JPS6237936A - 異なる厚さの層に同時に開孔を形成する方法 - Google Patents

異なる厚さの層に同時に開孔を形成する方法

Info

Publication number
JPS6237936A
JPS6237936A JP61158129A JP15812986A JPS6237936A JP S6237936 A JPS6237936 A JP S6237936A JP 61158129 A JP61158129 A JP 61158129A JP 15812986 A JP15812986 A JP 15812986A JP S6237936 A JPS6237936 A JP S6237936A
Authority
JP
Japan
Prior art keywords
etching
insulating layer
thick
mask
substrate
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP61158129A
Other languages
English (en)
Japanese (ja)
Other versions
JPH0545057B2 (cg-RX-API-DMAC10.html
Inventor
ポール・エドワード・ニクソン
マーテイ・サーヤナラヤナ・ポラヴラプ
デービツド・スタナソロヴイツチ
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
International Business Machines Corp
Original Assignee
International Business Machines Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by International Business Machines Corp filed Critical International Business Machines Corp
Publication of JPS6237936A publication Critical patent/JPS6237936A/ja
Publication of JPH0545057B2 publication Critical patent/JPH0545057B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H10P50/283—
    • C—CHEMISTRY; METALLURGY
    • C03—GLASS; MINERAL OR SLAG WOOL
    • C03C—CHEMICAL COMPOSITION OF GLASSES, GLAZES OR VITREOUS ENAMELS; SURFACE TREATMENT OF GLASS; SURFACE TREATMENT OF FIBRES OR FILAMENTS MADE FROM GLASS, MINERALS OR SLAGS; JOINING GLASS TO GLASS OR OTHER MATERIALS
    • C03C15/00—Surface treatment of glass, not in the form of fibres or filaments, by etching

Landscapes

  • Chemical & Material Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Chemical & Material Sciences (AREA)
  • Geochemistry & Mineralogy (AREA)
  • Materials Engineering (AREA)
  • Organic Chemistry (AREA)
  • Drying Of Semiconductors (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Weting (AREA)
JP61158129A 1985-08-09 1986-07-07 異なる厚さの層に同時に開孔を形成する方法 Granted JPS6237936A (ja)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US764148 1985-08-09
US06/764,148 US4624739A (en) 1985-08-09 1985-08-09 Process using dry etchant to avoid mask-and-etch cycle

Publications (2)

Publication Number Publication Date
JPS6237936A true JPS6237936A (ja) 1987-02-18
JPH0545057B2 JPH0545057B2 (cg-RX-API-DMAC10.html) 1993-07-08

Family

ID=25069822

Family Applications (1)

Application Number Title Priority Date Filing Date
JP61158129A Granted JPS6237936A (ja) 1985-08-09 1986-07-07 異なる厚さの層に同時に開孔を形成する方法

Country Status (4)

Country Link
US (1) US4624739A (cg-RX-API-DMAC10.html)
EP (1) EP0212251B1 (cg-RX-API-DMAC10.html)
JP (1) JPS6237936A (cg-RX-API-DMAC10.html)
DE (1) DE3681994D1 (cg-RX-API-DMAC10.html)

Families Citing this family (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2593631B1 (fr) * 1986-01-27 1989-02-17 Maurice Francois Ecran d'affichage a matrice active a resistance de grille et procedes de fabrication de cet ecran
US5010039A (en) * 1989-05-15 1991-04-23 Ku San Mei Method of forming contacts to a semiconductor device
US5205902A (en) * 1989-08-18 1993-04-27 Galileo Electro-Optics Corporation Method of manufacturing microchannel electron multipliers
US5086248A (en) * 1989-08-18 1992-02-04 Galileo Electro-Optics Corporation Microchannel electron multipliers
KR100797202B1 (ko) * 2000-06-23 2008-01-23 허니웰 인터내셔널 인코포레이티드 손상된 실리카 유전 필름에 소수성을 부여하는 방법 및 손상된 실리카 유전 필름 처리 방법
US6638438B2 (en) * 2001-10-16 2003-10-28 Ulisatera Corporation Printed circuit board micro hole processing method
US7709371B2 (en) * 2003-01-25 2010-05-04 Honeywell International Inc. Repairing damage to low-k dielectric materials using silylating agents
KR101040687B1 (ko) * 2003-01-25 2011-06-10 허니웰 인터내셔널 인코포레이티드 손상된 유전체 물질 및 막의 보상 및 회복
US7154086B2 (en) * 2003-03-19 2006-12-26 Burle Technologies, Inc. Conductive tube for use as a reflectron lens
US8475666B2 (en) * 2004-09-15 2013-07-02 Honeywell International Inc. Method for making toughening agent materials
US7678712B2 (en) * 2005-03-22 2010-03-16 Honeywell International, Inc. Vapor phase treatment of dielectric materials
US20080073516A1 (en) * 2006-03-10 2008-03-27 Laprade Bruce N Resistive glass structures used to shape electric fields in analytical instruments

Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5796552A (en) * 1980-12-09 1982-06-15 Nec Corp Manufacture of semiconductor device
JPS61161721A (ja) * 1985-01-11 1986-07-22 Nec Corp 表面平坦化法

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4180432A (en) * 1977-12-19 1979-12-25 International Business Machines Corporation Process for etching SiO2 layers to silicon in a moderate vacuum gas plasma
US4253907A (en) * 1979-03-28 1981-03-03 Western Electric Company, Inc. Anisotropic plasma etching
JPS5690525A (en) * 1979-11-28 1981-07-22 Fujitsu Ltd Manufacture of semiconductor device
DE3016736A1 (de) * 1980-04-30 1981-11-05 Siemens AG, 1000 Berlin und 8000 München Verfahren zum herstellen geaetzter strukturen in siliziumoxidschichten
US4457820A (en) * 1981-12-24 1984-07-03 International Business Machines Corporation Two step plasma etching
DE3216823A1 (de) * 1982-05-05 1983-11-10 Siemens AG, 1000 Berlin und 8000 München Verfahren zum herstellen von strukturen von aus metallsilizid und polysilizium bestehenden doppelschichten auf integrierte halbleiterschaltungen enthaltenden substraten durch reaktives ionenaetzen
DE3315719A1 (de) * 1983-04-29 1984-10-31 Siemens AG, 1000 Berlin und 8000 München Verfahren zum herstellen von strukturen von aus metallsiliziden bzw. silizid-polysilizium bestehenden doppelschichten fuer integrierte halbleiterschaltungen durch reaktives ionenaetzen
US4508815A (en) * 1983-11-03 1985-04-02 Mostek Corporation Recessed metallization
US4532002A (en) * 1984-04-10 1985-07-30 Rca Corporation Multilayer planarizing structure for lift-off technique

Patent Citations (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5796552A (en) * 1980-12-09 1982-06-15 Nec Corp Manufacture of semiconductor device
JPS61161721A (ja) * 1985-01-11 1986-07-22 Nec Corp 表面平坦化法

Also Published As

Publication number Publication date
US4624739A (en) 1986-11-25
EP0212251B1 (en) 1991-10-16
JPH0545057B2 (cg-RX-API-DMAC10.html) 1993-07-08
EP0212251A2 (en) 1987-03-04
DE3681994D1 (de) 1991-11-21
EP0212251A3 (en) 1988-03-16

Similar Documents

Publication Publication Date Title
JPS6237936A (ja) 異なる厚さの層に同時に開孔を形成する方法
JP2944185B2 (ja) コンタクトエッチング方法
JPH0254557A (ja) 半導体装置
JP2715877B2 (ja) 半導体装置の製造方法
JP2880014B2 (ja) シリコン基板のエッチング方法
JPS5840338B2 (ja) 半導体装置の製造法
JPS63287024A (ja) 半導体装置の製造方法
JPH0422021B2 (cg-RX-API-DMAC10.html)
JPS59132141A (ja) 半導体装置の製造方法
JPS60240131A (ja) 半導体装置の製造方法
JPH01248523A (ja) 半導体装置の製造方法
KR100259071B1 (ko) 반도체소자의 식각방법
KR100198633B1 (ko) 반도체 소자의 제조방법
JPS61174638A (ja) 電極金属配線パタ−ンの形成方法
JPS62229843A (ja) 半導体単結晶の異方性エツチング方法
JPH01243426A (ja) レジスト膜のエツチング方法
JPH06314685A (ja) 半導体装置製造方法
KR930017148A (ko) 반도체장치의 제조방법
JPS58155A (ja) 半導体装置の製造方法
JPH0737834A (ja) 半導体装置の製造方法
JPS6194327A (ja) 半導体素子の製造方法
JPS58145145A (ja) 半導体装置の素子間分離絶縁膜の形成方法
JPS62112342A (ja) 素子分離領域の形成方法
JPH03127827A (ja) 半導体装置の製造法
JPS60201634A (ja) 半導体装置の製造方法