JPWO2005091313A1 - 電子部品 - Google Patents
電子部品 Download PDFInfo
- Publication number
- JPWO2005091313A1 JPWO2005091313A1 JP2006511132A JP2006511132A JPWO2005091313A1 JP WO2005091313 A1 JPWO2005091313 A1 JP WO2005091313A1 JP 2006511132 A JP2006511132 A JP 2006511132A JP 2006511132 A JP2006511132 A JP 2006511132A JP WO2005091313 A1 JPWO2005091313 A1 JP WO2005091313A1
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- Prior art keywords
- land
- electronic component
- conductive
- substrate
- area
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
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- 239000000758 substrate Substances 0.000 claims abstract description 99
- RYGMFSIKBFXOCR-UHFFFAOYSA-N Copper Chemical compound [Cu] RYGMFSIKBFXOCR-UHFFFAOYSA-N 0.000 claims description 24
- 229910052802 copper Inorganic materials 0.000 claims description 22
- 239000010949 copper Substances 0.000 claims description 22
- 239000000463 material Substances 0.000 claims description 22
- 229910052751 metal Inorganic materials 0.000 claims description 18
- 239000002184 metal Substances 0.000 claims description 18
- 239000003989 dielectric material Substances 0.000 claims 2
- 229910000679 solder Inorganic materials 0.000 description 71
- 239000006071 cream Substances 0.000 description 34
- 238000000034 method Methods 0.000 description 29
- 229910045601 alloy Inorganic materials 0.000 description 16
- 239000000956 alloy Substances 0.000 description 16
- 230000008569 process Effects 0.000 description 16
- 230000000694 effects Effects 0.000 description 11
- 239000011521 glass Substances 0.000 description 11
- 238000004519 manufacturing process Methods 0.000 description 10
- 239000000919 ceramic Substances 0.000 description 9
- 230000008901 benefit Effects 0.000 description 8
- 238000010586 diagram Methods 0.000 description 8
- 238000007650 screen-printing Methods 0.000 description 8
- 239000000853 adhesive Substances 0.000 description 7
- 230000001070 adhesive effect Effects 0.000 description 7
- 230000035939 shock Effects 0.000 description 7
- 238000012360 testing method Methods 0.000 description 7
- 239000000470 constituent Substances 0.000 description 6
- 239000003822 epoxy resin Substances 0.000 description 6
- 229920000647 polyepoxide Polymers 0.000 description 6
- 239000011347 resin Substances 0.000 description 6
- 229920005989 resin Polymers 0.000 description 6
- 230000035882 stress Effects 0.000 description 6
- 239000010410 layer Substances 0.000 description 5
- PNEYBMLMFCGWSK-UHFFFAOYSA-N aluminium oxide Inorganic materials [O-2].[O-2].[O-2].[Al+3].[Al+3] PNEYBMLMFCGWSK-UHFFFAOYSA-N 0.000 description 4
- 230000008859 change Effects 0.000 description 4
- 229910017944 Ag—Cu Inorganic materials 0.000 description 3
- 239000003990 capacitor Substances 0.000 description 3
- 238000001816 cooling Methods 0.000 description 3
- 239000003365 glass fiber Substances 0.000 description 3
- 238000010438 heat treatment Methods 0.000 description 3
- 238000007747 plating Methods 0.000 description 3
- 206010040844 Skin exfoliation Diseases 0.000 description 2
- 230000002411 adverse Effects 0.000 description 2
- 239000011889 copper foil Substances 0.000 description 2
- 230000008021 deposition Effects 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 230000006866 deterioration Effects 0.000 description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 description 2
- 229910052737 gold Inorganic materials 0.000 description 2
- 239000010931 gold Substances 0.000 description 2
- 238000002844 melting Methods 0.000 description 2
- 230000008018 melting Effects 0.000 description 2
- 230000009467 reduction Effects 0.000 description 2
- 238000009966 trimming Methods 0.000 description 2
- 239000004925 Acrylic resin Substances 0.000 description 1
- 229920000178 Acrylic resin Polymers 0.000 description 1
- 229910001152 Bi alloy Inorganic materials 0.000 description 1
- 229910017932 Cu—Sb Inorganic materials 0.000 description 1
- 239000004593 Epoxy Substances 0.000 description 1
