JPS5742164A - Semiconductor device - Google Patents

Semiconductor device

Info

Publication number
JPS5742164A
JPS5742164A JP55117093A JP11709380A JPS5742164A JP S5742164 A JPS5742164 A JP S5742164A JP 55117093 A JP55117093 A JP 55117093A JP 11709380 A JP11709380 A JP 11709380A JP S5742164 A JPS5742164 A JP S5742164A
Authority
JP
Japan
Prior art keywords
layer
type
concentration
region
impurity
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Granted
Application number
JP55117093A
Other languages
English (en)
Other versions
JPH0330310B2 (ja
Inventor
Hideshi Ito
Mitsuo Ito
Shigeo Otaka
Kazutoshi Ashikawa
Tetsuo Iijima
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hitachi Ltd
Original Assignee
Hitachi Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hitachi Ltd filed Critical Hitachi Ltd
Priority to JP55117093A priority Critical patent/JPS5742164A/ja
Publication of JPS5742164A publication Critical patent/JPS5742164A/ja
Publication of JPH0330310B2 publication Critical patent/JPH0330310B2/ja
Granted legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/66—Types of semiconductor device ; Multistep manufacturing processes therefor
    • H01L29/68—Types of semiconductor device ; Multistep manufacturing processes therefor controllable by only the electric current supplied, or only the electric potential applied, to an electrode which does not carry the current to be rectified, amplified or switched
    • H01L29/76—Unipolar devices, e.g. field effect transistors
    • H01L29/772—Field effect transistors
    • H01L29/78—Field effect transistors with field effect produced by an insulated gate
    • H01L29/7801—DMOS transistors, i.e. MISFETs with a channel accommodating body or base region adjoining a drain drift region
    • H01L29/7802—Vertical DMOS transistors, i.e. VDMOS transistors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/08—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
    • H01L29/0843—Source or drain regions of field-effect devices
    • H01L29/0847—Source or drain regions of field-effect devices of field-effect transistors with insulated gate
    • H01L29/0852—Source or drain regions of field-effect devices of field-effect transistors with insulated gate of DMOS transistors
    • H01L29/0873—Drain regions
    • H01L29/0878—Impurity concentration or distribution
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00—Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/02—Semiconductor bodies ; Multistep manufacturing processes therefor
    • H01L29/06—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions
    • H01L29/08—Semiconductor bodies ; Multistep manufacturing processes therefor characterised by their shape; characterised by the shapes, relative sizes, or dispositions of the semiconductor regions ; characterised by the concentration or distribution of impurities within semiconductor regions with semiconductor regions connected to an electrode carrying current to be rectified, amplified or switched and such electrode being part of a semiconductor device which comprises three or more electrodes
    • H01L29/0843—Source or drain regions of field-effect devices
    • H01L29/0847—Source or drain regions of field-effect devices of field-effect transistors with insulated gate

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
JP55117093A 1980-08-27 1980-08-27 Semiconductor device Granted JPS5742164A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP55117093A JPS5742164A (en) 1980-08-27 1980-08-27 Semiconductor device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP55117093A JPS5742164A (en) 1980-08-27 1980-08-27 Semiconductor device

Publications (2)

Publication Number Publication Date
JPS5742164A true JPS5742164A (en) 1982-03-09
JPH0330310B2 JPH0330310B2 (ja) 1991-04-26

Family

ID=14703215

Family Applications (1)

Application Number Title Priority Date Filing Date
JP55117093A Granted JPS5742164A (en) 1980-08-27 1980-08-27 Semiconductor device

Country Status (1)

Country Link
JP (1) JPS5742164A (ja)

