JPWO2022064315A5 - - Google Patents

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Publication number
JPWO2022064315A5
JPWO2022064315A5 JP2022551443A JP2022551443A JPWO2022064315A5 JP WO2022064315 A5 JPWO2022064315 A5 JP WO2022064315A5 JP 2022551443 A JP2022551443 A JP 2022551443A JP 2022551443 A JP2022551443 A JP 2022551443A JP WO2022064315 A5 JPWO2022064315 A5 JP WO2022064315A5
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JP
Japan
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ftj
transistor
terminal
electrically connected
circuit
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JP2022551443A
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Japanese (ja)
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JP7727648B2 (ja
JPWO2022064315A1 (https=
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Priority claimed from PCT/IB2021/058288 external-priority patent/WO2022064315A1/ja
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JP2022551443A 2020-09-25 2021-09-13 半導体装置、及び電子機器 Active JP7727648B2 (ja)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2020161173 2020-09-25
JP2020161173 2020-09-25
PCT/IB2021/058288 WO2022064315A1 (ja) 2020-09-25 2021-09-13 半導体装置、及び電子機器

Publications (3)

Publication Number Publication Date
JPWO2022064315A1 JPWO2022064315A1 (https=) 2022-03-31
JPWO2022064315A5 true JPWO2022064315A5 (https=) 2024-09-24
JP7727648B2 JP7727648B2 (ja) 2025-08-21

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JP2022551443A Active JP7727648B2 (ja) 2020-09-25 2021-09-13 半導体装置、及び電子機器

Country Status (5)

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US (1) US12400693B2 (https=)
JP (1) JP7727648B2 (https=)
KR (1) KR20230071154A (https=)
CN (1) CN116097358A (https=)
WO (1) WO2022064315A1 (https=)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR20230070233A (ko) * 2020-09-22 2023-05-22 가부시키가이샤 한도오따이 에네루기 켄큐쇼 반도체 장치 및 전자 기기
WO2022084782A1 (ja) 2020-10-20 2022-04-28 株式会社半導体エネルギー研究所 半導体装置、及び電子機器
CN120165774B (zh) * 2025-05-19 2025-08-19 成都新易盛通信技术股份有限公司 一种评估线性光模块频率响应特性的方法

Family Cites Families (24)

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Publication number Priority date Publication date Assignee Title
JP2788290B2 (ja) 1988-07-08 1998-08-20 オリンパス光学工業株式会社 強誘電体メモリ
JP2788265B2 (ja) 1988-07-08 1998-08-20 オリンパス光学工業株式会社 強誘電体メモリ及びその駆動方法,製造方法
US5519234A (en) 1991-02-25 1996-05-21 Symetrix Corporation Ferroelectric dielectric memory cell can switch at least giga cycles and has low fatigue - has high dielectric constant and low leakage current
JPH05347422A (ja) * 1992-06-16 1993-12-27 Fujitsu Ltd 二安定ダイオード
JP3188179B2 (ja) 1995-09-26 2001-07-16 シャープ株式会社 強誘電体薄膜素子の製造方法及び強誘電体メモリ素子の製造方法
JPH09161473A (ja) 1995-12-11 1997-06-20 Fujitsu Ltd 強誘電体メモリセル及びこれを用いた強誘電体メモリ
US5784310A (en) 1997-03-03 1998-07-21 Symetrix Corporation Low imprint ferroelectric material for long retention memory and method of making the same
JP3960030B2 (ja) 2001-12-11 2007-08-15 富士通株式会社 強誘電体メモリ
JP2003242771A (ja) 2002-02-15 2003-08-29 Toshiba Corp 半導体記憶装置
JP4256670B2 (ja) 2002-12-10 2009-04-22 富士通株式会社 容量素子、半導体装置およびその製造方法
JP3979947B2 (ja) 2003-02-04 2007-09-19 三洋電機株式会社 強誘電体メモリ
JP2005183841A (ja) 2003-12-22 2005-07-07 Fujitsu Ltd 半導体装置の製造方法
JP4652087B2 (ja) 2004-03-11 2011-03-16 株式会社半導体エネルギー研究所 半導体装置
JP5190275B2 (ja) 2008-01-09 2013-04-24 パナソニック株式会社 半導体メモリセル及びそれを用いた半導体メモリアレイ
JP5886496B2 (ja) 2011-05-20 2016-03-16 株式会社半導体エネルギー研究所 半導体装置
US8891285B2 (en) 2011-06-10 2014-11-18 Semiconductor Energy Laboratory Co., Ltd. Semiconductor memory device
WO2015141625A1 (ja) * 2014-03-17 2015-09-24 株式会社 東芝 不揮発性記憶装置
US10319426B2 (en) * 2017-05-09 2019-06-11 Micron Technology, Inc. Semiconductor structures, memory cells and devices comprising ferroelectric materials, systems including same, and related methods
US9934838B1 (en) * 2017-05-10 2018-04-03 International Business Machines Corporation Pulse shaping unit cell and array for symmetric updating
US10755759B2 (en) * 2018-06-28 2020-08-25 International Business Machines Corporation Symmetrically programmable resistive synapse for RPU using current-programmed single domain wall ferroelectric
US11360704B2 (en) * 2018-12-21 2022-06-14 Micron Technology, Inc. Multiplexed signal development in a memory device
US11205467B2 (en) * 2019-05-09 2021-12-21 Namlab Ggmbh Ferroelectric memory and logic cell and operation method
US11380708B2 (en) * 2019-08-30 2022-07-05 Taiwan Semiconductor Manufacturing Company, Ltd. Analog non-volatile memory device using poly ferroelectric film with random polarization directions
WO2021112247A1 (ja) * 2019-12-04 2021-06-10 国立大学法人東京工業大学 不揮発性記憶装置、不揮発性記憶素子及びその製造方法

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