- 229910000846 In alloy Inorganic materials 0.000 description 1
- 229910020836 Sn-Ag Inorganic materials 0.000 description 1
- 229910020830 Sn-Bi Inorganic materials 0.000 description 1
- 229910020888 Sn-Cu Inorganic materials 0.000 description 1
- 229910020935 Sn-Sb Inorganic materials 0.000 description 1
- 229910020994 Sn-Zn Inorganic materials 0.000 description 1
- 229910020988 Sn—Ag Inorganic materials 0.000 description 1
- 229910018728 Sn—Bi Inorganic materials 0.000 description 1
- 229910019204 Sn—Cu Inorganic materials 0.000 description 1
- 229910008757 Sn—Sb Inorganic materials 0.000 description 1
- 229910009069 Sn—Zn Inorganic materials 0.000 description 1
- 229910001297 Zn alloy Inorganic materials 0.000 description 1
- 239000000654 additive Substances 0.000 description 1
- 230000000996 additive effect Effects 0.000 description 1
- 230000003064 anti-oxidating effect Effects 0.000 description 1
- 239000011247 coating layer Substances 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000020169 heat generation Effects 0.000 description 1
- 230000001771 impaired effect Effects 0.000 description 1
- 230000006872 improvement Effects 0.000 description 1
- 238000000691 measurement method Methods 0.000 description 1
- 239000000203 mixture Substances 0.000 description 1
- 229910052759 nickel Inorganic materials 0.000 description 1
- 238000000059 patterning Methods 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 230000002787 reinforcement Effects 0.000 description 1
- 229910001925 ruthenium oxide Inorganic materials 0.000 description 1
- WOCIAKWEIIZHES-UHFFFAOYSA-N ruthenium(iv) oxide Chemical compound O=[Ru]=O WOCIAKWEIIZHES-UHFFFAOYSA-N 0.000 description 1
- 230000011218 segmentation Effects 0.000 description 1
- 238000005476 soldering Methods 0.000 description 1
- 230000008646 thermal stress Effects 0.000 description 1
- 229910052718 tin Inorganic materials 0.000 description 1
Images
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- H01C1/144—Terminals or tapping points or electrodes specially adapted for resistors; Arrangements of terminals or tapping points or electrodes on resistors the terminals or tapping points being welded or soldered
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- H01L23/498—Leads, i.e. metallisations or lead-frames on insulating substrates, e.g. chip carriers
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- H01L23/49816—Spherical bumps on the substrate for external connection, e.g. ball grid arrays [BGA]
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- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K3/00—Apparatus or processes for manufacturing printed circuits
- H05K3/30—Assembling printed circuits with electric components, e.g. with resistor
- H05K3/32—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
- H05K3/34—Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
- H05K3/341—Surface mounted components
- H05K3/3431—Leadless components
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
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- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Computer Hardware Design (AREA)
- Manufacturing & Machinery (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Electric Connection Of Electric Components To Printed Circuits (AREA)
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Abstract
Description
2.電極
2a.個別電極
2b.共通電極
3.抵抗
4.ランド
4a.通常のランド
4b.面積の大きいランド
5.ガラス
6.トリミング溝
7.オーバーコート
8.クリームハンダ
9.導電性突起
10.ボール
11.固化したクリームハンダ
12.回路板
13.回路板のランド
14.突起状部材
21.ICチップ
22.固化したクリームハンダ
23.回路板
アルミナセラミックからなる大型の基板1を用意する。当該大型の基板1の両面には縦横に分割用の溝が設けられており、かかる分割後の最小単位の基板1が一つのネットワーク抵抗器を構成する。その溝を有する大型の基板1面に多数の抵抗素子を形成していく過程を、図3を参照しながら以下に説明する。かかる図面では、前記最小単位の基板1(図1(a)に相当)について示している。
第2のネットワーク抵抗器は、本発明の電子部品において、ランド4bが、四角形等であること、及び/又はランド4bにおいて基板1の長辺方向寸法が、短辺方向寸法より大である電子部品の一例である。従って、図4に示す(a)乃至(f)の過程をこの順に、上述した本発明に係る第1のネットワーク抵抗器と略同様に製造される。上述の本発明に係る第1のネットワーク抵抗器の製造と異なる、又は追加する事項は次の通りである。図4(a)において、基板1の長辺方向に沿った個別電極膜2a寸法を短辺方向に沿った個別電極膜2a寸法より大きくしている。図4(e)において、オーバーコート膜7を配する際に露出させるランド4形状は、長方形の四隅に丸みを有する形状とした。