Cited By (43)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS628571A (ja) * 1985-07-04 1987-01-16 Nec Corp 半導体装置
JPS62155567A (ja) * 1985-11-12 1987-07-10 ゼネラル・エレクトリツク・カンパニイ 絶縁ゲ−ト型半導体装置の製造方法
US4680604A (en) * 1984-03-19 1987-07-14 Kabushiki Kaisha Toshiba Conductivity modulated MOS transistor device
US4686551A (en) * 1982-11-27 1987-08-11 Nissan Motor Co., Ltd. MOS transistor
JPS62213166A (ja) * 1986-03-13 1987-09-19 Nec Corp 縦型高耐圧ｍｏｓｆｅｔ
JPS63133678A (ja) * 1986-11-26 1988-06-06 Nec Corp 縦型電界効果トランジスタの製造方法
JPS63157477A (ja) * 1986-12-22 1988-06-30 Nissan Motor Co Ltd 電導度変調形ｍｏｓｆｅｔ
JPS63177566A (ja) * 1987-01-19 1988-07-21 Nec Corp 電界効果トランジスタ
US4803532A (en) * 1982-11-27 1989-02-07 Nissan Motor Co., Ltd. Vertical MOSFET having a proof structure against puncture due to breakdown
JPS6482565A (en) * 1987-09-24 1989-03-28 Mitsubishi Electric Corp Field-effect semiconductor device
JPS6482567A (en) * 1987-09-24 1989-03-28 Mitsubishi Electric Corp Field-effect semiconductor device
JPS6482566A (en) * 1987-09-24 1989-03-28 Mitsubishi Electric Corp Field-effect semiconductor device
JPS6482564A (en) * 1987-09-24 1989-03-28 Mitsubishi Electric Corp Field-effect semiconductor device
US4879584A (en) * 1987-02-13 1989-11-07 Kabushiki Kaisha Toshiba Semiconductor device with isolation between MOSFET and control circuit
JPH0247874A (ja) * 1988-08-10 1990-02-16 Fuji Electric Co Ltd Ｍｏｓ型半導体装置の製造方法
US4902636A (en) * 1988-01-18 1990-02-20 Matsushita Electric Works, Ltd. Method for manufacturing a depletion type double-diffused metal-oxide semiconductor field effect transistor device
US4974059A (en) * 1982-12-21 1990-11-27 International Rectifier Corporation Semiconductor high-power mosfet device
JPH0494576A (ja) * 1990-08-11 1992-03-26 Sharp Corp 縦型パワーｍｏｓ　ｆｅｔ
USRE34025E (en) * 1987-02-13 1992-08-11 Kabushiki Kaisha Toshiba Semiconductor device with isolation between MOSFET and control circuit
US5191396A (en) * 1978-10-13 1993-03-02 International Rectifier Corp. High power mosfet with low on-resistance and high breakdown voltage
US5338961A (en) * 1978-10-13 1994-08-16 International Rectifier Corporation High power MOSFET with low on-resistance and high breakdown voltage
US5545908A (en) * 1991-12-09 1996-08-13 Nippondenso Co., Ltd. Vertical type insulated-gate semiconductor device
JPH08213615A (ja) * 1995-08-18 1996-08-20 Matsushita Electron Corp 縦型ｍｏｓ電界効果トランジスタ
JPH08250731A (ja) * 1994-12-30 1996-09-27 Siliconix Inc 高いブレークダウン電圧と低いオン抵抗を兼ね備えたトレンチ型ｍｏｓｆｅｔ
US5631487A (en) * 1993-07-30 1997-05-20 Nec Corporation Semiconductor device and motor driver circuit using the same
US5701023A (en) * 1994-08-03 1997-12-23 National Semiconductor Corporation Insulated gate semiconductor device typically having subsurface-peaked portion of body region for improved ruggedness
US5869371A (en) * 1995-06-07 1999-02-09 Stmicroelectronics, Inc. Structure and process for reducing the on-resistance of mos-gated power devices
JP2001210823A (ja) * 2000-01-21 2001-08-03 Denso Corp 半導体装置
JP2002176176A (ja) * 2000-12-08 2002-06-21 Denso Corp 半導体装置
US6703665B1 (en) * 1999-08-20 2004-03-09 Shindengen Electric Manufacturing Co., Ltd. Transistor
WO2005034246A1 (ja) * 2003-10-03 2005-04-14 National Institute Of Advanced Industrial Science And Technology 炭化ケイ素半導体装置
JP2006059916A (ja) * 2004-08-18 2006-03-02 Matsushita Electric Ind Co Ltd 半導体装置
WO2007070050A1 (en) * 2005-12-14 2007-06-21 Freescale Semiconductor, Inc. Power mosfet and method of making the same
US7482285B2 (en) 1999-06-09 2009-01-27 International Rectifier Corporation Dual epitaxial layer for high voltage vertical conduction power MOSFET devices
US8327822B2 (en) 2007-09-21 2012-12-11 Yanmar Co., Ltd. Diesel engine
JP2013239554A (ja) * 2012-05-15 2013-11-28 Mitsubishi Electric Corp 半導体装置及びその製造方法
JP2015115375A (ja) * 2013-12-09 2015-06-22 国立研究開発法人産業技術総合研究所 炭化珪素半導体装置
JP2018060985A (ja) * 2016-10-07 2018-04-12 トヨタ自動車株式会社 半導体装置
JP2018125544A (ja) * 2013-08-08 2018-08-09 クリー インコーポレイテッドＣｒｅｅ Ｉｎｃ． 縦型パワートランジスタデバイス
US10600903B2 (en) 2013-09-20 2020-03-24 Cree, Inc. Semiconductor device including a power transistor device and bypass diode
WO2020193169A1 (de) * 2019-03-26 2020-10-01 Robert Bosch Gmbh Leistungstransistorzelle für batteriesysteme
US10868169B2 (en) 2013-09-20 2020-12-15 Cree, Inc. Monolithically integrated vertical power transistor and bypass diode
JP2022051424A (ja) * 2020-09-18 2022-03-31 株式会社東芝 半導体装置

