Inc. | Magnet array in conjunction with rotating magnetron for plasma sputtering |
| US10047430B2 (en) | 1999-10-08 | 2018-08-14 | Applied Materials, Inc. | Self-ionized and inductively-coupled plasma for sputtering and resputtering |
| US8696875B2 (en) * | 1999-10-08 | 2014-04-15 | Applied Materials, Inc. | Self-ionized and inductively-coupled plasma for sputtering and resputtering |
| FR2799921B1 (fr) * | 1999-10-19 | 2002-01-11 | Metal Process | Procede de production d'un plasma par decharges a barriere multipolaire de type capacitif, et dispositif pour la mise en oeuvre d'un tel procede |
| JP2002075969A (ja) | 2000-08-25 | 2002-03-15 | Hitachi Ltd | プラズマ処理装置 |
| JP4606637B2 (ja) * | 2001-04-12 | 2011-01-05 | キヤノンアネルバ株式会社 | マグネトロン型平行平板表面処理装置 |
| US20030024478A1 (en) | 2001-08-06 | 2003-02-06 | Anelva Corporation | Surface processing apparatus |
| US7041201B2 (en) * | 2001-11-14 | 2006-05-09 | Applied Materials, Inc. | Sidewall magnet improving uniformity of inductively coupled plasma and shields used therewith |
| DE10326135B4 (de) * | 2002-06-12 | 2014-12-24 | Ulvac, Inc. | Entladungsplasma-Bearbeitungsanlage |
| JP3823069B2 (ja) * | 2002-06-12 | 2006-09-20 | 株式会社アルバック | 磁気中性線放電プラズマ処理装置 |
| US7504006B2 (en) * | 2002-08-01 | 2009-03-17 | Applied Materials, Inc. | Self-ionized and capacitively-coupled plasma for sputtering and resputtering |
| US7032536B2 (en) * | 2002-10-11 | 2006-04-25 | Sharp Kabushiki Kaisha | Thin film formation apparatus including engagement members for support during thermal expansion |
| US7273638B2 (en) * | 2003-01-07 | 2007-09-25 | International Business Machines Corp. | High density plasma oxidation |
| JP2006073790A (ja) * | 2004-09-02 | 2006-03-16 | Tokyo Institute Of Technology | プラズマエッチング装置 |
| KR100738875B1 (ko) * | 2006-02-15 | 2007-07-12 | 주식회사 에스에프에이 | 평면디스플레이용 화학 기상 증착장치 |
| PT2251454E (pt) | 2009-05-13 | 2014-10-01 | Sio2 Medical Products Inc | Revestimento e inspeção de vaso |
| US9458536B2 (en) | 2009-07-02 | 2016-10-04 | Sio2 Medical Products, Inc. | PECVD coating methods for capped syringes, cartridges and other articles |
| US11624115B2 (en) | 2010-05-12 | 2023-04-11 | Sio2 Medical Products, Inc. | Syringe with PECVD lubrication |
| US9878101B2 (en) | 2010-11-12 | 2018-01-30 | Sio2 Medical Products, Inc. | Cyclic olefin polymer vessels and vessel coating methods |
| JP5711581B2 (ja) * | 2011-03-25 | 2015-05-07 | 東京エレクトロン株式会社 | プラズマ処理装置 |
| US9272095B2 (en) | 2011-04-01 | 2016-03-01 | Sio2 Medical Products, Inc. | Vessels, contact surfaces, and coating and inspection apparatus and methods |
| CA2855353C (en) | 2011-11-11 | 2021-01-19 | Sio2 Medical Products, Inc. | Passivation, ph protective or lubricity coating for pharmaceutical package, coating process and apparatus |
| US11116695B2 (en) | 2011-11-11 | 2021-09-14 | Sio2 Medical Products, Inc. | Blood sample collection tube |
| JP2013122080A (ja) * | 2011-12-12 | 2013-06-20 | Ulvac Japan Ltd | スパッタリング装置 |
| JP6018757B2 (ja) * | 2012-01-18 | 2016-11-02 | 東京エレクトロン株式会社 | 基板処理装置 |
| JP6009171B2 (ja) * | 2012-02-14 | 2016-10-19 | 東京エレクトロン株式会社 | 基板処理装置 |
| EP2846755A1 (en) | 2012-05-09 | 2015-03-18 | SiO2 Medical Products, Inc. | Saccharide protective coating for pharmaceutical package |
| US20150297800A1 (en) | 2012-07-03 | 2015-10-22 | Sio2 Medical Products, Inc. | SiOx BARRIER FOR PHARMACEUTICAL PACKAGE AND COATING PROCESS |