Claims (14)
- 基板の一方の面に、複数の回路素子、及び導電性突起からなる当該回路素子の外部端子を有する電子部品において、
単体の回路素子は、対となる電極と、当該電極に接触する抵抗体又は誘電体を構成要素とし、当該電極の一部をランドとして露出させつつ前記回路素子がオーバーコートにより被覆され、前記導電性突起は固着部材を含み、当該固着部材により前記ランドに固着され、前記ランドのうち少なくとも3つのランドが他のランドよりも面積が大きく、前記面積の大きいランドにのみ導電性突起が固着された場合に当該導電性突起と平地とが接触した状態で電子部品が自立可能であり、全ての導電性突起が実質的に同一寸法の導電性ボールとランド全面との固着で形成されることを特徴とする電子部品。 - 面積の大きいランドが、基板外端と近接する位置にあることを特徴とする請求項1記載の電子部品。
- 導電性ボールとランド全面とが、各々のランド面積値に略比例した量の固着部材にて固着されることを特徴とする請求項1又は2記載の電子部品。
- 前記面積の大きいランドに固着された導電性突起は、基板面に沿った断面積最大値が、それ以外のランドに固着された導電性突起の基板面に沿った断面積最大値より大きいことを特徴とする請求項1乃至3のいずれかに記載の電子部品。
- 面積の大きいランドから延在する電極と、抵抗体又は誘電体とが重なり合って接続される領域が、前記面積の大きいランドの中心と、前記対となる他端の電極との最短経路を結ぶ直線上を避けて存在することを特徴とする請求項1乃至4のいずれかに記載の電子部品。
- 面積の大きいランドにおいて、基板の長辺方向寸法が短辺方向寸法よりも大であることを特徴とする請求項1乃至5のいずれかに記載の電子部品。
- 面積の大きいランドが、四角形の基板の四隅に存在することを特徴とする請求項1乃至6のいずれかに記載の電子部品。
- 面積の大きいランドが、長方形の基板の短辺側の両外端と近接する位置に存在することを特徴とする請求項1乃至7のいずれかに記載の電子部品。
- 面積の大きいランドが、四角形、楕円形、四隅に丸みを有する四角形のいずれかであることを特徴とする請求項1乃至8のいずれかに記載の電子部品。
- 面積の大きいランドの、基板の長辺方向寸法が、短辺方向寸法より大であることを特徴とする請求項1乃至9のいずれかに記載の電子部品。
- 導電性突起が、鉛を実質的に含まないことを特徴とする請求項1乃至12のいずれかに記載の電子部品。
- 導電性突起が、銅を主体とすることを特徴とする請求項11に記載の電子部品。
- 電子部品を構成する各抵抗体又は誘電体が全て実質的に同一形状であり、且つ隣接する抵抗体又は誘電体間距離が実質的に同一であることを特徴とする請求項1乃至12のいずれかに記載の電子部品。
- 面積の大きいランドがメタルグレーズ系材料からなり、当該ランド全面が固着部材で被覆されていることを特徴とする請求項1乃至13のいずれかに記載の電子部品。
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JP2004179092 | 2004-06-17 | ||
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JP2004224064 | 2004-07-30 | ||
JP2004224064 | 2004-07-30 | ||
PCT/JP2005/000760 WO2005091313A1 (ja) | 2004-03-24 | 2005-01-21 | 電子部品 |
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US20120161312A1 (en) * | 2010-12-23 | 2012-06-28 | Hossain Md Altaf | Non-solder metal bumps to reduce package height |
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JPH08139233A (ja) * | 1994-11-08 | 1996-05-31 | Matsushita Electric Ind Co Ltd | モジュール部品 |
JPH0946045A (ja) * | 1995-07-26 | 1997-02-14 | Oki Electric Ind Co Ltd | 多層配線基板の製造方法 |
JP2000058709A (ja) * | 1998-08-17 | 2000-02-25 | Nec Corp | 突起電極構造および突起電極形成方法 |
JP2000077218A (ja) * | 1998-09-01 | 2000-03-14 | Matsushita Electric Ind Co Ltd | チップ形抵抗ネットワーク |
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US5172471A (en) * | 1991-06-21 | 1992-12-22 | Vlsi Technology, Inc. | Method of providing power to an integrated circuit |
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JP2000100851A (ja) * | 1998-09-25 | 2000-04-07 | Sony Corp | 半導体部品及びその製造方法、半導体部品の実装構造及びその実装方法 |
US6444563B1 (en) * | 1999-02-22 | 2002-09-03 | Motorlla, Inc. | Method and apparatus for extending fatigue life of solder joints in a semiconductor device |
JP3490987B2 (ja) * | 2001-07-19 | 2004-01-26 | 沖電気工業株式会社 | 半導体パッケージおよびその製造方法 |
JP2003234433A (ja) * | 2001-10-01 | 2003-08-22 | Matsushita Electric Ind Co Ltd | 半導体装置、半導体装置の実装方法、ならびに実装体およびその製造方法 |
US6856516B2 (en) * | 2002-08-20 | 2005-02-15 | Cts Corporation | Ball grid array resistor capacitor network |
US6780751B2 (en) * | 2002-10-09 | 2004-08-24 | Freescale Semiconductor, Inc. | Method for eliminating voiding in plated solder |
US7070088B2 (en) * | 2004-03-09 | 2006-07-04 | Texas Instruments Incorporated | Method of semiconductor device assembly including fatigue-resistant ternary solder alloy |
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2005
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- 2005-01-21 JP JP2006511132A patent/JP4568719B2/ja not_active Expired - Fee Related
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JPH0722213A (ja) * | 1993-07-06 | 1995-01-24 | Matsushita Electric Ind Co Ltd | 面実装部品への半田バンプ形成方法 |
JPH08139233A (ja) * | 1994-11-08 | 1996-05-31 | Matsushita Electric Ind Co Ltd | モジュール部品 |
JPH0946045A (ja) * | 1995-07-26 | 1997-02-14 | Oki Electric Ind Co Ltd | 多層配線基板の製造方法 |
JP2000058709A (ja) * | 1998-08-17 | 2000-02-25 | Nec Corp | 突起電極構造および突起電極形成方法 |
JP2000077218A (ja) * | 1998-09-01 | 2000-03-14 | Matsushita Electric Ind Co Ltd | チップ形抵抗ネットワーク |
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