KR100215351B1 - 가변 기록 및 소거 시간 주기를 갖는 비휘발성 반도체 메모리 장치 - Google Patents

가변 기록 및 소거 시간 주기를 갖는 비휘발성 반도체 메모리 장치 Download PDF

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Publication number
KR100215351B1
KR100215351B1 KR1019960042329A KR19960042329A KR100215351B1 KR 100215351 B1 KR100215351 B1 KR 100215351B1 KR 1019960042329 A KR1019960042329 A KR 1019960042329A KR 19960042329 A KR19960042329 A KR 19960042329A KR 100215351 B1 KR100215351 B1 KR 100215351B1
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KR
South Korea
Prior art keywords
memory cell
time period
erase
write
verify
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Expired - Fee Related
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KR1019960042329A
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English (en)
Korean (ko)
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KR970017665A (ko
Inventor
토시야 사토
Original Assignee
가네꼬 히사시
닛본 덴기 가부시끼가이샤
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Publication of KR970017665A publication Critical patent/KR970017665A/ko
Application granted granted Critical
Publication of KR100215351B1 publication Critical patent/KR100215351B1/ko
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    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3436—Arrangements for verifying correct programming or erasure
    • G11C16/344—Arrangements for verifying correct erasure or for detecting overerased cells
    • G11C16/3445—Circuits or methods to verify correct erasure of nonvolatile memory cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/32—Timing circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3436—Arrangements for verifying correct programming or erasure
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3436—Arrangements for verifying correct programming or erasure
    • G11C16/3454—Arrangements for verifying correct programming or for detecting overprogrammed cells
    • G11C16/3459—Circuits or methods to verify correct programming of nonvolatile memory cells
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/349—Arrangements for evaluating degradation, retention or wearout, e.g. by counting erase cycles
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/349—Arrangements for evaluating degradation, retention or wearout, e.g. by counting erase cycles
    • G11C16/3495—Circuits or methods to detect or delay wearout of nonvolatile EPROM or EEPROM memory devices, e.g. by counting numbers of erase or reprogram cycles, by using multiple memory areas serially or cyclically

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  • Semiconductor Memories (AREA)
KR1019960042329A 1995-09-27 1996-09-25 가변 기록 및 소거 시간 주기를 갖는 비휘발성 반도체 메모리 장치 Expired - Fee Related KR100215351B1 (ko)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP95-274886 1995-09-27
JP27488695A JP2806326B2 (ja) 1995-09-27 1995-09-27 不揮発性半導体記憶装置の書込み・消去方法

Publications (2)

Publication Number Publication Date
KR970017665A KR970017665A (ko) 1997-04-30
KR100215351B1 true KR100215351B1 (ko) 1999-08-16

Family

ID=17547914

Family Applications (1)

Application Number Title Priority Date Filing Date
KR1019960042329A Expired - Fee Related KR100215351B1 (ko) 1995-09-27 1996-09-25 가변 기록 및 소거 시간 주기를 갖는 비휘발성 반도체 메모리 장치

Country Status (4)

Country Link
US (1) US5708605A (https=)
JP (1) JP2806326B2 (https=)
KR (1) KR100215351B1 (https=)
TW (1) TW307012B (https=)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101075504B1 (ko) * 2009-01-29 2011-10-21 주식회사 하이닉스반도체 불휘발성 메모리 소자의 소거 동작 방법

Families Citing this family (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3093649B2 (ja) * 1996-09-05 2000-10-03 九州日本電気株式会社 不揮発性半導体メモリ装置
US6081453A (en) * 1997-04-15 2000-06-27 Kabushiki Kaisha Toshiba Nonvolatile semiconductor memory device
JP3098486B2 (ja) * 1998-03-31 2000-10-16 山形日本電気株式会社 不揮発性半導体記憶装置
US6005810A (en) * 1998-08-10 1999-12-21 Integrated Silicon Solution, Inc. Byte-programmable flash memory having counters and secondary storage for disturb control during program and erase operations
US6141260A (en) 1998-08-27 2000-10-31 Micron Technology, Inc. Single electron resistor memory device and method for use thereof
TW439029B (en) * 1998-11-27 2001-06-07 Acer Peripherals Inc Method for preventing flash memory data from being lost or miswritten
KR100311042B1 (ko) * 1999-06-26 2001-11-02 윤종용 기입 주기의 프로그래밍이 가능한 동기식 메모리 장치 및 이를 이용한 데이터 기입 방법
TWI220031B (en) * 2003-07-01 2004-08-01 Delta Electronics Inc Method and apparatus for time-relevant accessing a non-volatile memory in an electrical equipment
US7142627B2 (en) 2004-12-23 2006-11-28 Ramtron International Corporation Counting scheme with automatic point-of-reference generation
US7120220B2 (en) 2004-12-23 2006-10-10 Ramtron International Corporation Non-volatile counter
US7257046B2 (en) * 2005-06-13 2007-08-14 Atmel Corporation Memory data access scheme
US9594679B2 (en) * 2008-05-01 2017-03-14 Sandisk Il Ltd. Flash cache flushing method and system
US8004884B2 (en) * 2009-07-31 2011-08-23 International Business Machines Corporation Iterative write pausing techniques to improve read latency of memory systems
US9009547B2 (en) 2011-01-27 2015-04-14 Apple Inc. Advanced programming verification schemes for analog memory cells
US9293194B2 (en) 2011-01-27 2016-03-22 Apple Inc. Programming and erasure schemes for analog memory cells
JP5404670B2 (ja) 2011-02-10 2014-02-05 株式会社東芝 不揮発性半導体記憶装置
US8374040B2 (en) 2011-02-25 2013-02-12 International Business Machines Corporation Write bandwidth in a memory characterized by a variable write time

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH03250496A (ja) * 1990-02-27 1991-11-08 Nec Corp 電気的書込み消去可能な不揮発性半導体記憶装置
JP3248928B2 (ja) * 1991-08-23 2002-01-21 富士通株式会社 不揮発性半導体記憶装置およびデータ消去方法
JPH0581881A (ja) * 1991-09-20 1993-04-02 Mitsubishi Electric Corp 半導体記憶装置
JP3348466B2 (ja) * 1992-06-09 2002-11-20 セイコーエプソン株式会社 不揮発性半導体装置
JPH06251593A (ja) * 1993-02-24 1994-09-09 Matsushita Electron Corp フラッシュメモリの消去あるいは書き込み制御方法
US5463586A (en) * 1993-05-28 1995-10-31 Macronix International Co., Ltd. Erase and program verification circuit for non-volatile memory
JPH0737395A (ja) * 1993-07-19 1995-02-07 Sony Corp 不揮発性半導体記憶装置
JP3448365B2 (ja) * 1994-09-20 2003-09-22 三菱電機株式会社 不揮発性半導体記憶装置
US5621687A (en) * 1995-05-31 1997-04-15 Intel Corporation Programmable erasure and programming time for a flash memory

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR101075504B1 (ko) * 2009-01-29 2011-10-21 주식회사 하이닉스반도체 불휘발성 메모리 소자의 소거 동작 방법

Also Published As

Publication number Publication date
JP2806326B2 (ja) 1998-09-30
KR970017665A (ko) 1997-04-30
JPH0991979A (ja) 1997-04-04
US5708605A (en) 1998-01-13
TW307012B (https=) 1997-06-01

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