| EP2720059B1 (en) * | 2012-10-15 | 2015-03-11 | MagCam NV | Devices and methods for determining a magnetic field distribution of a magnet along a main surface of said magnet. |
| US9664626B2 (en) | 2012-11-01 | 2017-05-30 | Sio2 Medical Products, Inc. | Coating inspection method |
| WO2014078666A1 (en) | 2012-11-16 | 2014-05-22 | Sio2 Medical Products, Inc. | Method and apparatus for detecting rapid barrier coating integrity characteristics |
| AU2013352436B2 (en) | 2012-11-30 | 2018-10-25 | Sio2 Medical Products, Inc. | Controlling the uniformity of PECVD deposition on medical syringes, cartridges, and the like |
| US9764093B2 (en) | 2012-11-30 | 2017-09-19 | Sio2 Medical Products, Inc. | Controlling the uniformity of PECVD deposition |
| US9662450B2 (en) | 2013-03-01 | 2017-05-30 | Sio2 Medical Products, Inc. | Plasma or CVD pre-treatment for lubricated pharmaceutical package, coating process and apparatus |
| CN105392916B (zh) | 2013-03-11 | 2019-03-08 | Sio2医药产品公司 | 涂布包装材料 |
| US9937099B2 (en) | 2013-03-11 | 2018-04-10 | Sio2 Medical Products, Inc. | Trilayer coated pharmaceutical packaging with low oxygen transmission rate |
| EP2971227B1 (en) | 2013-03-15 | 2017-11-15 | Si02 Medical Products, Inc. | Coating method. |
| WO2015148471A1 (en) | 2014-03-28 | 2015-10-01 | Sio2 Medical Products, Inc. | Antistatic coatings for plastic vessels |
| US9663780B2 (en) | 2014-10-15 | 2017-05-30 | Alpaqua Engineering, LLC | Solid-core ring-magnet |
| JP5938809B2 (ja) * | 2014-12-15 | 2016-06-22 | 国立大学法人名古屋大学 | 分子線エピタキシー装置 |
| KR102786617B1 (ko) | 2015-08-18 | 2025-03-26 | 에스아이오2 메디컬 프로덕츠, 엘엘씨 | 산소 전달률이 낮은, 의약품 및 다른 제품의 포장용기 |
| JP6865417B2 (ja) * | 2016-09-23 | 2021-04-28 | 国立大学法人茨城大学 | 除電装置 |
| US10504705B2 (en) * | 2017-09-15 | 2019-12-10 | Applied Materials, Inc. | Physical vapor deposition chamber with static magnet assembly and methods of sputtering |
| JP7055054B2 (ja) * | 2018-04-11 | 2022-04-15 | 東京エレクトロン株式会社 | プラズマ処理装置、プラズマ制御方法、及びプラズマ制御プログラム |
| MA53439A (fr) | 2018-08-23 | 2021-06-30 | Alpaqua Eng Llc | Aimant à noyau solide |
| US11242519B2 (en) | 2018-08-23 | 2022-02-08 | Alpaqua Engineering, LLC | Discontinuous wall hollow core magnet |
| US12372497B2 (en) | 2021-08-18 | 2025-07-29 | Alpaqua Engineering, LLC | Plate cushion device having a compression gap lock |
| KR20240016800A (ko) | 2022-07-29 | 2024-02-06 | 삼성전자주식회사 | 플라즈마 처리 장치 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS5324303B2 (https=) * | 1975-01-31 | 1978-07-20 | ||
| JPH0834205B2 (ja) * | 1986-11-21 | 1996-03-29 | 株式会社東芝 | ドライエツチング装置 |
| JPS6473725A (en) * | 1987-09-16 | 1989-03-20 | Matsushita Electric Industrial Co Ltd | Etching device |
| DE4018954A1 (de) * | 1989-06-15 | 1991-01-03 | Mitsubishi Electric Corp | Trockenaetzgeraet |
| US5279669A (en) * | 1991-12-13 | 1994-01-18 | International Business Machines Corporation | Plasma reactor for processing substrates comprising means for inducing electron cyclotron resonance (ECR) and ion cyclotron resonance (ICR) conditions |
-
1995
- 1995-12-27 JP JP7340682A patent/JPH08288096A/ja active Pending
-
1996
- 1996-02-06 US US08/597,182 patent/US5733405A/en not_active Expired - Lifetime
- 1996-02-09 TW TW085101691A patent/TW314685B/zh not_active IP Right Cessation
- 1996-02-12 KR KR1019960003289A patent/KR100223394B1/ko not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| US5733405A (en) | 1998-03-31 |
| TW314685B (https=) | 1997-09-01 |
| KR960032626A (ko) | 1996-09-17 |
| JPH08288096A (ja) | 1996-11-01 |
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