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5553462A (en) * 1978-10-13 1980-04-18 Int Rectifier Corp Mosfet element

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5553462A (en) * 1978-10-13 1980-04-18 Int Rectifier Corp Mosfet element

Cited By (54)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5598018A (en) * 1978-10-13 1997-01-28 International Rectifier Corporation High power MOSFET with low on-resistance and high breakdown voltage
US5742087A (en) * 1978-10-13 1998-04-21 International Rectifier Corporation High power MOSFET with low on-resistance and high breakdown voltage
US5191396A (en) * 1978-10-13 1993-03-02 International Rectifier Corp. High power mosfet with low on-resistance and high breakdown voltage
US5338961A (en) * 1978-10-13 1994-08-16 International Rectifier Corporation High power MOSFET with low on-resistance and high breakdown voltage
US4803532A (en) * 1982-11-27 1989-02-07 Nissan Motor Co., Ltd. Vertical MOSFET having a proof structure against puncture due to breakdown
US4686551A (en) * 1982-11-27 1987-08-11 Nissan Motor Co., Ltd. MOS transistor
US4974059A (en) * 1982-12-21 1990-11-27 International Rectifier Corporation Semiconductor high-power mosfet device
USRE32784E (en) * 1984-03-19 1988-11-15 Kabushiki Kaisha Toshiba Conductivity modulated MOS transistor device
US4680604A (en) * 1984-03-19 1987-07-14 Kabushiki Kaisha Toshiba Conductivity modulated MOS transistor device
JPS628571A (ja) * 1985-07-04 1987-01-16 Nec Corp 半導体装置
JPS62155567A (ja) * 1985-11-12 1987-07-10 ゼネラル・エレクトリツク・カンパニイ 絶縁ゲ−ト型半導体装置の製造方法
JPS62213166A (ja) * 1986-03-13 1987-09-19 Nec Corp 縦型高耐圧ｍｏｓｆｅｔ
JPS63133678A (ja) * 1986-11-26 1988-06-06 Nec Corp 縦型電界効果トランジスタの製造方法
JPS63157477A (ja) * 1986-12-22 1988-06-30 Nissan Motor Co Ltd 電導度変調形ｍｏｓｆｅｔ
JPS63177566A (ja) * 1987-01-19 1988-07-21 Nec Corp 電界効果トランジスタ
US4879584A (en) * 1987-02-13 1989-11-07 Kabushiki Kaisha Toshiba Semiconductor device with isolation between MOSFET and control circuit
USRE34025E (en) * 1987-02-13 1992-08-11 Kabushiki Kaisha Toshiba Semiconductor device with isolation between MOSFET and control circuit
JPS6482565A (en) * 1987-09-24 1989-03-28 Mitsubishi Electric Corp Field-effect semiconductor device
JPS6482567A (en) * 1987-09-24 1989-03-28 Mitsubishi Electric Corp Field-effect semiconductor device
JPS6482566A (en) * 1987-09-24 1989-03-28 Mitsubishi Electric Corp Field-effect semiconductor device
JPS6482564A (en) * 1987-09-24 1989-03-28 Mitsubishi Electric Corp Field-effect semiconductor device
US5055895A (en) * 1988-01-18 1991-10-08 Matsushuta Electric Works, Ltd. Double-diffused metal-oxide semiconductor field effect transistor device
US4902636A (en) * 1988-01-18 1990-02-20 Matsushita Electric Works, Ltd. Method for manufacturing a depletion type double-diffused metal-oxide semiconductor field effect transistor device
FR2635413A1 (fr) * 1988-08-10 1990-02-16 Fuji Electric Co Ltd Procede de fabrication pour un dispositif metal-oxyde-semiconducteur
JPH0247874A (ja) * 1988-08-10 1990-02-16 Fuji Electric Co Ltd Ｍｏｓ型半導体装置の製造方法
JPH0494576A (ja) * 1990-08-11 1992-03-26 Sharp Corp 縦型パワーｍｏｓ　ｆｅｔ
US5545908A (en) * 1991-12-09 1996-08-13 Nippondenso Co., Ltd. Vertical type insulated-gate semiconductor device
US5631487A (en) * 1993-07-30 1997-05-20 Nec Corporation Semiconductor device and motor driver circuit using the same
US5897355A (en) * 1994-08-03 1999-04-27 National Semiconductor Corporation Method of manufacturing insulated gate semiconductor device to improve ruggedness
US5701023A (en) * 1994-08-03 1997-12-23 National Semiconductor Corporation Insulated gate semiconductor device typically having subsurface-peaked portion of body region for improved ruggedness
JPH08250731A (ja) * 1994-12-30 1996-09-27 Siliconix Inc 高いブレークダウン電圧と低いオン抵抗を兼ね備えたトレンチ型ｍｏｓｆｅｔ
US5869371A (en) * 1995-06-07 1999-02-09 Stmicroelectronics, Inc. Structure and process for reducing the on-resistance of mos-gated power devices
US6046473A (en) * 1995-06-07 2000-04-04 Stmicroelectronics, Inc. Structure and process for reducing the on-resistance of MOS-gated power devices
JPH08213615A (ja) * 1995-08-18 1996-08-20 Matsushita Electron Corp 縦型ｍｏｓ電界効果トランジスタ
US7482285B2 (en) 1999-06-09 2009-01-27 International Rectifier Corporation Dual epitaxial layer for high voltage vertical conduction power MOSFET devices
US6703665B1 (en) * 1999-08-20 2004-03-09 Shindengen Electric Manufacturing Co., Ltd. Transistor
JP2001210823A (ja) * 2000-01-21 2001-08-03 Denso Corp 半導体装置
JP2002176176A (ja) * 2000-12-08 2002-06-21 Denso Corp 半導体装置
WO2005034246A1 (ja) * 2003-10-03 2005-04-14 National Institute Of Advanced Industrial Science And Technology 炭化ケイ素半導体装置
JP2006059916A (ja) * 2004-08-18 2006-03-02 Matsushita Electric Ind Co Ltd 半導体装置
WO2007070050A1 (en) * 2005-12-14 2007-06-21 Freescale Semiconductor, Inc. Power mosfet and method of making the same
US8327822B2 (en) 2007-09-21 2012-12-11 Yanmar Co., Ltd. Diesel engine
JP2013239554A (ja) * 2012-05-15 2013-11-28 Mitsubishi Electric Corp 半導体装置及びその製造方法
JP2018125544A (ja) * 2013-08-08 2018-08-09 クリー インコーポレイテッドＣｒｅｅ Ｉｎｃ． 縦型パワートランジスタデバイス
USRE48380E1 (en) 2013-08-08 2021-01-05 Cree, Inc. Vertical power transistor device
USRE49913E1 (en) 2013-08-08 2024-04-09 Wolfspeed, Inc. Vertical power transistor device
US10600903B2 (en) 2013-09-20 2020-03-24 Cree, Inc. Semiconductor device including a power transistor device and bypass diode
US10868169B2 (en) 2013-09-20 2020-12-15 Cree, Inc. Monolithically integrated vertical power transistor and bypass diode
US10950719B2 (en) 2013-09-20 2021-03-16 Cree, Inc. Seminconductor device with spreading layer
JP2015115375A (ja) * 2013-12-09 2015-06-22 国立研究開発法人産業技術総合研究所 炭化珪素半導体装置
JP2018060985A (ja) * 2016-10-07 2018-04-12 トヨタ自動車株式会社 半導体装置
US10256295B2 (en) 2016-10-07 2019-04-09 Toyota Jidosha Kabushiki Kaisha Semiconductor device
WO2020193169A1 (de) * 2019-03-26 2020-10-01 Robert Bosch Gmbh Leistungstransistorzelle für batteriesysteme
JP2022051424A (ja) * 2020-09-18 2022-03-31 株式会社東芝 半導体装置

