JPWO2022009618A5 - - Google Patents
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- JPWO2022009618A5 JPWO2022009618A5 JP2022534981A JP2022534981A JPWO2022009618A5 JP WO2022009618 A5 JPWO2022009618 A5 JP WO2022009618A5 JP 2022534981 A JP2022534981 A JP 2022534981A JP 2022534981 A JP2022534981 A JP 2022534981A JP WO2022009618 A5 JPWO2022009618 A5 JP WO2022009618A5
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- JP
- Japan
- Prior art keywords
- diagram showing
- nonvolatile memory
- current
- memory device
- variable resistance
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
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Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2020118177 | 2020-07-09 | ||
| JP2020118177 | 2020-07-09 | ||
| PCT/JP2021/022553 WO2022009618A1 (ja) | 2020-07-09 | 2021-06-14 | 抵抗変化型不揮発性記憶装置およびその書き込み方法 |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| JPWO2022009618A1 JPWO2022009618A1 (https=) | 2022-01-13 |
| JPWO2022009618A5 true JPWO2022009618A5 (https=) | 2023-03-23 |
| JP7708759B2 JP7708759B2 (ja) | 2025-07-15 |
Family
ID=79552915
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2022534981A Active JP7708759B2 (ja) | 2020-07-09 | 2021-06-14 | 抵抗変化型不揮発性記憶装置およびその書き込み方法 |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US12190950B2 (https=) |
| JP (1) | JP7708759B2 (https=) |
| CN (1) | CN115917651B (https=) |
| WO (1) | WO2022009618A1 (https=) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US11315634B1 (en) * | 2020-10-20 | 2022-04-26 | International Business Machines Corporation | Device comprising tunable resistive elements |
| CN119054020A (zh) * | 2022-04-19 | 2024-11-29 | 索尼半导体解决方案公司 | 存储装置、电子设备和存储装置控制方法 |
Family Cites Families (29)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| KR100699837B1 (ko) * | 2005-04-04 | 2007-03-27 | 삼성전자주식회사 | 반도체 메모리 장치 및 반도체 메모리 장치의 프로그래밍방법 |
| JP4967176B2 (ja) * | 2007-05-10 | 2012-07-04 | シャープ株式会社 | 可変抵抗素子とその製造方法及び不揮発性半導体記憶装置 |
| JP4846813B2 (ja) * | 2009-03-12 | 2011-12-28 | 株式会社東芝 | 不揮発性半導体記憶装置 |
| JP4628501B2 (ja) * | 2009-03-25 | 2011-02-09 | パナソニック株式会社 | 抵抗変化素子の駆動方法及び不揮発性記憶装置 |
| US8508976B2 (en) * | 2009-04-30 | 2013-08-13 | Panasonic Corporation | Nonvolatile memory element and nonvolatile memory device |
| JP2011009344A (ja) * | 2009-06-24 | 2011-01-13 | Sharp Corp | 不揮発性可変抵抗素子のフォーミング方法 |
| CN102197434A (zh) | 2009-10-15 | 2011-09-21 | 松下电器产业株式会社 | 电阻变化型非易失性存储装置 |
| JP2011204785A (ja) * | 2010-03-24 | 2011-10-13 | Toshiba Corp | 不揮発性記憶装置 |
| JP5521850B2 (ja) | 2010-07-21 | 2014-06-18 | ソニー株式会社 | 抵抗変化型メモリデバイスおよびその駆動方法 |
| JP5000026B2 (ja) * | 2010-10-29 | 2012-08-15 | パナソニック株式会社 | 不揮発性記憶装置 |
| JP2012133836A (ja) * | 2010-12-20 | 2012-07-12 | Toshiba Corp | 抵抗変化型メモリ |
| KR20120103913A (ko) * | 2011-03-11 | 2012-09-20 | 삼성전자주식회사 | 가변 저항 소자, 상기 가변 저항 소자를 포함하는 반도체 장치 및 상기 반도체 장치의 동작 방법 |
| CN103052990B (zh) * | 2011-08-02 | 2015-01-07 | 松下电器产业株式会社 | 电阻变化型非易失性存储装置及其驱动方法 |
| KR20130072842A (ko) * | 2011-12-22 | 2013-07-02 | 에스케이하이닉스 주식회사 | 프로그램 펄스 발생 회로 및 이를 구비하는 비휘발성 메모리 장치 |
| WO2013157261A1 (ja) * | 2012-04-20 | 2013-10-24 | パナソニック株式会社 | 不揮発性記憶素子の駆動方法および不揮発性記憶装置 |
| JP2014078302A (ja) * | 2012-10-11 | 2014-05-01 | Panasonic Corp | クロスポイント型抵抗変化不揮発性記憶装置及びクロスポイント型抵抗変化不揮発性記憶装置の読み出し方法 |
| US8981332B2 (en) * | 2013-03-15 | 2015-03-17 | Intermolecular, Inc. | Nonvolatile resistive memory element with an oxygen-gettering layer |
| US9336881B2 (en) * | 2014-06-16 | 2016-05-10 | Panasonic Intellectual Property Management Co., Ltd. | Variable resistance nonvolatile memory device including a variable resistance layer that changes reversibly between a low resistance state and a high resistance state according to an applied electrical signal |
| CN105632543B (zh) * | 2014-11-21 | 2018-03-30 | 松下知识产权经营株式会社 | 具有防篡改性的非易失性存储装置及集成电路卡 |
| JP2016167326A (ja) * | 2015-03-09 | 2016-09-15 | ルネサスエレクトロニクス株式会社 | 半導体記憶装置 |
| US11139024B2 (en) * | 2017-03-01 | 2021-10-05 | Nanobridge Semiconductor, Inc. | Semiconductor device |
| US10541011B1 (en) * | 2017-08-01 | 2020-01-21 | SK Hynix Inc. | Electronic device |
| JP6956204B2 (ja) * | 2017-12-29 | 2021-11-02 | パナソニック株式会社 | 抵抗変化型不揮発性記憶装置 |
| US10783941B1 (en) * | 2019-05-28 | 2020-09-22 | Intel Corporation | Floating block select based programming time (tPROG) |
| US11610101B2 (en) * | 2019-08-30 | 2023-03-21 | International Business Machines Corporation | Formation failure resilient neuromorphic device |
| CN112825259A (zh) * | 2019-11-20 | 2021-05-21 | 三星电子株式会社 | 非易失性存储器及其操作方法 |
| KR102802846B1 (ko) * | 2019-12-23 | 2025-05-07 | 에스케이하이닉스 주식회사 | 저항성 메모리 장치 및 그의 동작 방법 |
| JP2021150308A (ja) * | 2020-03-16 | 2021-09-27 | キオクシア株式会社 | 半導体記憶装置 |
| US11145349B1 (en) * | 2020-09-28 | 2021-10-12 | Globalfoundries U.S. Inc. | Physically unclonable function architecture including memory cells with parallel-connected access transistors and common write wordlines |
-
2021
- 2021-06-14 JP JP2022534981A patent/JP7708759B2/ja active Active
- 2021-06-14 WO PCT/JP2021/022553 patent/WO2022009618A1/ja not_active Ceased
- 2021-06-14 CN CN202180043696.4A patent/CN115917651B/zh active Active
-
2022
- 2022-11-18 US US18/057,067 patent/US12190950B2/en active Active
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