Also Published As

Publication number Publication date
JPH0330310B2 (ja) 1991-04-26

Similar Documents

Publication Publication Date Title
JPS5742164A (en) Semiconductor device
JPS57206073A (en) Mis semiconductor device
JPS6453574A (en) Semiconductor device
JPS5710266A (en) Mis field effect semiconductor device
JPS5759384A (en) Manufacture of longitudinal type insulated field effect semiconductor device
JPS56126973A (en) Mos field effect transistor
JPS56126977A (en) Junction type field effect transistor
JPS55140262A (en) Semiconductor device
JPS6433970A (en) Field effect semiconductor device
JPS57164573A (en) Semiconductor device
JPS57192083A (en) Semiconductor device
JPS57211278A (en) Semiconductor device
JPS55153378A (en) Field effect transistor
JPS6473770A (en) Semiconductor device and manufacture thereof
JPS56108275A (en) Field effect transistor
JPS56140663A (en) Semiconductor device
JPS6461059A (en) Semiconductor device
JPS5673468A (en) Mos type semiconductor device
JPS56104470A (en) Semiconductor device and manufacture thereof
JPS57128957A (en) Semiconductor integrated circuit device and manufacture thereof
JPS5698876A (en) Junction type fet
JPS5654069A (en) High withstand voltage mos field-effect semiconductor device
JPS5670668A (en) Longitudinal semiconductor device
JPS5563876A (en) Field-effect semiconductor device
JPS57199268A (en) Junction type field effect transistor